共查询到19条相似文献,搜索用时 74 毫秒
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用InGaAs/InP APD的红外单光子探测技术 总被引:1,自引:1,他引:1
由于在量子信息技术特别是量子密钥分配系统中的应用,以InGaAs/InP雪崩二极管为基础的红外单光子探测技术,近年来成为研究的热点之一。主要介绍了单光子探测用InGaAs/InP APD的选择和实现红外单光子探测器的关键技术:半导体制冷精密温控技术和APD的驱动控制技术,重点介绍了门控电路。 相似文献
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单光子探测模块在多个领域中有重要的用途,然而现有的单光子探测模块依赖进口芯片.研制了一种基于国产元器件的1550 nm的单光子探测模块,改进了触发信号处理电路,避免了使用进口芯片.在触发信号的作用下,雪崩光电二极管进入盖革模式,处在盖革模式下的雪崩光电二极管接收到光子以后,产生雪崩信号;雪崩光电二极管的输出信号中的雪崩... 相似文献
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针对宽禁带半导体SiC APD紫外单光子探测器,本文提出了一种1×8线阵型单光子计数读出电路.根据光强条件并通过合适的时序控制,可选取固定门控或互补门控探测方式,实现宽动态范围紫外光子信号的探测计数.读出电路采用TSMC 0.18μm CMOS工艺制备,测试结果表明,读出电路具备单光子探测功能,性能与仿真分析预期结果吻合.最终,借助微动系统二维转台完成对日盲紫外单波长光子的探测与成像,实现对多个独立紫外光源的准确区分与目标定位. 相似文献
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近年来,单光子探测技术在激光雷达等方面的应用越来越受到研究人员的关注。研制了基于InGaAs负反馈雪崩二极管(Negative Feedback Avalanche Diode, NFAD)的自由运转式集成型近红外单光子探测器。设计将被动淬灭原理的NFAD与主动淬灭技术结合,针对NFAD的信号读出电路易受电磁干扰的问题,创新地提出了无前级放大器的雪崩信号高阻抗差分提取电路,并采用吸波材料对关键电路部分进行了屏蔽,同时提高了淬灭性能和稳定性。此外,为了降低暗噪声计数率,针对集成制冷型NFAD器件的散热进行了详细的热设计,对集成热电制冷的NFAD器件和高速淬灭电路发热量较大的特点进行了电路和散热结构设计优化。通过实验对淬灭电路性能、散热设计和抗干扰设计进行了验证。结果表明:无前置放大器设计的探测器性能稳定,对1 550 nm波长光子的最高探测效率可达33%,在-50℃、10%探测效率时可用死时间低至120 ns,此时暗计数率890 Hz,后脉冲概率10.6%。探测器散热性能良好,环境20℃风冷下的最低制冷温度可稳定在-58℃。上述结果表明这一低噪声计数、高集成度的通信波段近红外单光子探测器... 相似文献
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采用APD单光子阵列读出集成电路的红外测距技术 总被引:1,自引:1,他引:1
红外单光子探测因其超高的检测灵敏度和信噪比,有效提升了弱光检测系统的性能水平。基于TSMC 0.35m CMOS工艺,提出了一种阵列型数字式红外读出电路及其应用系统的设计方法。采用由OSC多相时钟构成的低段全局共享TDC和高段像素独享TDC的两段式阵列结构,在170 MHz时钟频率下,实测获得了小于1 ns的时间分辨率和3s的量程,并在1 kHz的帧率下采用串行模式输出数据,经相关数据处理,最终实现测距轮廓成像的功能。 相似文献
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针对现有基于尖峰噪声电容平衡方法的单光子探测技术工作频率较低的问题,设计了利用高速二极管平衡的InGaAs/InP雪崩光电二极管信号提取方案.配合高速信号处理电路,实现了工作频率最高达700 MHz的近红外单光子探测器.雪崩二极管制冷至218 K,在脉宽小于1 ns、重复频率700 MHz的门脉冲触发下,当探测效率为10%时,暗计数率为7×10~(-6)/pulse,后脉冲率为7.4%.该方案提供了一种重复频率连续可调宽带高速单光子探测方法,结构简单且性能良好. 相似文献
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Avalanche photodiodes(APDs) are promising light sensors with high quantum efficiency and low noise. It has been extensively used in radiation detection, laser radar and other weak signal detection fields. Unlike other photodiodes, APD is a very sensitive light detector with very high internal gain. The basic theory shows that the gain of APD is related to the temperature. The internal gain fluctuates with the variation of temperature. Investigated was the influence of the variation of the gain induced by the fluctuation of temperature on the output from APD for a very weak laser pulse input in laser radar. An active reverse-biased voltage compensation method is used to stabilize the gain of APD. An APD model is setup to simulate the detection of light pulse signal. The avalanche process, various noises and temperature's effect are all included in the model. Our results show that for the detection of weak light signal such as in laser radar, even a very small fluctuation of temperature could cause a great effect on APD's gain. The results show that the signal-tonoise ratio of the APD's output could be improved effectively with the active gain-control system. 相似文献
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M.B. Reine J.W. Marciniec K.K. Wong T. Parodos J.D. Mullarkey P.A. Lamarre S.P. Tobin R.W. Minich K.A. Gustavsen M. Compton G.M. Williams 《Journal of Electronic Materials》2008,37(9):1376-1386
This article reports new characterization data for large-area (250 μm × 250 μm) back-illuminated planar n-on-p HgCdTe electron-initiated avalanche photodiodes (e-APDs). These e-APDs were fabricated in p-type HgCdTe films grown by liquid-phase epitaxy (LPE) on CdZnTe substrates. We previously reported that these arrays exhibit
