MgO掺杂对ZnO基线性电阻陶瓷性能的影响

以ZnO为基添加Al2O3和MgO制备了导电陶瓷;研究了MgO掺杂含量对ZnO陶瓷电阻率、电阻温度系数和相对密度的影响;测试分析了ZnO导电陶瓷在室温小电流时的伏安特性.结果表明,ZnO-Al2O3-MgO系陶瓷具有线性的伏-安(V-I)特性;添加MgO能增大电阻率且可改善电阻温度系数,当x(MgO) =5％时,小电流电阻率为178 Ω·cm,电阻温度系数为－1.5×10-3/℃;适量的MgO含量有利于烧结致密化.     

ZnO薄膜的丙酮气敏特性研究

用直流磁控反应溅射法,分别在Si(111)基片及Al2O3陶瓷基片上制备了ZnO薄膜,并进行TiO2、SnO2、Al2O3或CuO的掺杂和退火处理。用XRD分析了退火前后晶型的变化,利用气敏测试系统对各样品进行了气敏特性测试。结果表明:经过700℃退火后的样品,在最佳工作温度为220℃时,对丙酮有很好的选择性和很高的灵敏度(34.794)。掺杂TiO2或SnO2,可提高ZnO薄膜传感器对丙酮的灵敏度(57.963)。     

纳米ZnO基掺杂气敏元件阵列的制备与特性

以金属蒸气氧化法制备的纯纳米ZnO为气敏原料,通过丝网印刷技术在Al2O3基片上制得纯ZnO和掺杂ZnO的气敏元件阵列。结果表明,元件阵列具有低的功耗,纯ZnO气敏元件阵列在350~400℃对橙汁、可乐、酒精和汽油有较高的敏感性,灵敏度分别为2.9,2.9,53.5和43.4。通过Bi2O3+Cu2O的掺杂,可以降低纯ZnO的电导,并进一步提高气敏元件在250~350℃温度区间对汽油的敏感性。并对其气敏机理进行了探讨。     

复合钒钛酸干凝胶薄膜的湿敏特性研究

采用sol-gel法制备了复合钒钛酸干凝胶(H2V10Ti2O30-y·nH2O)薄膜,并对其湿敏特性进行了研究。结果表明:该薄膜为层状结构。用此薄膜制备的湿敏元件,在RH为11%～95%的范围内,感湿特性曲线线性好,其响应、恢复时间分别为5s和20s,湿滞为RH2%,感湿温度系数为RH0.45%/℃,并具有良好的稳定性。H2V10Ti2O30-y·nH2O干凝胶薄膜湿敏元件的灵敏度和湿滞均优于复合钒酸(H2V12O31-y·nH2O)干凝胶薄膜湿敏元件。     

B-Zn复合掺杂的LNT微波介质陶瓷的低温烧结

研究了烧结助剂B2O3、ZnO对Li0.925Nb0.375Ti0.8O3(LNT)陶瓷烧结特性及介电性能的影响。结果表明:B2O3-ZnO复合掺杂能有效降低烧结温度至900℃。ZnO的添加调节了LNT陶瓷正的频率温度系数,质量分数为1%的B2O3和4%的ZnO是最佳添加量,可得到εr为59.5,Q·f为7840GHz,τf为0×10–6℃–1的微波介质陶瓷材料。     

高纯微晶氧化铝陶瓷的研制

选用超细高纯Al2O3粉为原料.分析了不同方法掺杂MgO添加剂及掺杂不同氧化物添加剂的Al2O3陶瓷显微结构.实验结果表明,利用包覆将MgO均匀加入到Al2O3粉体中,可以制备出致密细晶Al2O3陶瓷;此外,向Al2O3微粉中掺杂ZnO,也可以制备出细晶Al2O3陶瓷.而Y2O3掺杂及ZnO与Y2O3和MgO共掺杂的Al2O3陶瓷中有晶粒异常长大现象.     

空气中烧结制备SrTiO3基压敏电阻器的研究

通过掺杂La2O3,PbO和ZnO,在空气中烧结制备得到了SrTiO3基压敏电阻陶瓷.研究了掺杂剂对该种陶瓷相结构、形貌和电性能的影响,并对在氧化性气氛中制备SrTiO3基半导体陶瓷的方法进行了探讨.结果表明,所制压敏电阻具有高的相对介电常数(εr=(1.51～2.78)×104)和良好的非线性J-E特性(α=5.5～...     

