热透镜效应对激光光束准直的影响

利用高斯光束传播定律,分析了热透镜效应对激光光束准直的影响,对两种不同的腔型做了数值模拟与计算,并计算了经具有不同MT因子的调焦望远镜系统准直后的激光光束的发散角与光斑尺寸。通过计算与分析表明,对于同一高斯光束,用MT因子较大的系统可以获得更好的准直效果,准直后光束的发散角更稳定。     

激光准直扩束设计和仿真

从哈特曼法自动测量像差所需解决的准直(平行)光束出发,基于高斯先学理论,从工程角度分析了大倍率准直扩束系统的原理,实现了改变激光光束直径和发散角的准直扩束系统的设计,并通过仿真得到了验证,满足了光学系统的哈特曼像差测量要求.     

微束衍射仪中的光束准直技术

本文介绍X射线衍射仪中微束衍射仪(MDG)的光束准直技术。对准直的概念及各调节机构在光束准直中的功能进行了分析。提出一种简单快速的光束准直方法。     

新型矿用激光指向仪的设计

在新型矿用激光指向仪的设计过程中,根据仪器设计指标要求,首先采用新型半导体激光器、倒置的高倍率望远系统,设计了激光指向仪准直光路系统,利用双透镜望远准直系统将半导体激光器发出的椭圆形高斯光束进行整形,提高准直精度。然后利用Pro/E软件对壳体组、镜筒组等部件进行了三维机械设计。设计结果表明,仪器结构合理,外形美观,小型轻便。最后,对激光指向仪的误差源进行了理论分析和计算,理论分析与实测数据基本相符,满足设计要求。     

高精度激光光束准直系统设计

为了进一步提高激光光束用作直线基准的精度,建立了基于反射镜平动式光束稳定器以及两点式光束漂移分离法的高精度激光光束准直系统。首先,对系统中基于反射镜平动的光束稳定器进行研究,对其光束偏转原理以及影响因素进行分析,并对两点式光束漂移分离方法进行介绍。然后,对光束偏转单元的分辨力以及偏转范围、所使用的压电陶瓷非线性和迟滞特性、以及光束偏转单元的频率响应特性进行实验测试。最后,对该激光准直系统的激光光束准直精度进行测试。实验结果表明本文提出的光束偏转单元在120μrad范围内的光束偏转分辨力可以达到5 nrad,频率响应特性高于2 kHz;最终激光准直系统的准直精度在二维方向上分别达到1.9×10^-8 rad和2.1×10^-8 rad,相对于现有技术约提高了3倍,满足激光光束用作高精度直线基准的需求。     

电子束泵浦准分子激光放大器的双程光路自动准直

提出了一种电子束泵浦准分子激光放大器的双程光路准直方法,以保证光束在放大器中按照预定方向传输,并使多路光束稳定精确地照射靶面.首先,鉴于准分子放大器中无天然准直基准提出了利用双叉丝像传递光路进行准直的方法,即把输入光束叉丝基准作为“近场点”,把输出光束叉丝基准作为“远场点”,并设计了放大器准直光路,编写了相应的软件.然后,在现有实验室条件下开展了电子束泵浦准分子激光放大器双程光路的自动准直实验.最后,分析了影响该方法的相关因素及准直精度.实验及分析表明,设计的准直系统在较短时间内实现了预定传输光路的自动准直,系统自身精度为0.63μrad,光束最大复位误差为13.75 μm,满足了电子束泵浦准分子激光放大器双程光路自动准直的要求.     

照明光束准直性对傅里叶功率谱尺度的影响

本文详细分析了光束准直性对物体傅里叶功率谱尺度的影响,指出在一定条件下,光束准直性的好坏不影响傅里叶功率谱的尺度。文中的分析与结论对频谱分析系统的正确使用具有指导意义和实用价值。     

LD准直透镜光能耦合效率与波差的理论分析

ＬＤ准直透镜光能耦合效率与波差的理论分析陈海清，阮玉，常洋燕（华中理工大学）０引言激光二级管发射的光束是发散的，需经过椭圆光束准直，整形及象散校正，从而获得发散度小准直度高的光束，同时还要考虑系统的光能利用效率与波差问题。准直透镜的作用是把ＬＤ所发出...     