gain that increases exponentially with reverse bias voltage, with gain-versus-bias curves that are quite uniform from element
to element, and with a maximum gain of 648 at −11.7 V at 160 K for a cutoff wavelength of 4.06 μm. Here we report new data on these planar e-APDs. Data from a third LPE film with a longer cutoff wavelength (4.29 μm at 160 K) supports the exponential dependence of gain on cutoff wavelength, for the same bias voltage, that we reported
for the first two films (with cutoffs of 3.54 μm and 4.06 μm at 160 K), in agreement with Beck’s empirical model for gain versus voltage and cutoff wavelength in HgCdTe e-APDs. Our
lowest gain-normalized current density at 80 K and zero field-of-view is 0.3 μA/cm2 at −10.0 V for a cutoff of 4.23 μm at 80 K. We report data for the temperature dependence of gain over 80 K to 200 K. We report, for the first time, the dependence
of measured gain on junction area for widely spaced circular diodes with radii of 20 μm to 175 μm. We interpret the variation of measured gain with junction area in terms of an edge-enhanced electric field, and fit the
data with a two-gain model having a lower interior gain and a higher edge gain. We report data for the excess noise factor
F(M) near unity for gains up to 150 at 196 K. We describe the abrupt breakdown phenomenon seen in most of our devices at high
reverse bias. 相似文献
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高速近红外1 550 nm单光子探测器采用半导体制冷和热管风冷混合技术,雪崩二极管工作于盖革模式下,使用交流耦合方式提供门脉冲信号,通过延迟补偿和采样边沿锁存方式消除尖脉冲干扰,采用反馈门控减小后脉冲的影响。采用了ECL(Emitter Couple Logic)与TTL(Transistor-TransistorLogic)混合电子技术提高单光子探测系统的运行频率,其频率可大于10 MHz;另外,通过对雪崩信号的放大来提高信号的动态范围,进一步优化探测器的性能。实验测试与分析表明,探测器在时钟频率10 MHz、温度-62℃、门脉冲宽度8 ns的条件下的最优性能参数为:量子探测效率12.8%,暗计数率3.76×10-6ns-1,噪声等效功率8.68×10-19W/Hz1/2。 相似文献
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平面型雪崩光电二极管(APD)在结弯曲处具有高的电场,导致在结边缘的提前击穿.运用FEMLAB软件对不同工艺流程制备的三种不同结构平面型InP/InGaAs APD的电场分布进行了二维有限元模拟,在表面电荷密度为5×1011cm-2时分析了吸收层厚度、保护环掺杂浓度、保护环和中央结纵向及横向间距等因素对边缘提前击穿特性的抑制程度.比较了这三种结构的InP/InGaAs APD在边缘提前击穿的抑制特性的优劣.通过理论研究对平面InP/InGaAs APD进行了优化. 相似文献
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文章简单回顾了氮化镓基雪崩光电二极管的发展现状,从制作高响应率、低漏电流的雪崩器件出发,详细阐明了制作氮化镓基雪崩光电二极管的工艺过程,特别考虑了干法刻蚀带来的物理损伤以及后续的消除损伤处理。由于雪崩器件对于材料的质量具有较苛刻的要求,因此特别对材料进行了必要的筛选。通过一系列工艺上的改进,成功地制作出国内第一只氮化镓基雪崩光电二极管,器件的光敏面直径是40μm;并对其进行了光电性能测试。测试结果表明,当反向偏压是58V时,漏电流大约是1.18×10^-7A,雪崩增益是3。 相似文献
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Low-Noise Mid-Wavelength Infrared Avalanche Photodiodes 总被引:1,自引:0,他引:1
Siddhartha Ghosh Shubhrangshu Mallick Koushik Banerjee Christoph Grein Silviu Velicu Jun Zhao Don Silversmith Jean Baptist Rodriguez Elena Plis Sanjay Krishna 《Journal of Electronic Materials》2008,37(12):1764-1769
Mid-wavelength infrared (MWIR) p
+–n
−–n
+ avalanche photodiodes (APDs) were fabricated using two materials systems, one with mercury cadmium telluride (HgCdTe) on
a silicon (Si) substrate and the other with an indium arsenide/gallium antimonide (InAs/GaSb) strained layer superlattice
(SLS). Diode characteristics, avalanche characteristics, and excess noise factors were measured for both sets of devices.
Maximum zero-bias resistance times active area (R
0
A) of 3 × 106 Ω cm2 and 1.1 × 106 Ω cm2 and maximum multiplication gains of 1250 at −10 V and 1800 at −20 V were measured for the HgCdTe and the SLS, respectively,
at 77 K. Gains reduce to 200 in either case at 120 K. Excess noise factors were almost constant with increasing gain and were
measured in the range of 1 to 1.2. 相似文献
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文章简单回顾了氮化镓基雪崩光电二极管的发展现状,从制作高响应率、低漏电流的雪崩器件出发,详细阐明了制作氮化镓基雪崩光电二极管的工艺过程,特别考虑了干法刻蚀带来的物理损伤以及后续的消除损伤处理。由于雪崩器件对于材料的质量具有较苛刻的要求,因此特别对材料进行了必要的筛选。通过一系列工艺上的改进,成功地制作出国内第一只氮化镓基雪崩光电二极管,器件的光敏面直径是40μm;并对其进行了光电性能测试。测试结果表明,当反向偏压是58V时,漏电流大约是1.18×10-7A,雪崩增益是3。 相似文献