Methods for Preparing Samples of Track Membranes for Scanning Electron Microscopy

Methods for preparing porous polymer samples to investigate their structure by scanning electron microscopy are described. The technique for cleavages preparation is complemented by preliminary treatment of a polymer with radiation, photo- or thermal-oxidation destruction to render it brittle. The advantages of this technique have been demonstrated with Mylar, polycarbonate, and polypropylene track membranes.     

Vacuum Methods in Electron Microscopy. By Wilbur C. Bigelow

Microstructural evolution in two in situ reinforced composite systems, one produced by partial reduction and the other by grain growth, has been examined over a range of size scales using light microscopy, scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Metal-ceramic matrix composites were formed by the partial reduction of Al₂O₃–Cr₂O₃ solid solutions to form Cr metal particles in an Al₂O₃–Cr₂O₃ matrix which had a lower Cr₂O₃ concentration. In a second system, grain growth of Si₃N₄ during liquid phase sintering produced large, whisker-like grains in a fine-grained Si₃N₄ matrix, bonded by an oxynitride phase. The mechanisms controlling microstructural evolution in these two systems were examined.     

蛋白质电子显微术

本文简要介绍了蛋白质电子显微术的基本原理和方法,包括低温电镜术和三维重构方法,以及该技术在研究膜蛋白二维晶体、二十面体对称性病毒和非对称性单颗粒蛋白质分子或复合物结构上的应用。随着分辨率的不断提高,蛋白质电子显微术已成为蛋白质结构测定的一种手段。     

Scanning Optical Microscopy via a Scanning Electron Microscope

We have described in detail the principles of operation of a commercially available SEM-based scanning optical microscope. The stage consists of a cathodoluminescent material which converts the scanning electron beam into a scanning optical beam and an optical system to focus the light beam onto the specimen. The resolution attainable with such a stage is discussed as well as the efficiency of electron-to-photon conversion. Simplified formulae are given and a set of curves plotted which can be used to determine the appropriate tradeoff between resolution and optical power. Examples of the imaging ability in the optical beam induced current mode from various semiconductor devices are presented.     

Cross-Sectional Transmission Electron Microscopy For Polycrystalline Silicon Films

The grain structure and the surface roughness of undoped polycrystalline silicon films were studied by TEM of cross-sectional specimens. The grain diameter parallel to the surface could be directly determined as a function of the distance from the interface. An almost linear increase was found for all deposition temperatures between 923 K and 1123 K. For low deposition temperatures, the grains are columnar, while for high temperatures they are equiaxed. Cross-sectional TEM-specimens further allow a quantitative determination of the surface roughness. The roughness is not correlated with the grain diameter at the surface. A sharp increase of the roughness at 1123 K can be explained by the disappearance of a preferred orientation of the grains.     

一个自动扫描电子显微镜系统方法

扫描电子显微镜对于材料研究来说是一个很好的工具,该工具在较大扫描尺度上需要在人工操作下探索材料的形貌和组成.当前其发展重点是:通过无需仪器设置的完全自动的仪器操作方法快速地检测出大量的不同性质的样品,例如颗粒样品.技术领域的不断创新与仪器领域关键区域的革新带来一个新层次的操作,其具有的可靠性和准确性开创了一个新的应用领域.     

Modern Methods of Scanning-Probe Microscopy and Spectroscopy1

Modern methods of scanning-probe microscopy and spectroscopy are reviewed. Theoretical models providing adequate interpretation of experimental results are described. Such promising methods as probe nanolithography, scanning near-field microscopy, and thermoscopy are discussed. An artifact caused by the finite size of the contact zone is analyzed in more detail.     

The Third International Conference on Scanning Tunnelling Electron Microscopy

The transition quasi-crystalline→crystalline is found to be very sluggish in the ternary alloy Al₆₀Mn₁₁Ni₄. This makes it possible to study in detail the relationship between the decagonal phase, obtained after furnace cooling, and two different crystalline phases, which result after long annealing at 400°C. Use is made of electron diffraction, high resolution electron microscopy and optical diffraction. The crystalline phases still exhibit features which are closely related to those of the decagonal phase. This can be concluded from a comparison of the electron diffraction patterns of the quasi-crystalline phase along a number of zones, with those of the crystalline phases along corresponding zones. The crystalline phases contain different types of defects which are analysed in detail using high resolution images and diffuse scattering in the electron diffraction patterns. The close relationship between the electron diffraction patterns of the crystalline and quasi-crystalline phases is explained in terms of general optical principles. Some characteristic features of a model of the quasi-crystalline phase are tentatively proposed.     

Recent Advances Of High Voltage Electron Microscopy In Biology

Recent advances in the understanding of the structure of biological material made possible by the high voltage electron microscope are reviewed by briefly summarizing some of the more important results obtained in the past few years. The examination of thick sections of selectively stained specimens has continued to be the most widely used approach and has yielded information on the three-dimensional organization of a range of organelles, including the Golgi apparatus, neurofibrils and the transverse tubular system of striated muscle. The alternative method of studying intact cells prepared by critical-point drying is becoming increasingly popular, and has already made a significant contribution in demonstrating the microtrabecular systems within the cytoplasm of cultured cells.     

扫描电镜低电压显微的实现

介绍了扫描电镜低电压显微的优点和限制及为实现低电压显微而对扫描电镜的改进。