Influence of defects on the photoluminescence kinetics in GaN/AlN quantum-dot structures

The influence of defects in the AlN barrier on photoluminescence decay after pulse excitation is studied for structures with GaN quantum dots in an AlN matrix. For these quantum-dot structures, it is found that the initial part of the decay curves corresponds to fast photoluminescence decay. Comparison of the photoluminescence-decay curves for the GaN/AlN quantum-dot structures and AlN layers without quantum dots shows that fast decay is defined by the contribution of the photoluminescence band related to defects in the AlN matrix.     

Exciton spin dynamics in zinc-blende GaN/AlN quantum dots: Temperature dependence

The exciton spin alignment is measured in an ensemble of self-organized cubic GaN/AlN quantum dots. By picosecond time-resolved photoluminescence experiments, we show that the exciton linear polarization does not decay with time from 20 to 300 K.     

Optical properties of wurtzite GaN/AlN quantum dots grown on non-polar planes: The effect of stacking faults in the reduction of the internal electric field

The optical emission of non-polar GaN/AlN quantum dots has been investigated. The presence of stacking faults inside these quantum dots is evidenced in the dependence of the photoluminescence with temperature and excitation power. A theoretical model for the electronic structure and optical properties of non-polar quantum dots, taking into account their realistic shapes, is presented which predicts a substantial reduction of the internal electric field but a persisting quantum confined Stark effect, comparable to that of polar GaN/AlN quantum dots. Modeling the effect of a 3 monolayer stacking fault inside the quantum dot, which acts as zinc-blende inclusion into the wurtzite matrix, results in an additional 30% reduction of the internal electric field and gives a better account of the observed optical features.     

Reprint of: Optical properties of wurtzite GaN/AlN quantum dots grown on non-polar planes: The effect of stacking faults in the reduction of the internal electric field

The optical emission of non-polar GaN/AlN quantum dots has been investigated. The presence of stacking faults inside these quantum dots is evidenced in the dependence of the photoluminescence with temperature and excitation power. A theoretical model for the electronic structure and optical properties of non-polar quantum dots, taking into account their realistic shapes, is presented which predicts a substantial reduction of the internal electric field but a persisting quantum confined Stark effect, comparable to that of polar GaN/AlN quantum dots. Modeling the effect of a 3 monolayer stacking fault inside the quantum dot, which acts as zinc-blende inclusion into the wurtzite matrix, results in an additional 30% reduction of the internal electric field and gives a better account of the observed optical features.     

Nonradiative recombination in GaN quantum dots formed in the AlN matrix

The mechanisms of temperature quenching of steady-state photoluminescence are studied for structures with hexagonal GaN quantum dots embedded in the AlN matrix. The structures are grown by molecular beam epitaxy. The study is conducted for structures with differently sized quantum dots, for which the peak of the photoluminescence band is in the range from 2.5 to 4.0 eV. It is found that the activation energy of thermal quenching of photoluminescence varies from 27 to 110 meV, as the quantum-dot height is decreased from 5 to 2 nm. A model is suggested to interpret the results. According to the model, the photo-luminescence signal is quenched because of the transfer of charge carriers from energy levels in the quantum dots to defect levels in the matrix.     

Giant piezoelectric effect in GaN self-assembled quantum dots

We observe in strained GaN self-assembled quantum dots grown on an AlN layer, a dramatic modification of the optical emission spectra as the dot size varies. In “large” quantum dots with an average height of 4.1 nm, the photoluminescence (PL) peak is centered at 2.95 eV, nearly 0.5 eV below the bulk GaN bandgap. We attribute this enormous redshift to a giant 5.5 MV cm⁻¹ piezoelectric field present in our dots. Temperature-dependent PL studies reveal the strongly zero-dimensional character of this QD system and are consistent with an intrinsic PL mechanism.     

