用于低中频GPS接收机的CMOS闪烁型模数转换器

模数转换器引入的信噪比的降低会直接影响GPS接收机的灵敏度,需仔细设计以减小信噪比的降低。采用TSMC0.25μm CMOS单层多晶硅五层金属工艺设计了一个用于低中频GPS接收机的CMOS4bit16.368MHz闪烁型模数转换器。实现一个高性能闪烁型模数转换器的关键是得到一个低功耗、低回程噪声、低失调电压的前置放大器和比较器电路,因此重点放在了提出的新的前置放大器和比较器的设计和优化上。在时钟采样率16.368MHz和输入信号频率4.092MHz的条件下,转换器测试得到的信噪失真比为24.7dB,无杂散动态范围为32.1dB,积分非线性为 0.31/-0.46LSB,,差分非线性为 0.66/-0.46LSB,功耗为3.5mW。转换器占用芯片面积0.07mm2。测试结果表明了该模数转换器的有效性,并已成功应用于GPS接收机芯片中。     

99.1 mW 12位40 MSPS流水线A/D转换器

设计并实现了一种12位40 MSPS流水线A/D转换器,并在0.18 μm HJTC CMOS工艺下流片.芯片工作电压为3.3 V,核心部分功耗为99.1 mW.为优化ADC功耗,采用多位/级的系统结构和套筒式运放结构,并采用逐级按比例缩小的设计方法进一步节省功耗.测试结果表明,A/D转换器的DNL小于0.46 LSB,INL小于0.86 LSB;采样率为40 MSPS时,输入19.1 MHz信号,SFDR超过80 dB,SNDR超过65 dB.     

应用于无线传感网络SoC的逐次逼近A/D转换器

设计了应用于无线传感网络SoC解决方案的10位150 kS/s 逐次逼近A/D转换器.通过失调消除技术、合理的时序控制和版图设计,实现了电路的高精度和低功耗.设计的A/D转换器积分非线性和微分非线性分别为0.54 LSB和0.8 LSB;在150 kS/s采样率、14.3 kHz输入信号频率时,信噪比为60.8 dB,无杂散动态范围83.1 dB.设计实现基于TSMC 0.18 μm混合信号CMOS工艺,IP核面积为0.083 mm2,1.8 V工作电压下功耗为0.56 mW.     

一种具有84.8dB SFDR和72dB SNDR的14位80MS/s CMOS模数转换器

本文描述了一种基于0.35μm CMOS工艺的14位采样率80MS/s的流水线型模数转换器的设计. 所提出的电荷分享校正技术消除了与信号相关的电荷注入效应, 加上片内的低抖动时钟电路, 保证了模数转换器的高动态性能. 一种信号电容开关技术和高对称版图减小了电容失配, 确保了模数转换器的总线性度. 测试结果表明, 该模数转换器在36.7MHz输入频率下, 实现了11.6位的有效位, 84.8dB的无杂散动态范围(SFDR), 72dB的信号噪声失真比(SNDR), 在无校准情况下获得了＋0.63/－0.6 LSB的微分非线性和＋1.3/－0.9 LSB的积分非线性. 输入频率200MHz时,仍然可以保持75dB的SFDR和59dB的SNDR.     

一种11位80MS/s分段式电流舵DAC的设计与验证

基于SMIC 0.13μm CMOS工艺,在3.3V/1.2V(模拟/数字)双电源下,设计了一种11位80MS/s的数/模转换器(DAC)。电路采用分段式电流舵结构,高6位为温度计码,低5位为二进制码。该DAC应用于无线通信SoC的模拟前端。IP核尺寸为960μm×740μm,功耗40mW,电路仿真结果显示,DAC的最大积分非线性误差和微分非线性误差分别为0.5LSB和0.3LSB。在20MHz输出信号频率和80MHz采样率下,DAC差分输出的SFDR为80dB。设计的电路已经通过MPW流片验证,给出了DAC芯片照片与实测数据。     