（Bi2O3、ZnO）对（Zr0．8Sn0．2）TiO4介电性能的影响

采用常规固相合成工艺研究了添加剂Bi2O3、ZnO等对(Zr0.8Sn0.2)TiO4的烧结性能、微观结构和微波介电性能的影响.结果表明,陶瓷的烧结温度随着Bi2O3含量的增大而降低,而陶瓷的最大烧结密度随着Bi2O3的增大而增大;当w(Bi2O3)>3%时,其烧结可降低至1175℃;各种材料配方均能烧结出致密的陶瓷.陶瓷的介电常数随着Bi2O3含量的增大而略有增大,但增加幅度较小;而材料的介电损耗则随Bi2O3含量的增大而增加,且增大幅度较大.当w(ZnO)=1%、w(Bi2O3)=3%时,可在1190℃获得致密的陶瓷,在测试频率1 MHz下,介电常数约41,介电损耗为1.5×10-4,其综合微波介电性能最佳.     

ZnO陶瓷薄膜的制备及其低压压敏性质

利用新型Sol-Gel法在镀有Au底电极的单晶硅片上制备Bi2O3、Sb2O3掺杂的ZnO陶瓷薄膜,先驱体溶液由Bi2O3、Sb2O3掺杂的ZnO纳米粉体均匀分散于含有Zn(CH3COO)2、Bi(NO3)3及Sb2O3的溶胶中制成,薄膜由甩胶法制备,并由400℃预烧、750℃退火。制得的陶瓷薄膜ZnO结晶良好,并存在β－Bi2O3、Zn2Sb3Bi3O14及Zn7Sb2O12相,表现出良好的低压压敏性质,厚约为3μm为ZnO陶瓷薄膜非线性系数α为6.2、压敏电压为5V,漏电流为8μA。     

Fe_2O_3+MgO+K_2CO_3湿敏陶瓷材料性能的研究

研究了Fe_2O_3-MgO-K_2CO_3湿敏陶瓷材料的成分、工艺、组织与性能,对测得的“湿度—电阻”数据进行了数学分析,从中选出最佳成分与工艺。利用XRD、SEM及能谱分析等测试手段对试样的相组成、相结构、晶粒度、气孔率以及成分进行了观察、测试和半定量分析,并讨论了它们对湿敏特性的影响。结果表明,该铁基湿敏陶瓷材料具有固有阻值低、阻值变化范围大和线性度好等优点。     

Effect of Sb2O3-doped on optical absorption of ZnO thin film

ZnOthinfil mis a compound semiconductive materialof hexagonal Wurtzite structure.It has been widely ap-pliedto manyareas suchastransitive conductive windowmaterials , ultraviolet detectors , LEDs and LDs lumi-nance devices ,etc ,because of its unique electrical andoptical properties , good chemical stability, high activeenergy and melting point ,abundant ,cheap and nontox-ic source,and relatively lowpreparing temperature[1-4].Recent researches showthat the properties of ZnOthinfil mchange o…     

新型光湿敏元件及应用

介绍了利用硅作衬底的陶瓷钛酸镧锶（SrLaTiO3)材料的半导体元件，独特的MIS结构元件，既具有光的特性，又可以测量湿度信号。利用光、湿敏特性元件设计成光、湿敏传感器。     

X-ray absorption and emission spectroscopy of ZnO nanoparticle and highly oriented ZnO microrod arrays

The electronic structures of ZnO nanoparticles and microrod arrays are studied by O 1s X-ray absorption spectroscopy (XAS) and O Kα X-ray emission spectroscopy (XES). We show that the present LDA+U^SIC calculation approach is suitable to correct the LDA self-interaction error of the cation d-states. The atomic eigenstates of 3d in zinc and 2p in oxygen are energetically close, which induces strong Zn-3d-O-2p hybridization. This anomalous valence band cation-d-anion-p hybridization is affected when the localization of the Zn 3d-states is taken into account. Experimentally, the XES spectra show energy dependence in the spectral shape revealing selected excitations to the Zn 3d, 4s and 4p states, hybridized with O 2p states. Strong anisotropic effects are observed for the highly oriented ZnO rods, but not for the isotropic spherical nanoparticles. The nanostructured ZnO has primarily bulk XAS and XES properties.     

