Sub-micrometer thick CuInSe2 films for solar cells using sequential elemental evaporation

CuInSe₂ thin films were prepared using sequential vacuum evaporation of In, Se and Cu at moderately low substrate temperatures, avoiding any treatment using toxic H₂Se gas. The samples were annealed at 400 °C at a pressure of 10⁻⁵ mbar to form CuInSe₂. Structural, optical, electrical, compositional and morphological characterizations were carried out on these films. We could obtain highly stoichiometric film, using this simple method, without opting for co-evaporation or high substrate temperature for deposition.     

The formation of CuInSe2 thin film solar cell absorbers from electroplated precursors with varying selenium content

We present results from real-time X-ray diffraction experiments on the formation of CuInSe₂ solar cell absorbers by annealing precursors, produced by simultaneous electrodeposition of copper, indium and selenium. The investigations reveal, that a reduced amount of electrochemically deposited selenium is the decisive parameter in order to realise a chalcopyrite formation behaviour as observed for sputtered stacked elemental layer (SEL) precursors. A simultaneous electrodeposition of the elements copper, indium and selenium in the molar ratio 1:1:2 of the chalcopyrite CuInSe₂ leads to the formation of binary copper and indium selenides during the electrodeposition process. The existence of binary selenides besides the intermetallic phase Cu₁₁In₉ as initial phases leads to an unfavourable absorber morphology. This can be explained by the observed semiconductor formation mechanism. A reduction of the deposited amount of selenium favours the formation of the intermetallic compound Cu₁₁In₉ and reduces the amount of binary selenides. These precursors show a formation behaviour and resulting absorber morphology as known for sputtered SEL precursors.     

Preparation and study of structural and optical properties of CSVT deposited CuInSe2 thin films

A simple close-spaced vapour transport (CSVT) system has been designed and fabricated. Copper indium diselenide (CuInSe₂) thin films of wide range of thickness (4000–60000 Å) have been prepared using the fabricated CSVT system at source temperatures 713, 758 and 843 K. A detailed study on the deposition temperature has been made and the temperature profile along with the reaction kinetics is reported. The composition of the chemical constituents of the films has been determined by energy dispersive X-ray analysis. The structural characterization of the as-deposited CuInSe₂ films of various thicknesses has been carried out by X-ray diffraction method. The diffractogram revealed that the CuInSe₂ films are polycrystalline in nature with chalcopyrite structure. The structural parameters such as lattice constants, axial ratio, tetragonal distortion, crystallite size, dislocation density and strain have been evaluated and the results are discussed. The surface morphology of the as-deposited CuInSe₂ thin films has been studied using scanning electron microscope. The transmittance characteristics of the CuInSe₂ films have been studied using double beam spectrophotometer in the wavelength range 4000–15000 Å and the optical constants n and k are evaluated. The absorption coefficient has been found to be very high and is of the order of 10⁵–10⁶ m⁻¹. CuInSe₂ films are found to have a direct allowed transition and the optical band gap is found to be in the range 0.85–1.05 eV.     

Real-time investigations on the formation of CuInSe2 thin film solar cell absorbers from electrodeposited precursors

In this article, we present results of a detailed real-time X-ray diffraction (XRD) study on the formation of CuInSe₂ from electroplated precursors. The solid-state reactions observed during the selenisation of three different types of precursors are presented. The first type of precursors (I) consists of the nanocrystalline phases Cu_2−xSe and InSe at room temperature, which react to CuInSe₂ starting at 470 K. The second type of precursor (II) shows an inhibited CuInSe₂ formation out of the initial phases Cu_2−xSe and γ-In₂Se₃ starting at 400 K. The third precursor type (III) shows completely different selenisation behaviour. Starting from the intermetallic compound Cu₁₁In₉ and amorphous selenium, the formation of the binary selenides In₄Se₃ and CuSe is observed after the melting point of selenium at 494 K. After selenium transfer reactions, the compound semiconductor CuInSe₂ is formed out of Cu_2−xSe and InSe. This type (III) reaction path is well known for the selenisation of SEL precursors (stacked elemental layers of sputtered copper and indium and thermally evaporated selenium).     

Preparation and characterization of spray-deposited Cu2ZnSnS4 thin films

Thin films of Cu₂ZnSnS₄ (CZTS), a potential candidate for absorber layer in thin film heterojunction solar cell, have been successfully deposited by spray pyrolysis technique on soda-lime glass substrates. The effect of substrate temperature on the growth of CZTS films is investigated. X-ray diffraction studies reveal that polycrystalline CZTS films with better crystallinity could be obtained for substrate temperatures in the range 643-683 K. The lattice parameters are found to be a=0.542 and c=1.085 nm. The optical band gap of films deposited at various substrate temperatures is found to lie between 1.40 and 1.45 eV. The average optical absorption coefficient is found to be >10⁴ cm⁻¹.     

