A background digital calibration of split-capacitor 16-bit SAR ADC with sub-binary architecture

The paper introduces a sub-binary architecture in 16-bit split-capacitor successive-approximation register (SAR) analog-to-digital converters (ADCs). The redundancy in sub-binary capacitors array provides ways to correct the dynamic errors in conversion procedure with a smaller overall conversion time. So the redundancy can be used to solve the mismatch or parasitic problems in split-capacitor CDAC SAR. A background digital calibration method with perturbation is utilized to calibrate the conversion errors. The behavioral simulation and measured results show that the 16-bit SAR ADC performance can be improved after the digital calibration. The prototype was fabricated in 0.18 μm CMOS process. The INL are −6/7.813 LSB, the DNL are −0.925/1.313 before calibration. After calibration, the INL are −0.813/0.938, the DNL are −0.625/0.688. The measured ENOB is 11.42 bit and SFDR is 79.95 dB before calibration, while the ENOB is 14.46 bit and SFDR is 95.65 dB after calibration.     

一种低功耗11位100MS/s采样率SAR ADC IP

本文介绍了一种双通道11位100MS/s采样率的混合结构SAR ADC IP。每个通道均采用flash-SAR结构以达到高速低功耗的目的。为了进一步降低功耗,flash和SAR中的比较器均采用全动态比较器。SAR中逐次逼近逻辑所需要的高速异步触发时钟采用门控环形振荡器产生。为了提高电容的匹配性,在版图设计中,采用底板包围顶板的MOM电容结构,有效减小电容寄生。本设计制造工艺为SMIC55nm的低漏电CMOS工艺,双通道的总面积为0.35mm2且核心面积仅为0.046 mm2。双通道模数转换器在1.2V供电电压下消耗的总电流为2.92mA。在2.4MHz输入和50MHz输入下的有效转换位数（ENOB）分别为9.9位和9.34位。计算得出本设计的FOM值为18.3fJ/conversion-step。     

An 8 bit 1 MS/s SAR ADC with 7.72-ENOB

This paper presents a low power 8-bit 1 MS/s SAR ADC with 7.72-bit ENOB. Without an op-amp, an improved segmented capacitor DAC is proposed to reduce the capacitance and the chip area. A dynamic latch comparator with output offset voltage storage technology is used to improve the precision. Adding an extra positive feedback in the latch is to increase the speed. What is more, two pairs of CMOS switches are utilized to eliminate the kickback noise introduced by the latch. The proposed SAR ADC was fabricated in SMIC 0.18 μm CMOS technology. The measured results show that this design achieves an SFDR of 61.8 dB and an ENOB of 7.72 bits, and it consumes 67.5 μ W with the FOM of 312 fJ/conversion-step at 1 MS/s sample under 1.8 V power supply.     

一种SAR ADC电容失配自测量与数字校准技术

为了解决高分辨率逐次逼近模数转换器(SAR ADC)中,电容式数模转换器(DAC)的电容失配导致精度下降的问题,提出了一种电容失配自测量方法,以及一种可适用于各种差分电容DAC设计的低复杂度的前台数字校准方法。该方法利用自身电容阵列及比较器完成位电容失配测量,基于电容失配的转换曲线分析,对每一位输出的权重进行修正,得到实际DAC电容大小对应的正确权重,完成数字校准。数模混合电路仿真结果表明,引入电容失配的16位SAR ADC,经该方法校准后,有效位数由10.74 bit提高到15.38 bit。     

一个单通道10位160兆每秒的逐次逼近式模数转换器

This paper demonstrates a single-channel 10-bit 160 MS/s successive-approximation-register （SAR） analog-to-digital converter （ADC） in 65 nm CMOS process with a 1.2 V supply voltage. To achieve high speed, a new window-opening logic based on the asynchronous SAR algorithm is proposed to minimize the logic delay, and a partial set-and-down DAC with binary redundancy bits is presented to reduce the dynamic comparator offset and accelerate the DAC settling. Besides, a new bootstrapped switch with a pre-charge phase is adopted in the track and hold circuits to increase speed and reduce area. The presented ADC achieves 52.9 dB signal-to-noise distortion ratio and 65 dB spurious-free dynamic range measured with a 30 MHz input signal at 160 MHz clock. The power consumption is 9.5 mW and a core die area of 250 ×200 μm^2 is occupied.     

