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微机电系统的主要元件是加速度器,它在恶劣环境下工作,热循环和机械冲击会导致元件的失效,材料疲劳引起的断裂、水蒸气引起性能的降低等现象都需要从原始材料开始进行特性测量,同时对制成品同样需要严格的测量和筛选。这里介绍Analog Devices公司的ADXL250双轴表面型MEMS加速度器的生产测试方法。ADXL250是额定值±50G的加速度器,电容性传感器是关键元件,它形成在Si衬底上,在正交90度的两个灵敏轴对加速度产生反应,静止电容量只有0.1pF,加速度使电容量变化,变化量0.001~0.01pF,由片上的电子电路读出。ADXL250采用14引脚的陶瓷封装,可供表面贴装的印刷电路板使用。要求封装内的全部元 相似文献
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在分析原子力显微镜工作原理的基础上,详细介绍了各种基于原子力显微镜的悬臂梁微尖端器件的应用进展,并展望了悬臂梁微尖端器件的发展前景。 相似文献
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原子力显微镜已成为人们观测和研究物体微观世界的强有力工具,由悬臂梁与探针集成件(Cantileverstylus)组成的力传感器是原子力显微镜的一个关键部件,它的结构和性能直接影响原子力显微镜的性能、测量分辨率和测试图象质量。本文着重介绍了原子力显微镜基本工作原理、对力传感器的要求、力传感器的结构和设计、力传感器的微机械加工以及其主要性能测试等问题。 相似文献
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压电微悬臂有原子力显微镜中的应用 总被引:2,自引:0,他引:2
微悬臂是原子力显微镜中最重要的部件之一。用压电微悬臂代替常用的Si、SiO2或Si3N微悬臂后的原子力显微镜有一定独特的优点。由于压电微悬臂中的压电薄膜具有压电效应,因此它既可致动微悬臂,又可探测微悬臂的位移量,使得原子力显微镜的结构简单、响应速度快、扫描速度加快.文中简要介绍了压电微悬臂的制作过程,分析了压电微悬臂在原子力显微镜中的各种应用及相应的原子力显微镜的工作原理和有关结果,并与普通原子力 相似文献
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传统的以PC机为控制核心的AFM(atomic force microscope)越来越无法满足快速成像的要求,具有先进控制系统的高速AFM正成为国内外的一个研究热点.本文介绍了一种以DSP(digital signal processor)为控制核心的AFM系统.在该系统中,自动进针/退针、扫描电压的产生、A/D采样、D/A输出以及数字闭环反馈控制等任务均在DSP控制下完成;在分辨率为512×512时,可以获得行频55 Hz的扫描速度.实验表明,即便在这样高速扫描的情况下,该系统仍具有良好的成像性能. 相似文献
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Cristina Martin‐Olmos L. Guillermo Villanueva Peter D. van der Wal Andreu Llobera Nico F. de Rooij Jürgen Brugger Francesc Perez‐Murano 《Advanced functional materials》2012,22(7):1482-1488
Processing flexibility and good mechanical properties are the two major reasons for SU‐8 extensive applicability in the micro‐fabrication of devices. In order to expand its usability down to the nanoscale, conductivity of ultra‐thin SU‐8 layers as well as its patterning by AFM are explored. By performing local electrical measurements outstanding insulating properties and a dielectric strength 100 times larger than that of SiO2 are shown. It is also demonstrated that the resist can be nano‐patterned using AFM, obtaining minimum dimensions below 40nm and that it can be combined with parallel lithographic methods like UV‐lithography. The concurrence of excellent insulating properties and nanometer‐scale patternability enables a valuable new approach for the fabrication of nanodevices. As a proof of principle, nano‐electrode arrays for electrochemical measurements which show radial diffusion and no overlap between different diffusion layers are fabricated. This indicates the potential of the developed technique for the nanofabrication of devices. 相似文献
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Daniele Passeri Ugo Sassi Andrea Bettucci Emanuela Tamburri Francesco Toschi Silvia Orlanducci Maria Letizia Terranova Marco Rossi 《Advanced functional materials》2012,22(14):2956-2963
The thermoacoustic effect of isolated single‐wall carbon nanotubes aligned between electrodes is experimentally observed for the first time by imaging the emitted acoustic wave using an atomic force microscopy‐based technique specifically developed for the task. The capability of such a technique for single‐point thermoacoustic measurements is first verified on carbon nanotubes layers with two electrodes for injecting alternate electric current. The technique is then demonstrated to allow the acquisition, simultaneously with the topography, of images reflecting the pressure of the acoustic wave at fixed distance from the sample. Such a capability is used to collect images reflecting the amplitude of acoustic waves generated by isolated nanotubes and nanotube bundles by the thermoacoustic effect. 相似文献