光电编码器LED光源的准直

由于发光二极管(LED)光束的准直度对光电编码器性能影响很大,研究了LED光束的准直特性.分析了光源辐射角对光栅光通量的影响;运用图像旋转理论和频域分析方法,导出了莫尔条纹透光特性函数式,揭示了光源准直度参数对莫尔条纹函数特性的影响.获得了与光束准直度相关的不同透光缝宽度下的莫尔条纹仿真波形,分析了光源准直特性指标对莫尔条纹对比度以及光栅间隙的影响.理论计算结果表明,当透光缝宽度减小5 μm时,莫尔条纹图像的对比度下降17.66%,实验结果与理论仿真波形吻合,表明文中提出的莫尔条纹函数式可为高精度和高可靠性编码器没计和生产提供参考.     

热透镜效应对激光光束聚焦的影响

利用高斯光束传播的ABCD定律,分析了热透镜效应对高斯光束聚焦的影响,对两种腔型做了数值计算和分析,并计算了不同焦距透镜对高斯光束聚焦后的腰斑半径和腰斑位置。通过计算分析表明对于同一高斯光束用短焦距透镜聚焦后得到的光斑比用长焦距透镜聚焦得到的光斑更稳定。     

Axial resolution of confocal Raman microscopes: Gaussian beam theory and practice

A straightforward and transparent model, based on Gaussian beam optics, for the axial r ₀ resolution of a confocal microscope is presented. A confocal Raman microscope was used to determine the axial confocality in practice. The axial response of a thin planar object was measured for three different objectives, two pinhole sizes and a slit. The results show that, in the case of a confocal configuration, the response calculated with the model provides a good prediction of the axial resolution of the confocal microscope.     

Optics of ion beams for the neutral beam injection system on HL-2A Tokamak

The ion beam optics for the neutral beam injection system on HL-2A Tokomak is studied by two- dimensional numerical simulation program firstly, where the emitting surface is taken at 100 Debye lengths from the plasma electrode. The mathematical formulation, computation techniques are described. Typical ion orbits, equipotential contours, and emittance diagram are shown. For a fixed geometry electrode, the effect of plasma density, plasma potential and plasma electron temperature on ion beam optics is examined, and the calculation reliability is confirmed by experimental results. In order to improve ion beam optics, the application of a small pre-acceleration voltage (～100 V) between the plasma electrode and the arc discharge anode is reasonable, and a lower plasma electron temperature is desired. The results allow optimization of the ion beam optics in the neutral beam injection system on HL-2A Tokomak and provide guidelines for designing future neutral beam injection system on HL-2M Tokomak.     

An accurate, repeatable, and well characterized measurement of laser damage density of optical materials

Known for more than 40 years, laser damage phenomena have not been measured reproducibly up to now. Laser resistance of optical components is decreased by the presence of material defects, the distribution of which can initiate a distribution of damage sites. A raster scan test procedure has been used for several years in order to determine laser damage density of large aperture UV fused silica optics. This procedure was improved in terms of accuracy and repeatability. We describe the equipment, test procedure, and data analysis to perform this damage test of large aperture optics with small beams. The originality of the refined procedure is that a shot to shot correlation is performed between the damage occurrence and the corresponding fluence by recording beam parameters of hundreds of thousands of shots during the test at 10 Hz. We characterize the distribution of damaging defects by the fluence at which they cause damage. Because tests are realized with small Gaussian beams (about 1 mm at 1e), beam overlap and beam shape are two key parameters which have to be taken into account in order to determine damage density. After complete data analysis and treatment, we reached a repeatable metrology of laser damage performance. The measurement is destructive for the sample. However, the consideration of error bars on defect distributions in a series of parts allows us to compare data with other installations. This will permit to look for reproducibility, a necessary condition in order to test theoretical predictions.     

高斯涡旋光束通过像散透镜后的相位奇异特性

光场相位奇异特性研究在奇点光学研究领域中具有非常重要的意义。本文运用广义惠更斯-菲涅尔衍射积分公式推导出高斯涡旋光束通过像散透镜后的光场分布表达式,并研究了它在几何焦平面上的相位奇异特性。结果表明,高斯涡旋光束通过像散透镜后在几何焦平面上存在相位奇点,相位奇点受到透镜的像散系数、光束束腰宽度和涡旋离轴量等参数的影响。在一定条件下,几何焦平面上出现直刃型位错线或光涡旋。当像散系数为0时,光涡旋出现在y轴上。当像散系数不为0,而涡旋离轴量为0时,会出现直刃型位错线或光涡旋,且各自的位置都非常稳定。当像散系数、涡旋离轴量或束腰宽度改变时,光涡旋会发生移动。这对光学元器件的设计和涡旋光束相位奇点的控制有一定的参考价值。     