一种11位80 MS/s分段式电流舵DAC的设计与验证

基于SMIC 0.13 μm CMOS工艺,在3.3 V/1.2 V(模拟/数字)双电源下,设计了一种11位80 MS/s的数/模转换器(DAC)。电路采用分段式电流舵结构,高6位为温度计码,低5位为二进制码。该DAC应用于无线通信SoC的模拟前端。IP核尺寸为960 μm ×740 μm,功耗40 mW,电路仿真结果显示,DAC的最大积分非线性误差和微分非线性误差分别为0.5 LSB和0.3 LSB。在20 MHz输出信号频率和80 MHz采样率下,DAC差分输出的SFDR为80 dB。设计的电路已经通过MPW流片验证,给出了DAC芯片照片与实测数据。     

一种1.8V 10位120MS/s CMOS电流舵D/A转换器IP核

采用低摆幅低交叉点的高速CMOS电流开关驱动器结构和中心对称Q2随机游动对策拓扑方式的pMOS电流源阵列版图布局方式,基于TSMC 0.18靘 CMOS工艺实现了一种1.8V 10位120MS/s分段温度计译码电流舵CMOS电流舵D/A转换器IP核.当电源电压为1.8V时,D/A转换器的微分非线性误差和积分非线性误差分别为0.25LSB和0.45LSB,当采样频率为120MHz,输出频率为24.225MHz时的SFDR为64.9dB.10位D/A转换器的有效版图面积为0.43mm×0.52mm,符合SOC的嵌入式设计要求.     

一种1.8V 10位120MS/s CMOS电流舵D/A转换器IP核

采用低摆幅低交叉点的高速CMOS电流开关驱动器结构和中心对称Q2随机游动对策拓扑方式的pMOS电流源阵列版图布局方式,基于TSMC 0.18靘 CMOS工艺实现了一种1.8V 10位120MS/s分段温度计译码电流舵CMOS电流舵D/A转换器IP核.当电源电压为1.8V时,D/A转换器的微分非线性误差和积分非线性误差分别为0.25LSB和0.45LSB,当采样频率为120MHz,输出频率为24.225MHz时的SFDR为64.9dB.10位D/A转换器的有效版图面积为0.43mm×0.52mm,符合SOC的嵌入式设计要求.     

一种16.9 mW 10 bit 50 Msample/s 流水线ADC IP核设计

设计了一个10位50 Msample/s流水线ADC IP核.采用SMIC 0.25 μm 1P5M数字CMOS工艺,通过使用运算放大器共享技术、电容逐级缩减技术和对单元电路的优化,使得整个IP核面积仅为0.24 mm2.仿真结果表明,在50 MHz采样率、输入信号为2.04 MHz正弦信号情况下,该ADC模块具有8.9 bit的有效分辨率,最大微分非线性为0.65 LSB,最大积分非线性为1.25 LSB,而整个模块的功耗仅为16.9 mW.     

0.35μm CMOS 4位1 Gsample/s全并行模数转换器设计

介绍了一种基于0.35μm CMOS工艺的4位最大采样速率为1GHz的全并行结构模数转换器的设计.因为在高采样率的情况下,比较器的亚稳态问题降低了模数转换器的无杂散动态范围,在本次设计中对其进行了优化.后仿真结果表明,输入信号为22.949MHz,在1GHz采样率的情况下,信噪比达到25.08dB,积分非线性和微分非线性分别小于0.025LSB和0.01LSB,无杂散动态范围达到32.91dB.芯片采用具有两层多晶硅的0.35μmCMOS工艺设计,总面积为0.84mm2.     

Low-power CMOS fully-folding ADC with a mixed-averaging distributed T/H circuit

This paper describes an 8-bit 125 Mhzlow-powerCMOS fully-foldinganalog-to-digital converter(ADC).A novel mixed-averaging distributed T/H circuit is proposed to improve the accuracy. Folding circuits are not only used in the fine converter but also in the coarse one and in the bit synchronization block to reduce the number of comparators for low power. This ADC is implemented in 0.5μm CMOS technology and occupies a die area of 2 × 1.5 mm~2. The measured differential nonlinearity and integral nonlinearity are 0.6 LSB/-0.8 LSB and 0.9 LSB/-1.2 LSB, respectively. The ADC exhibits 44.3 dB of signal-to-noise plus distortion ratio and 53.5 dB of spurious-free dynamic range for 1 MHz input sine-wave. The power dissipation is 138 mW at a sampling rate of 125 MHz at a 5 V supply.     

