Fabrication of CuInSe2 films and solar cells by the sequential evaporation of In2Se3 and Cu2Se binary compounds

Cu₂Se/In_xSe(x≈1) double layers were prepared by sequentially evaporating In₂Se₃ and Cu₂Se binary compounds at room temperature on glass or Mo-coated glass substrates and CuInSe₂ films were formed by annealing them in a Se atmosphere at 550°C in the same vacuum chamber. The In_xSe thickness was fixed at 1 μm and the Cu₂Se thickness was varied from 0.2 to 0.5 μm. The CuInSe₂ films were single phase and the compositions were Cu-rich when the Cu₂Se thickness was above 0.35 μm. And then, a thin CuIn₃Se₅ layer was formed on the top of the CuInSe₂ film by co-evaporating In₂Se₃ and Se at 550°C. When the thickness of CuIn₃Se₅ layer was about 150 nm, the CuInSe₂ cell showed the active area efficiency of 5.4% with V_oc=286 mV, J_sc=36 mA/cm² and FF=0.52. As the CuIn₃Se₅ thickness increased further, the efficiency decreased.     

Synthesis and transport properties of prospective photovoltaic systems related to CuInSe2 and CuGaSe2

Solid solutions in CuGaSe₂–ZnSe and CuInSe₂–ZnSe systems have been obtained by radio frequency heating. In order to prepare n-type phases based on CuGaSe₂, p-type (CuGa)_1−xZn_2xSe₄ and (CuIn)_1−xZn_2xSe₄ (0.05x0.1) single crystals were doped by Ag, Hg, Cd, Zn implantation. The crystal structure of the solid solutions was studied by X-ray diffraction; the substitutors as well as the implantant valence states were analyzed using X-ray photoelectron spectroscopy. Hall effect, electrical conductivity, and the charge carrier mobility of an n-type zinc-implantated solid solution (CuGa)_1−xZn_2xSe₄ and (CuIn)_1−xZn_2xSe₄ (0.05x0.1) were studied.     

Study of point defects in CuGaSe2 single crystals by means of electron paramagnetic resonance and photoluminescence

Point defects in CuGaSe₂ single crystals as vacancies V_Se, V_Cu and defect pair (2V_Cu⁻+Ga_Cu²⁺) have been studied by means of electron paramagnetic resonance (EPR) and low-temperature photoluminescence (PL). EPR hyperfine structure has been found at temperatures as low as 1.45–45 K and the temperature dependence of EPR line is discussed. Photo-EPR spectrum reveals optically active behavior of intrinsic point defects in CuGaSe₂ crystals. Three bands of PL emission show different origins and two low-energy bands at 1.55 and 1.58 eV have been found to be steady despite H₂-, O₂- and Se₂-annealings. The experimental data added with electric characterization in accordance with the used annealings and together with a defect physics model allow consideration of the point defect ensemble in CuGaSe₂ in more detail.     

CVD of CuGaSe2 for thin film solar cells with various transport agents

Chemical vapor deposition (CVD) in an open tube system was employed to deposit single-phase CuGaSe₂ thin films on plain and Mo-coated glass substrates. The use of HCl and ternary CuGaSe₂ source material resulted in non-stoichiometric volatilization of the source material. The use of binary source materials – Cu₂Se and Ga₂Se₃ – in combination with I₂ and HCl as the respective transport agents yielded single-phase CuGaSe₂ thin films while the source materials were volatilized stoichiometrically. Mo/CuGaSe₂/CdS/ZnO devices were fabricated from these samples exhibiting an open-circuit voltages up to V_oc=853 mV.     

Effect of selenization pressure on CuInSe2 thin films selenized using co-sputtered Cu-In precursors

CuInSe₂ thin films were formed from the selenization of co-sputtered Cu–In alloy layers. These layers consisted of only two phases, CuIn₂ and Cu₁₁In₉, over broad Cu–In composition ratio. The concentration of Cu₁₁In₉ phase increased by varying the composition from In-rich to Cu-rich. The composition of co-sputtered Cu–In alloy layers was linearly dependent on the sputtering power of Cu and In targets. The metallic layers were selenized either at a low pressure of 10 mTorr or at 1 atm Ar. A small number of Cu–Se and In–Se compounds were observed during the early stage of selenization and single-phase CuInSe₂ was more easily formed in vacuum than at 1 atm Ar. Therefore, CuInSe₂ films selenized in vacuum showed smoother surface and denser microstructure than those selenized at 1 atm. The results showed that CuInSe₂ films selenized in vacuum had good properties suitable for a solar cell.     