Optical and electrical properties of flash-evaporated amorphous CuInSe2 films

Amorphous films of CuInSe₂ were deposited on glass substrate by flash evaporation of source materials. The films were found to be p-type semiconductors. The direct optical band-gap energy was obtained to be 1.21–1.41 eV. The film DC conductivity ranged from 1.2–5.7 S cm⁻¹ at 285 K for different film thickness with corresponding activation energy of 55.5–301 meV. From temperature dependence of conductivity, the carrier transport was interpreted to be due to band conduction above 270 K.     

CuInSe2 thin film preparation through a new selenisation process using chemical bath deposited selenium

Copper indium selenide thin films were prepared through a novel and an eco-friendly selenisation process. In this method, selenium film required for selenisation was prepared using chemical bath deposition technique, at room temperature. Thus, totally avoided usage of highly toxic H₂Se or selenium vapour. Here, the process involved annealing the Stacked layer, Se/In/Cu in which Cu and In were deposited using vacuum evaporation technique. Investigations on the solid-state reaction between the layers were done by analysing structural and optical properties of films formed at different annealing temperatures. Optimum annealing condition for the formation of copper indium selenide thin film was found to be 673 K for 1 h in high vacuum. Compositional dependence of the growth process was also studied using various Cu/In ratios. Optical band gap was decreased with increase in Cu/In ratio. Carrier concentration and hence conductivity were found to be increased with increase in Cu/In ratio. The films obtained were p-type and highly Cu-rich films were degenerate.     

The formation of CuInSe2 thin films by rapid thermal processing

Formation of polycrystalline thin film CuInSe₂ was achieved by the rapid thermal processing of vacuum-deposited copper, indium, and selenium. Films were fabricated and characterized in three composition regions: copper-poor (approximately 20 at.% Cu). stoichiometric (25 at.% Cu) and copper-rich (approximately 28 at.% Cu). Characterization results including X-ray diffraction analysis, electron probe for microanalysis, scanning electron microscopy, and optical reflection and transmission measurements are presented. The results show that nearly single-phase material has been formed from co-deposited precursors with a post-deposition annealing time of less than 2 min. The films have smooth morphologies amenable for photovoltaic device fabrication, optical absorption coefficients in the high 10⁴ cm⁻¹ range, and an optical band gap of 1.0 eV.     

Electrodeposition of CuInSe2 from ethylene glycol at 150 °C

Polycrystalline chalcopyrite thin films were potentiostatically electrodeposited from ethylene glycol solution onto SnO₂-coated glass substrates at 150 °C. The thickness of the layers was estimated using talysurf at 1.0 μm after deposition for 60 min. X-ray diffraction (XRD), X-ray fluorescence (XRF), scanning electron microscopy (SEM) and energy dispersive X-ray (EDX) analyses were used to identify and characterise compounds formed at different potentials. It was found that Cu_1.75Se formation was dominant at −0.80 V vs Se and indium assimilation increased at more negative voltages forming a mixture of compounds including numerous Cu-Se binary phases and copper indium diselenide (CuInSe₂) at the cathode. As-deposited materials showed poor crystallinity and therefore films were annealed in Ar/5%H₂ in the presence of Se to improve the material quality for all investigations. Although the films were deposited at 150 °C, no noticeable improvement of the CuInSe₂ was observed, suggesting growth from aqueous media at room temperature to be preferable.     

Structure, morphology and photoelectrochemical activity of CuInSe2 thin films as determined by the characteristics of evaporated metallic precursors

CuInSe₂ thin films have been obtained by the sequential evaporation of Cu and In layers, and subsequent reaction at 400°C with elemental selenium vapor. The individual metallic film thickness and the substrate temperature during evaporation have been varied in order to promote intermixing and alloy formation before the selenization. The structure, morphology and photoelectrochemical activity of the CuInSe₂ films have been determined by the characteristics of the evaporated metallic precursors. An improvement in the CuInSe₂ quantum efficiency, related mainly to the increased homogeneity and smoothing of the sample surface, can be gained by using as precursors multiple stacked Cu–In bilayers evaporated onto unheated substrates.     

