共查询到20条相似文献,搜索用时 109 毫秒
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Te-Hua Fang 《Microelectronics Journal》2004,35(9):701-707
The machining characteristics of the nanolithographic process were studied using atomic force microscopy. Nano-oxidation experiments were conducted to investigate the influence that the different experimental parameters had on height, width and the growth rate of the nanowires and nanodots as well as upon the machining efficiency. The experimental parameters included; the applied voltage, humidity, scanning oxidization time, crystalline orientation and the shape of the probe tip. The results indicated that as the oxidization time and the applied voltage were increased, the nanowire's height and width also increased. `Also, a nanowire with increased height was produced when the humidity was higher. Finally as the probe tip began to wear and the tip's radius increased, a nanowire with a higher height and width was produced. 相似文献
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原子力显微镜在聚合物溶液结构研究中的应用 总被引:1,自引:0,他引:1
驱油用水溶性聚合物溶液的应用性能由其聚合物溶液的微观结构所决定,因此在驱油用聚合物合成及配方研究中迫切需要研究其溶液的微观结构。本文使用原子力显微镜(AFM)、环境扫描电镜(ESEM)和透射电镜(TEM)观察了水溶液中聚合物(HAWSP,AP-P4)的微观结构。研究发现常温常压下原子力显微镜观察到的聚合物网络结构图案清晰,边界分辨率高。透射电镜观察到的聚合物网络结构较模糊且网络结构有断裂现象。环境扫描电镜观测到的网络结构尺寸大小是AFM观测到的几倍甚至是十几倍。动态光散射(dynamic light scattering,DLS)结果证明AFM和TEM所观测到的聚合物结构最接近于真实结构。结果表明使用原子力显微镜在观察水溶性聚合物类样品时,能够较真实反映其微观结构。 相似文献
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The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications. The distance between cantilever tip and sample surface in non-contact AFM is a time-varying parameter even for a fixed sample height, and typically difficult to identify. A remedy to this problem is to directly identify the sample height in order to generate high-precision atomic-resolution images. For this, the microcantilever (which forms the basis for the operation of AFM) is modeled as a single mode approximation and the interaction between the sample and cantilever is derived from a van der Waals potential. Since in most practical applications only the microcantilever deflection is accessible, we will use merely this measurement to identify the sample height. In most non-contact AFMs, cantilevers with high-quality factors are employed essentially for acquiring high-resolution images. However, due to high-quality factor, the settling time is relatively large and the required time to achieve a periodic motion is long. As a result, identification methods based on amplitude and phase measurements cannot be efficiently utilized. The proposed method overcomes this shortfall by using a small fraction of the transient motion for parameter identification, so the scanning speed can be increased significantly. Furthermore, for acquiring atomic-scale images of atomically flat samples, the need for feedback loop to achieve setpoint amplitude is basically eliminated. On the other hand, for acquiring atomic-scale images of highly uneven samples, a simple PI controller is designed to track the desired constant sample height. Simulation results are provided to demonstrate the feasibility of the approach for both sample height identification and tracking the desired sample height. 相似文献
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原子力显微镜( AFM)广泛应用于纳米尺度的成像和操纵,其较低的扫描速度严重影响了测试的效率。为此,许多研究人员通过设计先进的Z向控制算法改善系统的响应速度,达到提高扫描速度的目的,而先进的控制算法的实现首先需要对AFM的Z向反馈系统进行建模。为此,本文提出一种简单准确的系统辨识方法,通过对系统输入输出数据的分析,得到AFM的Z向反馈系统模型,并利用该模型验证先进控制算法的控制性能。实验表明该方法能为先进控制算法的设计和实现建立有效的仿真模型。 相似文献
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Zhiqin Zhong Guojun Zhang Shuya Wang Liping Dai 《Materials Science in Semiconductor Processing》2013,16(6):2028-2031
The authors have investigated the effects of different annealing temperatures in Ar atmosphere on the SiO2/4H-SiC interfaces by spectroscopic ellipsometry (SE) and atomic force microscopy (AFM). There is a strong correlation between the annealing temperatures and the quality of SiO2/4H-SiC interface. Annealing at 600 °C can significantly improve the quality of SiO2/4H-SiC interface with no transition layer. The reasons for such improvement in the quality of the SiO2/4H-SiC interface after moderate temperature annealing at 600 °C may be explained by the formation and consumption of carbon clusters and silicon oxycarbides during annealing. 相似文献
