ZnO薄膜p型掺杂的研究进展

ZnO薄膜作为一种多功能半导体材料，近年来一直受到广泛关注。然而，如何制备高质量的p型ZnO薄膜是实现其实用化的关键。概括了p型掺杂困难的原因，并指出Ⅲ-Ⅴ族元素共掺杂可能是p型掺杂的最好方法。简单回顾了ZnO薄膜p型掺杂的研究现状，并对今后的发展趋势进行了展望。     

p型掺杂ZnO薄膜的研究进展

近年来,随着对ZnO的光电性质及其在光电领域应用的开发研究,制备可靠稳定的低阻p型ZnO薄膜成为研究热点之一。本文论述了p型ZnO薄膜制备的难点及其解决方法,综述了其最新研究进展,并对p型ZnO的研究进行了展望。     

ZnO薄膜p型掺杂的研究进展

ZnO是一种新型的II-VI族半导体材料,具有许多优异的性能.但由于ZnO存在诸多的本征施主缺陷(如空位氧V_o和间隙锌Zn_i),对受主产生高度自补偿作用,天然为n型半导体,难以实现p型转变.ZnO薄膜p型掺杂的实现是ZnO基光电器件的关键技术,也一直是ZnO研究中的主要课题,目前已取得重大进展,文章对此进行了详细阐述.     

p型ZnO薄膜的研究进展

ZnO材料以其优良的光电特性和相对低廉的成本而倍受人们的青睐,但是要获得高质量的p型ZnO薄膜难度极大,这已成为阻碍ZnO基光电器件走向实用化的主要障碍。综述了p型ZnO薄膜掺杂面临的困难、p型ZnO掺杂理论进展及实现p型ZnO薄膜的各种掺杂方法,并对p型ZnO薄膜的各种制备工艺方法进行了概括和比较,最后指出了提高p型ZnO薄膜质量的努力方向。     

ZnO薄膜p型掺杂的研究进展

ZnO薄膜作为一种多功能半导体材料,近年来一直受到广泛关注.然而,如何制备高质量的p型ZnO薄膜是实现其实用化的关键.概括了p型掺杂困难的原因,并指出Ⅲ-Ⅴ族元素共掺杂可能是p型掺杂的最好方法.简单回顾了ZnO薄膜p型掺杂的研究现状,并对今后的发展趋势进行了展望.     

ZnO薄膜的制备及p型掺杂研究进展

氧化锌是一种在声表面波传感器、压电器件以及太阳能电池等方面具有很好应用前景的材料。介绍了目前制备ZnO薄膜的主要方法,综述了ZnO薄膜p型掺杂的研究现状,并对ZnO薄膜的研究进行了展望。     

p型ZnO掺杂及其发光器件研究进展与展望

ZnO是一种新型的Ⅱ-Ⅵ族宽带隙半导体,具有很多优异的的光电性能.但一般制备出的ZnO薄膜材料均是n型,很难实现p型的掺杂.ZnO的p型掺杂是实现其光电器件应用的关键技术,也是目前ZnO研究的关键课题.目前在p型ZnO的掺杂理论和实验方面都有很大的进展,对此进行了详细的分析与论述,并且展望了p型ZnO薄膜制备的前景.     

p型ZnO薄膜研究进展

ZnO薄膜是一种应用广泛的半导体材料.近几年来,随着对ZnO的光电性质及其在光电器件方面应用的开发研究,ZnO薄膜成为研究热点之一.制备掺杂的p型ZnO是形成同质p-n结以及实现其实际应用的重要途径.近来已在p型ZnO及其同质结发光二极管(LED s)研究方面取得了较大的进展.目前报道的p型ZnO薄膜的电阻率已降至10-3Ω.cm量级.得到了具有较好非线性伏安特性的ZnO同质p-n结和紫外发光LED.本文就其最新进展进行了综述.     

氧化锌中的本征点缺陷对材料光电性能的影响

ZnO薄膜中的本征点缺陷对材料的电学、发光性能有着至关重要的影响.目前,对本征点缺陷的研究是ZnO领域的一大热点,也是实现ZnO基光电器件的关键技术之一.本文结合最新研究,扼要综述了本征点缺陷的电荷特性、对本征ZnO为n型的作用机理、对p型ZnO制备的影响及点缺陷对薄膜绿光发光的贡献.     