带2位/级的新型转换过程和自锁定比较器的6位600 MS/s 逐次逼近型模数转换器

本文提出了一个在600MHz采样率下的6位逐次逼近寄存器（SAR）。由于对ADC高速的追求,本设计借鉴了2位/级的思想,并在此基础上给出了2位/级的新型转换过程,解决了DAC之间不匹配问题并减少了功耗。同时,采用了改进的分布式比较器拓扑结构以获得速度。通过整合多比较器的输入端减小了时钟馈通效应和失调,引入比较器的自锁技术进一步减小了功耗。测量结果表明,在600MHz采样频率、5.6MHz输入频率下,得到信号与噪声加失真比（SNDR）为32.13 dB,无杂散动态范围（SFDR）为44.05 dB。当输入频率接近奈奎斯特时,SNDR / SFDR分别下降到28.46/39.20 dB。最终该ADC由TSMC 65纳米工艺制造,其设计面积为0.045 mm2。在1.2V电源电压下的功耗为5.01 mW,并得到FoM值为252 fJ/转换过程。     

一种10位50MS/s两级逐次逼近流水线混合型A/D转换器

本文在0.18μm CMOS工艺下,实现了一款10位50MS/s两级逐次逼近流水线混合型模数转换器（pipeline SAR ADC）。其由基于逐次逼近的增益模数单元和逐次逼近ADC组成,并采用1位冗余位放宽了子模数转换器的比较误差。通过采用逐次逼近结构,增益减半MDAC技术,动态比较器及动态逐次逼近控制逻辑,降低了模数转换器的功耗和面积。流片测试结果表明,在1.8V电源电压,50MS/s采样速率下,信噪失真比(SFDR)和功耗分别为56.04dB和5mV。     

一种带二进制校正的10位100 MS/s SAR ADC

基于SMIC 65 nm CMOS工艺,设计了一种带二进制校正的10位100 MS/s逐次逼近型模数转换器(SAR ADC),主要由自举开关、低噪声动态比较器、电容型数模转换器(C-DAC)、异步SAR逻辑以及数字纠错电路组成。电容型数模转换器采用带2位补偿电容的拆分单调电容转换方案,通过增加2位补偿电容,克服了电容型数模转换器在短时间内建立不稳定和动态比较器失调电压大的问题,使SAR ADC的性能更加稳定。数字纠错电路将每次转换输出的12位冗余码转换成10位的二进制码。使用Spectre进行前仿真验证,使用Virtuoso进行版图设计,后仿真结果表明,当电源电压为1.2 V、采样率为100 MS/s、输入信号为49.903 MHz时,该ADC的SNDR达到58.1 dB,而功耗仅为1.3 mW。     

一种电容阵列结构的10位8通道1MS/s逐次逼近AD转换器

设计了一种用于多电源SoC的10位8通道1MS/s逐次逼近结构AD转换器。为提高ADC精度,DAC采用改进的分段电容阵列结构。为降低功耗,比较器使用了反相器阈值电压量化器,在模拟输入信号的量化过程中减少静态功耗产生。电平转换器将低电压数字逻辑信号提升为高电平模拟信号。采用UMC 55nm 1P6M数字CMOS工艺上流片验证设计。测试结果表明,当采样频率为1 MS/s、输入信号频率为10 kHz正弦信号情况下,该ADC模块在3.3 V模拟电源电压和1.0 V数字电源电压下,具有最大微分非线性为0.5LSB,最大积分非线性为1LSB。测得的SFDR为75 dB,有效分辨率ENOB为9.27位。     

一种基于65 nm CMOS工艺的10位10 MS/s SAR ADC

基于SMIC 65 nm CMOS工艺,设计了一种10位10 MS/s逐次逼近型模数转换器(SAR ADC)。采用全差分的R-C组合式DAC网络结构进行设计,提高了共模噪声抑制能力和转换精度。与全电容结构相比,R-C组合式DAC网络结构有效减小了版图面积。DAC中各开关的导通采用对称的开关时序,使比较器差分输入的共模电平保持为固定值,降低了比较器的失调电压,提高了ADC的线性度。在2.5 V模拟电源电压和1.2 V数字电源电压下,使用Spectre进行仿真验证,测得DNL为0.5 LSB,INL为0.8 LSB;在输入信号频率为4.990 2 MHz,采样频率为10 MHz的条件下,测得电路的有效位数为9.63位,FOM为0.04 pJ/conv。     