The role of transport processes of nonequilibrium charge carriers in radiative properties of arrays of InAs/GaAs quantum dots

The results of time-resolved photoluminescence studies of heterostructures containing monolayer arrays of InAs/GaAs quantum dots are presented. A two-component time dependence of intensity of photoluminescence from the ground state of quantum dots, with characteristic times of the slow component up to hundreds of nanoseconds and those of rapid one several nanoseconds, is studied. It is shown that the slow component is determined by the transport of nonequilibrium charge carriers between the quantum dots. At low temperatures, the time of the slow component is determined by tunneling, and at high temperatures by thermal escape of nonequilibrium charge carriers. The ratio of the contributions of tunneling and thermal escape is determined by the degree of isolation of quantum dots. A theoretical model is constructed that describes the effect of the dynamics of carrier transport on the emergence and decay of the slow component of photoluminescence.     

Piezoelectric models for semiconductor quantum dots

The importance of fully coupled and semi-coupled piezoelectric models for quantum dots are compared. Differences in the strain of around 30% and in the electron energies of up to 30 meV were found possible for GaN/AlN dots.     

Visible InGaN/GaN Quantum-Dot Materials and Devices

General properties of III-V nitride-based quantum dots (QDs) are presented, with a special emphasis on InGaN/GaN QDs for visible optoelectronic devices. Stranski-Krastanov GaN/AlN dots are first discussed as a prototypical system. It is shown that the optical transition energies are governed by a giant quantum-confined Stark effect, which is the consequence of the presence of a large built-in internal electric field of several MV/cm. Then we move to InGaN/GaN QDs, reviewing the different fabrication approaches and their main optical properties. In particular, we focus on InGaN dots that are formed spontaneously by In composition fluctuations in InGaN quantum wells. Finally, some advantages and limitations of nitride laser diodes with active regions based on InGaN QDs are discussed, pointing out the requirements on dot uniformity and density in order to be able to exploit the expected quantum confinement effects in future devices.     

The effect of built-in electric field in GaN/AlGaN quantum wells with high AIN mole fraction

Spontaneous and piezoelectric polarization in hexagonal GaN/AlGaN heterostructures give rise to large built-in electric fields. The effect of the builtin electric field in GaN/Al_xGa_1−xN quantum wells was investigated for x=0.2 to 0.8 by photoluminescence studies. The quantum well structures were grown by molecular beam epitaxy on (0001) sapphire substrates. Cross-sectional transmission electron microscopy performed on the samples revealed abrupt interfaces and uniform layer thicknesses. The low temperature (4 K) photoluminescence peaks were progressively red-shifted due to the quantum confined Stark effect depending on the AlN mole fraction in the barriers and the thickness of the GaN quantum well. Our results verify the existence of very large built-in electric fields of up to 5 MV/cm in GaN/Al_0.8Ga_0.2N quantum wells.     

Effect of conjugation with biomolecules on photoluminescence and structural characteristics of CdSe/ZnS quantum dots

The photoluminescence and photoluminescence excitation spectra, the X-ray diffraction patterns, and the effect of conjugation with biomolecules upon these characteristics are studied for silanized CdSe/ZnS quantum dots. Along with the band of annihilating excitons in the quantum dots, the luminescence spectra exhibit emission associated with defects. It is established that the emission spectrum of defects involves at least two components. It is shown that the defects are located mainly at the small-sized quantum dots; the defects responsible for the long-wavelength component are located mainly at the quantum dots larger in size than the quantum dots, at which the defects responsible for the short-wavelength component are located. It is found that conjugation with biomolecules induces not only the blue shift of the excitonic band, but transformation of the emission spectra of defects and an increase in the contribution of defects to the luminescence spectrum as well. The changes observed in the emission spectrum of defects are attributed to the formation of certain emission centers. It is shown that, when conjugated with biomolecules, the quantum dots experience increasing compression strains. This effect is responsible for the blue shift of the luminescence band of the quantum dots.     