An 8-bit 80-Msample/s pipelined analog-to-digital converter withbackground calibration

An 8-bit 80-Msample/s pipelined analog-to-digital converter (ADC) uses monolithic background calibration to reduce the nonlinearity caused by interstage gain errors. Test results show that the ADC achieves a peak signal-to-noise-and-distortion ratio of 43.8 dB, a peak integral nonlinearity of 0.51 least significant bit (LSB), and a peak differential nonlinearity of 0.32 LSB with active background calibration. It dissipates 268 mW from a 3 V supply and occupies 10.3 mm ² in a single-poly 0.5 μm CMOS technology     

采用改进型1.5位/级结构的10位100MHz流水线模数转换器

介绍了一个采用改进型1.5位/级结构的10位100MHz流水线结构模数转换器.测试结果表明,模数转换器的信噪失真比最高可以达到57dB,在100MHz输入时钟下,输入信号为57MHz的奈奎斯特频率时,信噪失真比仍然可以达到51dB.模数转换器的差分非线性和积分非线性分别为0.3LSB和1.0LSB.电路采用0.18μm混合信号CMOS工艺实现,芯片面积为0.76mm2.     

A systematic design approach for low-power 10-bit 100 MS/s pipelined ADC

A systematic design approach for low-power 10-bit, 100 MS/s pipelined analog-to-digital converter (ADC) is presented. At architectural level various per-stage-resolution are analyzed and most suitable architecture is selected for designing 10-bit, 100 MS/s pipeline ADC. At Circuit level a modified wide-bandwidth and high-gain two-stage operational transconductance amplifier (OTA) proposed in this work is used in track-and-hold amplifier (THA) and multiplying digital-to-analog converter (MDAC) sections, to reduce power consumption and thermal noise contribution by the ADC. The signal swing of the analog functional blocks (THA and MDAC sections) is allowed to exceed the supply voltage (1.8 V), which further increases the dynamic range of the circuit. Charge-sharing comparator is proposed in this work, which reduces the dynamic power dissipation and kickback noise of the comparator circuit. The bootstrap technique and bottom plate sampling technique is employed in THA and MDAC sections to reduce the nonlinearity error associated with the input signal resulting in a signal-to-noise-distortion ratio of 58.72/57.57 dB at 2 MHz/Nyquist frequency, respectively. The maximum differential nonlinearity (DNL) is +0.6167/−0.3151 LSB and the maximum integral nonlinearity (INL) is +0.4271/−0.4712 LSB. The dynamic range of the ADC is 58.72 dB for full-scale input signal at 2 MHz input frequency. The ADC consumes 52.6 mW at 100 MS/s sampling rate. The circuit is implemented using UMC-180 nm digital CMOS technology.     

A CMOS switch-capacitor 14-bit 100 Msps pipeline ADC with over 90 dB SFDR

This article presents a design of 14-bit 100?Msamples/s pipelined analog-to-digital converter (ADC) implemented in 0.18?µm CMOS. A charge-sharing correction (CSC) is proposed to remove the input-dependent charge-injection, along with a floating-well bulk-driven technique, a fast-settling reference generator and a low-jitter clock circuit, guaranteeing the high dynamic performance of the ADC. A scheme of background calibration minimises the error due to the capacitor mismatch and opamp non-ideality, ensuring the overall linearity. The measured results show that the prototype ADC achieves spurious-free dynamic range (SFDR) of 91?dB, signal-to-noise-and-distortion ratio (SNDR) of 73.1?dB, differential nonlinearity (DNL) of +0.61/?0.57?LSB and integrated nonlinearity (INL) of +1.1/?1.0?LSB at 30?MHz input and maintains over 78?dB SFDR and 65?dB SNDR up to 425?MHz, consuming 223?mW totally.     

