Structural and optical properties of sulfur-annealed CuInS2 thin films

CuInS₂ thin films were deposited by single source vacuum thermal evaporation method on substrates submitted to longitudinal thermal gradient. Some of these films were annealed in sulfur atmosphere and converted into CuInS₂ homogenous layers. Both of the as-deposited and sulfurated films were characterized by X-ray diffraction, optical transmission and reflection measurements. The optical band gap of films after sulfurization was 1.50 eV which is near the optimum value for photovoltaic energy conversion.     

Preparation and study of structural and optical properties of CSVT deposited CuInSe2 thin films

A simple close-spaced vapour transport (CSVT) system has been designed and fabricated. Copper indium diselenide (CuInSe₂) thin films of wide range of thickness (4000–60000 Å) have been prepared using the fabricated CSVT system at source temperatures 713, 758 and 843 K. A detailed study on the deposition temperature has been made and the temperature profile along with the reaction kinetics is reported. The composition of the chemical constituents of the films has been determined by energy dispersive X-ray analysis. The structural characterization of the as-deposited CuInSe₂ films of various thicknesses has been carried out by X-ray diffraction method. The diffractogram revealed that the CuInSe₂ films are polycrystalline in nature with chalcopyrite structure. The structural parameters such as lattice constants, axial ratio, tetragonal distortion, crystallite size, dislocation density and strain have been evaluated and the results are discussed. The surface morphology of the as-deposited CuInSe₂ thin films has been studied using scanning electron microscope. The transmittance characteristics of the CuInSe₂ films have been studied using double beam spectrophotometer in the wavelength range 4000–15000 Å and the optical constants n and k are evaluated. The absorption coefficient has been found to be very high and is of the order of 10⁵–10⁶ m⁻¹. CuInSe₂ films are found to have a direct allowed transition and the optical band gap is found to be in the range 0.85–1.05 eV.     

Structural and optical properties of CuInTe2 films prepared by thermal vacuum evaporation from a single source

The CuInTe₂ thin films were prepared by thermal vacuum evaporation from a single source. The effects of heat treatment on both structural an optical properties of CuInTe₂ films were studied. X-ray diffraction studies reveal that the films prepared by the present method showed formation of single phase CuInTe₂ at heating treatment temperature higher than 300°C. The calculated lattice constants for CuInTe₂ films annealed at 300°C were found to be and . The value of the grain size obtained in these films was of the order of 50 nm. The value of optical energy gap (0.97 eV) and the dispersive refractive index n(λ) for CuInTe₂ film annealed at 300°C were evaluated by optical absorption measurement.     

Analysis of the optical absorption characteristics of CuInSe2 thin films

Thin films of compound CuInSe₂ have been developed onto glass substrates by in situ thermal annealing of the stack of successively evaporated elemental layers in vacuum. The atomic compositions and the optical properties of the films have been determined by proton-induced X-ray emission (PIXE) method and spectrophotometry in the photon wavelength range of 300–2500 nm, respectively. The typical optical absorption characteristic of the films has been critically analysed. The absorption coefficients vary from 10³ to 10⁵ cm⁻¹ in the measured wavelength range. The films have more than one type of fundamental electronic transitions. Direct allowed and direct forbidden transitions vary between 0.947 to 0.989 eV and 1.099 to 1.204 eV, respectively, depending on the composition of the films. The former transition varies inversely with the Cu/In ratio while the latter shows no such dependence. Valence band splittings due to spin–orbit coupling converge towards the single-crystal value for the near-stoichiometric (NS) and Cu-rich films.     

Effect of preparation conditions on the optical and thermochromic properties of thin films of tungsten oxide

Thin films of tungsten oxide have been prepared by thermal evaporation. The effect of preparation conditions (heating of substrates and oxygen environment) on the optical constants (n and k) of the films has been studied. Satisfactory derivation of n and k from the measured normal incidence transmittance of the films was achieved. It was found that (a) both n and k have larger values for films deposited on heated substrates than for those deposited on unheated substrates, and at a given substrate temperature, (b) both n and k have smaller values for films deposited in the oxygen atmosphere than those deposited without an introduction of oxygen in the chamber.Thermochromic colouration of the films was carried out by annealing the films in vacuum. The annealing of the films produced significant loss in the oxygen content (measured by X-ray photoelectron spectroscopy) and modulation of the transmittance for the films deposited on unheated substrates with or without the oxygen environment and films deposited on heated substrates with the oxygen. The loss in the oxygen content and the modulation of transmittance, however, were very small for films deposited on heated substrates without the oxygen. For annealed films, satisfactory derivation of n and k was achieved for films deposited on unheated substrates, while for films deposited on heated substrates this was not possible. This study revealed that upon annealing the optical properties of the films prepared in the oxygen environment were mainly absorptance-modulated, and those of the films without the oxygen were reflectance-modulated.     