Determination of Cu(In1−xGax)3Se5 defect phase in MBE grown Cu(In1−xGax)Se2 thin film by Rietveld analysis

Quantitative phase analysis of Cu(In_1−xGa_x)Se₂ (CIGS) thin film grown over Mo coated soda lime glass substrates was studied by Rietveld refinement process using room temperature X-ray data at θ-2θ mode. Films were found to contain both stoichiometric Cu(In_1−xGa_x)Se₂ and defect related Cu(In_1−xGa_x)₃Se₅ phases. Best fitting was obtained using crystal structure with space group I-42d for Cu(In_1−xGa_x)Se₂ and I-42m for Cu(In_1−xGa_x)₃Se₅ phase. The effects of Ga/III (=Ga/In+Ga=x) ratio and Se flux during growth over the formation of Cu(In_1−xGa_x)₃Se₅ defect phase in CIGS was studied and the correlation between quantity of Cu(In_1−xGa_x)₃Se₅ phase and solar cell performance is discussed.     

Real-time investigations on the formation of CuInSe2 thin film solar cell absorbers from electrodeposited precursors

In this article, we present results of a detailed real-time X-ray diffraction (XRD) study on the formation of CuInSe₂ from electroplated precursors. The solid-state reactions observed during the selenisation of three different types of precursors are presented. The first type of precursors (I) consists of the nanocrystalline phases Cu_2−xSe and InSe at room temperature, which react to CuInSe₂ starting at 470 K. The second type of precursor (II) shows an inhibited CuInSe₂ formation out of the initial phases Cu_2−xSe and γ-In₂Se₃ starting at 400 K. The third precursor type (III) shows completely different selenisation behaviour. Starting from the intermetallic compound Cu₁₁In₉ and amorphous selenium, the formation of the binary selenides In₄Se₃ and CuSe is observed after the melting point of selenium at 494 K. After selenium transfer reactions, the compound semiconductor CuInSe₂ is formed out of Cu_2−xSe and InSe. This type (III) reaction path is well known for the selenisation of SEL precursors (stacked elemental layers of sputtered copper and indium and thermally evaporated selenium).     

The formation of CuInSe2 thin film solar cell absorbers from electroplated precursors with varying selenium content

We present results from real-time X-ray diffraction experiments on the formation of CuInSe₂ solar cell absorbers by annealing precursors, produced by simultaneous electrodeposition of copper, indium and selenium. The investigations reveal, that a reduced amount of electrochemically deposited selenium is the decisive parameter in order to realise a chalcopyrite formation behaviour as observed for sputtered stacked elemental layer (SEL) precursors. A simultaneous electrodeposition of the elements copper, indium and selenium in the molar ratio 1:1:2 of the chalcopyrite CuInSe₂ leads to the formation of binary copper and indium selenides during the electrodeposition process. The existence of binary selenides besides the intermetallic phase Cu₁₁In₉ as initial phases leads to an unfavourable absorber morphology. This can be explained by the observed semiconductor formation mechanism. A reduction of the deposited amount of selenium favours the formation of the intermetallic compound Cu₁₁In₉ and reduces the amount of binary selenides. These precursors show a formation behaviour and resulting absorber morphology as known for sputtered SEL precursors.     

Characterization of co-sputtered Cu-In alloy precursors for CuInSe2 thin films fabrication by close-spaced selenization

Sputtering technique for Cu–In precursor films fabrication using different Cu and In layer sequences have been widely investigated for CuInSe₂ production. But the CuInSe₂ films fabricated from these precursors using H₂Se or Se vapour selenization mostly exhibited poor microstructural properties. The co-sputtering technique for producing Cu–In alloy films and selenization within a close-spaced graphite box resulting in quality CuInSe₂ films was developed. All films were analysed using SEM, EDX, XRD and four-point probe measurements. Alloy films with a broad range of compositions were fabricated and XRD showed mainly In, CuIn₂ and Cu₁₁In₉ phases which were found to vary in intensities as the composition changes. Different morphological properties were displayed as the alloy composition changes. The selenized CuInSe₂ films exhibited different microstructural properties. Very In-rich films yielded the ODC compound with small crystal sizes whilst slightly In-rich or Cu-rich alloys yielded single phase CuInSe₂ films with dense crystals and sizes of about 5 μm. Film resistivities varied from 10⁻²–10⁸ Ω cm. The films had compositions with Cu/In of 0.40–2.3 and Se/(Cu+In) of 0.74–1.35. All CuInSe₂ films with the exception of very Cu-rich ones contained high amount of Se (>50%).     

