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1.
The electron doped Ln2−xCexCuO4 (Ln=lanthanide) oxides have intergrowth structures consisting of superconductively active CuO2 sheets alternating with inactive (Ln, Ce)2O2 fluorite layers along the c-axis. Stabilization of such intergrowth structures requires bond length matching across the intergrowth interface. The bond length matching criterion causes a monotonic decrease in the Ce solubility limit from x=0.24 to x=0.15 as the size of Ln3+ decreased from Ln=La0.5Nd0.5 to Ln=Gd. Annealing in N2 atm of Ln2−xCexCuO4 at temperatures above 900°C creates oxygen vacancies and the number of vacancies decreases with increasing Ce content. The value of x at which a semiconductor to superconductor transition occurs in Ln2−xCexCuO4 increases with decreasing size of Ln3+ due to an increasing Madelung energy caused by a decreasing Cu−O bond length.  相似文献   

2.
The stability of the copper ion in +1, +2, and +3 oxidation states for oxides synthesized at oxygen activity, 10−6<f(O2)<103 bar, makes possible formation of a wide variety of distinct structures since the copper ion in a particular oxidation state prefers a unique coordination to oxygen. Thus, by controlling the oxygen pressure during the synthesis and annealing, the distribution of metaland oxygen-ions can be modified on atomic scale to optimize the structural and electronic properties. We present several examples of compounds of which the critical structural elements for superconductivity, i.e. the perfectly ordered CuO2-planes, have been obtained and doped with holes by means of high oxygen pressure. These materials, La2CuO4+δ, La2-xCaxCuO4, La2-yCu2O6+° and GaSr2Y1-xCaxCu2O7, offer a unique opportunity to study the relationship between superconductivity and structural, magnetic, and chemical properties.  相似文献   

3.
The superconducting properties of (M x /YBa2Cu3O7−δy )N multilayer films were studied for varying layer thickness x. Different M phases were examined including green-phase Y2BaCuO5 (211), Y2O3, BaZrO3, CeO2, SmBa2Cu3O7−δ (Sm123), brown-phase La2BaCuO5 (La211), and MgO. Multilayer (M x /YBa2 Cu3O7−δy )N structures were grown by pulsed laser deposition onto SrTiO3 or LaAlO3 single-crystal substrates by alternate ablation of separate YBa2Cu3O7−δ (123) and M targets, at temperatures of 750°C to 790°C. The x layer thickness was varied from 0.1 nm to 4.5 nm, and the y 123 layer thickness was kept constant within a given range of 10 to 25 nm. Different M phase and x layer thicknesses caused large variations of the microstructural and superconducting properties, including superconducting transition (T c), critical current density as a function of applied magnetic field J c(H), self-field J c(77 K), and nanoparticle layer coverage. Strong flux-pinning enhancement up to 1 to 3x was observed to occur for M additions of 211 and BaZrO3 at 65 to 77 K, Y2O3 at 65 K, and CeO2 for H < 0.5 T. BaZrO3 had a noticeably different epitaxy forming smaller size nanoparticles ∼8 nm with 3 to 4x higher areal surface particle densities than other M phases, reaching 5 × 1011 nanoparticles cm−2. To optimize flux pinning and J c (65 to 77 K, H = 2 to 3 T), the M layer thickness had to be reduced below a critical value that correlated with a nanoparticle surface coverage <15% by area. Unusual effects were observed for poor pinning materials including Sm123 and La211, where properties such as self-field J c unexpectedly increased with increasing x layer thickness.  相似文献   

4.
Rare-earth-modified ferroelectric crystals with the formula (Sr1−xBax)1− 3y/2 RyNb22O6, where R = La, Nd, Sm, Gd, and Lu, have Been prepared and studied. When R = La, Nd, x ≃ .5 and y = 0.02, the modified material, at room temperature, exhibited twice the pyroelectric coefficient and four times the dielectric constant of the unmodified Sr1−xBaxNb2O6 (x ≃ .5). Curie temperatures decreased, dielectric constants increased, while loss factor and detector signal-to-noise ratios remained nearly the same with the addition of rare earth doping. The calculated response based on the measured properties agree with the measured response of actual detectors. These properties suggested that the modified SBN are good materials for small element or array pyroelectric infrared detector applications.  相似文献   

