热循环对Sn58Bi(纳米Ti)/Cu焊点界面与性能影响

为了改善Sn-58Bi低温钎料的性能,通过在Sn-58Bi低温钎料中添加质量分数为0.1%的纳米Ti颗粒制备了Sn-58Bi-0.1Ti纳米增强复合钎料。在本文中,研究了纳米Ti颗粒的添加对-55～125 _^oC热循环过程中Sn-58Bi/Cu焊点的界面金属间化合物(IMC)生长行为的影响。研究结果表明：回流焊后,在Sn-58Bi/Cu焊点和Sn-58Bi-0.1Ti/Cu焊点的界面处都形成一层扇贝状的Cu₆Sn₅ IMC层。在热循环300次后,在Cu₆Sn₅/Cu界面处形成了一层Cu₃Sn IMC。Sn-58Bi/Cu焊点和Sn-58Bi-0.1Ti/Cu焊点的IMC层厚度均和热循环时间的平方根呈线性关系。但是,Sn-58Bi-0.1Ti/Cu焊点的IMC层厚度明显低于Sn-58B/Cu焊点,这表明纳米Ti颗粒的添加能有效抑制热循环过程中界面IMC的过度生长。另外计算了这两种焊点的IMC层扩散系数,结果发现Sn-58Bi-0.1Ti/Cu焊点的IMC层扩散系数(整体IMC、Cu₆Sn₅和Cu₃Sn IMC)明显比Sn-58Bi/Cu焊点小,这在一定程度上解释了Ti纳米颗粒对界面IMC层的抑制作用。     

TiO_2纳米颗粒掺杂对Sn-3.0Ag-0.5Cu-xTiO_2焊点界面Cu_6Sn_5 IMC晶粒生长的影响机理

研究了Ti O2纳米颗粒掺杂影响回流焊过程中Sn-3.0Ag-0.5Cu-x Ti O2焊点界面Cu6Sn5金属间化合物(intermetallic compound,IMC)晶粒生长机理.基于Cu原子扩散通量驱动晶粒成熟生长(flux driven ripening,FDR)理论模型分析了Cu6Sn5IMC晶粒生长机理.结果表明,Ti O2纳米颗粒掺杂改变了焊点界面Cu6Sn5IMC晶粒形貌和尺寸.含Ti O2纳米颗粒的焊点Cu6Sn5IMC晶粒尺寸要小于不含Ti O2纳米颗粒的焊点,且晶粒分布要更加均匀.试验数据与FDR理论模型基本吻合.Cu6Sn5IMC晶粒生长指数分别为0.346,0.338,0.332和0.342,这说明Cu6Sn5IMC晶粒生长是由原子互扩散和晶粒成熟共同控制.     

热循环对Sn58Bi-0.1Ti/Cu焊点界面与性能影响

为了改善Sn58Bi低温钎料的性能,通过在Sn58Bi低温钎料中添加质量分数为0.1%的纳米Ti颗粒制备了Sn58Bi-0.1Ti纳米增强复合钎料。研究了纳米Ti颗粒的添加对-55～125℃热循环过程中Sn58Bi/Cu焊点的界面金属间化合物(IMC)生长行为的影响。结果表明:回流焊后,在Sn58Bi/Cu焊点和Sn58Bi-0.1Ti/Cu焊点的界面处都形成一层扇贝状的Cu6Sn5IMC层。在热循环300次后,在Cu_6Sn_5/Cu界面处形成了一层Cu_3Sn IMC。Sn58Bi/Cu焊点和Sn58Bi-0.1Ti/Cu焊点的IMC层厚度均和热循环时间的平方根呈线性关系。但是,Sn58Bi-0.1Ti/Cu焊点的IMC层厚度明显低于Sn58Bi/Cu焊点,这表明纳米Ti颗粒的添加能有效抑制热循环过程中界面IMC的过度生长。另外计算了这2种焊点的IMC层扩散系数,结果发现Sn58Bi-0.1Ti/Cu焊点的IMC层扩散系数(整体IMC、Cu_6Sn_5和Cu_3Sn IMC)明显比Sn58Bi/Cu焊点小,这在一定程度上解释了Ti纳米颗粒对界面IMC层生长的抑制作用。     

微量Nd对Sn-6.5Zn合金及钎料/Cu界面结构的影响

研究了微量稀土元素Nd的添加对Sn-6.5Zn合金组织及钎料/Cu焊点界面金属间化合物(IMC)特征的影响.结果表明:微量Nd元素在Sn-6.5Zn钎料中的添加能够显著细化合金组织和形成均匀细密界面IMC层;添加0.1 wt％Nd元素即能促进钎料/Cu焊点界面反应及界面区域成分的均匀性.     