大通流高电压高α值ZnO压敏电阻器

研究了 Zn O压敏电阻器的通流量、非线性系数α值及压敏电压与粉料粒径和 Sb2 O3含量的关系。研究结果表明 ,适当添加 Sb2 O3,将粉料超细粉碎 ,可以制成通流量 4× 10 3A/ cm2、α值 110、压敏电压 380 V/ mm的 Zn O压敏电阻器。     

叠烧对ZnO压敏电阻中Bi_2O_3挥发的控制

采用高能球磨法制备ZnO压敏电阻混合粉体。用XRD、SEM对其形貌和微观结构进行了表征。研究了叠烧烧结时,不同位置ZnO压敏电阻中Bi2O3的挥发情况及对其电性能的影响。结果表明:中心位置处ZnO压敏电阻的非线性系数为31,较表层提高100%;其漏电流为6.0μA,电位梯度为345V/mm。Bi2O3的挥发,呈现从中心到表层逐步加剧的趋势。     

Effects of humidity during formation of zinc oxide electron contact layers from a diethylzinc precursor solution

This work focuses on the role of humidity in the formation of ZnO thin films from a reactive diethylzinc precursor solution for use as the electron contact layer (ECL) in organic photovoltaic (OPV) devices. This method is well suited for flexible devices because the films are annealed at 120 °C, making the process compatible with polymer substrates. ZnO films were prepared by spin coating and annealing at different relative humidity (RH) levels. It is found that RH during coating and annealing affects the chemical and physical properties of the ZnO films. Using x-ray photoelectron spectroscopy it is found that increasing RH during the formation steps produces a more stoichiometric oxide and a higher Zn/O ratio. Spectroscopic ellipsometry data shows a small decrease in the optical band gap with increased humidity, consistent with a more stoichiometric oxide. Kelvin probe measurements show that increased RH during formation results in a larger work function (i.e. further from vacuum). Consistent with these data, but counter to what might be expected, when these ZnO films are used as ECLs in OPV devices those with ZnO ECLs processed in low RH (less stoichiometric) had higher power conversion efficiency than those with high-RH processed ZnO due to improved open-circuit voltage. The increase in open-circuit voltage with decreasing humidity was observed with two different donor polymers and fullerene acceptors, which shows the trend is due to changes in ZnO. The observed changes in open-circuit voltage follow the same trend as the ZnO work function indicating that the increase in open-circuit voltage with decreasing humidity is the result of improved energetics at the interface between the bulk-heterojunction and the ZnO layer due to a vacuum level shift.     

Electrochemical schottky characteristics of ZnO for capacitance-voltage measurements

Water-based Schottky contacts are examined for flatband potential on bulk single-crystal ZnO material. The Zn and O faces are studied as well as the a-axis. Also, depletion capacitance-voltage (CV) measurements are made on a bulk ZnO sample that has been exposed to extensive electron irradiation. The CV measurements show that the ZnO (O-face) surface is only slightly affected by electron irradiation up to 2 MeV.     

sol-gel法制备ZnO薄膜压敏电阻

利用sol-gel法在镀有Au底电极的单晶硅片上,制备掺有Bi2O3、Co2O3、Cr2O3和MnO2的ZnO薄膜压敏电阻。薄膜由旋涂法制备,并在300℃下预处理、600℃退火。制得的ZnO薄膜结晶良好。膜厚约为1μm,ZnO薄膜压敏电阻的非线性系数为15.1,压敏电压为3.037 V,漏电流为43.25μA。     

Si基氨化ZnO／Ga2O3薄膜制备GaN纳米线

利用射频磁控溅射法在Si(111)衬底上溅射ZnO中间层和Ga2O3薄膜，然后在管式炉中常压下通氨气对ZnO/Ga2O3薄膜进行氨化，高温下ZnO层在氨气气氛中挥发，而Ga2O3薄膜和氨气反应合成出GaN纳米线．X射线衍射测量结果表明利用该方法制备的GaN纳米线具有沿c轴方向择优生长的六角纤锌矿结构．利用扫描电子显微镜、透射电子显微镜、傅里叶红外透射谱、能量弥散谱及选区电子衍射观测并分析了样品的形貌、成分和晶格结构．研究发现ZnO层的挥发有利于Ga2O3和NH3反应合成GaN纳米线．     

镁掺杂对ZnO-Al_2O_3系陶瓷性能的影响

运用回归数学分析并结合ＳＥＭ观测结果，对影响ＺｎＯ－Ａｌ２Ｏ３系陶瓷电阻及阻－温特性的线性化机制进行了探讨。研究表明，Ａｌ２Ｏ３、ＭｇＯ的掺杂及烧成工艺均对材料的电阻率和电阻温度系数有较为明显的影响，镁掺杂对材料的电子激活能有较大的影响，当材料的电子激活能值较低时，通过回归处理发现其阻－温特性具有较好的线性，符合麦克劳林公式。