5.
Magnetization measurements were carried out on bulk Tl2Ba2CaCu2O8 (referred to as Tl-2212) and on various site-selective substituted Tl-2212 samples. At 5K between 0 and 4.5 T, the 5 at. % Mg-doped Tl-2212 (Tl,Mg-2212) samples displayed enhanced pinning as demonstrated by a field dependent increase of the magnetic critical-current density Jc by 18 to 25 percent over that of pristine Tl-2212. Excess Mg (10–15 at. %), however, is deleterious. Rietveld refinement of the x-ray diffraction pattern showed Mg on the Tl sites. Auger electron spectroscopy analysis showed part of the Mg on grain boundaries. The flux-creep activation energies are higher for flux expulsion than for flux penetration in both Tl-2212 and Tl,Mg-2212 samples; the latter displays higher individual values. Our results demonstrate an increase in the number density of flux lines as a result of increased density of atomic-size-structural, defects by Mg (5 at. %) doping. In the Tl2−yBa2(Ca1−zYz)Cu2O8−x(z=0–0.3; single phase; x and y represent oxygen and thallium vacancies) system also studied, the Tc decreases as z increases. At z=0.3, the sample becomes an antiferromagnetic semiconductor.  相似文献   

6.
In this paper, results of the one-dimensional (1D) digital filtering are extended to the two-dimensional (2D) case. It introduces a technique and an algorithm for the computation of the product H(z1,z2)H(z1−1,z2−1). The technique is used to find a minimum phase transfer function of a 2D system such that the previous product matches a given correlation sequence. The algorithm requires less arithmetic operations than the traditional methods. The former is based on a matrix formulation of the product, which is used to investigate the 2D partial fraction decomposition (PFD) and stability.  相似文献   

7.
YBa2Cu3O7− δ (Y123) samples with excess Nd2O3 and Y2O3 additions in the same molar ratios were melt textured in air. In the Nd-doped samples, in addition to Y ion site substitution, partial substitution into the Ba2+ sites is anticipated because of the similar ionic sizes of Nd3+ and Ba2+. The microstructure, Tc, and magnetic properties of Nd-doped samples were analyzed and compared with undoped Y123 and samples with excess Y2O3. The Nd2O3 additions lead to significant magnetization improvements, likely due to both rare earth- and Ba-site substitution by the doped Nd3+ ions, and to increases in Tc. Y2O3 additions resulted in no marked property enhancement.  相似文献   

8.
YBa2Cu3Ox domains for levitation applications have been produced by a seeding technology that includes Nd1+x Ba2−x Cu3Oy seeds and melt-processing technologies such as conventional melt-textured growth, melt-texturing with PtO2 and Y2BaCuO5 additions, and the new solid-liquid-melt-growth technology. Large domains (∼20 mm) with high levitation forces (F1 up to 8.2 N) have been produced. The reproducibility of the results is good, and the capability of producing a large number of pellets in a single batch indicates good potential for the production of large amounts of this material.  相似文献   

9.
In order to gain deep insight into the origin of the large thermoelectric power and metallic electrical conduction observed for La2−x Sr x CuO4 possessing a two-dimensional layered structure and the consequently obtained two-dimensional electronic structure, we investigate the energy–momentum dispersion and the lifetime of quasiparticles by using high-resolution angle-resolved photoemission spectroscopy. By calculating the thermoelectric power using the Bloch–Boltzmann theory and the experimentally obtained information about the electronic structure and electron scatterings, we found that the large thermoelectric power of La2−x Sr x CuO4 is mainly brought about by the anisotropic electron scattering caused by the strong electron correlation, and that the two-dimensional electronic structure makes almost no important contribution to the large S(T) except for rather minor effect of the van Hove singularity near the Fermi level.  相似文献   

10.
Polycrystalline Ba8Ga x Ge46−x exhibits promising thermoelectric performance with the figure of merit ZT close to that of single crystals. Polycrystalline Ba8Ga x Ge46−x is promising for applications, but reproducibility and thermal stability of thermoelectric properties need to be demonstrated. Polycrystalline samples of Ba8+dGa x Ge46−x -type clathrates (15.0 ≤ x ≤ 16.8 with varied nominal Ga content and d = 0 or 0.2) were prepared by direct reaction of the elements, followed by ball milling and hot pressing. Trace Ge impurity was observed (<1.0 wt.%) depending on the synthesis method. The electrical resistivity was stable in measurements up to 1000 K, regardless of Ge impurity. However, measurements to 1050 K resulted in irreversible increase in carrier concentration while the carrier mobility remained unchanged.  相似文献   

11.
Ternary rare-earth sulfides NdGd1+x S3, where 0 ≤ x ≤ 0.08, were prepared by sulfurizing Ln2O3 (Ln = Nd, Gd) with CS2 gas, followed by reaction sintering. The sintered samples have full density and homogeneous compositions. The Seebeck coefficient, electrical resistivity, and thermal conductivity were measured over the temperature range of 300 K to 950 K. All the sintered samples exhibit a negative Seebeck coefficient. The magnitude of the Seebeck coefficient and the electrical resistivity decrease systematically with increasing Gd content. The thermal conductivity of all the sintered samples is less than 1.9 W K−1 m−1. The highest figure of merit ZT of 0.51 was found in NdGd1.02S3 at 950 K.  相似文献   

