一种低功耗嵌入式14位400MHz数模转换器

设计了一个14位刷新频率达400MHz,用于高速频率合成器的低功耗嵌入式数模转换器。该数模转换器采用5+4+5分段式编码结构,其电流源控制开关输出驱动级采用归零编码以提高DAC动态特性。该数模转换器核采用0.18μm1P6M混合信号CMOS工艺实现,整个模块面积仅为1.1mm×0.87mm。测试结果表明,该DAC模块的微分非线性误差是-0.9～+0.5LSB,积分非线性误差是-1.4～+1.3LSB,在400MHz工作频率下,输出信号频率为80MHz时的无杂散动态范围为76.47dB,并且功耗仅为107.2mW。     

A 10-bit 200-MHz CMOS video DAC for HDTV applications

This paper describes a 10-bit 200-MHz CMOS current steering digital-to-analog converter (DAC) for HDTV applications. The proposed 10-bit DAC is composed of a unit decoded matrix for 6 MSBs and a binary weighted array for 4 LSB’s, considering linearity, power consumption, routing area, and glitch energy. A new switching scheme for the unit decoded matrix is developed to improve linearity further. Cascade current sources and differential switches with deglitch latch improve dynamic performance. The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are 0.3 LSB and 0.2 LSB, respectively. The converter achieves a spurious-free dynamic range (SFDR) of above 55 dB over a100-MHz bandwidth and low glitch energy of 1.5 pVs. The circuit is fabricated in a 0.25 μm CMOS process and occupies 0.91 mm². When operating at 200 M Sample/s, it dissipates 82 mW from a 3.3 V power supply.     

An 8-bit low power DAC with re-used distributed binary cells architecture for reconfigurable transmitters

In this work an 8-bit DAC is presented which uses a new segmented architecture, where distributed binary cells are re-used in thermometric manner to realize the MSB unit cells. The DAC has been fabricated in 0.18 μm five-metal CMOS n-well process to be embedded in multi-standard reconfigurable wireless transmitters for low-speed applications. The proposed architecture has an inherent ability to reduce midcode glitch like the unary architecture, and the simulated midcode glitch is only 0.01 pV s. Simulation results show that the proposed DAC performs with an integral nonlinearity (INL) of 0.33 LSB and a differential nonlinearity (DNL) of 0.14 LSB. The DAC can achieve a maximum measured SFDR of 65.19 dB for 97.50 kHz signal at a sampling rate of 100 MSPS, without using any calibration or dynamic element matching (DEM) technique. For 1.07 MHz signal the measured SFDR is 56.84 dB at 100 MSPS sampling rate. At 50 MSPS sampling frequency and 146 kHz signal the SFDR of the DAC is 65.90 dB. The measured SFDR at 538 kHz signal is 63.62 dB for a sampling rate of 50 MSPS. Measured third order intermodulation distortion of the DAC is 58.55 dB, for a dual tone test with 1.03 MHz and 1.51 MHz signals at 50 MSPS sampling rate. Low power is also an important aspect in portable wireless devices. For 10.06 MHz signal and 100 MSPS sampling frequency, the power dissipation of the DAC is 20.74 mW with 1.8 V supply.     

A power-efficient 10-bit 40-MS/s sub-sampling pipelined CMOS analog-to-digital converter

This paper presents a 10-bit 40-MS/s pipelined analog-to-digital converter (ADC) in a 0.13-μm CMOS process for subsampling applications. A simplified opamp-sharing scheme between two successive pipelined stages is proposed to reduce the power consumption. For subsampling, a cost-effective fast input-tracking switch with high linearity is introduced to sample the input signal up to 75 MHz. A two-stage amplifier with hybrid frequency compensation is developed to achieve both high bandwidth and large swing with low power dissipation. The measured result shows that the ADC achieves over 77 dB spurious free dynamic range (SFDR) and 57.3 dB signal-to-noise-plus-distortion ratio (SNDR) within the first Nyquist zone and maintains over 70 dB SFDR and 55.3 dB SNDR for input signal up to 75 MHz. The peak differential nonlinearity (DNL) and integral nonlinearity (INL) are ±0.2 LSB and ±0.3 LSB, respectively. The ADC consumes 15.6 mW at the sampling rate of 40 MHz from a 1.2-V supply voltage, and achieves a figure-of-merit (FOM) value of 0.22 pJ per conversion step.     