Preparation of Cu(In,Ga)(S,Se)2 thin films by sequential evaporation and annealing in sulfur atmosphere

Cu(In,Ga)(S,Se)₂ thin films with high Ga/III ratio (around 0.8) were prepared by sequential evaporation from CuGaSe₂, CuInSe₂, In₂Se₃ and Ga₂Se₃ compounds and then annealing in H₂S gas atmosphere. The annealing temperature was varied from 400 to 500 °C. These samples were characterized by means of XRF, EPMA, XRD and SEM. The S/(S+Se) mole ratio in the thin films increased with increase in the annealing temperature, keeping the Cu, In and Ga contents nearly constant. The open circuit voltage increased and the short circuit current density decreased with increase in the annealing temperature. The best solar cell using Cu(In,Ga)(S,Se)₂ thin film with Ga/(In+Ga)=0.79 and S/(S+Se)=0.11 annealed at 400 °C demonstrated V_oc=535 mV, I_sc=13.3 mA/cm², FF=0.61 and efficiency=4.34% without AR-coating.     

Effect of copper diffusion on photovoltaic characteristics of CuGaSe2–GaAs cells

CuGaSe₂–GaAs heterojunctions were fabricated by fast evaporation of polycrystalline CuGaSe₂ from a single source on n-type GaAs substrates. The best CuGaSe₂–GaAs photocell (without an antireflective coating) exhibited an efficiency of 11.5%, J_sc=32 mA/cm², V_oc=610 mV and FF=0.60. The spectral distribution of photosensitivity of CuGaSe₂–GaAs junctions extends from 400 to 900 nm. The CuGaSe₂ films were characterized by X-ray diffraction (XRD) and scanning electron microscope (SEM) techniques. XRD analysis indicated that the thin films were strongly oriented along the (1 1 2) plane. SEM studies of CuGaSe₂ films showed nearly stoichiometric composition with grain size about 1–2 μm. The energy dispersive X-ray spectroscopy (EDX) analysis of Cu concentration distribution in n-type GaAs showed that Cu diffused from the film into n-type GaAs during the growth process resulting in formation of the latent p–n homojunction in substrate. The diffusion coefficient of Cu in GaAs at growth temperature (520°C) estimated from EDX measurements was 6×10⁻⁸ cm²/s.     

Experimental investigation of Cu(In1−x,Gax)Se2/Zn(O1−z,Sz) solar cell performance

In this study we investigate the performance of Cu(In_1−x,Ga_x)Se₂/Zn(O_1−z,S_z) solar cells by changing the gallium content of the absorber layer in steps from CuInSe₂ to CuGaSe₂ and at each step vary the sulfur content of the Zn(O,S) buffer layer. By incorporating more or less sulfur into the Zn(O,S) buffer layer it is possible to change its morphology and band gap energy. Surprisingly, the best solar cells with Zn(O,S) buffer layers in this study are found for close to or the same Zn(O,S) buffer layer composition for all absorber Ga compositions. In comparison to their CdS references the best solar cells with Zn(O,S) buffer layers have slightly lower open circuit voltage, V_oc, lower fill factor, FF, and higher short circuit current density, J_sc, which result in comparable or slightly lower conversion efficiencies. The exception to this trend is the CuGaSe₂ solar cells, where the best devices with Zn(O,S) have substantially lowered efficiency compared with the CdS reference, because of lower V_oc, FF and J_sc. X-ray photon spectroscopy and X-ray diffraction measurements show that the best Zn(O,S) buffer layers have similar properties independent of the Ga content. In addition, energy dispersive spectroscopy scans in a transmission electron microscope show evidence of lateral variations in the Zn(O,S) buffer layer composition at the absorber/buffer layer interface. Finally, a hypothesis based on the results of the buffer layer analysis is suggested in order to explain the solar cell parameters.     

Single crystal growth and properties of γ-phase in the CuInSe2+2CdS⇔CuInS2+2CdSe reciprocal system

The intermediate solid solution, γ-phase, exists in the CuInSe₂+2CdS⇔CuInS₂+2CdSe reciprocal system. It crystallizes in the cubic structure and has a wide homogeneity range. Single crystals of the γ-phase are grown by a modified Bridgman method and their composition, crystal structure, optical and electrical properties are studied. The band gap varies from 1.43 to 1.05 eV along the ‘Cu₃Cd₂In₃S₈’-‘CuCd₂InSe₄’ compositional section. The crystals are photosensitive, mostly p-type, with hole concentrations in the 10¹⁵-10¹⁶ cm⁻³ range and mobilities up to 18 cm²/V s. The results indicate that the γ-phase can be considered as a new absorbing material for thin-film solar cells.     