An 11-bit 200 MS/s subrange SAR ADC with low-cost integrated reference buffer

This paper presents an 11-bit 200 MS/s subrange SAR ADC with an integrated reference buffer in 65 nm CMOS. The proposed ADC employs a 3.5-bit flash ADC for coarse conversion, and a compact timing scheme at the flash/SAR boundary to speed up the conversion. The flash decision is used to control charge compensating for the reference voltage to reduce its input-dependent fluctuation. Measurement results show that the fabricated ADC has achieved significant improvement by applying the reference charge compensation. In addition, the ADC achieves a maximum signal-to-noise-and-distortion ratio of 59.3 dB at 200 MS/s. It consumes 3.91 mW from a 1.2 V supply, including the reference buffer.     

A 9 b/12 b 50 MS/s experimental ADC with continuous approximation architecture in 65 nm CMOS

A 9 bits 50 MS/s 0.5 mW continuous approximation mixed successive approximation (CAR&SAR) ADC is presented. A 12 bits 50 MS/s 0.6 mW CAR&CAR ADC is presented. In the field of low power and high performance ADC, CAR is a new architecture different from SAR. It is faster and easier to get high accuracy. Here we will introduce CAR and its circuit implementation, and the 9 bits experimental ADC is designed to verify CARADC''s feasibility. Meanwhile, its resolution can be extended to 12 bits with adding an extra CAR, and then the performance is raised to 0.6 mW 50 MS/s 72 dB SNDR at TT corner and the Walden FOM is 3.6 fj/conv-step. The 9 b ADC was fabricated by using TSMC 1P9M 65 nm CMOS technology. The ADC achieves 50 dB SNDR and the realized Walden FOM is 34 fj/conv-step. The simulation and measurement results prove that CAR is available in the low power and high performance ADC and it even outperforms SAR. The ADC core occupies an active area of 0.045 mm².     

一种全集成8位2.16 GS/s SAR ADC

设计了一种8位2.16 GS/s四通道、时间交织逐次逼近型模数转换器(TI-SAR ADC).单通道SAR ADC采用数据环、异步时钟环的双环结构实现高速工作.采用带复位开关的动态比较器缩短量化时间,提高比较精度.结合反向单调切换时序,逐步增大共模电压,提升量化速度.基于55 nm CMOS工艺设计,后仿真结果表明,在...     

一个电容阵列定制的100MS/s，9bit，0.43mW逐次逼近型模数转换器

本论文介绍了一个带定制电容阵列的低功耗9bit,100MS/s逐次比较型模数转换器。其电容阵列的基本电容单元是一个新型3D,电容值为1fF的MOM电容。除此之外,改进后的电容阵列结构和开关转换方式也降低了不少功耗。为了验证设计的有效性,该比较器在TSMC IP9M 65nm LP CMOS工艺下流片。测试结果如下：采样频率100MS/s,输入频率1MS/s时,有效位数（ENOB）为7.4,bit,信噪失真比（SNDR）为46.40dB,无杂散动态范围（SFDR）为62.31dB。整个芯片核面积为0.030mm2,在1.2V电源电压下功耗为0.43mW。该设计的品质因数（FOM）为23.75fJ/conv。     

一种应用于高精度SAR ADC校准的剪枝神经网络算法

介绍了一种基于剪枝神经网络的后台校准算法,能够对高精度单通道SAR ADC的电容失配、偏移、增益等多个非理想因素同时进行校准,有效提高SAR ADC的精度。本算法不仅可以达到全连接神经网络校准效果,而且同时对贡献小的权重进行剔除,降低了校准电路的资源消耗,加快了神经网络校准算法速度。仿真结果表明,信号频率接近奈奎斯特频率的情况下,对16 bit 5 MS/s的 SAR ADC进行校准,校准后ADC的有效位数从7.4 bit提高到15.6 bit,无杂散动态范围从46.8 dB提高到126.2 dB。     

