Cold-atom scanning probe microscopy

Scanning probe microscopes are widely used to study surfaces with atomic resolution in many areas of nanoscience. Ultracold atomic gases trapped in electromagnetic potentials can be used to study electromagnetic interactions between the atoms and nearby surfaces in chip-based systems. Here we demonstrate a new type of scanning probe microscope that combines these two areas of research by using an ultracold gas as the tip in a scanning probe microscope. This cold-atom scanning probe microscope offers a large scanning volume, an ultrasoft tip of well-defined shape and high purity, and sensitivity to electromagnetic forces (including dispersion forces near nanostructured surfaces). We use the cold-atom scanning probe microscope to non-destructively measure the position and height of carbon nanotube structures and individual free-standing nanotubes. Cooling the atoms in the gas to form a Bose-Einstein condensate increases the resolution of the device.     

Quantitative modelling in scanning probe microscopy

Significant progress has been made in the theoretical modelling of scanning probe microscopy. The models available now are sufficiently refined to provide information not only about the surface, but also the probe tip, and the physical changes occurring during the scanning process. This has significantly improved the quantitative analysis of experimental and theoretical results. Scanning probe microscopes can now be reliably used to analyse events on the level of single atoms and single electrons.     

Surface analysis algorithms for scanning probe microscopy

A single data set in scanning probe microscopy is large, typically in the megabyte range. As interpretation is accomplished by displaying the data in image form for visualization, image processing methods are used to both convert to visual images and to modify the images in order to clarify features of interest. Although an impressive number of image-processing algorithms are available on most commercial probe microscopes, many potentially very interesting ones are not. In addition, the special character of scanning probe data sets calls for development of new algorithms specially suited to this kind of problem. The work here analyzes images produced using atomic force microscope data sets. Algorithms are shown and discussed using images of oxide surfaces. The following algorithms are applied: tilt correction, scattering noise removal, surface smoothing, surface compression, probability density function analysis, correlation, and power spectrum analysis. Such algorithms and others serve to remove spurious surface spikes, enhance visualization of long-range surface features in the presence of short-range surface variations, remove line-to-line scanning artifacts, etc.     

Microfluidic push-pull probe for scanning electrochemical microscopy

This paper presents a microfluidic push-pull probe for scanning electrochemical microscopy (SECM) consisting of a working microelectrode, an integrated counter/reference electrode and two microchannels for pushing and pulling an electrolyte solution to and away from a substrate. With such a configuration, a droplet of a permanently renewed redox mediator solution is maintained just at the probe tip to carry out SECM measurements on initially dry substrates or in microenvironments. For SECM imaging purposes, the probe fabricated in a soft polymer material is used in a contact regime. SECM images of various gold-on-glass samples demonstrate the proof-of-concept of a push-pull probe for local surface activity characterization with high spatial resolution even on vertically oriented substrates. Finite element computations were performed to guide the improvement of the probe sensitivity.     

Energy dissipation measurements in frequency-modulated scanning probe microscopy

Local dissipation measurements by scanning probe microscopy have attracted increasing interest as a method for probing energy losses and hysteretic phenomena due to magnetic, electrical, and structural transformations at the tip-surface junction. One challenge of this technique is the lack of a standard for ensuring quantification of the dissipation signal. In the following, we explored magnetic dissipation imaging of an yttrium-iron garnet (YIG) sample, using a number of similar but not identical cantilever probes. Typical frequency-dependent dispersion of the actuator-probe assembly commonly approached ± 1 part in 10(3) Hz(-1), much larger than the minimum detectable level of ± 1 part in 10(5) Hz(-1). This cantilever-dependent behavior results in a strong crosstalk between the conservative (frequency) and dissipative channels. This crosstalk was very apparent in the YIG dissipation images and in fact should be an inherent feature of single-frequency heterodyne detection schemes. It may also be a common effect in other dissipation imaging, even down to the atomic level, and in particular may be a significant issue when there are correlations between the conservative and dissipative components. On the other hand, we present a simple method for correcting for this effect. This correction technique resulted in self-consistent results for the YIG dissipation measurements and would presumably be effective for other systems as well.     