12.
Previous work has shown that unlike YBa2 Cu3 O7-δ (Y123), the Nd-Ba-Cu-O system exhibits a solid solution Nd1+xBa2-x Cu3O7+δ (Nd123ss) for 0.04≤ × ≤0.6.1–3) An earlier paper showed that although the superconducting properties decrease nonlinearly for increasing x, Tc can be varied by increasing the annealing temperature without changing the low temperature oxygen soak.2 The changes in microstructure and Tc with increasing x are analogous with Y123 with increasing δ except that the total hole concentration remained constant. Tc was modeled in terms of oxygen disorder resulting from Nd3+ atoms on the Ba sites relocating chain oxygens to anti-chain sites. The variability in Tc as a function of x and processing conditions can be explained by the number of fourfold coordinated coppers on the chain sites. In this paper, the model has been further substantiated by processing in 1% O2. The annealing in a reduced oxygen partial pressure followed by a 450°C oxygen soak resulted in a marked increase in Tc compared to the 100% PO2 anneal. The low PO2 anneal favors pairing of Nd3+ substituting for Ba2+ to conserve oxygen ions, resulting in fewer disrupted fourfold-coordinated coppers thus increasing charge transfer from the planes to the chains.  相似文献   

13.
A series of compounds with composition Ag0.5In0.5−x Pb5Sn4Te10 (= 0.05 to 0.20) were prepared by slowly cooling the melts of the corresponding elements, and the effect of In content on the thermoelectric transport properties of these compounds has been investigated. Results indicate that the compounds’ electronic structure is sensitive to In content, and that the carrier concentration of these compounds at room temperature increases from 4.86 × 1018 cm−3 to 3.85 × 1021 cm−3 as x increases from 0.05 to 0.20. For these compounds, electrical conductivity decreases and Seebeck coefficient increases with increasing In content. Ag0.05In0.03Pb0.5Sn0.4Te10 shows very low lattice thermal conductivity, and has a maximum dimensionless figure of merit ZT of 1.2 at 800 K.  相似文献   

14.
Silicon wafers were steam oxidized at temperatures of 550–1000°C and pressures of 0.05–8 atm with H2 16O, H2 18O, and D2 16O. Deuterium (D) and18O profiles in 100–200 nm thick oxide films were measured with Cs+ beam secondary ion mass spectroscopy (SIMS). The use of D and18O isotopes enabled analysis of these elements without interference from the sputtering ambient. Peaks in the D profiles near the interface are due predominantly to abrupt changes in the ion yield and charging conditions as the interface is approached. Although the D concentration is nearly constant at ∼ 1 × 1020 cm−3 for 700–1000°C oxidations, it rises to a non-equilibrium value of 6 × 1020 cm−3 at 600°C. Analysis of steam indiffusions below 800°C indicates that the OD concentration is proportional to the (steam pressure)1/2, in agreement with earlier results on as-oxidized wet thermal oxides. The results of sequential isotope oxidations indicate that there is rapid exchange ofboth the hydrogen and oxygen species during transport of “water” to the SiO2. Si interface. We examine these results in terms of the concentrations of the interacting species in the oxide films, and our results are compared to similar reported studies.  相似文献   

15.
From a consideration of the phase equilibrium diagram of the system Bi2O3-SrO-CaO-CuO, a simple annealing procedure was developed to precipitate Bi2+xSr2+xCuO6+d, Sr14Cu24O41−x, and Bi2Sr3O6 in high-temperature superconducting Sr-rich “Bi2Sr2CaCu2O8” ceramics and Ca2CuO3 and a liquid in Ca-rich “Bi2Sr2CaCu2O8” ceramics. The transformation results in an increase of the critical current density of which is believed to express improved pinning properties of the superconducting crystals, in particular an increased pinning energy, which reduces the probability for thermally activated depinning. Possible pinning centers which were introduced during precipitation of the second phases are the surface of the precipitates.  相似文献   