一种非二进制权重的高能效比逐次比较型模数转换器

介绍了一种非二进制权重的高能效比逐次比较型模数转换器。该ADC采用了非二进制权重的电容结构以降低工艺失配对性能的影响,极大地减小了总电容的值;使用了自适应时钟来实现每一位的量化,提高了采样频率,并且不需要外界提供高速时钟;采用了注入扰动的最小均方校准算法,用很小的电路代价实现了后台数字校准。本芯片在SMIC 0.13μm工艺上实现,芯片模拟部分核心面积为0.042mm2,数字校准模块面积为0.04mm2,芯片工作在25MHz采样率时功耗为2.8mW,信噪失真比为58.6dB,有效位数为9.5位。     

一种用于生物医学信号的自适应SAR ADC

基于0.18 μm CMOS工艺,设计了一种用于生物医学信号的12位逐次逼近型模数转换器(SAR ADC)。数模转换器采用分段结构电容阵列,并加入1位冗余位。比较器采用互补输入对管构成的动态比较器,以减小噪声和功耗。栅压自举开关被用于采样保持电路,并增加了堆叠管和虚拟管。针对生物医学信号具有稀疏性的特点,通过延时上极板复位时间的方法检测两次采样电压差值,实现采样率自适应切换。仿真结果表明,在120 kS/s采样率、1 V电源电压的条件下,该SAR ADC的功耗仅为4.65 μW,无杂散动态范围为76.29 dB,优值为16.9 fJ/(conv·step),有效位数达11.16 bit。     

A 10-bit 50 MS/s SAR ADC in 65 nm CMOS with on-chip reference voltage buffer

This paper presents the design of a 10-bit, 50 MS/s successive approximation register (SAR) analog-to-digital converter (ADC) with an on-chip reference voltage buffer implemented in 65 nm CMOS process. The speed limitation on SAR ADCs with off-chip reference voltage and the necessity of a fast-settling reference voltage buffer are elaborated. Design details of a high-speed reference voltage buffer which ensures precise settling of the DAC output voltage in the presence of bondwire inductances are provided. The ADC uses bootstrapped switches for input sampling, a double-tail high-speed dynamic comparator and split binary-weighted capacitive array charge redistribution DACs. The split binary-weighted array DAC topology helps us to achieve low area and less capacitive load and thus enhances power efficiency. Top-plate sampling is utilized in the DAC to reduce the number of switches. In post-layout simulation which includes the entire pad frame and associated parasitics, the ADC achieves an ENOB of 9.25 bits at a supply voltage of 1.2 V, typical process corner and sampling frequency of 50 MS/s for near-Nyquist input. Excluding the reference voltage buffer, the ADC consumes 697 μW and achieves an energy efficiency of 25 fJ/conversion-step while occupying a core area of 0.055 mm².     

A 12-bit 30-MS/s VCO-based SAR ADC with NOC-assisted multiple adaptive bypass windows

This paper proposes a technique that uses the number of oscillation cycles (NOC) of a VCO-based comparator to set multiple adaptive bypass windows in a 12-bit successive approximation register (SAR) analog-to-digital converter (ADC). The analysis of the number of bit cycles, power and static performance shows that three adaptive bypass windows reduce power consumption, and decrease DNL and have similar INL, compared with the SAR ADC without bypass windows. In addition, a 1-bit split-and-recombination redundancy technique and a general bypass logic digital error correction method are proposed to address the settling issues and optimize the size of the bypass window. This design is implemented in 40 nm CMOS technology. The conversion frequency of the ADC reaches up to 30 MS/s. The ADC achieves an SFDR of 85.35 dB and 11.12-bit ENOB with Nyquist input, consuming 380 μW, down from 427 μW without multiple adaptive bypass windows, at a 1.1 V supply, resulting in a figure of merit (FoM) of 5.69 fJ/conversion-step.     

用于便携式生物电势采集系统的455nW，220fJ每次转换，12位，2kS/s 逐次逼近型模数转换器

本文叙述了一种超低功耗的12位,2kS/s的逐次逼近型模数转换器。为了降低功耗,数字电路部分的电压被降低,并且锁存器的失调电压被自补偿。为了获得更好的线性度和更低的噪声,本文提出了一种改进的数模转换电容阵列版图和一种低回踢噪声的锁存器。该芯片采用0.18微米1P6M CMOS工艺流片验证。整个ADC仅消耗455nW,达到了61.8dB的SNDR。该模数转换器的优值为220fJ每次转换。整个ADC的面积仅为674×639μm2。