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1.
Two different grain boundary engineering processing routes for type 304 austenitic stainless steel have been compared. The processing routes involve the application of a small level of strain (5%) through either cold rolling or uni-axial tensile straining followed by high-temperature annealing. Electron backscatter diffraction and orientation mapping have been used to measure the proportions of Σ3n boundary types (in coincidence site lattice notation) and degree of random boundary break-up, in order to gain a measure of the success of the two types of grain boundary engineering treatments. The distribution of grain boundary plane crystallography has also been measured and analyzed in detail using the five-parameter stereological method. There were significant differences between the grain boundary population profiles depending on the type of deformation applied. 相似文献
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The present paper reports a comparative analysis of Σ3 (in the coincidence site lattice notation) grain boundary types, in two grain boundary engineered brass specimens, by use of electron backscatter diffraction (EBSD) data coupled to the measurement of boundary traces in a single section. Although most of the data were analysed using the new single‐section technique, an analysis of boundary plane orientations in three dimensions was made in a subset of the data in order to validate the single section methodology. The single‐section trace analysis procedure, coupled with EBSD, is a viable and robust tool for analysis of Σ3 grain boundary planes. The procedure provides data which suggest that part of the enhanced strain‐to‐failure in specimen B compared to specimen A is the result of an increased proportion of mobile Σ3 boundaries, i.e. those which are displaced from the {111} symmetrical tilt configuration. 相似文献
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Mitra L. Taheri Jason T. Sebastian Bryan W. Reed David N. Seidman Anthony D. Rollett 《Ultramicroscopy》2010
A site-specific method for measuring solute segregation at grain boundaries in an Aluminum alloy is presented. A Σ7(Σ7=38°〈1 1 1〉) grain boundary (GB) in an aluminum alloy (Zr, Cu as main alloying elements) was evaluated using site-specific Local Electrode Atom Probe (LEAP). A sample containing a Σ7 GB was prepared by combining electron backscatter diffraction (EBSD) and focused ion beam (FIB) milling to locate the GB of interest and extract a specimen. Its composition was determined by LEAP, and compared to a general high angle GB (HAGB). Zr was the only alloying element present in the Σ7 GB, whereas the general HAGB contained both Cu and Zr. This site-specific LEAP method was found to be an accurate method for measuring GB segregation at specific GB misorientations. The method has advantages over other methods of measuring chemistry at GBs, such as spectroscopy, in that GB structure can be assessed in three dimensions. 相似文献
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'Five-parameter' analysis of grain boundary networks by electron backscatter diffraction 总被引:1,自引:0,他引:1
VALERIE RANDLE 《Journal of microscopy》2006,222(2):69-75
This paper describes state‐of‐the‐art analysis of grain boundary populations by EBSD, with particular emphasis on advanced, nonstandard analysis. Data processing based both on misorientation alone and customised additions which include the boundary planes are reviewed. Although commercial EBSD packages offer comprehensive data processing options for interfaces, it is clear that there is a wealth of more in‐depth data that can be gleaned from further analysis. In particular, determination of all five degrees of freedom of the boundary population provides an exciting opportunity to study grain boundaries by EBSD in a depth that was hitherto impossible. In this presentation we show ‘five‐parameter’ data from 50 000 boundary segments in grain boundary engineered brass. This is the first time that the distribution of boundary planes has been revealed in a grain boundary engineered material. 相似文献
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Electrodeposited nanocrystalline materials are expected to have a homogeneous grain size and a narrow grain size distribution. In Co–Ni electrodeposited films, however, under certain conditions an undesired columnar grain structure is formed. Fully automated three‐dimensional (3D) orientation microscopy, consisting of a combination of precise material removal by focussed ion beam and subsequent electron backscatter diffraction (EBSD) analysis, was applied to fully characterize the grain boundaries of these columnar grains in order to gain further understanding on their formation mechanisms. Two‐dimensional orientation microscopy on these films indicated that the development of columnar grains could be related to the formation of low‐energy triple junctions. 3D EBSD allowed us to verify this suggestion and to determine the boundary planes of these triples. The triplets are formed by grain boundaries of different quality, a coherent twin on the {} plane, an incoherent twin and a large‐angle grain boundary. These three boundaries are related to each other by a rotation about the 〈〉 direction. A second particularity of the columnar grains is the occurrence of characteristic orientation gradients created by regular defects in the grain. Transmission electron microscopy was applied to investigate the character of the defects. For this purpose, a sample was prepared with the focussed ion beam from the last slice of the 3D EBSD investigation. From the TEM and 3D EBSD observations, a growth mechanism of the columnar grains is proposed. 相似文献
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An in situ annealing stage has been developed in‐house and integrated in the chamber of a Scanning Electron Microscope equipped with an Electron BackScattered Diffraction system. Based on the Joule effect, this device can reach the temperature of 1200°C at heating rates up to 100°C/s, avoiding microstructural evolutions during heating. A high‐purity tantalum deformed sample has been annealed at variable temperature in the range 750°C–1030°C, and classical mechanisms of microstructural evolutions such as recrystallization and grain coarsening phenomena have been observed. Quantitative measurements of grain growth rates provide an estimate of the mean grain boundary mobility, which is consistent with the value estimated from physical parameters reported for that material. In situ annealing therefore appears to be suited for complementing bulk measurements at relatively high temperatures, in the context of recrystallization and grain growth in such a single‐phase material. 相似文献
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V. RANDLE 《Journal of microscopy》1999,195(3):226-232
Applications of electron backscatter diffraction (EBSD), also known as backscatter Kikuchi diffraction in the scanning electron microscope (SEM) are first and foremost microtexture and grain boundary misorientation analysis on a single polished section in the specimen. A more subtle and revealing approach to analysis of these data is to use EBSD to probe the orientations of planar surfaces, i.e. facets, which bound crystals. These surfaces include: • grain or phase boundaries • fractures • cracks It is of great interest to know the crystallography of such facets since it provides a key to understanding the physical properties of them.