An investigation into effect of cationic precursor solutions on formation of CuInSe2 thin films by SILAR method

SILAR deposition of CuInSe₂ films was performed by using Cu²⁺–TEAH₃ (cupric chloride and triethanolamine) and In³⁺–CitNa (indium chloride and sodium citrate) chelating solutions with weak basic pH as well as Na₂SeSO₃ solution at 70 °C. A separate mode and a mixed one of cationic precursor solutions were adopted to investigate effects of the immersion programs on crystallization, composition and morphology of the deposited CuInSe₂ films. Chelating chemistry in two solution modes was deducted based on IR measurement. The XRD, XPS and SEM results showed that well-crystallized, smoothly and distinctly particular CuInSe₂ films could be obtained after annealing in Ar at 400 °C for 1 h by using the mixed cationic solution mode.     

Structure, composition and optical properties of Cu2ZnSnS4 thin films deposited by Pulsed Laser Deposition method

Polycrystalline Cu₂ZnSnS₄ (CZTS) thin films have been directly deposited on heating Mo-coated glass substrates by Pulsed Laser Deposition (PLD) method. The results of energy dispersive X-ray spectroscopy (EDX) indicate that these CZTS thin films are Cu-rich and S-poor. The combination of X-ray diffraction (XRD) results and Raman spectroscopy reveals that these thin films exhibit strong preferential orientation of grains along [1 1 2] direction and small Cu_2−xS phase easily exists in CZTS thin films. The lattice parameters and grain sizes have been examined based on XRD patterns and Atom Force Microscopy (AFM). The band gap (E_g) of CZTS thin films, which are determined by reflection spectroscopy varies from 1.53 to 1.98 eV, depending on substrate temperature (T_sub). The optical absorption coefficient of CZTS thin film (T_sub=450 °C) measured by spectroscopic ellipsometry (SE) is above 10⁴ cm⁻¹.     

Preparation of Cu(In,Ga)(S,Se)2 thin films by sequential evaporation and annealing in sulfur atmosphere

Cu(In,Ga)(S,Se)₂ thin films with high Ga/III ratio (around 0.8) were prepared by sequential evaporation from CuGaSe₂, CuInSe₂, In₂Se₃ and Ga₂Se₃ compounds and then annealing in H₂S gas atmosphere. The annealing temperature was varied from 400 to 500 °C. These samples were characterized by means of XRF, EPMA, XRD and SEM. The S/(S+Se) mole ratio in the thin films increased with increase in the annealing temperature, keeping the Cu, In and Ga contents nearly constant. The open circuit voltage increased and the short circuit current density decreased with increase in the annealing temperature. The best solar cell using Cu(In,Ga)(S,Se)₂ thin film with Ga/(In+Ga)=0.79 and S/(S+Se)=0.11 annealed at 400 °C demonstrated V_oc=535 mV, I_sc=13.3 mA/cm², FF=0.61 and efficiency=4.34% without AR-coating.     

Optical and structural properties of – thin films

In this study, the sol–gel spin-coating method has been used to make Ta₂O₅–CeO₂ thin films. These films have been prepared in various composition ratios to observe changes in their optical and structural properties. Reflectance and transmittance spectra were collected in the spectral range of 300–1000 nm and were accurately fit using the Tauc–Lorentz model. Film thicknesses, refractive indices, absorption coefficients, and optical band gaps were extracted from the theoretical fit. The highest refractive index value was found at 5% CeO₂ doping. The structure of the films was characterized by X-ray diffractometry and Fourier transform infrared spectrometry, while the surface morphology was examined through atomic force microscopy.     