Precursor modification for preparation of CIS films by selenization technique

CuInSe₂ films have been prepared using the selenization technique. Preparation of the precursor as well as selenization were carried out by the vacuum evaporation technique. The sequence of copper and Indium layer deposition during precursor preparation affects the morphological and structural properties of precursor which directly have effects on the properties of selenized CIS films. A thin layer of amorphous selenium at the substrate/film interface has been used to improve the adherence of the film. The effect of the Se under-layer has been studied on the layers of copper, indium, CuIn precursors and CIS films, using structural, morphological and optical properties. The surface morphology of a single layer of copper and indium, with and without the Selenium under-layer, are quite different and drastically affect the properties of the precursor and selenized films. The Se under-layer does not take part in the chemical reaction of CIS formation during the selenization process. The modified CIS films are uniform, single phase, polycrystalline, chalcopyrite with (1 1 2) preferred orientation showing an energy band gap of 0.99 eV and an absorption coefficient of 10⁵ cm⁻¹, and have good adherence to the substrate for the scotch tape test.     

Effect of bath temperature and annealing on the formation of CuInSe2

CuInSe₂ films of 2 μm thickness were electrodeposited potentiostatically, from aqueous solution containing thiocyanate as a complexing agent, on Mo substrates. For all the experiments, the potential of the potentiostatic deposition of the materials was chosen to be −1 V, whereas the bath temperature of electrolyte was varied from 20 to 80 °C. It was found that the electrodeposited CuInSe₂ was characterized by an amorphous layer and densely-packed nanometric grains with a good homogeneity. After vacuum annealing at 200 °C, glancing angle X-ray diffraction revealed the presence of the CuInSe₂ phase whereas annealing under selenium atmosphere lead to the growth of molybdenum selenide compound MoSe₂, in addition to a better crystallization of the copper indium diselenide compound. Scanning electron microscopic revealed that despite an increase in the grains dimensions, there was no significant change in the films surface morphology when the bath temperature was varied from 20 to 80 °C. At the same time, the composition of the electrodeposited Cu-In-Se layers becomes richer in copper. This increase in copper concentration is mainly compensated by a deficit in selenium atoms.     

An investigation into effect of cationic precursor solutions on formation of CuInSe2 thin films by SILAR method

SILAR deposition of CuInSe₂ films was performed by using Cu²⁺–TEAH₃ (cupric chloride and triethanolamine) and In³⁺–CitNa (indium chloride and sodium citrate) chelating solutions with weak basic pH as well as Na₂SeSO₃ solution at 70 °C. A separate mode and a mixed one of cationic precursor solutions were adopted to investigate effects of the immersion programs on crystallization, composition and morphology of the deposited CuInSe₂ films. Chelating chemistry in two solution modes was deducted based on IR measurement. The XRD, XPS and SEM results showed that well-crystallized, smoothly and distinctly particular CuInSe₂ films could be obtained after annealing in Ar at 400 °C for 1 h by using the mixed cationic solution mode.     

Thermal diffusion of Cu into In2Se3: A better approach to SEL technique in the deposition of CuInSe2 thin films

This paper reports the modifications made in the preparation techniques of getting CuInSe₂ thin films starting with chemical bath deposited (CBD) selenium films. In the present study, CBD Se film was converted into CuInSe₂ by stacked elemental layer (SEL) technique and also by thermal diffusion of Cu into In₂Se₃. In both the cases CBD Se films were used to avoid toxic Se vapor and H₂Se gas. Improvements were made in these techniques through a detailed study, varying the composition of the films over a wide range by changing the Cu/In ratio. Structural, optical and electrical characterizations were performed. On comparing the material properties of CuInSe₂ deposited by these two techniques, it was found that photosensitivity was better for samples prepared by thermal diffusion of Cu into In₂Se₃. So the technique of thermal diffusion of Cu into In₂Se₃ was found to be better than SEL technique in the preparation of CuInSe₂ using CBD Se. Cu-rich, In-rich and nearly stoichiometric samples could be prepared by thermal diffusion of Cu into In₂Se₃. These samples were analyzed using energy dispersive spectroscopy, Raman spectroscopy and atomic force microscopy also.     

Crystal structure and composition of polycrystalline CuInSe2

This work presents and analyses the X-ray diffraction data for the semiconducting compound CuInSe₂, synthesized by the vertical Bridgman method. The (Cu/In) ratio was varied to produce a stoichiometric CuInSe₂ ingot. Structure factors (F_hkl) equations for the (hkl) reflections, which are available for the ternary chalcopyrite-structured semiconductors, were deduced analytically and have been used to calculate the relative peak intensities for CuInSe₂ diffraction planes.CuInSe₂ thin films were also prepared by flash evaporation of a stoichiometric CuInSe₂ powder, onto different substrates. Structural characterization of these films was carried out by X-ray diffraction and scanning electron microscopy studies. The composition of the different samples has been determined by energy dispersive spectrometry. The results obtained indicate the presence of the chalcopyrite phase and nearly stoichiometric compositions.     