Microstructural characterization of autogenous laser welds on 316L stainless steel using EBSD and EDS

This research is concerned with autogenous welding of 316L stainless steel and the microstructure generated by such a process. Autogenous welding does not require a filler material and in this case relies on an initial shallow melt phase to maintain a conduction limited weld. Essentially, a high power laser beam traverses the substrate, with the beam shaped by conventional optics, which produces a Gaussian irradiance distribution; or with a diffractive optical element, used to produce a uniform irradiance distribution. Initial results have shown that due to the nature of the heating cycle, complex microstructures are developed. These fine, complicated microstructures cannot be satisfactorily resolved and quantified using standard optical microscopy techniques. Electron backscatter diffraction (EBSD) and energy dispersive spectroscopy (EDS) have been carried out on a number of different microstructures prepared using a range of welding parameters. It is demonstrated that the simultaneous determination of the chemistry and crystallography is a very useful tool for rapid identification of the different phases formed on solidification as a consequence of varying welding procedures.     

A new white beam x-ray microdiffraction setup on the BM32 beamline at the European Synchrotron Radiation Facility

A white beam microdiffraction setup has been developed on the bending magnet source BM32 at the European Synchrotron Radiation Facility. The instrument allows routine submicrometer beam diffraction to perform orientation and strain mapping of polycrystalline samples. The setup features large source to optics distances allowing large demagnification ratios and small beam sizes. The optics of the beamline is used for beam conditioning upstream a secondary source, suppressing any possible interference of beam conditioning on beam size and position. The setup has been designed for an easy and efficient operation with position control tools embedded on the sample stage, a high magnification large aperture optical microscope, and fast readout detectors. Switching from the white beam mode to the monochromatic mode is made easy by an automatic procedure and allows the determination of both the deviatoric and hydrostatic strain tensors.     

光子晶体实验中热辐射干扰的分析

搭建了针对10.6μm波长红外光的光子晶体探测系统,分析了在使用热敏探测器测量光强时,外界的热辐射干扰对光强探测的影响及产生的原因,并计算了高斯光束在经过透镜聚焦后在焦点附近的功率密度,揭示了光阑受热后会产生大量热辐射干扰,采用窄带滤光片可显著减小前置光阑热辐射的干扰。     

基于Bayesian原理的低陡度光学镜面面形误差离子束修正驻留时间算法

离子束修形是一种高效修除镜面误差的技术,驻留时间求解算法是此技术的关键问题之一。以光学镜面计算机控制成型原理为基础,建立基于Bayesian原理的平面镜面驻留时间算法,对数据边缘进行Gaussian延拓以消除边缘效应。分析驻留时间近似速度实现方式的实现误差与工艺参数的关系,通过在算法中引入附加光滑修正因子以提高驻留时间实现精度。在适当的路径规划下,将低陡度非球面修形过程近似用平面修形过程线性模型来描述,最终形成低陡度光学镜面面形误差离子束修正中驻留时间的快速近似算法。利用此算法对 100平面镜和 200球面镜进行修形加工,加工收敛率均可达9。研究结果表明：线性化近似模型是合理的,速度近似计算是可行的,基于Bayesian原理的低陡度非球面驻留时间求解算法是一种快速高效面形控制技术,可对镜面进行确定性精确修形。     

Multimode laser beam analyzer instrument using electrically programmable optics

Presented is a novel design of a multimode laser beam analyzer using a digital micromirror device (DMD) and an electronically controlled variable focus lens (ECVFL) that serve as the digital and analog agile optics, respectively. The proposed analyzer is a broadband laser characterization instrument that uses the agile optics to smartly direct light to the required point photodetectors to enable beam measurements of minimum beam waist size, minimum waist location, divergence, and the beam propagation parameter M(2). Experimental results successfully demonstrate these measurements for a 500 mW multimode test laser beam with a wavelength of 532 nm. The minimum beam waist, divergence, and M(2) experimental results for the test laser are found to be 257.61 μm, 2.103 mrad, 1.600 and 326.67 μm, 2.682 mrad, 2.587 for the vertical and horizontal directions, respectively. These measurements are compared to a traditional scan method and the results of the beam waist are found to be within error tolerance of the demonstrated instrument.     

Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics

A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics.