一种带有增益提高技术的高速CMOS运算放大器设计

设计了一种用于高速ADC中的高速高增益的全差分CMOS运算放大器。主运放采用带开关电容共模反馈的折叠式共源共栅结构,利用增益提高和三支路电流基准技术实现一个可用于12~14 bit精度,100 MS/s采样频率的高速流水线（Pipelined）ADC的运放。设计基于SMIC 0.25μm CMOS工艺,在Cadence环境下对电路进行Spectre仿真。仿真结果表明,在2.5 V单电源电压下驱动2 pF负载时,运放的直流增益可达到124 dB,单位增益带宽720 MHz,转换速率高达885 V/μs,达到0.1%的稳定精度的建立时间只需4 ns,共模抑制比153 dB。     

10 bit 40 MS/s流水线模数转换器的研制

设计了一种10 bit 40 MS/s流水线模数转换器.通过采用自举开关和增益提升的套筒式共源共栅运放,保证了采样保持电路和级电路的性能.该模数转换器采用TSMC 0.35 p.m CMOS3.3 V工艺流片验证,芯片核心面积为5.6 jmm2.测试结果表明,该模数转换器在采样率为40 MHz输入频率为280 kHz时,获得54.5 dB的信噪比和60.2 dB的动态范围;在采样率为46 MHz输入频率为12.6 MHz时,获得52.1 dB的信噪比和60.6 dB的动态范围.     

一种全差分增益提升运放的设计与建立特性优化

在2．5V电源电压下采用中芯国际（SMIC）0．25μm混合信号CMOS工艺设计了一个单级全差分运算放大器。所设计的运放采用了增益提升技术,其主运放为一个带有开关电容共模反馈的全差分折叠一共源共栅运放。两个带有连续时间共模反馈的全差分折叠一共源共栅运放作为辅运放用来提升主运放的开环增益。此外,本文还提出了一种可用于增益提升运放高速设计的基于仿真的优化方法。仿真结果表明,所设计运放的直流增益可达102dB,单位增益频率为822MHz,通过高速优化,其达到0．1％精度的建立时间为4ns。     

一款适用于高速读出电路的输出级运算放大器设计

〖JP+1〗CMOS运算放大器是红外探测器系统读出电路的重要模块,其性能直接影响红外读出电路性能。本文设计了一款适用于高速读出电路的输出级运算放大器,在负载电阻100 kΩ,负载电容25 pF的条件下,使读出电路的工作频率大于20 MHz。输出级运算放大器由折叠共源共栅差分运放和甲乙类推挽反相运放级联构成。折叠共源共栅差分运放可以实现电路高增益、大输出电压范围和高输出阻抗,同时可以有效减小放大器输入端的米勒电容效应。甲乙类推挽反相运放具有高电压电流转换效率,可以灵活地从负载得到电流或者向负载提供电流,实现高电流增益,驱动大负载。两级运放之间通过米勒电容实现频率补偿,保证运放的稳定性。本文设计的高速输出级运算放大器基于SMIC 018μm工艺设计,最终实现指标:功耗不大于10mW,运放增益>84dB,相位裕度79°,单位增益带宽>100 MHz,噪声78 μV(1～500 MHz),输出电压范围1～5 V,建立时间<15ns。通过设计高速输出级运算放大器,红外读出电路的读出速率和帧频得到有效提高。     

采用环型运放的12-bit 40-MS/s采样保持电路设计实现

为了保证模数转换器转换速度和精度,本文基于0.18微米工艺,设计实现了一款应用于12-bit 40-MS/s流水线ADC前端的采样保持电路.所采用的环型结构运放,可以简化设计、且占用面积小;同时,采用绝缘体上硅工艺,可以消除栅压自举开关中开关管的衬偏效应,改善开关的线性度,提高采样保持电路的性能.采样保持电路面积是0.023平方毫米.测试结果表明：在1.5V供电电压下,采样保持电路功耗是3.5mW;在1MHz输入频率、40MHz采样频率下,该采样保持电路无杂散动态范围可以达到76.85dB,满足12-bit 40-MS/s流水线模数转换器应用需求.     

一种10位80 MS/s低功耗采样保持电路的设计

给出了一种基于开关电容(SC)电路的10位80 MHz采样频率低功耗采样保持电路。它是为一个10位80 MS/s流水线结构A/D转换器的前端采样模块设计的。在TSMC 0.25μmCMOS工艺,2.5 V电源电压下,该电路的采样频率为80 MHz;在奈奎斯特频率采样时,无杂散动态范围(SFDR)为75.4 dB,SNDR为71.8 dB,ENOB为11.6,输入信号范围可达160 MHz(两倍采样频率),此时SFDR仍大于70 dB。该电路功耗为16.8 mW。     

一个用于14位采样保持电路的全差分增益增强放大器的分析和设计

介绍了一种全差分增益增强CMOS运算放大器的设计和实现。该放大器用于14位20 MHz采样频率的流水线模/数转换器(A/D)的采样保持电路。为了实现大的输入共模范围,采用折叠式共源共栅放大器。主放大器采用开关电容共模反馈电路在获得大输出摆幅的同时降低了功耗。辅助放大器则采用简单的连续时间共模反馈电路。该放大器采用UMC Logic 0.25μm工艺,电源电压为2.5 V。Hspice仿真结果显示,在负载为15 pF的情况下,其增益为104 dB,单位增益带宽为166 MHz。     

一种运用于高速ADC的采样保持电路设计

设计了一种用于Pipelined ADCs中的前置采样保持电路.从理论上推导了12bit、100MHz的模数转换器对采样保持电路各个子电路的性能指标要求,按此要求设计了增益增强型运放、自举开关等子电路.基于SMIC 0.13μm,3.3V工艺,Spectre仿真结果表明,在采样频率为100MS/s,输入信号频率为9.7656M时实现了81.9dB的信噪失真比(SINAD)和13.3位的有效位数(ENOB),无杂散动态范围(SFDR)可达94.9dB,功耗仅为24mW.输入直到奈奎斯特频率,仍能保持81.5dB的信噪失真比和13.2位的有效位数,SFDR可达到92.67dB.     

用于10位100 MS/s流水线A/D转换器的采样保持电路

设计了一个用于10位100 MHz采样频率的流水线A/D转换器的采样保持电路。选取了电容翻转结构;设计了全差分套筒式增益自举放大器,可以在不到5 ns内稳定在最终值的0.01%内;改进了栅压自举开关,减少了与输入信号相关的非线性失真,提高了线性度。采用TSMC 0.25μm CMOS工艺,2.5 V电源电压,对电路进行了仿真和性能验证,并给出仿真结果。所设计的采样保持电路满足100 MHz采样频率10位A/D转换器的性能要求。     

一种高速高增益CMOS运算放大器的设计

设计了一种应用于采样保持电路中高速高增益运算放大器。该运放采用全差分增益提高型共源共栅结构。在输入信号通路上加入适当的补偿电容,消除了零极点对对运放建立时间的影响,同时对主运放的次极点进行了优化,改进了相位裕度。采用0.35μmCMOS工艺仿真,结果表明,运放的开环直流增益达到106dB,单位带宽为831MHz（负载电容8pF）,相位裕度为60.5&#176;,压摆率为586V/μs,满足12位50MS/s流水线ADC中采样保持电路性能要求。     

A 200-MHz 15-mW BiCMOS sample-and-hold amplifier with 3 V supply

A sample-and-hold amplifier designed for the front end of high-speed low-power analog-to-digital converters employs a BiCMOS sampling switch and a low-voltage amplifier to achieve a sampling rate of 200 MHz while allowing input/output voltage swings of 1.5 V with a 3-V supply. The circuit also incorporates a cancellation technique to relax the trade-off between the hold-mode feedthrough and the sampling speed. Fabricated in a 20-GHz 1-μm BiCMOS technology, an experimental prototype exhibits a harmonic distortion of -65 dB with a 10-MHz analog input and occupies an area of 220×150 μm². The measured feedthrough is -52 dB for a 50-MHz analog input and the droop rate is 40 μV/ns     

一种应用于流水线ADC采样保持电路的设计

介绍了一种应用于12位、10MS/s流水线模数转换器前端的高性能采样保持（SH）电路的设计。该电路采用全差分电容翻转型结构及下极板采样技术,有效地减少噪声、功耗及电荷注入误差。采用一种改进的栅源电压恒定的自举开关,极大地减小电路的非线性失真。运算放大器为增益增强型折叠式共源共栅结构,能得到较高的带宽和直流增益。该采样保...     

A 10-bit 50-MS/s sample-and-hold circuit with low distortion sampling switches

A fully-differential switched-capacitor sample-and-hold (S/H) circuit used in a 10-bit 50-MS/s pipeline analog-to-digital converter (ADC) was designed and fabricated using a 0.35-μm CMOS process. Capacitor fliparound architecture was used in the S/H circuit to lower the power consumption. In addition, a gain-boosted operational transconductance amplifier (OTA) was designed with a DC gain of 94 dB and a unit gain bandwidth of 460 MHz at a phase margin of 63 degree, which matches the S/H circuit. A novel double-side bootstrapped switch was used, improving the precision of the whole circuit. The measured results have shown that the S/H circuit reaches a spurious free dynamic range (SFDR) of 67 dB and a signal-to-noise ratio (SNR) of 62.1 dB for a 2.5 MHz input signal with 50 MS/s sampling rate. The 0.12 mm2 S/H circuit operates from a 3.3 V supply and consumes 13.6 mW.     

An 8-b, 40 msamples/s switched-current-mode track-and-hold circuiton a BiCMOS sea-of-gates array

A fully differential track-and-hold circuit based on the switched-current processing has been integrated on a fully complementary 1.2 μm-6 GHz BiCMOS sea-of-gates array. It is based on a BiCMOS switched-current memory cell which uses MOS transistors to store the analog information and bipolar transistors to implement the switch. This improves the speed achievable and the distortion compared to a CMOS-only switched-current memory cell. A differential configuration is also presented which made it possible to improve performances such as the hold mode feedthrough (<-67 dB @ 10 MHz) or the pedestal error. The acquisition time for a full scale step is 22 ns, in order to reach the final value within 0.1%. It achieves 8-b precision at a sample-rate of 40 MHz under Nyquist condition, a full scale track-mode bandwidth of 150 MHz and a consumption of 80 mW for a surface of 0.44 mm²     

一种低功耗14位10MS/s流水线A/D转换器

基于0.6μm BiCMOS工艺,设计了一个低功耗14位10MS/s流水线A/D转换器.采用了去除前端采样保持电路、共享相邻级间的运放、逐级递减和设计高性能低功耗运算放大器等一系列低功耗技术来降低ADC的功耗.为了减小前端采样保持电路去除后引入的孔径误差,采用一种简单的RC时间常数匹配方法.仿真结果表明,当采样频率为10MHz,输入信号为102.5kHz,电源电压为5V时,ADC的信噪失真比(SNDR)、无杂散谐波范围(SFDR)、有效位数(ENOB)和功耗分别为80.17dB、87.94dB、13.02位和55mW.     

一种12位2 GS/s BiCMOS采样保持电路

基于130 nm BiCMOS工艺,设计了一种12位高速采样保持电路,对电路的主要性能进行了分析。电路采用差分结构,采样开关是开环交换射极跟随开关。在输入信号范围内,缓冲器的线性度较高。采用Cadence Spectre软件进行仿真。结果表明,当采样率为2 GS/s,模拟输入差分信号为992 MHz频率、0.5V_pp幅度的正弦波时,SFDR达75.11 dB,SNDR达73.82 dB,电路功耗仅为98 mW,满足了12位采样保持的要求。     

A 1.5-V 50-MHz pseudodifferential CMOS sample-and-hold circuit with low hold pedestal

This paper describes the design strategy and implementation of a low-voltage pseudodifferential double-sampled timing-skew-insensitive sample-and-hold (S/H) circuit with low hold pedestal based on the Miller-effect scheme. The S/H circuit employs bootstrapped switches in order to facilitate low voltage operation. The design considerations for each building block are described in detail. The S/H circuit has been designed using a 0.35-/spl mu/m 2P4M CMOS technology and experimental results are presented. The 1.5-V S/H circuit operates up to a sampling frequency of 50 MHz with less than -54.6 dB of total harmonic distortion for an input sinusoidal amplitude of 0.8 V/sub pp/. In these conditions, a differential hold pedestal of less than 0.8 mV, 1.6 ns acquisition time at 0.8-V step input, and 0.8 V/sub pp/ full-scale differential input range are achieved.     

A 7 ns 1 Mb BiCMOS ECL SRAM with shift redundancy

A 7-Mb BiCMOS ECL (emitter coupled logic) SRAM was fabricated in a 0.8 μm BiCMOS process. An improved buffer with a high-level output of nearly V_CC is adopted to eliminate the DC current in the level converter circuit, and the PMOS transistor has a wide operating margin in the level converter. The configurable bit organization is realized by using a sense-amplifier switch circuit with no access degradation. A wired-OR demultiplexer for the ×1 output, having the same critical path as the ×4 output circuit, allows for the same access time between the two modes. The ×1 or ×4 mode is electrically selected by the external signal. A simplified programming redundancy technology, shift redundancy, is utilized. Address programming is performed by cutting only one fuse in the shift redundancy. The RAM operates at the ECL-10K level with an access time of 7 ns. and the power dissipation at 50 MHz is 600 mW for the × mode     

Design techniques for high-throughput BiCMOS self-timed SRAMs

Design techniques for a high-throughput BiCMOS self-timed SRAM are described. A new BiCMOS read circuit using a pipelined read architecture and a BiCMOS complementary clocked driver (BCCD) are proposed to reduce the operating cycle time. A 8192×9-b dual-port self-timed SRAM designed using the proposed techniques achieved a clock cycle time of 3.0 ns, that is, a 333-MHz operating frequency, by SPICE simulation on model parameters for 0.8-μm BiCMOS technology. A high-speed built-in self-test (BIST) circuit was studied and designed for the 3.0-ns cycle SRAM. It is confirmed that the BIST circuit allows the 3.0-ns cycle SRAM to test at its maximum operating frequency