12bit高稳定性数模转换器设计

设计了一款12 bit高稳定性控制类数模转换器(DAC),该DAC集成了带有稳定启动电路的新型低失调带隙基准源(BGR),改善了基准电路的稳定性以及对温度和工艺的敏感性;DAC采用了改进的两级电阻串结构,通过开关电阻匹配和特殊版图布局,在既不增加电路功耗又不扩大版图面积的前提下,提高了DAC的精度并降低了工艺浓度梯度对整体性能的影响.基于CSMC 0.5 μm 5 V 1P4M工艺对所设计的DAC芯片进行了流片验证.测试结果表明:常温下DAC的微分非线性(DNL)小于0.45 LSB,积分非线性(INL)小于1.5 LSB,并且在-55～125℃内DNL小于1 LSB,INL小于2.5 LSB;5V电源电压供电时功耗仅为3.5 mW,实现了高精度、高稳定性的设计目标.     

A current-steering self-calibration 14-bit 100-MSPs DAC

This paper presents the design and implementation of a 14-bit,100 MS/s CMOS digital-to-analog converter(DAC).Analog background self-calibration based on the concept of analog current trimming is introduced.A constant clock load switch driver,a calibration period randomization circuit and a return-to-zero output stage have been adopted to improve the dynamic performance.The chip has been manufactured in a SMIC 0.13-μm process and occupies 1.33× 0.97 mm2 of the core area.The current consumption is 50 mA under 1.2/3.3 V dual power supplies for digital and analog,respectively.The measured differential and integral nonlinearity is 3.1 LSB and 4.3 LSB,respectively.The SFDR is 72.8 dB at a 1 MHz signal and a 100 MHz sampling frequency.     

A 12-b, 150 MHz Sample/s CMOS Current Steering D/A Converter with Gradient Error Compensation

This paper discusses a circuit of 12-b, 150 MHz Sample/s current steering DAC with hierarchical symmetrical switching sequences which will compensate gradient error. The circuit of 12-b DAC employs segmented architecture, the least significant bits (LSB's) steer a binary weighted array, while the most significant bits (MSB's) are thermometer decoded and steer a unary array. The measured differential nonlinearity and integral nonlinearity are ± 0.6 least significant bit (LSB) and ±0.9 LSB, respectively. The output spectrum of the DAC is −63 dB with an input frequency of 30 MHz at 150 MHz conversion rate. The circuit is fabricated in 0.5 μ μm, two-poly two-metal, 5.0 V, mixed-signal CMOS process and occupies 1.27 × 0.96 mm, when operating at 150 MHz Sample/s, it dissipates 91.6 mW from 5.0 V power supply which is much lower than those of [1]. Jinguang Jiang received the M.Sc. degree from Hunan University, Hunan, China, in 1998 and the PhD degree from Hunan University, Hunan, China, in 2003, all in Electrical Engineering. He is currently a Postdoctoral fellow of Control Science and Engineering in the Faculty of Electrical and Information Engineering at the University of Hunan. His interests are mode distinguish and intelligent system, intelligent signal process, low-power and low-voltage analog integrated circuits design. Bo Wang received the M.Sc. degree from Southeast University, China, in 1998. He is currently as a senior analog design engineer working at Caretta Integrated Circuits, Shanghai, China. His interests are high-speed analog IC design and analog system modeling and analysis. Yaonan Wang received the M.Sc. degree from Hunan University, Hunan, China, in 1991 and the Ph.D. degree from Hunan University, Hunan, China, in 1994, all in Control Theory and Control Engineering. He is currently a Professor and dean of school of Electrical and Information Engineering at the University of Hunan. He is engaged in research of intelligent control, intelligent signal process, image distinguish and its application.     