16.
Grain growth and texturing of YBa2Cu3O7−δ is greatly influenced by the presence of liquid phase additives during sintering. Oxides such as TiO2, SiO2, Bi2O3, and Pr6O11 were incorporated into the liquid phase during the sintering of YBa2Cu3O7−δ (123) by use of grain boundary diffusion couples and the microstructure was analyzed using scanning electron microscopy/electron dispersive spectroscopy. Exaggerated grain growth and domain formation was observed in bulk specimens. Differential thermal analysis and real time dynamic x-ray diffraction were used to determine reaction sequencing. The ability and extent of domain formation was determined for 123 samples coupled with impurity oxides to be a function of sintering temperature (940–980°) and oxygen partial pressure. Enhanced texturing was observed at low PO2 atmospheres. The addition of Bi2O3 and TiO2 was shown to degrade dc magnetic susceptibility of 123 whereas SiO2 and Pr6O11 enhanced it. The domain formation and texturing takes place in the bulk for 123 at temperatures of 980°C or below (i.e. well below the peritectic decomposition temperature) by the interaction of an impurity doped liquid phase followed by a precipitation and exaggerated grain growth.  相似文献   

17.
For the nominal composition of Bi2.27−xPbxSr2Ca2Cu3O10+d, the lead content was varied from x < 0.05 to 0.45. The compositions were examined between 800 and 890‡C which is supposed to be the temperatue range over which the so-called 2223 phase (Bi2Sr2Ca2Cu3O10+d) is stable. Only compositions between x < 0.18 to 0.36 could be synthezised in a single phase state. For x <0.36, a lead-containing phase with a stoichiometry of Pb4(Sr,Ca)5CuOd with a small solubiliy of Bi is formed, for x > 0.18 mainly Bi2Sr2CaCu2O8+d and cuprates are the equilibrium phases. The temperature range for the 2223 phase was found to be 800 to 890‡C but the 2223 phase has extremely varying cation ratios over this temperaure range. Former single phase 2223 samples turn to multiphase samples when annealed at slightly higher or lower temperaures. A decrease in the Pb solubility with increasing as well as decreasing temperature with a maximum at about 850‡C was found for the 2223 phase.  相似文献   

18.
Strained-layer SiGex-on-Si heteroepitaxy has been achieved by photolytic decomposition of disilane (Si2H6) and digermane (G e2H6) in an ultra high vacuum (UHV) chamber at substrate temperatures as low as 275°C. An ArF excimer laser (193 nm) shining parallel to the Si substrate was used as the UV light source to avoid surface damage and substrate heating. The partial pressures of the source gases in the reactor were chosen to vary the Ge mole fraction x from 0.06 to 0.5 in the alloy. The Si2H6 partial pressure was kept at 10 mTorr and the Ge2H6 partial pressure was varied from 0.13 to 2 mTorr with the laser intensity fixed at 2.75 × 1015 photons/cm2·pulse. To fit the Si1−xGex growth rate and Ge mole fraction data, the absorption cross section of Ge2H6 at 193 nm was set to 1 × 10−16 cm2, which is 30 times larger than that of Si2H6 (3.4 × 10−18 cm2). For Si1−xGex alloy growth, the deposition rate of Si increases with Ge mole fraction, resulting in increased Si1−xGex alloy growth rates for higher Ge content. The increase of the Si growth rate was attributed to the enhanced adsorption rate of Si2H6 pyrolytically in the presence of Ge, rather than due to photolytic decomposition reaction. The Ge mole fraction in Si1−xGex alloys can be predicted by a new model for Si and Ge pyrolytic and photolytic growth. The model describes the increased growth rate of Si1−xGex alloys due to a Ge2H6 catalytic effect during photo-enhanced chemical vapor deposition.  相似文献   

19.
Chemical–mechanical polishing of CdTe and Zn x Cd1−x Te single-crystal surfaces by bromine-evolving compositions based on aqueous solutions of H2O2(HNO3)–HBr–solvent has been investigated. The dependences of the chemical–mechanical polishing rate on the dilution of the base polishing etchant for various organic components have been determined. The surface condition after such polishing has been investigated using profilometry. The polishing etchant compositions for CdTe and Zn x Cd1−x Te single-crystal surfaces and the chemical polishing conditions have been optimized.  相似文献   

20.
The SiO2 film as an insulator in InP MOS structure was grown by mercury-sensitized photo induced chemical-vapor deposition (photo-CVD) utilizing gaseous mixture of monosilane (SiH4) and nitrous oxide (N4O) under 253.7 nm ultraviolet light irradiation. The PHOTOX SiO2 film (i.e., SiO2 film prepared by photo-CVD system) deposited at 250° C has a refractive index of 1.46 and breakdown field strength of 7.0 MV/cm. The 1 MHz capacitance-voltage characteristics of the InP MOS diode was measured to study the interface state densities. The minimum value is 1.2 × 1011 cm−2eV−1 for the sample prepared at a substrate temperature of 250° C.  相似文献   

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