Scanning tunneling microscopy of electrodeposited CuInSe2 nanoscale multilayers

We have investigated the electrochemical deposition of modulated thin films based on the Cu_xIn_2−xSe₂ system. CuInSe₂ is a leading alternative to silicon for use in thin film photovoltaic solar cells due to its optical absorption and electrical characteristics. Alternating layers of two different compositions based on the Cu_xIn_2−xSe₂ system were potentiostatically deposited. These nanometer-scale layers are used to form reduced-dimensionality structures such as superlattices that can be used in concentrator solar cells. We have used X-ray diffraction, energy-dispersive spectroscopy, and scanning tunneling microscopy to characterize our asdeposited thin films. The ability of the scanning tunneling microscope to resolve the individual nanoscale layers of our multilayered thin films is shown and is used to determine modulation wavelengths.     

Fabrication of nano N-doped In2Ga2ZnO7 for photocatalytic hydrogen production under visible light

N-doped In₂Ga₂ZnO₇ photocatalysts were fabricated by solid state reaction route. All the prepared photocatalysts were successfully characterised by PXRD, optical absorption spectra, SEM, TEM, XPS, BET surface area and photoresponse studies. The formation of In₂Ga₂ZnO₇ was confirmed by the PXRD pattern. Optical absorption spectra showed that the visible light absorption of all the photocatalysts were enhanced by nitrogen doping. Among all the prepared photocatalysts, 1 wt% Pt loaded N-GaInZn-500 showed enhanced photocatalytic activity towards hydrogen evolution under visible light irradiation in presence of 10 vol% methanol solution as sacrificial agent. The excellent photocatalytic activity of N-GaInZn-500 is in agreement with N-content, bandgap energy, PL intensity and Surface area.     

Electrical and luminescent properties of CuGaSe2 crystals and thin films

CuGaSe₂ thin films with thicknesses of about 2 μm were prepared by flash and single source evaporation onto mica and (1 1 0)-oriented ZnSe substrates in the substrate temperature range 150–450°C. The obtained polycrystalline CuGaSe₂ films had the chalcopyrite structure with the predominant growth direction 2 2 1. Hall effect, conductivity and luminescence measurements have been carried out on CuGaSe₂ thin films and source materials: CuGaSe₂ single crystals grown by Bridgman technique and by chemical vapour transport using I₂ as transport agent. All films and crystals are p-type. Two acceptor levels with ionization energies E_A150–56 meV and E_A2130–150 meV have been identified as due to Ga vacancy and presence of Se atoms on interstitial sites respectively.     

CuGaxSey chalcopyrite-related thin films grown by chemical close-spaced vapor transport (CCSVT) for photovoltaic application: Surface- and bulk material properties, oxidation and surface Ge-doping

Device-grade ternary Cu-Ga-Se chalcopyrite thin films used for photovoltaic energy conversion have been prepared by a novel chemical close-spaced vapor transport (CCSVT) technique developed for a deposition on areas of up to 10×10 cm². A two-step process has been developed which allows the fine tuning of the film composition and the electronic properties. The extension of deposition times in the two-step process led to final film compositions with [Ga]/[Cu] ratios ranging from 0.9 to 5.7, allowing the study of the structural phase transitions. In this paper the main focus of interest is related to the material properties of the device-grade thin films prepared by CCSVT technique. We present our recent studies on (i) the growth, compositional, structural and electronic structural properties, (ii) the degradation under ambient conditions and (iii) the feasibility of n-type doping this p-type semiconducting material by germanium. Thin films were grown with chalcopyrite (1:1:2) and CuGaSe₂-related defect compound structures (DC) with stoichiometries of CuGa₃Se₅ and CuGa₅Se₈. In order to derive the DC structure, X-ray and neutron powder diffraction investigations have been carried out on powders of these CuGaSe₂-related compounds grown by elemental synthesis (powder) and CCSVT (thin films), respectively. We found no hints for an ordering of defects, as proposed in the past and giving name to the so-called Ordered Defect Compounds (ODC) in this and related structures. From our results a growth model is presented for CuGa₃Se₅ formation in gallium-rich CCSVT-grown CuGa_xSe_y films. The chemical and electronic surface and interface structure of CuGaSe₂ thin films with bulk [Ga]/[Cu] ratios between 0.94 and 1.39 is investigated by X-ray and UV-excited photoelectron spectroscopy (XPS and UPS, respectively). A transition of the Cu:Ga:Se surface composition from 1:1:2 for the Cu-rich bulk sample to 1:3:5 for the sample with the highest bulk [Ga]/[Cu] ratio is observed. Simultaneously, a downward shift of the valence band maximum position with respect to the Fermi energy is found. The comparison of the estimated conduction band minimum with that of CdS reveals the formation of a pronounced “cliff-like” conduction band offset at the respective interface.Furthermore, the CuGaSe₂ thin film degradation under ambient as well as under thermal conditions of CuGaSe₂ thin films has been studied by XPS. During thermal oxidation, the formation of predominantly Ga₂O₃ and some amount of SeO₂ were observed, but no copper oxides could be detected in the near-surface region of the thin films. The same oxides are found after native oxidation in air under ambient conditions. An additional sodium oxide compound formed at the thin film surface, Na_xO and Na₂CO₃ after thermal and native oxidation, respectively.Germanium ion implantation technique of the near-surface region of CuGaSe₂ thin films has been used in order to prove the feasibility of n-type doping. In photoluminescence (PL) studies, the occurrence of a new emission line is identified as Ge related and explained as a donor-acceptor-pair (DAP) recombination. The precise role the Ge is playing in this doping of CuGaSe₂ is revealed by X-ray absorption spectroscopy (XANES and EXAFS) and ab initio calculations based on the density functional theory. The studies indicate that the incorporated Ge atoms preferentially occupy Ga sites when relaxation around the dopant is taken into account. Additionally, our corresponding theoretical band structure model predicts the existence of additional localized electronic acceptor and donor defect bands within the band gap of CuGaSe₂ originating from a strong covalent interaction between Ge 4s and Se 4p states for Ge atoms tetrahedrally surrounded by the Se nearest-neighbor atoms. A theoretically predicted anti-bonding Ge-Se4sp³ defect band appearing well above the Fermi level for the Ge¹⁺_Ga point defect system can be directly linked to a Ge-dopant-related donor-acceptor-pair transition as observed in our photoluminescence spectra.     