A 14-bit intrinsic accuracy Q2 random walk CMOS DAC

In this paper, a 14-bit, 150-MSamples/s current steering digital-to-analog converter (DAC) is presented. It uses the novel Q² random walk switching scheme to obtain full 14-bit accuracy without trimming or tuning. The measured integral and differential nonlinearity performances are 0.3 and 0.2 LSB, respectively; the spurious-free dynamic range is 84 dB at 500 kHz and 61 dB at 5 MHz. Running from a single 2.7-V power supply, it has a power consumption of 70 mW for an input signal of 500 kHz and 300 mW for an input signal of 15 MHz. The DAC has been integrated in a standard digital single-poly, triple-metal 0.5-μm CMOS process. The die area is 13.1 mm²     

A high-performance CMOS 70-MHz palette/DAC

A VLSI circuit has been developed that combines dual-ported RAMs and three high-speed 8-b digital-to-analog converters (DACs). It is known as a palette/DAC. A 6-2 segmented DAC architecture improves differential linearity and monotonicity. The current-source cell uses a cascode device to improve the DAC's linearity. A reference current, set by an on-chip bandgap reference voltage generator, and its associated distribution scheme eliminate the negative effects of threshold mismatches between current source cells, supply line resistance, and noise. The maximum conversion rate is 70 MHz with typical DC differential nonlinearity of 0.48 LSB (least significant bit). The 253-mil/SUP 2/ is designed on a double-metal CMOS process and consumes 1.2 W of power.     

A low glitch 10-bit 75-MHz CMOS video D/A converter

A low glitch 10-bit 75-MHz CMOS current-output video digital-to-analog Converter (DAC) for high-definition television (HDTV) applications is described. In order to achieve monotonicity and low glitch, a special segmented antisymmetric switching sequence and an innovative asymmetrical switching buffer have been used. The video DAC has been fabricated by using 0.8 μm single-poly double-metal CMOS technology. Experimental results indicated that the conversion rate is above 75 MHz, and nearly 50% of samples have differential and integral linearity errors less than 0.24 LSB and 0.6 LSB, respectively. The glitch has been reduced to be less than 3.9 pV·s and the settling time within ±0.1% of the final value is less than 13 ns. The video DAC is operated by a single 5 V power supply and dissipates 1.70 mW at 75 MHz conversion rate (140 mW in the DAC portion). The chip size of video DAC is 1.75 mm×1.2 mm (1.75 mm×0.7 mm for the DAC portion)     

一种基于65 nm CMOS工艺的10位10 MS/s SAR ADC

基于SMIC 65 nm CMOS工艺,设计了一种10位10 MS/s逐次逼近型模数转换器(SAR ADC)。采用全差分的R-C组合式DAC网络结构进行设计,提高了共模噪声抑制能力和转换精度。与全电容结构相比,R-C组合式DAC网络结构有效减小了版图面积。DAC中各开关的导通采用对称的开关时序,使比较器差分输入的共模电平保持为固定值,降低了比较器的失调电压,提高了ADC的线性度。在2.5 V模拟电源电压和1.2 V数字电源电压下,使用Spectre进行仿真验证,测得DNL为0.5 LSB,INL为0.8 LSB;在输入信号频率为4.990 2 MHz,采样频率为10 MHz的条件下,测得电路的有效位数为9.63位,FOM为0.04 pJ/conv。     

A systematic design approach for low-power 10-bit 100 MS/s pipelined ADC

A systematic design approach for low-power 10-bit, 100 MS/s pipelined analog-to-digital converter (ADC) is presented. At architectural level various per-stage-resolution are analyzed and most suitable architecture is selected for designing 10-bit, 100 MS/s pipeline ADC. At Circuit level a modified wide-bandwidth and high-gain two-stage operational transconductance amplifier (OTA) proposed in this work is used in track-and-hold amplifier (THA) and multiplying digital-to-analog converter (MDAC) sections, to reduce power consumption and thermal noise contribution by the ADC. The signal swing of the analog functional blocks (THA and MDAC sections) is allowed to exceed the supply voltage (1.8 V), which further increases the dynamic range of the circuit. Charge-sharing comparator is proposed in this work, which reduces the dynamic power dissipation and kickback noise of the comparator circuit. The bootstrap technique and bottom plate sampling technique is employed in THA and MDAC sections to reduce the nonlinearity error associated with the input signal resulting in a signal-to-noise-distortion ratio of 58.72/57.57 dB at 2 MHz/Nyquist frequency, respectively. The maximum differential nonlinearity (DNL) is +0.6167/−0.3151 LSB and the maximum integral nonlinearity (INL) is +0.4271/−0.4712 LSB. The dynamic range of the ADC is 58.72 dB for full-scale input signal at 2 MHz input frequency. The ADC consumes 52.6 mW at 100 MS/s sampling rate. The circuit is implemented using UMC-180 nm digital CMOS technology.     