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Cong Yan Imad Arfaoui Nicolas Goubet Marie‐Paule Pileni 《Advanced functional materials》2013,23(18):2315-2321
The elastic properties of highly ordered three‐dimensional colloidal crystals of gold nanocrystals (called supracrystals) are reported. This study is based on the simultaneous growth of two kinds of gold nanocrystal supracrystals that range in size from 5 nm to 8 nm: interfacial supracrystals and precipitated supracrystals. The elastic properties are deduced from nanoindentation measurements performed with an atomic force microscope. The Young's modulus of the interfacial supracrystals, which grow layer‐by‐layer and form well‐defined films, is compared to that of precipitated supracrystals, which are produced by homogeneous growth in solution. For the precipitated supracrystals, characterized by a thickness larger than 1 μm, the Oliver and Pharr model is used to determine the elastic moduli, which are in the gigapascal range and decrease with increasing nanocrystal size. For the interfacial supracrystals, with 300 nm average thickness, a second model (plate model) is applied in addition to the Oliver and Pharr model. These two models confirm independently that the interfacial films are very soft with Young's modulus in the range of 80–240 MPa. This result reveals a totally new feature of nanocrystal solids, never emphasized before. It is shown that these changes in the Young's modulus are related to the supracrystal growth mechanism. 相似文献
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S. Piperno I. Kaplan‐Ashiri S. R. Cohen R. Popovitz‐Biro H. D. Wagner R. Tenne E. Foresti I. G. Lesci N. Roveri 《Advanced functional materials》2007,17(16):3332-3338
Geoinspired synthetic chrysotile nanotubes both stoichiometric and 0.67 wt % Fe doped were characterized by transmission electron microscopy and electron diffraction. Bending tests of the synthetic chrysotile nanotubes were performed using the atomic force microscope. The nanotubes were found to exhibit elastic behaviour at small deformations (below ca. 20 nm). Young's modulus values of (159 ± 125) GPa and (279 ± 260) GPa were obtained from the force‐deflection curves using the bending equation for a clamped beam under a concentrated load, for the stoichiometric and the Fe doped chrysotile nanotubes, respectively. The structural modifications induced by Fe doping altered the mechanical properties, with an apparent dependence of the latter on the number of constituting walls of the nanotubes. 相似文献
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扫描探针显微镜(SPM)作为一种广泛应用的表面表征工具,不仅可以表征三维形貌,还能定量地研究表面的粗糙度、孔径大小和分布及颗粒尺寸,在许多学科均可发挥作用.以纳米材料为主要研究对象,综述了国外最新的几种扫描探针显微表征技术,包括扫描隧道显微镜(STM)、原子力显微镜(AFM)和近场扫描光学显微镜(SNOM)等方法,展示了这几种技术在纳米材料的结构和性能方面的应用. 相似文献
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展示了摩擦强度对聚酰亚胺薄膜表面形态的影响,原子力显微图像显示,机械摩擦会使聚酰亚胺薄膜表面上形成微沟槽,这些沟槽的表面具有丰富的表面精细构造。原子显微图像还揭示了机械摩擦可以改变被磨擦聚酰亚胺膜的表面形态。 相似文献
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超光滑光学基底表面原子力显微镜测试方法 总被引:1,自引:0,他引:1
原子力显微镜(AFM)是评价亚纳米级表面粗糙度σRMS最主要的测试仪器,但其测试结果会因采样条件(采样间距、采样点数)及测量点位置变化而改变。以AFM测试超光滑光学基底随机表面为例,应用累积功率谱理论建立了确定合理采样条件的方法,避免了采样条件选取不当带来的数据丢失或冗余;通过全局优化选取测量点和局部优化选取测量点相结合,降低了样品表面区域性差异给测试结果带来的不确定性,并大大减少了获得可靠测试结果所需的测试量。上述工作为超光滑光学基底AFM测试提供了有效方案。 相似文献