Current mode ADC design in a 0.5-μm CMOS process

This paper presents a pipelined current mode analog to digital converter（ADC） designed in a 0.5-μm CMOS process.Adopting the global and local bias scheme,the number of interconnect signal lines is reduced numerously,and the ADC exhibits the advantages of scalability and portability.Without using linear capacitance,this ADC can be implemented in a standard digital CMOS process;thus,it is suitable for applications in the system on one chip（SoC） design as an analogue IP.Simulations show that the proposed current mode ADC can operate in a wide supply range from 3 to 7 V and a wide quantization range from ±64 to ±256 μA.Adopting the histogram testing method,the ADC was tested in a 3.3 V supply voltage/±64 μA quantization range and a 5 V supply voltage/±256 μA quantization range,respectively.The results reveal that this ADC achieves a spurious free dynamic range of 61.46 dB,DNL/INL are-0.005 to ＋0.027 LSB/-0.1 to ＋0.2 LSB,respectively,under a 5 V supply voltage with a digital error correction technique.     

A RF receiver frontend for SC-UWB in a 0.18-μm CMOS process

正A radio frequency(RF) receiver frontend for single-carrier ultra-wideband(SC-UWB) is presented. The front end employs direct-conversion architecture,and consists of a differential low noise amplifier(LNA),a quadrature mixer,and two intermediate frequency(IF) amplifiers.The proposed LNA employs source inductively degenerated topology.First,the expression of input impedance matching bandwidth in terms of gate-source capacitance, resonant frequency and target S_(11) is given.Then,a noise figure optimization strategy under gain and power constraints is proposed,with consideration of the integrated gate inductor,the bond-wire inductance,and its variation.The LNA utilizes two stages with different resonant frequencies to acquire flat gain over the 7.1-8.1 GHz frequency band,and has two gain modes to obtain a higher receiver dynamic range.The mixer uses a double balanced Gilbert structure.The front end is fabricated in a TSMC 0.18-/im RF CMOS process and occupies an area of 1.43 mm~2.In high and low gain modes,the measured maximum conversion gain are 42 dB and 22 dB,input 1 dB compression points are -40 dBm and -20 dBm,and S_(11) is better than -18 dB and -14.5 dB.The 3 dB IF bandwidth is more than 500 MHz.The double sideband noise figure is 4.7 dB in high gain mode.The total power consumption is 65 mW from a 1.8 V supply.     

日立公司开发0.5μm CMOS门阵列

日立制作所开发耗散功率1．2μW、工作频率100MHz、0．5μPrnCMOS门阵列IIG72G系列，并从1994年6月开始销售。该系列最大使用门数约50万门，工艺采用0．SHrn三层AI布线，申源电压为2．7V、3．3V时的门速度为0．Zns，与以前该公司产品相比速度提高1．5倍，耗散功率为1．ZZ。W，与该公司的产品相比减少1／2左右。封装采用QFP和PG八，也在研制BGA的封装，50万门的JI：IG72G6677／为］2万日元（购买1000个时的单价）。日立公司开发0.5μm CMOS门阵列@一凡…     

0.5μm CMOS腐蚀工艺研究

本文主要介绍了0.5 μm CMOS 工艺中一些腐蚀模块的工艺。     

A 0.5 V offset cancelled latch comparator in standard 0.18 μm CMOS process

This paper presents a new 0.5 V high-speed dynamic latch comparator with built-in foreground offset cancellation capability and rail-to-rail input range. Traditional latch comparators lose their speed performance in low voltage condition, especially in sub-1V applications. The proposed latch comparator utilizes a speed-up technique based on a novel boosting method to mitigate the low voltage imperfections on circuit operation. Employing a new offset cancellation technique based on the same boosting capacitors is another key idea. This enhances the accuracy of the ultra low-voltage latch comparators and relaxes the need for preamplifier stage, which is conventionally used in the low offset latch comparator. The performed Monte Carlo simulations over corners in 0.18 μm standard CMOS process show the improvement of input referred offset voltage with a standard deviation of 29.9 mV/299 μV before and after offset cancellation, respectively. The designed comparator dissipates 34 μW power from 0.5 V voltage supply while operating in 200 MHz clock frequency and detects 1 mV input difference.     