A 14-b 20-Msamples/s CMOS pipelined ADC

The capacitor error-averaging technique, updated with look-ahead decision and digital correction, is used to demonstrate a 14-b 20-Msamples/s pipelined analog-to digital converter (ADC) with no trimming or calibration. The prototype ADC exhibits a differential nonlinearity (DNL) of +0.23/-0.28 least significant bit (LSB), an integral nonlinearity (INL) of +0.95/-1.06 LSB, a spurious-free dynamic range (SFDR) of 91.6 dB, and a signal-to-noise ratio (SNR) of 74.2 dB with a 1-MHz input and a 20-MHz clock. The prototype in 0.5-μm CMOS occupies an area of 4.5×2.4 mm² and consumes 720 mW at 5 V     

An 8-bit 20-MS/s ZCBC Time-Domain Analog-to-Digital Data Converter

An 8-bit 20-MS/s time-domain analog-to-digital data converter (ADC) using the zero-crossing-based circuit technique is presented. Compared with the conventional ADCs, signal processing is executed in both the voltage and time domains. Since no high-gain operational amplifier is needed, this time-domain ADC works well in a low supply voltage. The proposed ADC has been fabricated in a 0.18-mum CMOS process. Its power dissipation is 4.64 mW from a supply voltage of 1.8 V. This active area occupies 1.2 times 0.7 mm². The measured signal-to-noise-distortion ratio achieves 44.2 dB at an input frequency of 10 MHz. The integral nonlinearity is less than plusmn1.07 LSB, and the differential nonlinearity is less than plusmn0.72 LSB. This time-domain ADC achieves the effective bits of 7.1 for a Nyquist input frequency at 20 MS/s.     

A 14-b 12-MS/s CMOS pipeline ADC with over 100-dB SFDR

A 1.8-V 14-b 12-MS/s pseudo-differential pipeline analog-to-digital converter (ADC) using a passive capacitor error-averaging technique and a nested CMOS gain-boosting technique is described. The converter is optimized for low-voltage low-power applications by applying an optimum stage-scaling algorithm at the architectural level and an opamp and comparator sharing technique at the circuit level. Prototyped in a 0.18-/spl mu/m 6M-1P CMOS process, this converter achieves a peak signal-to-noise plus distortion ratio (SNDR) of 75.5 dB and a 103-dB spurious-free dynamic range (SFDR) without trimming, calibration, or dithering. With a 1-MHz analog input, the maximum differential nonlinearity is 0.47 LSB and the maximum integral nonlinearity is 0.54 LSB. The large analog bandwidth of the front-end sample-and-hold circuit is achieved using bootstrapped thin-oxide transistors as switches, resulting in an SFDR of 97 dB when a 40-MHz full-scale input is digitized. The ADC occupies an active area of 10 mm/sup 2/ and dissipates 98 mW.     

Oversampled pipeline A/D converters with mismatch shaping

This paper presents a pipeline analog-to-digital converter (ADC) with improved linearity. The linearity improvement is achieved through a combination of oversampling and mismatch shaping, which modulates the distortion energy out of band. Mismatch shaping can be realized in a traditional 1-bit/stage pipeline ADC, but the ADCs transfer characteristic properties limit its effectiveness at pushing the distortion out of band. These limitations can be alleviated by using a 1-bit/stage commutative feedback capacitor switching pipeline design. A test chip was fabricated in a 0.35-μm CMOS process to demonstrate mismatch shaping. Experimental results obtained indicate that the spurious-free dynamic range improves by 8.5 dB to 76 dB when mismatch shaping is used at an oversampling ratio of 4 and a sampling rate of 61 MHz. The signal-to-noise and distortion ratio improves by 3 dB and the maximum integral nonlinearity decreases from 1.8 to 0.6 LSB at the 12-bit level     

A 12-bit 20-Msample/s pipelined analog-to-digital converter with nested digital background calibration

A 12-bit 20-Msample/s pipelined analog-to-digital converter (ADC) is calibrated in the background using an algorithmic ADC, which is itself calibrated in the foreground. The overall calibration architecture is nested. The calibration overcomes the circuit nonidealities caused by capacitor mismatch and finite operational amplifier (opamp) gain both in the pipelined ADC and the algorithmic ADC. With a 58-kHz sinusoidal input, test results show that the pipelined ADC achieves a peak signal-to-noise-and-distortion ratio (SNDR) of 70.8 dB, a peak spurious-free dynamic range (SFDR) of 93.3 dB, a total harmonic distortion (THD) of -92.9 dB, and a peak integral nonlinearity (INL) of 0.47 least significant bit (LSB). The total power dissipation is 254 mW from 3.3 V. The active area is 7.5 mm/sup 2/ in 0.35-/spl mu/m CMOS.