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Te-Hua Fang 《Microelectronics Journal》2004,35(7):595-599
The nanoindentation experiment was carried out to estimate nanomechanical characteristics of polycarbonate polymer films. Hardness, effective elastic modulus and contact stress-strain rate curve were obtained. The results showed that the effective elastic modulus and the hardness decreased as the applied load was increased. As the hold time was increased, the effective elastic modulus and the hardness also decreased. Furthermore, decreasing the loading rate also decreased the effective elastic modulus and the hardness. A power-law creep equation was obtained. When taking a log coordinate to the equation, the contact stress increased as the contact strain rate increased and has a linear appearance. 相似文献
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G. -R. Yang Y. -P. Zhao Jan M. Neirynck Shyam P. Murarka Ronald J. Gutmann 《Journal of Electronic Materials》1997,26(8):935-940
The surface quality of parylene-N(PA-N) films, as determined by x-ray photoelectron spectroscopy (XPS) and atomic force microscopy
(AFM), after chemical-mechanical polishing (CMP), is influenced mostly by two factors: quality of the as-deposited film and
the slurry composition. The higher the quality of the as-deposited film (more specifically, less oxygen content), the higher
the quality of the polished film. The XPS and AFM results show that PA-N film polished in 1% A12O3 abrasive (0.3 Μm particles), NH4OH (2% by volume), and water, has better quality compared to the other slurries investigated. With high quality PA-N films,
the film surface quality affected by CMP is relatively independent of polishing time, indicating that changes in surface chemistry
occur in the initial seconds of polishing. 相似文献
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《Mechatronics》2015
A macro-scale atomic force microscope (macro-AFM) has been designed and used for teaching precision mechatronics. The macro-AFM uses a novel electromagnetic self-sensing self-actuating probe. It operates in frequency-modulation AFM (FM-AFM) mode with intermittent contact. The AFM has an imaging volume of 250 mm × 40 mm × 1 mm with a resolution of about 1 μm at 1 Hz measurement bandwidth. The macro-AFM is simple and relatively inexpensive to build. It is scaled to make motion visible to the eye and is robust for a lab environment, all of which make it an affordable and effective educational tool. The macro-AFM is used in Mechatronics (2.737), a graduate level course at MIT, where in a series of 11 laboratory exercises, the students assembled and programmed the AFM system. This article provides the design and theory used for making and controlling the macro-AFM, as well as experimental results. 相似文献
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基于隧道电流检测方式的原子力显微镜纳米检测系统设计 总被引:2,自引:0,他引:2
原子力显微镜(AFM)是当前进行材料表面微观形貌观察及分析的强有力工具之一。本文主要介绍一种隧道显微镜(STM)检测方式的原子力显微镜纳米检测系统(AFM.IPC-208B),该AFM系统设计是在STM.IPC-205B系统设计的基础上,采用隧道电流工作方式,将STM与AFM功能组合兼容。文章详细阐述了AFM.IPC-208B系统的设计原理、镜体、扫描控制以及数据采集。新设计的AFM.IPC-208B系统仍具有0.1nm的分辨率,检测范围为0~2mm×2mm,系统操作简易,工作效率高,与原STM.IPC-205B系统兼容,工作性能稳定可靠。 相似文献
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水提女贞子粗多糖经过纯化得到三种多糖分别为LL-Ⅰ1,LL-Ⅰ2,LL-Ⅲ。用气相色谱对女贞子多糖组分进行分析,用原子力显微镜对其结构形态进行观测,结果表明,LL-Ⅰ1,含有鼠李糖/核糖、阿拉伯糖、甘露糖、葡萄糖和半乳糖;LL-Ⅰ2,含有鼠李糖/核糖和葡萄糖;LL-Ⅲ含有鼠李糖/核糖、阿拉伯糖、甘露糖、葡萄糖和半乳糖。原子力显微镜分析表明LL-Ⅰ1,LL-Ⅰ2,LL-Ⅲ分别不同程度的聚集成股,且具有螺旋结构。这种现象可能与聚集体的分子间相互作用和糖链间的氢键缔合有关。 相似文献
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C. Bresolin M. Pesaturo P. Paruzzi V. Soncini D. Erbetta M. Bigi 《Microelectronic Engineering》2003,70(2-4):196-200
An atomic force microscope (AFM) was used to study anomalies in the titanium disilicide formation of narrow (0.26 μm) poly lines at the edge of n+ and p+ implant masks; a special test structure was designed both for morphological and electrical evaluations. On poly lines along the borders of the n+ mask, before titanium deposition, the AFM was able to detect some material build-up exactly on the locations where the silicide is severely reduced in thickness or interrupted, as inferred by electrical data and SEM analysis on finished samples. A carbon (or nitrogen) atom knock-on during the arsenic implant was invoked to explain the observed local hindering of the silicide formation. 相似文献