0.5μm SOI CMOS器件和电路

研究了0.5μm SOI CMOS器件和电路,开发出成套的0.5μm SOI CMOS工艺.经过工艺投片,获得了性能良好的器件和电路,其中当工作电压为3V时,0.5μm 101级环振单级延迟为42ps.同时,对部分耗尽SOI器件特性,如“浮体”效应、“kink”效应和反常亚阈值特性进行了讨论.     

0.5μm SOI CMOS器件和电路

研究了 0 .5μm SOI CMOS器件和电路 ,开发出成套的 0 .5μm SOI CMOS工艺 .经过工艺投片 ,获得了性能良好的器件和电路 ,其中当工作电压为 3V时 ,0 .5μm 10 1级环振单级延迟为 42 ps.同时 ,对部分耗尽 SOI器件特性 ,如“浮体”效应、“kink”效应和反常亚阈值特性进行了讨论     

Design of an LED driver based on hysteretic-current-control mode in a 0.6μm BCD process

Based on the 0.6μm BCDMOS process a hysteretic-current-control mode white light LED driver with high accuracy and efficiency is presented.The driver can work with a 6-40 V power supply,the maximum output current is up to 1.0 A,the maximum switching frequency is up to 1 MHz,the output current error is less than±5%,and the efficiency is greater than 80%.The circuit details of the high-side-current sensor and high-speed comparator,which greatly affect the accuracy of the whole driver,are emphasized.Then,the simulation and test results of this work are presented.     

Design and analysis of a UWB low-noise amplifier in the 0.18μm CMOS process

An ultra-wideband （3.1-10.6 GHz） low-noise amplifier using the 0.18μm CMOS process is presented. It employs a wideband filter for impedance matching. The current-reused technique is adopted to lower the power consumption. The noise contributions of the second-order and third-order Chebyshev fliers for input matching are analyzed and compared in detail. The measured power gain is 12.4-14.5 dB within the bandwidth. NF ranged from 4.2 to 5.4 dB in 3.1-10.6 GHz. Good input matching is achieved over the entire bandwidth. The test chip consumes 9 mW （without output buffer for measurement） with a 1.8 V power supply and occupies 0.88 mm^2.     

Investigation on SCR-based ESD protection device for biomedical integrated circuits in a 0.18-μm CMOS process

In these decades, integrated circuits for biomedical electronics applications have been designed and implemented in CMOS technologies. In order to be safely used by human, all microelectronic products must meet the reliability specifications. Therefore, electrostatic discharge (ESD) must be taken into consideration. To protect the biomedical integrated circuits in CMOS technologies from ESD damage, a dual-directional silicon-controlled rectifier (DDSCR) device was presented in this work. Experimental results show that the DDSCR has the advantages of high ESD robustness, low leakage, large swing tolerance, and good latchup immunity. The DDSCR was suitable for ESD protection in biomedical integrated circuits.     

Rotary traveling-wave oscillator design using 0.18μm CMOS

正A rotary traveling-wave oscillator(RTWO) targeted at 5.8 GHz band operation is designed and fabricated using standard 0.18μm CMOS technology.Both simulation and measurement results are presented.The chip size including pads is 1.5×1.5 mm~2.The measured output power at a frequency of 5.285 GHz is 6.68 dBm,with a phase noise of-102 dBc/Hz at 1 MHz offset from the carrier.     

Sub 0.5-V bulk-driven LTA in 0.18 μm CMOS

The paper deals with a new solution for an ultra-low-voltage loser take all (LTA) circuit, capable to operate from supply voltages ranging from 0.3 to 0.5 V. The proposed circuit exploit the idea of multiple voltage buffers with a common output. In order to obtain a compact and precise LTA, a new kind of an ultra-low-voltage buffer has been developed. Owing to the fact that for such a low supply voltage the available voltage swing is highly reduced, the impact of transistor mismatches and speed-accuracy-power tradeoffs have extensively been discussed in the paper. While implemented in a standard 0.18 μm CMOS process, the proposed LTA circuit in a two-input version consumes 3.0 μW from a 0.5 V supply and provides 10 μs crossover recovery time for a 1 pF load capacitance.     