ZnO薄膜的p型掺杂研究进展

ZnO作为重要的第三代半导体材料在光电领域具有广泛的应用前景因而引起越来越多的关注,ZnO薄膜的p型掺杂是实现ZnO基光电器件的关键,也是ZnO材料的主要研究课题.本文论述了ZnO薄膜P型转变的难点及其解决方法,概述了ZnO薄膜p型掺杂的研究现状,提出了有待进一步研究的问题.     

Comparative photoluminescence study on p-type and n-type ZnO films codoped by nitrogen and aluminium

We report on the temperature-dependent photoluminescence (PL) properties of n-type and p-type ZnO films codoped with N and Al. For the n-type film, the dominant emission at low temperature is exciton bound to neutral donors, while for the p-type film it is exciton bound to neutral acceptor at 3.33 eV. Four defect or impurity levels, including N acceptor, residual acceptor, and two doping-induced unknown deep acceptors, were identified. The energy level of the N acceptor was determined to be 0.23 eV. Excitation energy dependence of the PL was also investigated. It was found that at high excitation energy, the formation of exciton was suppressed by the formation of D⁺A⁻eh complexes.     

氧化锌薄膜场效应晶体管的制备及工艺研究

场效应晶体管是现代微电子技术的重要组成部分.为制备氧化锌薄膜晶体管,分析了氧化锌的p型、n型掺杂特性,对p型掺杂进行了实验分析和理论探讨,比较了各种制备氧化锌薄膜晶体管的工艺特点,展示了ZnO在未来电子和光电子领域的潜在应用.     

Effects of phosphorus doping source temperatures on fabrication and properties of p-type ZnO thin films

Phosphorus-doped p-type ZnO thin films have been deposited by metalorganic chemical vapor deposition using P₂O₅ as the dopant source. The conductivity types of the as-grown thin films were strongly temperature-dependent. When the substrate temperature maintains at the optimal one of 420 °C, the evaporating temperature of the phosphorus source plays significant roles in controlling the phosphorus content doping into films, then influences the films' performance. Optimizing the growth parameters, the optimal results were obtained with a resistivity of 6.49 Ω cm, a Hall mobility of 0.40 cm²/V s and a hole concentration of 2.42 × 10¹⁸ cm^− 3. The optical property of the optimal film was characterized by PL measurements, which indicated the film is of high optical quality.     

Power and pressure effects upon magnetron sputtered aluminum doped ZnO films properties

In this work, polycrystalline aluminum doped zinc oxide (ZnO:Al) films with c-axis (002) orientation have been grown on glass and silicon substrates by RF (radio frequency) magnetron sputtering technique, at room temperature. A systematic study of the effect of sputtering deposition parameters (i.e. RF power and argon gas pressure) on the structural, optical and electrical properties of the films was carried out. We observed that, with increasing RF power the growth rate increased, while it decreased with increasing gas pressure. As mentioned above, the films were polycrystalline in nature with a strong preferred (002) orientation. The intrinsic compressive stress was found to decrease with both increasing RF power and gas pressure, and near stress-free film was obtained at 200 W RF power and 2 × 10^− 1 Pa gas pressure. The obtained ZnO:Al films, not only have an average transmittance greater than 90% in the visible region, but also have an optical band gap between 3.33 and 3.47 eV depending on the sputtering parameters. Moreover, a low value of the electrical resistivity (~ 1.25 × 10^− 3 Ω cm) was obtained for the film deposited at 200 W and 2 × 10^− 3 mbar.     

Influence of lithium doping on the structural and electrical characteristics of ZnO thin films

Thin films of undoped and lithium-doped Zinc oxide, (Zn_1 − xLi_x)O; x = 0, 0.05, 0.10 and 0.20 were prepared by sol-gel method using spin-coating technique on silicon substrates [(111)Pt/Ti/SiO₂/Si)]. The influence of lithium doping on the structural, electrical and microstructural characteristics have been investigated by means of X-ray diffraction, leakage current, piezoelectric measurements and scanning electron microscopy. The resistivity of the ZnO film is found to increase markedly with low levels (x ≤ 0.05) of lithium doping thereby enhancing their piezoelectric applications. The transverse piezoelectric coefficient, e₃₁^? has been determined for the thin films having the composition (Zn_0.95Li_0.05)O, to study their suitability for piezoelectric applications.     