Sn-2．5Ag-0．7Cu（0．1RE）／Cu焊点界面区微观组织与Cu6Sn5的生长动力学

利用X射线衍射分析仪、JSM-5610LV扫描电镜及能谱分析研究钎焊和时效过程中低银Sn-2.5Ag-0.7Cu(0.1RE)/Cu焊点界面区显微组织和Cu6Sn5金属问化合物的生长行为.结果表明:钎焊过程中焊点界面区Cu6Sn5金属间化合物的厚度是溶解和生长两方面共同作用的结果;随着时效时间的延长,焊点界面区Cu6Sn5的形貌由扇贝状转变为层状,其长大动力学符合抛物线规律,由扩散机制控制;添加0.1%稀土元素能有效减慢界面Cu6Sn5金属间化合物在钎焊及时效过程中的长大速度,可改变焊点裂纹的起源位置,提高其可靠性.     

电流作用下Cu/Sn-15Bi/Cu焊点的组织演变

对Cu/Sn-15Bi/Cu焊点在150℃下的电迁移组织演变进行了研究. 结果表明,焊点阳极侧出现了近共晶相的偏聚,近共晶相厚度随电迁移时间的延长而逐渐增加;受“电子风”力的影响,钎料中Cu6Sn5金属间化合物逐渐向阳极侧偏聚,此外,由于阴极侧Cu6Sn5界面金属间化合物的脱落,钎料中的Cu6Sn5金属间化合物体积分数逐渐增加;焊点阴极侧界面金属间化合物厚度随电迁移时间延长逐渐增加,阳极侧界面金属间化合物厚度随电迁移时间延长先增加,后降低,当电迁移时间超过5 h后,界面金属间化合物厚度迅速增加.     

微连接用Sn-2.5Ag-0.7Cu(0.1RE)钎料焊点界面Cu6Sn5的长大行为

利用XRD、SEM及EDAX研究了钎焊和时效过程中低银Sn-2.5Ag-0.7Cu(0.1RE)/Cu焊点界面区显微组织和Cu6Sn5金属间化合物的生长行为。结果表明,钎焊过程中焊点界面区Cu6Sn5金属间化合物的厚度是溶解和生长两方面共同作用的结果;随时效时间的增加,焊点界面区Cu6Sn5的形貌由扇贝状转变为层状,其长大动力学符合抛物线规律,由扩散机制控制;添加0.1%(质量分数,下同)的RE能有效减慢界面Cu6Sn5金属间化合物在钎焊及时效过程中的长大速度,改变焊点的断裂机制,提高其可靠性。     

纳米铝颗粒增强Sn1.0Ag0.5Cu钎料性能及机理

通过机械混合的方法，制备Sn1.0Ag0.5Cu-xAl复合钎料.采用DSC、STR-1000型微焊点强度测试仪及SEM，研究了纳米铝颗粒对低银Sn1.0Ag0.5Cu钎料组织与性能的影响.结果表明，微量纳米铝颗粒的添加对钎料的熔化温度影响较小，其熔点均在226.9~229.0℃之间.随着纳米Al元素含量的增加，钎料的润湿角逐渐减小，力学性能逐渐增加，当纳米Al元素的添加量为0.1%时，焊点的拉伸力达到最大，为7.1 N.此外，Sn1.0Ag0.5Cu-0.1Al钎料的内部组织得到显著细化，焊点界面金属间化合物的生长也得到明显抑制，主要归因于纳米颗粒对金属间化合物生长的吸附作用.     

Sn-9Zn-0.1S/Cu焊点液固界面金属间化合物的生长动力学

采用扫描电镜和光学显微镜观察研究了230~260℃焊接温度范围内Sn-9Zn-0.1S/Cu焊点界面金属间化合物的结构及生长动力学.结果表明,在该焊点界面形成的化合物可分为两层:靠铜侧的是厚且平直的γ-Cu₅Zn₈化合物层;靠焊料侧的则为另一薄且呈扇贝、粒状的CuZn化合物层.提高钎焊温度及延长反应时间基本不改变Sn-9Zn-0.1S/Cu焊点界面金属间化合物的结构和成分,但会使形成的界面金属间化合物层厚度增加.γ-Cu₅Zn₈金属间化合物层的厚度与反应时间的平方根呈线性关系,表明其生长由扩散机制控制.根据阿伦尼乌斯公式,Sn-9Zn-0.1S/Cu焊点界面γ-Cu₅Zn₈金属间化合物层反应活化能为22.09 kJ/mol.     