An 80-MS/s 14-bit pipelined ADC featuring 83 dB SFDR

An 80-MS/s 14-bit pipelined analog-to-digital converter (ADC) is presented in this paper. After gain error and offset extraction from prototype measurement, the improved circuit achieves spurious free dynamic range (SFDR) of 82.9 dB and signal-to-noise-and-distortion ratio (SINAD) of 64.1 dB for a 30.5 MHz input, maintained within 6 dB performance deterioration up to 170 MHz input. Differential nonlinearity (DNL) is 0.66 LSB and integral nonlinearity (INL) is 2.5 LSB. Low-jitter clock amplifier and buffers with balanced loads are used to reduce the jitter and skew between different stages. An on-chip voltage reference generator is schemed with low impedance to reduce noise and spurs of reference signals. The ADC is fabricated in a 0.18-μm CMOS process with core area of 3.86 mm², and consumes 518 mW at 1.8 V supply.     

A 10-bit 1.8 V 45 mW 100 MHz CMOS transmitter chip for use in an XDSL modem in a home network

This paper describes a 10-bit 1.8 V 45 mW 100 MHz transmitter chip (TX chip) that is fabricated using 0.18 μm 1P6 M CMOS technology for use in an xDSL modem in a home network. The chip is composed of a 10-bit segmented digital-to-analog converter (DAC) and a fully differential adaptive line driver (LD). In designing the DAC, the switched-current method is used to increase the conversion speed; the anti-process-variation current cell with threshold-voltage compensation is used to reduce the linearity error, and the current cell, with differential input and gain boosting, is used to minimize the feedthrough error and tapered error distribution. The circuit layout of the current source has four-phase symmetry, not only to increase the linearity but also to eliminate the gradient error. To design a fully differential adaptive LD, the feed-forward capacitor and quiescent current control circuit are used to reduce the zero-crossing distortion and to minimize the second-order harmonic. Additionally, the power efficiency is increased using an output-impedance matching circuit. Measurements reveal that, for a TX chip at a differential load of 100 Ω and a supplied voltage of 1.8 V, the efficient number of bits, operating frequency, output voltage, output current, power consumption, differential nonlinearity error and integral nonlinearity error are 9 bits, 100 MHz, ± 0.874 V, ± 10 mA, 45.8 mW, ?0.80 to +0.62 LSB, and ?0.92 to +0.82 LSB, respectively.     

A 10-b 75-MSPS subranging A/D converter with integrated sample andhold

The design of a fully differential two-step analog-to-digital converter (ADC) is presented. A sample-and-hold (S/H) circuit based on a unity-gain feedback amplifier, flash ADCs driven by differential resistor ladders, and a differential digital-to-analog converter (DAC) combined with the subtractor are described. The chip has been fabricated in a standard high-speed bipolar process and, by extensively utilizing compensation techniques, achieves ±1 LSB integral nonlinearity and low harmonic distortion. A 75 Msample/s conversion rate not yet exceeded even by full-flash 10-b ADCs, has been achieved with a power consumption of 2 W. Due to the S/H circuit, the input bandwidth of 250 MHz; the effective resolution of 9 b at 5 MHz exhibits a gradual decrease over input frequency but still remains above 8 b up to 50 MHz     

A 12-bit 0.35 μm CMOS area optimized current-steering hybrid DAC

In this paper a 12-bit current-steering hybrid DAC is implemented using AMS 0.35 μm CMOS process technology. The architecture and design methodology used for the implementation of the DAC offer advantages like design speed up, easiness in design and a small active area. The proposed hybrid DAC consists of four 3-bit parallel matched current-steering subDACs and resistive networks that properly weight the current output of each subDAC to obtain the overall voltage-mode output of the 12-bit hybrid DAC. The performance of the hybrid DAC is validated through static and dynamic performance metrics. Simulations indicate that the DAC has an accuracy of 12-bit and a SFDR higher than 66 dB in whole Nyquist frequency band. The simulated INL is better than 1 LSB, while simulated DNL is better than 0.25 LSB. At an update rate of 250 MS/s the SFDR for signals up to 10 MHz is higher than 66 dB. The Figure of Merit (FoM) of the implemented hybrid DAC is better than recently presented DACs with 12-bit resolutions and implemented using various process technologies. The proposed hybrid DAC supporting high update rates with good dynamic performance can be used as an alternative in various applications in industry including video, digital TV, cable modems etc.     