100万门的0.5μm CMOS门阵列

据报道，采用《层金属布线0．SPinCMOS技术，制成LCA500K的样品，门数达100万门阵列。电源电压十2．7。＋3．6V和2．0。＋2．6V。二种电源电压可互换。最高工作频率为200MHZ。触发器的频率为400MHZ。在输出输入样品中，有622MHZ工作的模拟ECL接口和200MHZ工作的GTL／NTL接口。封装采用BGA，TCP陶瓷PGA塑料QFPTQFPMQUAD（QFP的一种）。现可供这样一种功能，把用户设计的电路变换成易于测试的电路。门数2～3万门阵列的开发费为300万日元。100万门的0.5μm CMOS门阵列@一凡…     

Design of a high-order single-loop Σ△ ADC followed by a decimator in 0.18μm CMOS technology

This work presents an oversampled high-order single-loop single-bit sigma–delta analog-to-digital converter followed by a multi-stage decimation filter.Design details and measurement results for the whole chip are presented for a TSMC 0.18μm CMOS implementation to achieve virtually ideal 16-b performance over a baseband of 640 kHz.The modulator in this work is a fully differential circuit that operates from a single 1.8 V power supply. With an oversampling ratio of 64 and a clock rate of 81.92 MHz,the modulator achieves a 94 dB dynamic range. The decimator achieves a pass-band ripple of less than 0.01 dB,a stop-band attenuation of 80 dB and a transition band from 640 to 740 kHz.The whole chip consumes only 56 mW for a 1.28 MHz output rate and occupies a die area of 1×2 mm^2.     

基于0.5μm CMOS工艺的高压器件

近年来,驱动类、音响类、接口类电路产品系列是CMOS集成电路发展的一个重要方向,这些电路中特有的高低压兼容结构是其重要的特点.相应地高低压兼容CMOS工艺技术应用也越来越广泛.本文研究了与常规CMOS工艺兼容的高压器件的结构与特性,在结构设计和工艺上做了大量的分析和实验,利用n-well和n管场注作漂移区,在没有增加任何工艺步骤的情况下,成功地将高压nMOS,pMOS器件嵌入在商用3.3/5V 0.5μm n-well CMOS工艺中.测试结果表明,高压大电流的nMOS管BVdssn达到23～25V,P管击穿BVdssp>19V.     

基于0.5μm CMOS工艺的高压器件

近年来,驱动类、音响类、接口类电路产品系列是CMOS集成电路发展的一个重要方向,这些电路中特有的高低压兼容结构是其重要的特点.相应地高低压兼容CMOS工艺技术应用也越来越广泛.本文研究了与常规CMOS工艺兼容的高压器件的结构与特性,在结构设计和工艺上做了大量的分析和实验,利用n-well和n管场注作漂移区,在没有增加任何工艺步骤的情况下,成功地将高压nMOS,pMOS器件嵌入在商用3.3/5V 0.5μm n-well CMOS工艺中.测试结果表明,高压大电流的nMOS管BVdssn达到23～25V,P管击穿BVdssp>19V.     

A curvature calibrated bandgap reference with base-emitter current compensating in a 0.13μm CMOS process

In bandgap references,the effect caused by the input offset of the operational amplifier can be effectively reduced by the utilization of cascade bipolar junction transistors(BJTs).But in modern CMOS logic processes,due to the small value ofβ,the base-emitter path of BJTs has a significant streaming effect on the collector current,which leads to a large temperature drift for the reference voltage.To solve this problem,a base-emitter current compensating technique is proposed in a cascade BJT bandgap refe...     

0.18μm CMOS Σ-Δ ADC用数字抽取滤波器设计

采用标准0.18μm CMOS工艺,设计了一种应用于UHF RFIDΣ-Δ模数转换器的数字抽取滤波器,并完成其前后仿真、逻辑综合、布局布线及版图实现等全流程.该滤波器主要实现滤波和降采样功能,由梳状滤波器、补偿滤波器和半带滤波器级联组成.合理选择各级滤波器的结构、阶数并采用规范符号编码(CSD)对其系数进行优化.仿真结果表明:采样频率为64MHz,过采样率为32的二阶Σ-Δ调制器的输出1位码流经过该滤波器滤波后,信噪比达到53.8dB;在1.8V工作电压下,功耗约为15mW.版图尺寸0.45mm×0.45mm,能够满足RFID中模数转换器的要求.