倒装芯片组装中微米级互连焊点的界面金属间化合物生长及动力学

利用焊点间距为100 μm,高度约为45 μm,成分为Sn-3.0Ag-0.5Cu (wt％) (SAC305)的倒装硅芯片与BT树脂基板组装互连,分别在150、125和100℃条件下时效至650 h.研究时效过程中界面主要金属间化合物的生长,结合经验功率定律及阿伦斯公式计算基板侧Cu焊盘界面IMC生长的动力学参数,对IMC的生长动力学探讨.结果表明,在互连回流后,双侧焊盘界面主要IMC为(Cu,Ni)6Sn5.在时效前100 h,(Cu,Ni)6Sn5生长速率较快;而在随后的时效过程中,随时效时间的增加生长速率逐渐降低.界面主要金属间化合物(Cu,Ni)6Sn5生长动力学研究结果可知:150、125以及100℃条件下时间参数分别为2.61、2.35和2.18,界面(Cu,Ni)6Sn5的生长激活能为67.89 kJ/mol.     

Ni-CNTs增强颗粒对Sn58Bi-0.1Er焊点组织与力学性能的影响

采用真空熔炼方法制备了不同Ni-CNTs含量的Sn58Bi-0.1Er钎料合金,研究不同Ni-CNTs含量对Sn58Bi-0.1Er复合钎料在Cu基板上的润湿性能的影响,并对不同Ni-CNTs含量下接头界面处金属间化合物的组织形貌及接头的剪切性能进行了分析.结果表明,当Ni-CNTs增强颗粒的添加为0.01％～0.05...     

3D封装芯片焊点可靠性有限元分析

选择工业中广泛使用的Sn,Sn3.9Ag0.6Cu钎料作为三维封装芯片键合焊点材料,采用ANSYS有限元软件建立三维封装模型,基于Garofalo-Arrhenius本构方程,进行-55～125°C热循环模拟,并通过田口法探讨封装结构和工艺参数对焊点的可靠性影响.结果表明,Cu柱与焊点接触处是整个结构的薄弱区域,在IM...     

Nd对Sn-3.8Ag-0.7Cu/Cu焊点高温可靠性的影响

通过研究150℃时效条件下Sn-3.8Ag-0.7Cu-0.05Nd/Cu焊点剪切力变化和界面微观结构演变,探讨稀土元素Nd对焊点高温可靠性的影响及其影响机制.结果表明,不同时效时间后Sn-3.8Ag-0.7Cu-0.05Nd/Cu焊点剪切力明显高于Sn-3.8Ag-0.7Cu/Cu焊点,且时效过程中Sn-3.8Ag-...     

Pb-free solders for flip-chip interconnects

A variety of lead-free solder alloys were studied for use as flip-chip interconnects including Sn-3.5Ag, Sn-0.7Cu, Sn-3.8Ag-0.7Cu, and eutectic Sn-37Pb as a baseline. The reaction behavior and reliability of these solders were determined in a flip-chip configuration using a variety of under-bump metallurgies (TiW/Cu, electrolytic nickel, and electroless Ni-P/Au). The solder micro-structure and intermetallic reaction products and kinetics were determined. The Sn-0.7Cu solder has a large grain structure and the Sn-3.5Ag and Sn-3.8Ag-0.7Cu have a fine lamellar two-phase structure of tin and Ag₃Sn. The intermetallic compounds were similar for all the lead-free alloys. On Ni, Ni₃Sn₄ formed and on copper, Cu₆Sn₅Cu₃Sn formed. During reflow, the intermetallic growth rate was faster for the lead-free alloys, compared to eutectic tin-lead. In solidstate aging, however, the interfacial intermetallic compounds grew faster with the tinlead solder than for the lead-free alloys. The reliability tests performed included shear strength and thermomechanical fatigue. The lower strength Sn-0.7Cu alloy also had the best thermomechanical fatigue behavior. Failures occurred near the solder/intermetallic interface for all the alloys except Sn-0.7Cu, which deformed by grain sliding and failed in the center of the joint. Based on this study, the optimal solder alloy for flip-chip applications is identified as eutectic Sn-0.7Cu. Editor’s Note: A hypertext-enhanced version of this article can be found at www.tms.org/pubs/journals/JOM/0106/Frear-0106.html For more information, contact D.R. Frear, Interconnect Systems Laboratories, Motorola, Tempe, AZ 85284; (480) 413-6655; fax (480) 413-4511; e-mail darrel.frear@motorola.com.     

