LED器件热阻测试仪的研制

本文介绍了LED热阻测试仪的工作原理、实现方法、技术指标以及使用效果.主要研究测试系统中的程控时序控制和多路数据采集、高精度器件壳温测量与控制等技术,设计开发了LED热阻测试仪和配套恒温夹具.LED热阻测试仪的研制解决了国内LED生产和使用中迫切需要解决的热阻测试问题.对于提高我国功率LED产品的可靠性,填补国内LED热阻测试的空白,具有重要意义.     

井下参数测试仪的研制

介绍了一种基于AT89C55单片机和实时内核RTX-51的井下参数测试仪,实现了对油井井下地质参数的测试,它同时具有参数设置、LED(发光二极管)实时数据显示、绘图仪接口、串行通信等功能。实现了测控过程的自动化、测量结果的数字化,提高了井下地质参数测量的精确度,降低了操作人员的劳动强度。     

基于.NET平台的LED光电参数测量系统设计与实现

提高LED的光学和电学参数的测量精度与效率对于确保LED的产品质量、满足市场需求具有重要的意义.根据企业中LED的实际生产情况,给出了一种基于.NET平台的LED/板上芯片(COB)光电参数快速测量系统的软硬件设计方案.该系统通过可替换结构实现LED/COB多规格测量;通过与上层生产过程执行系统(MES)系统或企业资源规划(ERP)系统数据交互实现在线测量;通过设备各个独立运动部件的协同配合实现快速测量;通过光谱仪中线性电荷耦合元件(CCD)各个像素与LED波长的对应关系,实现了全光谱同时测量;通过对测量数据的处理,实现了基于LED光电和色度参数的自动分选.实验验证结果表明,系统能够有效提高LED光电参数测量的精度与效率.     

基于VC＋＋的LED光电参数测试系统设计

本文针对发光二极管（LED）生产的实际需求,给出了新型LED光电参数测试系统的软硬件设计方案。利用功能强大的AVR单片机,结合高精度数控恒流源技术、光电转换处理技术、USB通信技术以及VC＋＋技术,实现了LED光电参数的在线测试,并提供了与分选设备通信的接口,适用于工业生产流水线上。实践证明,本测试系统实现了快速、准确、可靠的测试,以及测试自动化,提高了工作效率。     

一种测试仪的功率测量自动校准设计与实现

本文描述了基于Windows编程工具VC++设计的一款界面控制软件,通过远程自动控制KEYSIGHT信号发生器,实现了一种测试仪设备的功率测量自动化校准.经过实践证明,该技术极大的提高测量仪器自身的校准效率和准确性,可以广泛应用于测试测量仪器的研发和批生产过程.     

无线通信系统技术指标的自动测量

在组建通信系统前或在通信系统工作过程中，需要在某些时间对系统设备指标或空中无线辐射进行测量，如果这些测试工作使用计算机替代人工操作，交大大提高工作效率，提高测量的可靠性，地以无线电综合测试仪为背景，建立系统，实现测量自动化作一介绍。     

多功能LED参数测试系统的研制

针对半导体发光二极管(LED)参数检测仪器智能化程度不高、功能单一、效率低等缺陷,利用功能强大的C8051F020单片机,结合高精度数控恒流/恒压电源技术,光电转换处理技术和虚拟仪器技术,实现了LED的电参数、色参数和空间参数等功能的实时测量.参数测试实验表明,该LED参数测试分析系统操作简单,测试效率高.     

功率MOSFET参数测试仪的设计

功率MOSFET参数测试仪是用来测试功率MOSFET电特性参数的仪器设备（如阈值电压、跨导等）。以单片机为核心,介绍功率MOSFET参数测试仪的原理、设计及实现,设计了电特性参数测试的具体电路,编写了测试控制程序,通过对设计出的测试仪系统进行实验和调试,可以准确测量功率MOSFET的阈值电压、跨导、栅源漏电流、零栅压漏极电流及耐压。     

基于51单片机的手持绝缘电阻测试仪的设计

本文提出了一种基于51单片机绝缘电阻综合参数测试仪的设计方案.采用C8051为控制芯片,结合双积分检测电压的方法法,实现了对绝缘电阻的自动测量,测试数据可实时记录并通过LCD显示.通过该系统的开发,可以更大程度的提高绝缘电阻测量的自动化水平及测试范围.1.系统概述本文提出了基于C8051单片机的数字式绝缘电阻测试仪的设...     

安捷伦无线测试管理软件实现无线设备设计自动化、简化和加快无线设备设计

安捷伦科技的无线测试管理软件系列产品涵盖了cdma2000、IS-95、GPRS、GSM和AMPS等无线通信标准。在与Agilent 8960无线通信测试仪一起使用时，无线测试管理软件提供了一种快速简便的测量方式，而无需复杂的仪器控制和测量编程。通过快速简便的测试自动化功能，、无线设备开发人员可以获得确定和改进产品设计所需的数据，更快地使新的设计方案投入生产。据安捷伦无线设备产品部副总裁AlSchmidt介绍，通过无线测试管理软件，现在只需几个小时就可以完成过去一般需要几天才能完成的测量工作。该解决方案迅速实现了无线设备测试的自动化…     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Teleportation of an arbitrary unknown N-qubit entangled state under the controlling of M controllers

A new quantum protocol to teleport an arbitrary unknown N-qubit entangled state from a sender to a fixed receiver under M controllers(M < N) is proposed. The quantum resources required are M non-maximally entangled Greenberger-Home-Zeilinger (GHZ) state and N-M non-maximally entangled Einstein-Podolsky-Rosen (EPR) pairs. The sender performs N generalized Bell-state measurements on the 2N particles. Controllers take M single-particle measurement along x-axis, and the receiver needs to introduce one auxiliary two-level particle to extract quantum information probabilistically with the fidelity unit if controllers cooperate with it.     

Diode-end-pumped Nd:YVO4/LBO lasers with 4.2W continuous-wave output at 457 nm

A continuous-wave (CW) 457 nm blue laser operating at the power of 4.2 W is demonstrated by using a fiber coupled laser diode module pumped Nd: YVO4 and using LBO as the intra-cavity SHG crystal With the optimization of laser cavity and crystal parameters, the laser operates at a very high efficiency. When the pumping power is about 31 W, the output at 457nm reaches 4.2 W, and the optical to optical conversion efficiency is about 13.5% accordingly. The stability of the out putpower is better than 1.2% for 8 h continuously working.     

Call for Papers

正Wireless Body-area Networks The last decade has witnessed the convergence of three giant worlds:electronics,computer science and telecommunications.The next decade should follow this convergence in most of our activities with the generalization of sensor networks.In particular with the progress in medicine,people live longer and the aging of population will push the development of wireless personal networks     

Call for Papers—Feature Topic,Vol.12,No.7,2015

正Information Centric Networking Information-Centric Networking(ICN) is an emerging direction in Future Internet architecture research,gaining significant tractions among academia and industry.Aiming to replace the conventional host-to-host communication model by a data-centric model,ICN treats data content as the first