Specific features of photoluminescence properties of copper-doped cadmium selenide quantum dots

The effect of doping with copper on the photoluminescence properties of cadmium selenide quantum dots 4 nm in dimension is studied. The quenching of the excitonic photoluminescence band related to the quantum dots and the appearance of an impurity photoluminescence band in the near-infrared region are observed after doping of the quantum dots with copper. It is established that, on doping of the quantum dots, the photoluminescence kinetics undergoes substantial changes. The photoluminescence kinetics of the undoped quantum dots is adequately described by a sum of exponential relaxation relations, whereas the photoluminescence kinetics experimentally observed in the region of the impurity band of the copper-doped samples follows stretched exponential decay, with the average lifetimes 0.3–0.6 μs at the photon energies in the range of 1.47–1.82 eV. The experimentally observed changes in the photoluminescence properties are attributed to transformation of radiative centers in the quantum dots when doped with copper atoms.     

Efficiency droop in GaN LEDs at high injection levels: Role of hydrogen

Point defects in GaN and, in particular, their manifestation in the photoluminescence, optical absorption, and recombination current in light-emitting diodes with InGaN/GaN quantum wells are analyzed. The results of this analysis demonstrate that the wide tail of defect states in the band gap of GaN facilitates the trap-assisted tunneling of thermally activated carriers into the quantum well, but simultaneously leads to a decrease in the nonradiative-recombination lifetime and to an efficiency droop as the quasi-Fermi levels intersect the defect states with increasing forward bias. The results reveal the dominant role of hydrogen in the recombination activity of defects with dangling bonds and in the efficiency of GaN-based devices.     

Transport and Mobility Properties of Bulk Indium Nitride (InN) and a Two-Dimensional Electron Gas in an InGaN/GaN Quantum Well

We studied the transport and low-field mobility properties of bulk InN and a two-dimensional electron gas confined in an InGaN/GaN quantum well with regard to various parameters such as well width and interface roughness as a function of temperature. Since new material parameters for InN have been suggested by recent studies, the traditionally accepted and recently published parameter values for InN are used in our simulations and the results are compared. Mobility values in two and three dimensions are found from the steady-state drift velocities of carriers calculated using an ensemble Monte Carlo technique. Electron transport properties of bulk GaN and AlN are also presented and compared with bulk InN and InGaN/GaN quantum wells. The mobility of carriers in two dimensions is about 10,000 cm²/V s for low temperatures and in bulk InN increases significantly to a value of about 6,450 cm²/V s at room temperature when recently established material parameters are used.     

AlN/GaN/AlN heterostructures grown on Si substrate by plasma-assisted MBE for MSM UV photodetector applications

The AlN/GaN/AlN heterostructures were successfully grown on silicon substrate by plasma-assisted molecular beam epitaxy (MBE). High purity gallium (7N) and aluminum (6N5) were used to grow GaN and AlN, respectively. The structural and optical properties of the samples have been investigated by high-resolution X-ray diffraction (HR-XRD), photoluminescence (PL), Raman spectroscopy, transmission electron microscopy (TEM), selected area electron diffraction (SAED), dark field scanning transmission electron microscopy (DF STEM), and high-angle annular dark field scanning transmission electron microscopy (HAADF STEM). HR-XRD measurement showed that the sample has a typical diffraction pattern of hexagonal AlN/GaN/AlN heterostructures. Raman spectra revealed all four Raman-active modes, i.e., GaN-like E₂ (H), AlN-like A₁ (TO), AlN-like E₂ (H), and AlN-like A₁ (LO) inside the AlN/GaN/AlN heterostructures. Good thickness uniformity of the layers and high-quality hetero-structures without cracking were confirmed by TEM, SAED, DF STEM and HAADF STEM. The fabricated AlN/GaN/AlN heterostructures based metal-semiconductor-metal (MSM) for the UV photodetector shows a rise and fall of photoresponses, suggesting that the AlN/GaN/AlN heterostructures have good carrier transport and crystallinity properties.     