Sn-3.0Ag-0.5Cu-XCo钎焊接头金属间化合物层电迁移现象的研究

研究了以Co颗粒为增强相的Sn3.0Ag0.5Cu钎料合金接头的电迁移特性。结果表明,50℃、104A/cm2条件下直至16d,Sn3.0Ag0.5Cu-0.2Co钎料接头无明显电迁移现象产生。将温度提高至150℃后,接头正、负极处金属间化合物(IMC)层的厚度产生明显差异,即电子风力引发的‘极化效应’。Sn3.0Ag0.5Cu钎料接头在通电1d和3d后,正、负极处IMC层的结构发生了相反的变化。而Sn3.0Ag0.5Cu-0.05Co接头在通电3d后,负极处产生明显裂纹。此外,Co的引入有效地缓解了IMC层的生长趋势,提高了接头显微组织的稳定性。     

Improving the shear strength of Sn–Ag–Cu–Ni/Cu–Zn solder joints via modifying the microstructure and phase stability of Cu–Sn intermetallic compounds

This study focuses on the correlation between high-speed impact tests and the interfacial reaction in Sn-3.0Ag-0.5Cu-0.1Ni/Cu (wt%) and Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joints. Adding Ni into the Sn–Ag–Cu solder alters the interfacial morphology from scallop type to layer type and exhibits high shear strength after reflow in both solder joints. However, the shear strength of Sn-3.0Ag-0.5Cu-0.1Ni/Cu solder joints degrades significantly after thermal aging at 150 °C for 500 h. It is notable that Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joints still present higher shear strength after aging at 150 °C. The weakened shear strength in Sn-3.0Ag-0.5Cu-0.1Ni/Cu solder joints is due to stress accumulation in the interfacial (Cu,Ni)₆Sn₅ compound induced by the phase transformation from a high-temperature hexagonal structure (η-Cu₆Sn₅) to a low-temperature monoclinic structure (η'-Cu₆Sn₅). However, doping small amounts of Zn into (Cu,Ni)₆(Sn,Zn)₅ can inhibit the phase transformation during thermal aging and maintain strong shear strength. These experiments demonstrate that Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joints can act as a stable connection in the micro-electronic packaging of most electronic products at their average working temperatures.     

Influence of rapid solidification on Sn–8Zn–3Bi alloy characteristics and microstructural evolution of solder/Cu joints during elevated temperature aging

The effects of rapid solidification on the microstructure and melting behavior of the Sn–8Zn–3Bi alloy were studied. The evolution of the microstructural characteristics of the solder/Cu joint after an isothermal aging at 150 °C was also analyzed to evaluate the interconnect reliability. Results showed that the Bi in Sn–8Zn–3Bi solder alloy completely dissolved in the Sn matrix with a dendritic structure after rapid solidification. Compared with as-solidified Sn–8Zn–3Bi solder alloy, the melting temperature of the rapid solidified alloy rose to close to that of the Sn–Zn eutectic alloy due to the extreme dissolution of Bi in Sn matrix. Meanwhile, the adverse effect on melting behavior due to Bi addition was decreased significantly. The interfacial intermetallic compound (IMC) layer of the solder/Cu joint was more compact and uniform. Rapid solidification process obviously depressed the formation and growth of the interfacial IMC during the high-temperature aging and improved the high-temperature stability of the Sn–8Zn–3Bi solder/Cu joint.     

Properties analysis of a new type of solder paste SACBN07

In this work,the wettability,aging and shear properties of a new type of lead-free solder paste Sn-07Ag-05Cu + BiNi (SACBN07) was investigated by conducting a series of comparison experiments with SAC305 and SAC0307 solder paste.The results show that weuability of SACBN07 is almost equal to SAC305,and better than that of SAC0307 solder paste.The thickness of intermetallic compound (IMC) layer in SACBN07/Cu is lower than that of other two types of solder joint after aging.And Cu3Sn layer of SACBN07/Cu is thinner than that of SAC305 and SAC0307.In addition,the SACBN07 solder joints perform the best shear strength among these three types of solder pastes.