As far as investigation methodology is concerned, surfaces or facets associated with polycrystals are of two types: exposed or unexposed. Exposed facets, such as a fracture surface, can be viewed directly in the SEM, whereas unexposed facets, such as a grain boundary, are usually revealed as an etched trace on a polished surface. Photogrammetric methods can be used to obtain the positional orientation of an exposed facet, and the crystallographic orientation is obtained either directly from the surface or by indirect sectioning. Calibrated sectioning is required to obtain the equivalent parameters for an internal surface. The present paper compares the methods for obtaining and interpreting the crystallography of facets, with illustrations from several materials. 相似文献
As far as investigation methodology is concerned, surfaces or facets associated with polycrystals are of two types: exposed or unexposed. Exposed facets, such as a fracture surface, can be viewed directly in the SEM, whereas unexposed facets, such as a grain boundary, are usually revealed as an etched trace on a polished surface. Photogrammetric methods can be used to obtain the positional orientation of an exposed facet, and the crystallographic orientation is obtained either directly from the surface or by indirect sectioning. Calibrated sectioning is required to obtain the equivalent parameters for an internal surface. The present paper compares the methods for obtaining and interpreting the crystallography of facets, with illustrations from several materials. 相似文献
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纳米碳化硅颗粒强化氧化铝基陶瓷材料机理的研究现状 总被引:1,自引:0,他引:1
综述和分析了纳米碳化硅颗粒强化氧化铝基陶瓷材料的强韧化机制,认为由沿晶断裂到穿晶断裂的断裂模式的改变不是使复相陶瓷材料强韧化的机制之一,而恰恰是其韧性得不到显著提高的重要原因,并由此提出了有关复相材料新的设计思路。 相似文献
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Grain boundary migration is an important mechanism of microstructural modification both in rocks and in metals. Combining detailed cathodoluminescence (CL) and electron backscatter diffraction (EBSD) analysis offers the opportunity to relate directly changes in crystallographic orientation to migrating boundaries. We observe the following features in naturally heated quartz grains from the thermal aureole of the Ballachulish Igneous Complex (Scotland, U.K.): (a) propagation of substructures and twin boundaries in swept areas both parallel and at an angle to the growth direction, (b) development of slightly different crystallographic orientations and new twin boundaries at both the growth interfaces and within the swept area and (c) a gradual change in crystallographic orientation in the direction of growth. All these features are compatible with a growth mechanism in which single atoms are attached and detached both at random and at preferential sites, i.e. crystallographically controlled sites or kinks in boundary ledges. Additionally, strain fields caused by defects and/or trace element incorporation may facilitate nucleation sites for new crystallographic orientations at distinct growth interfaces but also at continuously migrating boundaries. This study illustrates the usefulness of combined CL and EBSD in microprocess analysis. Further work in this direction may provide detailed insight into both the mechanism of static grain growth and the energies and mobilities of boundaries in terms of misorientation and grain boundary plane orientation. 相似文献
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ANQI WANG IAN P. JONES GABRIEL LANDINI JUNFA MEI YAU Y. TSE YUE X. LI LINNAN KE YUANLI HUANG LI LIU CHUNREN WANG RACHEL L. SAMMONS 《Journal of microscopy》2018,270(1):53-63
The application of secondary electron (SE) imaging, backscattered electron imaging (BSE) and electron backscattered diffraction (EBSD) was investigated in this work to study the bacterial adhesion and proliferation on a commercially pure titanium (cp Ti) and a Ti6Al4V alloy (Ti 64) with respect to substrate microstructure and chemical composition. Adherence of Gram‐positive Staphylococcus epidermidis 11047 and Streptococcus sanguinis GW2, and Gram‐negative Serratia sp. NCIMB 40259 and Escherichia coli 10418 was compared on cp Ti, Ti 64, pure aluminium (Al) and vanadium (V). The substrate microstructure and the bacterial distribution on these metals were characterised using SE, BSE and EBSD imaging. It was observed that titanium alloy‐phase structure, grain boundaries and grain orientation did not influence bacterial adherence or proliferation at microscale. Adherence of all four strains was similar on cp Ti and Ti 64 surfaces whilst inhibited on pure Al. This work establishes a nondestructive and straight‐forward statistical method to analyse the relationship between microbial distribution and metal alloy structure. 相似文献