Effect of alumina doping on structural, electrical, and optical properties of sputtered ZnO thin films

A systematic study of the influence of alumina (Al₂O₃) doping on the optical, electrical, and structural characteristics of sputtered ZnO thin films is reported in this study. The ZnO thin films were prepared on 1737F Corning glass substrates by R.F. magnetron sputtering from a ZnO target mixed with Al₂O₃ of 0-4 wt.%. X-ray diffraction (XRD) analysis demonstrates that the ZnO thin films with Al₂O₃ of 0-4 wt.% have a highly (002) preferred orientation with only one intense diffraction peak with a full width at half maximum (FWHM) less than 0.5°. The electrical properties of the Al₂O₃-doped ZnO thin films appear to be strongly dependent on the Al₂O₃ concentration. The resistivity of the films decreases from 74 Ω·cm to 2.2 × 10^− 3 Ω·cm as the Al₂O₃ content increases from 0 to 4 wt.%. The optical transmittance of the Al₂O₃-doped ZnO thin films is studied as a function of wavelength in the range 200-800 nm. It exhibits high transparency in the visible-NIR wavelength region with some interference fringes and sharp ultraviolet absorption edges. The optical bandgap of the Al₂O₃-doped ZnO thin films show a short-wavelength shift with increasing of Al₂O₃ content.     

Effect of deposition geometry on structural, electrical and optical properties of ZnO:Al films by magnetron sputtering

Al-doped ZnO films were prepared by the dc magnetron sputtering technique on Suprasil-1 substrates at a temperature of 470 K. Plasma-emission monitoring was used to stabilize oxygen flow to the deposition chamber. The effect of substrate position during deposition on the structural, electrical and optical properties of the films was investigated. It was found that preparation of low-resistance films with high optical transmission over the visible region is possible under condition of low plasma effects on the growing film.     

Structural and functional properties of Al:ZnO thin films grown by Pulsed Laser Deposition at room temperature

Current research on transparent conductive oxides (TCOs) is focusing on indium-free TCOs, such as Al-doped ZnO (AZO), as an alternative to indium-tin oxide. In this work, AZO thin films were grown by Pulsed Laser Deposition at room temperature in oxygen atmosphere. The O₂ pressure was varied from 0.01 Pa to 10 Pa, highlighting the effects of defect formation and oxygen vacancies on the film properties. Structural properties were characterized by X-ray diffraction and Scanning Electron Microscopy, while functional properties were characterized by measurement of electrical conductivity, Hall mobility, carrier density and optical transmission. At an optimal deposition pressure of 2 Pa, optical transparency in the visible range and minimum resistivity (4.5 ? 10^− 4 Ω cm) were found, comparable to state-of-the-art TCOs. Mean value of visible transparency was shown to increase with increasing pressure, up to 88% at a deposition pressure of 10 Pa.     

Synthesis,characterization and photoresponse study of undoped and transition metal (Co,Ni, Mn) doped ZnO thin films

The synthesis, characterization and photoresponse studies of undoped and transition metal doped zinc oxide thin films are carried out in this work, in prospect of visible light photo detection and sensor applications. The undoped and transition metal ions such as, Co, Ni and Mn doped ZnO films in this study were synthesized by chemical solution deposition, involving spin-coating. We have characterized the deposited films using X-ray diffraction, scanning electron microscopy, photoluminescence and UV–vis spectroscopy studies. The devices of the films for photoresponse study were fabricated by top Ag contacts on the film surface in metal–semiconductor–metal configuration. The current–voltage characteristics and switching measurements of these devices were studied under the illumination of an incandescent lamp. We found a high ON/OFF ratio of 8 and highest photocurrent density of 0.7 mA/cm² for Ni doped ZnO film.