High-speed noncontact profiler based on scanning white-light interferometry

We describe a system for fast three-dimensional profilometry, of both optically smooth and optically rough surfaces, based on scanning white-light techniques. The system utilizes an efficient algorithm to extract and save only the region of interference, substantially reducing both the acquisition and the analysis times. Rough and discontinuous surfaces can be profiled without the phase-ambiguity problems associated with conventional phase-shifting techniques. The system measures steps to 100 μm, scans a 10μLm range in 5 s, and has a smooth surface repeatability of 0.5 nm.     

Implementation of atomically defined field ion microscopy tips in scanning probe microscopy

The field ion microscope (FIM) can be used to characterize the atomic configuration of the apices of sharp tips. These tips are well suited for scanning probe microscope (SPM) use since they predetermine the SPM resolution and the electronic structure for spectroscopy. A protocol is proposed for preserving the atomic structure of the tip apex from etching due to gas impurities during the period of transfer from the FIM to the SPM, and estimations are made regarding the time limitations of such an experiment due to contamination with ultra-high vacuum rest gases. While avoiding any current setpoint overshoot to preserve the tip integrity, we present results from approaches of atomically defined tungsten tips to the tunneling regime with Au(111), HOPG (highly oriented pyrolytic graphite) and Si(111) surfaces at room temperature. We conclude from these experiments that adatom mobility and physisorbed gas on the sample surface limit the choice of surfaces for which the tip integrity is preserved in tunneling experiments at room temperature. The atomic structure of FIM tip apices is unchanged only after tunneling to the highly reactive Si(111) surface.     

Scanning probe microscopy based on magnetoresistive sensing

Integrated sensors are essential for scanning probe microscopy (SPM) based systems that employ arrays of microcantilevers for high throughput. Common integrated sensors, such as piezoresistive, piezoelectric, capacitive and thermoelectric sensors, suffer from low bandwidth and/or low resolution. In this paper, a novel magnetoresistive-sensor-based scanning probe microscopy (MR-SPM) technique is presented. The principle of MR-SPM is first demonstrated using experiments with magnetic cantilevers and commercial MR sensors. A new cantilever design tailored to MR-SPM is then presented and micromagnetic simulations are employed to evaluate the achievable resolution. A remarkable resolution of 0.84?? over a bandwidth of 1?MHz is estimated, which would significantly outperform state-of-the-art optical deflection sensors. Due to its combination of high resolution at high bandwidth, and its amenability to integration in probe arrays, MR-SPM holds great promise for low-cost, high-throughput SPM.     

Manipulations of atoms and molecules by scanning probe microscopy

Scanning probe microscopy (SPM), including scanning tunneling microscopy (STM) and atomic force microscopy (AFM), has become a powerful tool in building nanoscale structures required by modern industry. In this article, the use of SPM for the manipulation of atoms and molecules for patterning nanostructures for opt-electronic and biomedical applications is reviewed. The principles and procedures of manipulation using STM and AFM-based technologies are presented with an emphasis on their ability to create a wide variety of nanostructures for different applications. The interaction among the atoms/molecules, surface, and tip are discussed. The approaches for positioning the atom/molecule from and to the desired locations and for precisely controlling its movement are elaborated for each specific manipulation technique. As an AFM-based technique, the dip-pen nanolithography is also included. Finally, concluding remarks on technological improvement and future research is provided.     

Anisotropy in wear processes measured by scanning probe microscopy

Wear of smooth amorphous carbon overcoats was performed in continuous sliding contact in the range of 10⁴–10⁷ cycles by a diamond or diamond-like carbon counterbody. The overcoats on superpolished hard disks were examined using friction and topographic scanning probe microscopy. An optimal Fourier (Wiener) filter was designed which preferentially filtered noise out of images of the smooth films. Second derivatives of the z-height were calculated parallel and perpendicular to the wear direction. The crosscorrelation of a friction force image and the corresponding z-height image shows that the correlation length is also extended in the wear direction. The local friction is independent of the z-height before wear, but increases with z-height upon wear. A model for the z-height and friction force evolution in contact sliding is discussed and compared with data.     