GaN growth on porous silicon by MOVPE

GaN films have been grown at 1050 °C on porous silicon (PS) substrates by metalorganic vapour phase epitaxy. The annealing phase of PS has been studied in temperature range from 300 to 1000 °C during 10 min under a mixture of ammonia (NH₃) and hydrogen (H₂). The PS samples were characterized after annealing by scanning electronic microscope (SEM). We observed that the annealing under the GaN growth conditions does not affect the porous structure.For the growth of the active GaN layer we used a thin AlN layer in order to improve wetting between GaN and PS/Si substrate. The growth of AlN and GaN films was controlled by laser-reflectometry. We estimated the porosity of PS samples from the evolution of the reflectivity signal during the AlN growth. The crystalline quality and surface morphology of GaN films were determined by X-ray diffraction and SEM, respectively. Preferential growth of hexagonal GaN with (0002) direction is observed and is clearly improved when the thickness of AlN layer increases. Epitaxial GaN layers were characterized by photoluminescence.     

Relaxation and recombination in ultrasmall InAs quantum dots

We report a photoluminescence study of self-organized nanometer-size InAs quantum dots grown by molecular beam epitaxy on a GaAs substrate. High optical excitation has been used in order to observe emission from higher states of the quantum dots. The energy difference between adjacent states turns out to be of the order of 40–50 meV for dot diameters around 20 nm. The photoluminescence decay time at the fundamental transition is found to be of the order of 700 ps, decreasing down to 100 ps for the highest confined states. Finally, a cascade-like mechanism for the carrier relaxation in these structures is strongly suggested by the time resolved data.     

Structural and optical characterization of GaN grown on porous silicon substrate by MOVPE

GaN was grown on porous silicon (PS) substrates by Metalorganic Vapour Phase Epitaxy at temperature of 1050 °C. An additional AlN buffer layer is used between GaN and PS. The crystalline quality and surface morphology of GaN films were studied by X-ray diffraction and scanning electron microscope (SEM), respectively. Preferential growth of hexagonal GaN with 〈00.1〉 direction is observed and is clearly improved when the thickness of AlN buffer layer increases. Morphological changes in PS layer appearing after growth have been also discussed.GaN optical qualities were determined by photoluminescence at low and room temperature (RT).     

Photoluminescence properties of cadmium-selenide quantum dots embedded in a liquid-crystal polymer matrix

The photoluminescence properties of cadmium-selenide (CdSe) quantum dots with an average size of ～3 nm, embedded in a liquid-crystal polymer matrix are studied. It was found that an increase in the quantum-dot concentration results in modification of the intrinsic (exciton) photoluminescence spectrum in the range 500–600 nm and a nonmonotonic change in its intensity. Time-resolved measurements show the biexponential decay of the photoluminescence intensity with various ratios of fast and slow components depending on the quantum-dot concentration. In this case, the characteristic lifetimes of exciton photoluminescence are 5–10 and 35–50 ns for the fast and slow components, respectively, which is much shorter than the times for colloidal CdSe quantum dots of the same size. The observed features of the photoluminescence spectra and kinetics are explained by the effects of light reabsorption, energy transfer from quantum dots to the liquid-crystal polymer matrix, and the effect of the electronic states at the CdSe/(liquid crystal) interface.     

Photoluminescence of InAs quantum dots grown on disoriented GaAs substrates

The photoluminescence spectra in an external magnetic field of an ensemble of InAs quantum dots grown by molecular beam epitaxy on a (001) GaAs substrate with a disorientation in the [010] direction are studied. A redistribution of the photoexcited carriers among different groups of dots under the influence of the magnetic field is observed. The concentration of quantum dots is determined by analyzing the data. Fiz. Tekh. Poluprovodn. 33, 1084–1087 (September 1999)