Effect of S/In concentration ratio on the physical properties of AgInS2-sprayed thin films

 AgInS₂ thin films have been prepared on glass substrates by the spray pyrolysis process using an aqueous solution, containing silver acetate (AgCH₃CO₂), thiourea (SC(NH₂)₂) and indium chloride (InCl₃) as precursors. The depositions were carried out at the substrate temperature of 420 °C. The value of the concentration ratio in the spray solution of indium and silver elements x=[Ag⁺]/[In³⁺] was equal to 1.3, whereas y=[S²⁻]/[In³⁺] varied between 4 and 7. The structural study (XRD, EPMA and AFM ) shows that all films obtained using y=4 with a nearly stoichiometric composition consist essentially of AgInS₂ chalcopyrite compound and they exhibit in the as-deposited state, the best crystallinity with a (1 1 2) preferential orientation. On the other hand, films obtained using y higher than y=4 exhibit p-type character. Moreover, the optical analysis via the transmittance, reflectance reveals that the band-gap energy E_g increases slightly as a function of y composition (E_g varies from 1.87 to 2.07 eV).     

Complexing agent effect on the stoichiometric ratio of the electrochemically prepared CuInSe2 thin films

The electrodeposition of CuInSe₂ is investigated to improve the stoichiometric properties of CuInSe₂ layers on indium tin oxide (ITO)-coated glass substrates and to develop one-step electrodeposition method for solar cell applications. XPS was utilized for the characterization of the surface properties of CuInSe₂ layers. The influence of the complexing agent, e.g. benzotriazole, bulk concentration of Cu and Se and deposition potentials on the stoichiometric properties, are discussed.     

Investigations on electron beam evaporated Cu(In0.85Ga0.15)Se2 thin film solar cells

CIGS bulk with composition of CuIn_0.85Ga_0.15Se₂ was synthesized by direct reaction of elemental copper, indium, gallium and selenium. CIGS thin films were then deposited onto well-cleaned glass substrates using the prepared bulk alloy by electron beam deposition method. The structural properties of the deposited films were studied using X-ray diffraction technique. The as-deposited CIGS films were found to be amorphous. On annealing, the films crystallized with a tetragonal chalcopyrite structure. An intermediate Cu-rich phase precipitated at 200 °C and dissociated at higher annealing temperatures. Average grain size calculated from the XRD spectra indicated that the films had a nano-crystalline structure and was further corroborated by AFM analysis of the sample surface. The chemical constituents present in the deposited CIGS films were identified using energy dispersive X-ray analysis. CIGS based solar cells were then fabricated on molybdenum and ITO coated glass substrates and the efficiencies have been evaluated.     

Effect of 8 MeV electron irradiation on electrical properties of CuInSe2 thin films

Radiation damages due to 8 MeV electron irradiation in electrical properties of CuInSe₂ thin films have been investigated. The n-type CuInSe₂ films in which the carrier concentration was about 3×10¹⁶ cm⁻³, were epitaxially grown on a GaAs(0 0 1) substrate by RF diode sputtering. No significant change in the electrical properties was observed under the electron fluence <3×10¹⁶ e cm⁻². As the electron fluence exceeded 10¹⁷ e cm⁻², both the carrier concentration and Hall mobility slightly decreased. The carrier removal rate was estimated to be about 0.8 cm⁻¹, which is slightly lower than that of III–V compound materials.     

A comparative study of CuInSe2 and CuIn3Se5 films using transmission electron microscopy, optical absorption and Rutherford backscattering spectrometry

CuInSe₂ and CuIn₃Se₅ films were grown by stepwise flash evaporation onto glass and Si substrates held at different temperatures. Transmission electron microscopy (TEM) studies revealed that the films grown above 370 K were polycrystalline, with CuInSe₂ films exhibiting larger average grain size than CuIn₃Se₅. Optical absorption studies yielded band gaps of 0.97±0.02 and 1.26±0.02 eV for CuInSe₂ and CuIn₃Se₅, respectively. Rutherford backscattering spectrometry (RBS) study of the films on Si showed that CuInSe₂/Si structures included an inhomogeneous interface region consisting of Cu and Si, whereas CuIn₃Se₅/Si structures presented sharp interface.