Effect of Cl ion implantation on electrical properties of CuInSe2 thin films

The effects of Cl ion implantation on the properties of CuInSe₂ epitaxial thin films have been investigated. Using five kinds of accelerating energies, the doped layer with a constant profile of Cl concentration along the depth direction was fabricated. From the results of reflection of high-energy electron diffraction, the damages due to implantation were removed by annealing at 400°C in N₂. The conductivity type in all implanted films was n-type, and the carrier concentration was increased with increasing Cl concentration in the thin films. Consequently, it is considered that Cl acts as a donor in CuInSe₂.     

Effect of 8 MeV electron irradiation on electrical properties of CuInSe2 thin films

Radiation damages due to 8 MeV electron irradiation in electrical properties of CuInSe₂ thin films have been investigated. The n-type CuInSe₂ films in which the carrier concentration was about 3×10¹⁶ cm⁻³, were epitaxially grown on a GaAs(0 0 1) substrate by RF diode sputtering. No significant change in the electrical properties was observed under the electron fluence <3×10¹⁶ e cm⁻². As the electron fluence exceeded 10¹⁷ e cm⁻², both the carrier concentration and Hall mobility slightly decreased. The carrier removal rate was estimated to be about 0.8 cm⁻¹, which is slightly lower than that of III–V compound materials.     

Structural and optical properties of In-rich Cu–In–Se polycrystalline thin films prepared by chemical spray pyrolysis

Structural and optical properties of In-rich Cu–In–Se polycrystalline thin films (0.54<In/(Cu+In)<0.78) prepared by chemical spray pyrolysis (CSP) on glass substrate have been systematically studied in terms of In/(Cu+In) ratio. Lattice constants a and c of the films decrease with increase of In/(Cu+In) ratio. The films exhibit a characteristic Raman peak shifting higher frequencies as the In/(Cu+In) ratio increases. Optical bandgap energy is approximately 1.22 eV for 0.54<In/(Cu+In)<0.67, but increases from 1.22 to 1.36 eV when the In/(Cu+In) ratio increases from 0.67 to 0.78. Photoacoustic measurements reveal the existence of high concentration of nonradiative centers introduced by the deviation from the stoichiometric composition.     

Carbon-doped Sb2S3 thin films: Structural, optical and electrical properties

We report the modification of electrical properties of chemical-bath-deposited antimony sulphide (Sb₂S₃) thin films by thermal diffusion of carbon. Sb₂S₃ thin films were obtained from a chemical bath containing SbCl₃ and Na₂S₂O₃ salts at room temperature (27 °C) on glass substrates. A carbon thin film was deposited on Sb₂S₃ film by arc vacuum evaporation and the Sb₂S₃-C layer was subjected to heating at 300 °C in nitrogen atmosphere or in low vacuum for 30 min. The value of resistivity of Sb₂S₃ thin films was substantially reduced from 10⁸ Ω cm for undoped condition to 10² Ω cm for doped thin films. The doped films, Sb₂S₃:C, retained the orthogonal stibnite structure and the optical band gap energy in comparison with that of undoped Sb₂S₃ thin films. By varying the carbon content (wt%) the electrical resistivity of Sb₂S₃ can be controlled in order to make it suitable for various opto-electronic applications.     

Structural and thermoelectric properties of nanostructured p-SnO thin films grown by e-beam evaporation method

Today, the earnest need for earth-abundant and environmentally friendly thermoelectric materials has revealed the importance of semiconductor metal oxides in order to eliminate the barrier towards their wide-ranging use in industrial applications. In the present work, we demonstrate the synthesis of p-type tin oxide thin films on quartz glass and Si substrates by using electron beam evaporation technique followed by rapid thermal annealing process at 200 °C for 20 min in Ar-atmosphere. Annealing-induced structural, electrical, optical and thermoelectric properties of pristine and annealed SnO thin films are primarily studied. The compositional and structural analysis of SnO films are performed by using X-Ray Diffraction, Scanning Electron Microscope as well as Atomic Force Microscope. Moreover, the mechanism of thermoelectric transportation at different measurement temperatures is deeply inspected via thermoelectric measurements. The Seebeck coefficient, carrier concentration and hole mobility in conjunction with the development of thin film nanostructures are discussed, predominantly. The optimal annealing may tune structural, electro-optic and thermoelectric properties of SnO films for the commercial-level maturity of thermoelectric devices for energy applications.     