Electrical scanning probe microscopy of an integrated blocking layer

Scanning probe microscopy was performed on an integrated blocking layer system developed for hybrid organic solar cells. A nanocomposite consisting of titania and an amphiphilic triblock copolymer ((PEO)MA-PDMS-MA(PEO)) was prepared by sol-gel chemistry. After plasma treatment and annealing of a spin casted film of 30-100 nm thickness a granular structure with a typical titania grain diameter of 20 nm was found. Conductive scanning force microscopy revealed that on top of almost every grain on the surface there is an increased conductivity compared to the average value. The correlation of grains and conductivity indicated that titania particles formed interconnecting paths through the film. For the resistivity of these pathways we found that effects of tip-sample and sample-electrode resistivity dominate. Additionally, conductive scanning force microscopy revealed non-conducting structures attributed to the thermal treatment. Kelvin probe microscopy of pristine samples on one side and plasma treated plus annealed samples on the other side showed that there is a shift in work function (0.8 +/- 0.2 eV) as expected for the transition of amorphous to anatase titania.     

扫描探针显微技术测量血管内皮细胞的弹性

血管内皮细胞的功能与许多疾病间存在关联,但现在对其功能好坏的定量描述仍十分少见。该文以内皮细胞的弹性作为衡量其功能的一个标准。通过理论建立压痕测量杨氏模量的计算方法,并利用扫描探针显微镜从实验上得到了正常及过氧化氢处理过的人脐静脉内皮细胞的杨氏模量。发现过氧化氢处理后细胞的杨氏模量升高,表明通过杨氏模量来表征细胞活性是可行的。     

Reduction of tip-sample contact using dielectrophoretic force scanning probe microscopy

Dielectrophoretic force microscopy is shown to allow for facile noncontact imaging of systems in aqueous media. Electrokinetic tip-sample forces were predicted from topography measurements of an interface and compared with experimental images. Correlation function and power spectral density analyses indicated that image feedback was maintained without mechanical contact using moderate potentials (e.g., approximately 18 nm off the surface for a 7-Vpp, 100-kHz waveform). The applied dielectrophoretic force and the corresponding increase in effective tip radius were predictably adjusted by changing the peak potential.     

基于SPM技术的纳米信息存储薄膜的研究进展

扫描探针显微技术SPM可以在原子或分子尺度上对表面进行表征和修饰，应用SPM技术可以在薄膜表面形成纳米级的信息点阵，特别适合发展超高密度的信息存储，是一种非常有希望代替传统磁存储，光存储的纳米级存储技术，本文介绍了纳米信息存储薄膜的研究进展，并对其制备技术和读写机制进行了初步的探讨。     

Detection of probe dither motion in near-field scanning optical microscopy

The probe-to-sample separation in near-field scanning optical microscopes can be regulated by a noncontact shear-force sensing technique. The technique requires the measurement of a minute dither motion applied to the probe. We have characterized an optical detection method for measuring this motion to determine the optimum detection configuration in terms of sensitivity and stability. A scalar diffraction model of the detection method is developed for calculating sensitivity, and experimental results are found to be in good agreement with the theoretical predictions. We find that maximum sensitivity and stability cannot be achieved simultaneously, and it may be desirable in practice to trade sensitivity for enhanced stability.     

Vortex imaging in superconducting films by scanning hall probe microscopy

We have used a low noise Scanning Hall Probe Microscope (SHPM) to study vortex structures in superconducting films. The microscope has high magnetic field (2.9×10^–8T/Hz at 77K) and spatial resolution, 0.85m. Magnetic field profiles of single vortices in High T_c YBa₂Cu₃O_7– thin films have been successfully measured and the microscopic penetration depth of the superconductor has been extracted as a function of temperature. Flux penetration into the superconductor has been imaged in real time (8s/frame).     

Investigation of fullerene embedded silicon surfaces with scanning probe microscopy

This study examines the intramolecular structures of individual fullerene molecules on a Si(111)-7 x 7 surface using an ultra-high vacuum scanning tunneling microscope. This study also discusses possible configurations of fullerene molecules with related orientations and electronic states of fullerene. A self-assembled layer of fullerene on a Si(111) surface is produced using special annealing treatments. The resulting electronic states and band gap energy can be estimated from I-V curves. Finally the field emission parameters, such as turn-on field and field enhancement factor beta, are determined using a traditional detecting system.