2Gbps GaAs单片4bit数模转换器的设计与实现

详述了单片超高速2G bps G aA s 4b it数模转换器(DAC)的设计、制造及测试。在南京电子器件研究所标准76 mm G aA s工艺线采用0.5μm全离子注入M ESFET工艺完成流片。芯入输入输出阻抗实现在片50Ω匹配。4 b it DAC的微分非线性(DN L)为±0.22最低有效位(LSB),积分非线性(IN L)为±0.45LSB,达到5.2 b it的转换精度。该单片电路提供差分互补输出,长周期输出特性无漂移。其最高转换速率可达2 G bps,建立时间小于250 ps,电路核心部分功耗为110 mW。     

A low-Voltage 10-bit CMOS DAC in 0.01-mm/sup 2/ die area

A low-voltage 10-bit digital-to-analog converter (DAC) for static/dc operation is fabricated in a standard 0.18-/spl mu/m CMOS process. The DAC is optimized for large integrated circuit systems where possibly dozens of such DAC would be employed for the purpose of digitally controlled analog circuit calibration. The DAC occupies 110 /spl mu/m/spl times/94 /spl mu/m die area. A segmented R-2R architecture is used for the DAC core in order to maximize matching accuracy for a minimal use of die area. A pseudocommon centroid layout is introduced to overcome the layout restrictions of conventional common centroid techniques. A linear current mirror is proposed in order to achieve linear output current with reduced voltage headroom. The measured differential nonlinearity by integral nonlinearity (DNL/INL) is better than 0.7/0.75 LSB and 0.8/2 LSB for 1.8-V and 1.4-V power supplies, respectively. The DAC remains monotonic (|DNL|<1 LSB) as INL reaches 4 LSB down to 1.3-V operation. The DAC consumes 2.2 mA of current at all supply voltage settings.     

An 8 bit, 100 kS/s,switch-capacitor DAC SAR ADC for RFID applications

An 8 bit switch-capacitor DAC successive approximation analog to digital converter (SAR-ADC) for sensor-RFID application is presented in this paper. To achieve minimum chip area, maximum simplicity is imposed on capacitive DAC; replacing capacitor bank with only a one switch-capacitor circuit. The regulated dynamic current mirror (RDCM) design is introduced to provide stabilized current. This invariable current from RDCM, charging or discharging the only capacitor in circuit is controlled by pulse width modulated signal to realize switch capacitor DAC. The switch control scheme is built using basic AND gates to generate the control signals for RDCM. Only one capacitor and reduced transistor count in digital part reduces the silicon area occupied by the ADC to only 0.0098 mm². The converter, designed in GPDK 90 nm CMOS, exhibits maximum sampling frequency of 100 kHz & consumes 6.75 µW at 1 V supply. Calculated signal to noise and distortion ratio (SNDR) at 1 V supply and 100 kS/s is 48.68 dB which relates to ENOB of 7.79 bits. The peak values of differential and integral nonlinearity are found to be +0.70/−0.89 LSB and +1.40/−0.10 LSB respectively. Evaluated figure of merit (FOM) is 3.87×10²⁰, which show that the proposed ADC acquires minimal silicon area and has sufficiently low power consumption compared to its counterparts in RFID applications.     

A 10-b, 500-MSample/s CMOS DAC in 0.6 mm2

A 10-b current steering CMOS digital-to-analog converter (DAC) is described, with optimized performance for frequency domain applications. For sampling frequencies up to 200 MSample/s, the spurious free dynamic range (SFDR) is better than 60 dB for signals from DC to Nyquist. For sampling frequencies up to 400 MSample/s, the SFDR is better than 55 dB for signals from DC to Nyquist. The measured differential nonlinearity and integral nonlinearity are 0.1 least significant bit (LSB) and 0.2 LSB, respectively. The circuit is fabricated in a 0.35-μm, single-poly, four-metal, 3.3 V, standard digital CMOS process and occupies 0.6 mm². When operating at 500 MSample/s, it dissipates 125 mW from a 3.3 V power supply. This DAC is optimized for embedded applications with large amounts of digital circuitry