Study of the sub-bandgap absorption and the optical transitions in CuInSe2 polycrystalline thin films

Optical transitions near the fundamental band edge are studied for CuInSe₂ films having various Cu/In ratios by analysing the variations of the absorption coefficient with incident photon energy. The results indicate different transitions depending upon the Cu/In ratio. There are sub-bandgap absorption for near stoichiometric and Cu-rich films. The results are compared to some literature data.     

Structure, morphology and photoelectrochemical activity of CuInSe2 thin films as determined by the characteristics of evaporated metallic precursors

CuInSe₂ thin films have been obtained by the sequential evaporation of Cu and In layers, and subsequent reaction at 400°C with elemental selenium vapor. The individual metallic film thickness and the substrate temperature during evaporation have been varied in order to promote intermixing and alloy formation before the selenization. The structure, morphology and photoelectrochemical activity of the CuInSe₂ films have been determined by the characteristics of the evaporated metallic precursors. An improvement in the CuInSe₂ quantum efficiency, related mainly to the increased homogeneity and smoothing of the sample surface, can be gained by using as precursors multiple stacked Cu–In bilayers evaporated onto unheated substrates.     

Depth profile analysis of CuInSe2 (CIS) thin films grown by the electrodeposition technique

In this study, we report the results obtained from the auger electron spectroscopy (AES) depth profiling of CIS thin films grown by the electrodeposition technique. This result enables one to do a comparison between the bulk and superficial elemental compositions. The AES result is also compared with that obtained by the inductively coupled plasma (ICP) spectroscopy. These results support our proposition that the electrodeposited CIS film has a Cu-rich bulk region and an In rich surface, which leads to the formation of an n-layer (CuIn₂Se_3.5) on the top of the p-type CIS (CuInSe₂) phase     

TiO2 thin films - Influence of annealing temperature on structural, optical and photocatalytic properties

Nanostructured TiO₂ thin films were deposited on glass substrates by sol-gel dip coating technique. The structural, morphological and optical characterizations of the as deposited and annealed films were carried out using X-ray diffraction (XRD), Raman spectroscopy, atomic force microscopy (AFM), and UV-vis transmittance spectroscopy. As-deposited films were amorphous, and the XRD studies showed that the formation of anatase phase was initiated at annealing temperature close to 400 °C. The grain size of the film annealed at 600 °C was about 20 nm. The lattice parameters for the films annealed at 600 °C were a = 3.7862 ? and c = 9.5172 ?, which is close to the reported values of anatase phase. Band gap of the as deposited film was estimated as 3.42 eV and was found to decrease with the annealing temperature. At 550 nm the refractive index of the films annealed at 600 °C was 2.11, which is low compared to a pore free anatase TiO₂. The room temperature electrical resistivity in the dark was of the order of 4.45 × 10⁶ ohm-cm. Photocatalytic activity of the TiO₂ films were studied by monitoring the degradation of aqueous methylene blue under UV light irradiation and was observed that films annealed above 400 °C had good photocatalytic activity which is explained as due to the structural and morphological properties of the films.     

Electrical characterization of Al, Ag and In contacts on CuInS2 thin films deposited by spray pyrolysis

The specific contact resistivity (ρ_C) for aluminum (Al), silver (Ag) and indium (In) metallic contacts on CuInS₂ thin films was determined from I-V measurements, with the purpose of having the most appropriate ohmic contact for TCO/CdS/CuInS₂ solar cells; ρ_C was measured using the transmission line method (TLM) for the metallic contacts evaporated on CuInS₂ thin films deposited by spray pyrolysis with ratios x=[Cu]/[In]=1.0, 1.1, 1.3 and 1.5 in the spray solution. The results show that In contacts have the lowest ρ_C values for CuInS₂ samples grown with x=1.5. The minimum ρ_C was 0.26 Ω cm² for the In contacts. This value, although not very low, will allow the fabrication of CuInS₂ solar cells with a small series resistance.     

Optical and electrical properties of flash-evaporated amorphous CuInSe2 films

Amorphous films of CuInSe₂ were deposited on glass substrate by flash evaporation of source materials. The films were found to be p-type semiconductors. The direct optical band-gap energy was obtained to be 1.21–1.41 eV. The film DC conductivity ranged from 1.2–5.7 S cm⁻¹ at 285 K for different film thickness with corresponding activation energy of 55.5–301 meV. From temperature dependence of conductivity, the carrier transport was interpreted to be due to band conduction above 270 K.