共查询到20条相似文献,搜索用时 15 毫秒
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A new type of drivers for light emitting diodes (LEDs) is introduced based on the switched-capacitor frequency modulation. In contrast to conventional constant dc current drivers, the current pulse is provided by this new switched-capacitor LED driver. In the present driver, the charging capacitor is charged and discharged through a LED and the current flow direction is controlled by a metal oxide semiconductor switch. The input current (and thus the LED brightness) is proportional to the switch clock frequency at relatively low frequencies and becomes saturated at relatively high frequencies. This new driver circuit is simple and robust and maintains high efficiency for a wide range of input powers. In addition, the dimming control is easily realized by modulating clock frequency. Finally, this LED driver consumes no dc current and thus provides inherent protection to LED in standby mode. 相似文献
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《Computer Integrated Manufacturing Systems》1998,11(3):135-145
Computer vision systems are the most versatile non-contact inspection systems. However, 100% scanning for the inspection of straightness of discrete industrial workpieces is time-consuming. As a result, a critical problem is the determination of the sample size for straightness inspection using computer vision inspection systems.This paper develops the methods to determine the acceptable sample size for estimating the mean line in the straightness inspection. The widest-prediction interval at different degrees of confidence to determine the sample size for estimating the mean line has been studied. The partial sequential test for testing the slope and intercept of the estimated mean line to determine the quality of straightness have also been discussed in this paper. 相似文献
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Junction temperature of high power light emitting diodes (LEDs), which is crucial for the thermal management of solid-state lighting, needs to be measured accurately. In this paper, a dynamic junction temperature measurement system for LEDs was proposed and the calibration including instrument calibration and factor K calibration were presented. The influence of the fast switch time in dynamic junction temperature test was analyzed and measurement errors caused by sampling delay were quantified. To prove the accuracy of the present system, comparison experiment was conducted. It shows a good agreement between the experimental data and reference value. Experiments also show that the measurement accuracy of the instrument can be up to 0.1?°C, and the standard error of temperature measurement can be controlled within 1%. 相似文献
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Brydegaard M Merdasa A Jayaweera H Ålebring J Svanberg S 《The Review of scientific instruments》2011,82(12):123106
We describe the development of a novel multispectral microscope, based on light-emitting diodes, capable of acquiring megapixel images in thirteen spectral bands from the ultraviolet to the near infrared. The system captures images and spectra in transmittance, reflectance, and scattering modes. We present as examples of applications ground truth measurements for remote sensing and parasitology diagnostics. The system is a general purpose scientific instrument that could be used to develop dedicated simplified instruments with optimal bands and mode selection. 相似文献
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Calibration of a wide-field frequency-domain fluorescence lifetime microscopy system using light emitting diodes as light sources 总被引:1,自引:0,他引:1
A. D. ELDER J. H. FRANK J. SWARTLING X. DAI & C. F. KAMINSKI 《Journal of microscopy》2006,224(2):166-180
High brightness light emitting diodes are an inexpensive and versatile light source for wide‐field frequency‐domain fluorescence lifetime imaging microscopy. In this paper a full calibration of an LED based fluorescence lifetime imaging microscopy system is presented for the first time. A radio‐frequency generator was used for simultaneous modulation of light emitting diode (LED) intensity and the gain of an intensified charge coupled device (CCD) camera. A homodyne detection scheme was employed to measure the demodulation and phase shift of the emitted fluorescence, from which phase and modulation lifetimes were determined at each image pixel. The system was characterized both in terms of its sensitivity to measure short lifetimes (500 ps to 4 ns), and its capability to distinguish image features with small lifetime differences. Calibration measurements were performed in quenched solutions containing Rhodamine 6G dye and the results compared to several independent measurements performed with other measurement methodologies, including time correlated single photon counting, time gated detection, and acousto optical modulator (AOM) based modulation of excitation sources. Results are presented from measurements and simulations. The effects of limited signal‐to‐noise ratios, baseline drifts and calibration errors are discussed in detail. The implications of limited modulation bandwidth of high brightness, large area LED devices (~40 MHz for devices used here) are presented. The results show that phase lifetime measurements are robust down to sub ns levels, whereas modulation lifetimes are prone to errors even at large signal‐to‐noise ratios. Strategies for optimizing measurement fidelity are discussed. Application of the fluorescence lifetime imaging microscopy system is illustrated with examples from studies of molecular mixing in microfluidic devices and targeted drug delivery research. 相似文献
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生产线零件编号检测系统的计算机视觉研究 总被引:2,自引:1,他引:1
计算机视觉检测(Autom ated V isual Inspection,AVI)技术是计算机检测的新发展,它使检测更具智能化和柔性化。提出一种新的TTFM算法,成功实现生产线零件编号的快速、精确的检测。 相似文献