Effects of annealing on CuInSe2 films grown by molecular beam epitaxy

CuInSe₂ (CIS) thin films with a range of Cu/In ratios were grown by molecular beam epitaxy on GaAs (0 0 1) at substrate temperatures of T_s = 450–500°C and the effects of annealing under various atmospheres have been investigated. Photoluminescence spectra obtained from an ex-situ vacuum annealed CIS film at a temperature of T_A = 350°C showed a red-shift and a broadening of an emission peak (peak c) which originally appeared at 0.970 eV before annealing and the red-shifted peak c was found to consist of two overlapping peaks. The excitation power dependence of these overlapping peaks indicated the radiative recombination processes associated with the emissions to be a conduction band to acceptor transition (peak at 0.970 eV) and a transition due to donor-acceptor pairs (peak at 0.959 eV), indicating the formation of a shallow donor-type defect during the vacuum annealing process. The origin of this defect has tentatively been attributed to Se vacancies. On the other hand, the molar fraction of oxygen increased with increasing annealing temperature in dry-air. An epitaxially grown In₂O₃ phase was found both in Cu-rich and In-rich films annealed at T_A 350°C, which was not observed in the films annealed in Ar atmosphere. Thermodynamic calculations based on the Cu---In---Se---O---N system showed In₂O₃ to be the most stable phase in good agreement with the experimental results.     

An investigation into effect of cationic precursor solutions on formation of CuInSe2 thin films by SILAR method

SILAR deposition of CuInSe₂ films was performed by using Cu²⁺–TEAH₃ (cupric chloride and triethanolamine) and In³⁺–CitNa (indium chloride and sodium citrate) chelating solutions with weak basic pH as well as Na₂SeSO₃ solution at 70 °C. A separate mode and a mixed one of cationic precursor solutions were adopted to investigate effects of the immersion programs on crystallization, composition and morphology of the deposited CuInSe₂ films. Chelating chemistry in two solution modes was deducted based on IR measurement. The XRD, XPS and SEM results showed that well-crystallized, smoothly and distinctly particular CuInSe₂ films could be obtained after annealing in Ar at 400 °C for 1 h by using the mixed cationic solution mode.     

Photoelectrochemical behavior of In2S3 formed on sintered In2O3 pellets

Microcrystals of In₂S₃ were formed on sintered In₂O₃ pellets by sulfurizing in H₂S atmosphere. The flat band potential of compound In₂S₃|In₂O₃ electrodes was evaluated as −1.0 V vs Ag|AgCl in 1 M KOH, 1 M Na₂S, 10⁻² M S. Significantly enhanced photocurrent was observed on compound In₂S₃|In₂O₃ electrodes with a lower degree of sulfurization to that of compound In₂S₃|In₂O₃ electrodes with higher degree of sulfurization. Photocurrent generation of compound In₂S₃|In₂O₃ electrodes was explained from the viewpoint of semiconductor sensitization.