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The misorientation relative to the average orientation of a grain and the point-to-point relative misorientation along a line across a moderately cold deformed grain, calculated from an electron backscatter diffraction (EBSD) dataset, are analysed in detail by visualizing both the misorientation angle and the misorientation axis. The significance of monitoring the misorientation axis is illustrated by an example of a grain subdivided into a misorientation band structure. A new technique to visualize the subdivision structure by assigning colours to misorientations in such a way that the contrast is maximized within a grain is introduced and discussed. Furthermore, some methods for grain boundary reconstruction from EBSD datasets are compared with the map of the confidence index in order to provide a validation of the accuracy of these methods. 相似文献
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T. WALTHER 《Journal of microscopy》2004,215(2):191-202
A new technique of analytical transmission electron microscopy called ConceptEM has been developed for determining highly accurately small amounts of solute or dopant atoms incorporated into well‐defined planar defects such as stacking faults, grain boundaries or interfaces. The method is based on recording series of analytical spectra taken with different electron beam diameters on the same position centred above a defect that is orientated either edge‐on or slightly inclined with respect to the electron beam. It can be applied to energy‐dispersive X‐ray spectroscopy or electron energy‐loss spectroscopy and necessitates only a nano‐probe modus but no scanning unit. Reliability and accuracy have been tested numerically under various conditions using simulations for a specific geometry, as a function of specimen thickness, material, acceleration voltage, collection angle, random beam displacements and solid solubility. The accuracy has been found to be substantially better (by factors of 5–10) than that of any other current standard technique based on single measurements. Our calculations suggest an accuracy in the determination of the Gibbsian solute excess at a special grain boundary down to ±1% of a monolayer, i.e. around ±0.1 atoms nm?2 under typical experimental conditions, with a maximum error about twice as large. The parameter limiting a straightforward analysis is found to be the solid solubility, which itself, however, can be measured accurately by the technique so that it can be taken into account quantitatively and the above‐stated precision is retained. 相似文献
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2Cr13活塞杆经过亚温淬火、回火调质后,采用580℃保温3~4h空冷或炉冷的稳定化工艺,基本上可以消除应力,并且没有明显的第二类回火脆性的产生,从而保证了2Cr13活塞杆高频淬火时减小弯曲量,避免感应器放电现象熔化活塞杆。 相似文献
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J. F. Watts 《Journal of microscopy》1985,140(2):243-260
The basic principles of X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy are described and their relative advantages as analysis methods for ceramic materials are reviewed. Their application in ceramics technology is illustrated by examples taken from the fields of catalysis and mineralogy. In particular, attention is drawn to recent developments of XPS which make it especially attractive for the study of ceramic materials. These include quantitative application of the X-ray photoelectron diffraction effect to layered, single crystal minerals; the development of higher energy X-ray sources for XPS, and the attendant study of the Sils–KLL Auger parameter as a probe of molecular and crystalline structure; and the analysis of small (?250 μm) surface features by XPS. 相似文献
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Grain boundary engineering has been proposed to increase the lifetime performance of sensitized austenitic stainless steel in aggressive environments. Increased microstructure resistance is typically associated with higher fractions of twin (Σ3) grain boundaries, but there is uncertainty about the properties and role of other boundaries. To develop predictive models for stress corrosion crack nucleation, more information is required about how grain boundary crystallography and the orientations of the grain boundary plane and its surrounding grains affect crack development. Digital image correlation combined with electron backscatter diffraction has been used to characterize the microstructure and to observe, in situ , the nucleation and propagation of short stress corrosion cracks in thermo-mechanically processed type 304 stainless steel. The crack path and its growth rate have been determined and are found to be influenced by the microstructure. 相似文献