基于EDA技术的数字电路设计性实验研究

利用EDA技术进行设计性实验的研究与开发,是改革传统数字电路实验教学模式的有效途径,能帮助学生熟悉和掌握最先进的电路设计方法和技能.通过实例分析及实验结果的对比,介绍了EDA技术中Multisim 2001软件平台在数字电路综合设计性实验中的具体应用及特点,阐明了EDA技术实验环境（仿真实验）与实际操作实验环境（实物实验）的优缺点,指出在数字电路设计性实验教学中,仿真实验与实物实验相结合的重要性.仿-实结合是现代数字电路设计性实验的最佳教学模式.     

一种基于FPGA的数字IC设计

EDA技术是一种高级、快速、有效的电子设计工具,充分利用了计算机自动设计、仿真和测试功能.利用EDA技术对数字集成电路(IC)进行描述、建模和设计,简化了IC电路设计任务.文章通过设计序列检测器,介绍了利用ALTERA公司的Quartus Ⅱ平台,通过硬件设计语言(VHDL),基于FPGA进行数字电路设计、描述、编译、仿真,定制IC等主要流程,表明了运用EDA技术设计数字电路具有灵活性、可靠性和可扩展性,在硬件设计领域中必将得到很好的应用.     

开发软件ISP在现代数字电路设计中的应用

电子设计自动化(EDA)技术为现代数字电路的设计提供了一个有力的工具.本文通过数字密码锁这一实例,详细介绍了开发软件ISP在现代数字电路设计中的使用方法.     

基于EDA技术的数字电子技术虚拟实验系统探究

文章针对如何提高数字电子技术实验课程的实践性问题,介绍了EDA技术及多种主流EDA设计工具,比较了多种EDA软件实现数字电路的方法和各个软件实现的侧重点。提出了基于EDA技术的虚拟实验系统框架的构建设想,介绍了实验主框架和各个具体实现模块。     

EDA技术在数字电路实验教学中的应用

在电子产品自动化及数字化发展环境下,传统的数字电路实验教学已经无法满足当前教育教学需求,因此为满足当前数字化电子技术人才培养需求,则需要不断创新数字电路实验教学.其中EDA技术在数字电路实验教学中的应用,则能够实现数字电路实验教学的创新发展,本文则重点分析EDA技术在数字电路实验教学中的应用.     

计算机用于电子线路维修(1) EDA技术及其Multisim7软件的主界面

EDA(Eletronic Desig nAutomation,电子设计自动化)技术是现代电子信息技术的杰出成果,是以计算机技术为基本工作平台,结合了电路分析和模拟及数字电子技术等方面的技术成果,为电子工程技术人员开发的一种电路仿真实验软件。现在的EDA软件已经能够完成模拟或数字电路的开发、设计、仿真实验;集成电路的设计、仿真实验;印刷线路板的设计等工作。而且在仿真软件中有各种虚拟仪器仪表,可以对所设计电路的全部功能进行系统的测试、优化设计。可以在仿真运行时,根据电路的运行情况调整器件参数,以获得理想的输出结果。利用EDA技术可以使企业…     

数字电路教学中的时序分析

时序分析在数字电路的设计中有非常重要的作用.本文对数字电路中时序分析的一些基本概念作了简单介绍.在讲授数字电路课程时,这些基本概念也可以作为对教材中基本内容的一种补充,学生能够对数字电路中的时序分析有一个比较清楚的认识.同时,由于目前许多广泛使用的EDA工具中都大量使用这些基本概念,我们认为,掌握这些基本概念,将会对学生了解EDA工具、完成数字电路实验以及从事具体的工作有较大的帮助.     

应用FPGA技术改造数字电路实验

数字电路和数字电路实验课程是高校电类专业的一门重要的技术基础课程和实验环节,笔者在共同编写FPGA技术应用书籍的同时,对照国际电子设计及应用技术的发展趋势,调研国内数字电路教学和实验现状,一致认为,采用FPGA技术,改造高校数字电路实验方法和手段,对促进教学内容的知识更新,顺应国际电子设计及应用技术发展需求,引入计算机EDA技术的设计和仿真手段,加强学生的综合设计能力和直观分析效率,使学生的学习和实验训练与现代技术发展相一致,具有一重要的意义和迫切性。     

EDA技术与数字电路的融合研究

本文介绍了EDA技术,提出了以数字电路基本知识为引导,以EDA平台为主要手段,建立传统数字电子技术设计和现代设计方法相结合的新模式.     

基于Proteus的数字电路虚拟实验室建设

本文以八路抢答器设计实验为例,介绍了Proteus在数字电路实验教学中的应用。实践表明,相对于传统数字电路实验室,虚拟仿真实验室不需购置专用设备,投资小,使用该EDA软件用于数字电路教学和实验,便教师和学生的交流互动,加深学生对数字电路相关概念的理解,激发学生学习积极性,提升学生的创新能力。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Teleportation of an arbitrary unknown N-qubit entangled state under the controlling of M controllers

A new quantum protocol to teleport an arbitrary unknown N-qubit entangled state from a sender to a fixed receiver under M controllers(M < N) is proposed. The quantum resources required are M non-maximally entangled Greenberger-Home-Zeilinger (GHZ) state and N-M non-maximally entangled Einstein-Podolsky-Rosen (EPR) pairs. The sender performs N generalized Bell-state measurements on the 2N particles. Controllers take M single-particle measurement along x-axis, and the receiver needs to introduce one auxiliary two-level particle to extract quantum information probabilistically with the fidelity unit if controllers cooperate with it.     

A rigorous proof of MIMO channel capacity’s increase with antenna number

It is well known that adding more antennas at the transmitter or at the receiver may offer larger channel capacity in the multiple-input multiple-output（MIMO） communication systems. In this letter, a simple proof is presented for the fact that the channel capacity increases with an increase in the number of receiving antennas. The proof is based on the famous capacity formula of Foschini and Gans with matrix theory.     

Diode-end-pumped Nd:YVO4/LBO lasers with 4.2W continuous-wave output at 457 nm

A continuous-wave (CW) 457 nm blue laser operating at the power of 4.2 W is demonstrated by using a fiber coupled laser diode module pumped Nd: YVO4 and using LBO as the intra-cavity SHG crystal With the optimization of laser cavity and crystal parameters, the laser operates at a very high efficiency. When the pumping power is about 31 W, the output at 457nm reaches 4.2 W, and the optical to optical conversion efficiency is about 13.5% accordingly. The stability of the out putpower is better than 1.2% for 8 h continuously working.     

Call for Papers

正Wireless Body-area Networks The last decade has witnessed the convergence of three giant worlds:electronics,computer science and telecommunications.The next decade should follow this convergence in most of our activities with the generalization of sensor networks.In particular with the progress in medicine,people live longer and the aging of population will push the development of wireless personal networks