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Process capability indices have been widely used by quality professionals for measuring process performance. Although process yield is the most common criterion used in the manufacturing industry for measuring process performance, a more advanced measurement formula Yq, called quality yield index, has been proposed as an alternative measure of process performance. Quality yield can be viewed as the classical process yield minus the truncated expected relative process loss, within the specifications, which focuses on customer satisfaction. By taking customer loss into consideration, the advantage of using the quality-yield measure as process performance is that the formula can be applied to processes with arbitrary distributions. Unfortunately, statistical properties of the estimated Yq are mathematically intractable. Therefore, capability testing cannot be performed. In this paper, a nonparametric but computer intensive method called bootstrap is used to obtain a lower confidence bound on quality yield for capability testing purposes. Simulation studies are conducted to examine the sampling distribution of the estimated Yq. An application using the index Yq for the light emitting diode manufacturing process is presented for illustration purposes. 相似文献
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P. Gamage S. Q. Xie 《The International Journal of Advanced Manufacturing Technology》2009,40(1-2):144-156
The cast extrusion manufacturing process is the initial step which enables the creation of the raw materials, such as clear polypropylene film, needed for the flexible packaging printing process. The current methodology of controlling extrusion-related defect occurrences is attempted by a combination of statistical sampling and human inspection. However, due to the fact that the defects are small in size and hard to visualise in a clear thin film 2 m in width moving at a speed of 50 m/min. This results in poor product quality and high return ratio from customers. To the best of our knowledge, there is no system available that can accurately detect such defects. This research investigates possible defect detection methodologies and has subsequently proposed a system that is capable of real-time monitoring of defects on the cast extrusion manufacturing process. The proposed system utilises the refraction of a collimated light source, which is referred to as Mie light scattering. A vision analysis system is subsequently used to perform a blob analysis to detect the contrasting dark regions of the defects. Two test rigs were constructed to test the feasibility of the system. The first test rig was created to test the theoretical Mie scattering principles and the performance of the image analysis software in practice. The second test rig was created to test the practicability of integrating the Mie scattering theory on the physical cast extrusion line. The results obtained from the tests indicated a success rate of 90% in identifying gels and a 100% success rate in correctly identifying all the die lines presented in the tested samples. It is also deduced that the software has a capability to detect gel granules with a diameter greater than 480 μm and die lines with a thickness greater than 320 μm amid complete repeatability, ensuring that the proposed system fully conforms to the standard industrial requirements. 相似文献
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立体视觉技术在工业检测中的应用越来越广泛,如何提高检测精度、降低系统构建难度至关重要。本文提出了一种视觉检测系统正向设计最优化方法,以系统的检测精度为目标函数,以可选器件、工作环境、被检工件为约束条件,以光学参数和系统参数为决策变量,将系统设计问题转化为多目标不等式约束的非线性最优化模型,通过Kuhn-Tucker约束条件极值点的求解,获得最优的系统设计参数。本方法为立体视觉检测系统的设计提供了理论参考,可避免传统逆向设计方法中依赖主观经验而无法确认结果的最优性,以及大量反复试验而造成设计成本浪费等问题,实验验证了方法的可行性。 相似文献
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In this paper, a vision-based inspection system that measures the dimensions of a ball stud is designed and implemented. The system acquires silhouetted images by backlighting and extracts the outlines of the nearly dichotomized images in subpixel accuracy. The sets of boundary data are modeled with reasonable geometric primitives and the parameters of the models are estimated in a manner that minimizes error. Jig-fixtures and servo systems for the inspection are also contrived. The system rotates an inspected object to recognize the objects in space not on a plane. The system moves the object vertically so that it may take several pictures of different parts of the object, resulting in improvement of measuring resolution. The performance of the system is evaluated by measurement of the dimensions of a standard ball, a standard cylinder, and a ball stud. 相似文献
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Yung Ting Chih-Ho Chen Hui-Yi Feng Shin-Liang Chen 《The International Journal of Advanced Manufacturing Technology》2008,39(9-10):905-918
Design of a glue dispenser route inspection system based upon the track of adhesive glue is the focus of this article. The defects of the glue track such as deformation, offset, scrape, and broken glue may affect the quality of production and efficiency. An automatic dispenser route inspection system in combination with the techniques of back-propagation neural (BPN) network with computer vision is developed. Before dispensing, the positioning process of the dispenser system is significant. A simple positioning method is developed to ensure the glued object mounted on a platform is in an acceptable position for glue shooting so that any likely failure due to inaccurate positioning is avoided. Thus, the positioning problem will therefore not influence the cause-and-effect failure investigation of other factors. The images of the track are acquired and then preprocessed to extract the features (coordinates of edge) for inspections. By checking the number of the searched pixels of the boundary of the glue track compared to the edge number of a uniform one, serious failure can be identified. For further diagnosis, six parameters including the average width and its standard deviation (SD) of the track, average offset and its SD, and the average deviation between the neighboring points on the left and right sides are designed as the input units in the input layer of a three-layer neural network and trained with experimental patterns. Using this BPN network system, the recognition rate is able to achieve 96.45% for additional arbitrarily chosen samples. 相似文献