Inx—Ga1—xAs／GaAs应变量子阱光学性质

研究了用分子束外延方法生长在GaAs(100)衬底上的In_xGa_(1-x)As/GaAs(x=0.1)应变多量子阱样品,观察了其光荧光谱和光调制反射谱的光谱结构,讨论了有关基态光跃迁和激发态光跃迁性质.根据实验结果给出了能带偏移比值为Q_c=0.69(Q_v=1-Q_c=0.31),并提出有关轻空穴束缚于GaAs层而形成Ⅱ类超晶格的重要佐证.     

应变In0.20 Ga0.80As／GaAs单量子阱结构的光谱研究

报道了用光致发光光谱，吸收光谱和光电流谱研究具有相同组伊阱宽，不同覆盖层厚度的应变Ｉｎ０．２０Ｇａ０．８０Ａｓ／ＧａＡｓ单量子阱结构的实验结果，结果理论计算，观察到ＧａＡｓ覆盖层厚度对单量子阱结构的材料质量，应力驰豫和发光淬灭机制的影响，确定了各样品应变值和导带不连续因子Ｑｃ，并讨论了这种结构发光机制。     

GaAs／AlGaAs多量子阱结构的热电子效应

采用低温荧光激发光谱研究了ＧａＡｓ／ＡｌＧａＡｓ多量子阱结构中热电子的驰豫过程,在ＰＬＥ谱中首次观察到ＧａＡｓ／ＡｌＧａＡｓ多量子阱中ＬＯ声子的发射,用四能带Ｋａｎｅ模型计算了由轻、重空穴杂化效应引起的价带结构的畸变及其对声子发射谱的影响,实验和理论计算结果均表明、光激发热电子可以通过发射ＬＯ声子直接弛豫到激子态上,实现热电子的冷却。     

表面电场导致InGaAs/GaAs量子阱子带跃迁选择定则的改变

本文报道用MOCVD方法制作高质量的InGaAs／GaAs应变量子阱材料．单量子阱样品在室温光伏谱中出现清晰的11H、12H、21H和22H激子吸收峰．首次用室温光伏方法研究表面自建电场导致InGaAs／GaAs量子阱中子带间跃迁选择定则的改变．     

GaAs／AlGaAs多量子阱二维面阵红外探测器

本文报道１０×１６元二维面阵ＧａＡｓ／ＡｌＧａＡｓ多量子阱红外探测器的研究进展．通过表面光栅耦合,采用垂直入射的工作模式,在Ｔ＝８０Ｋ时探测率为２．９e１０ｃｍ·Ｈｚ（１／２）／Ｗ,电压响应率为１．３e４Ｖ／Ｗ．各测试单元间探测率和电压响应率的偏差小于１８％,串音小于０．４５％,在最大探测率偏置条件下,器件的暗电流密度为６．２e－）Ａ／ｃｍ２．     

GaAs／GaAlAs单量子阱光调制器电学行为

利用导纳谱研究了ＧａＡｓ／ＧａＡｌＡｓ单量子阱光调制器的电学行为，观察到了量子阱中电子或空穴子能带的“场致去局域化”的物理现象。     

GaAs／Al0.4Ga0.6As多量了阱红外探测器光吸收计算

本文在有效质量理论基础上计算了ＧａＡｓ／Ａｌ０．４Ｇａ０．６Ａｓ多量了阱子带间光吸收谱以及电子态密度,具体讨论了两种情况的吸收,第一种情况是量子阱只存在一个基态;第二种情况是量子阱中存在一个基态同时还存在一个激发态,最后与有关实验进行比较。     

GaAs／AlGaAs双量子阱中量子相干特性的研究

研究了低温、平行磁场下两种ＧａＡｓ／ＡｌＧａＡｓ双量子阱的量子干涉特性．两种样品的阱宽均为６０,但挚垒层厚度不同,分别为１２０和２０．实验结果表明,样品的电导随磁场呈周期性振荡,振荡周期近似为ｈ／（ｅ·Ｓ）,这一结果同Ａｈａｒｏｎｏｖ－Ｂｏｈｍ效应的理论值相吻合。我们也发现,薄势垒层样品比厚势垒层样品的电导振荡幅度更大一些．     

GaAs/AlGaAs多量子阱材料差分反射光谱

介绍了一种新型的空间调制光谱技术—差分反射 ( DR)光谱技术 .利用振动光束差分反射测试系统 ,获得了 Ga As/Al Ga As多量子阱材料的 DR谱 ,初步分析了 DR信号的产生机制 .通过与材料的 PR谱及反射光谱的一阶微商谱比较分析 ,论证了 DR光谱技术用于多量子阱量子化跃迁观测的理论可行性 ,并从实验角度证明了 Ga As/Al Ga As多量子阱材料的 DR谱具有反射率谱对能量的一阶微商线型特征     

静压下（CdSe）_m／（ZnSe）_n－ZnSe超短周期超晶格量子阱的共振喇曼散射研究

在静压和液氮温度下观察到（ＣｄＳｅ）ｍ／（ＺｎＳｅ）ｎ短周期超晶格中重空穴激子的复合发光和多达４阶的类ＺｎＳｅＬＯ多声子喇曼散射,并观察到厚ＺｎＳｅ势垒层的带边发光和限制在厚势垒层中的类ＺｎＳｅＬＯ声子散射．结果表明,加压后（ＣｄＳｅ）ｍ／（ＺｎＳｅ）ｎ短周期超晶格中的类ＺｎＳｅ的１ＬＯ和２ＬＯ声子模频率分别以３．７６和７．１１ｃｍ－１／ＧＰａ的速率向高频方向移动,超晶格阱层光致发光峰的压力系数为５９．８ｍｅＶ／ＧＰａ．与（ＣｄＳｅ）ｍ／（ＺｎＳｅ）ｎ短周期超晶格共振时的类ＺｎＳｅ１ＬＯ声子模频率比与ＺｎＳｅ势垒层共振时的类ＺｎＳｅ１ＬＯ声子模频率低２．０ｃｍ－１,反映了（ＣｄＳｅ）ｍ／（ＺｎＳｅ）ｎ短周期超晶格中ＬＯ声子的限制效应     

静压下ZnCdSe/ZnSe量子阱中的激子跃迁

利用变分法理论研究了ZnCdSeZnSe量子阱(QWs)中基态重空穴激子光跃迁能量随静压的变化关系。计入了有限高势垒效应。考虑了晶格常数、有效质量、介电常数及体弹性模量等参量的压力效应特别是体弹性模量的压力导数对跃迁能量随压力变化的函数关系的影响。结果表明,体弹性模量的压力导数对跃迁能量随压力变化的函数关系影响很大。根据计算结果．估算出ZnCdSe／ZnSe QWs中Zn0.82Cd0.1:Se的体积弹性模量之压力导数近似为1．0。     

Uniform intermixing of quantum wells in p-i-n modulator structures by impurity free vacancy diffusion

We present the results of an investigation of impurity free vacancy diffusion (IFVD) post-growth treatments of p-i-n modulator structures. The investigation is in two parts. We first establish that gallium vacancies (V_Ga) are produced during IFVD (by measuring the intensity of the low temperature 1.2 eV signal from Si-V_Ga complexes) in a thick Si-doped GaAs sample. The second part of this work investigates the degree of intermixing of three 80Å GaAs quantum wells embedded in the intrinsic region of a p-i-n modulator at depths between 1–2 μm from the surface. Photoluminescence studies on etched samples and cathodoluminescence showed that no significant depth dependence occurs as a result of IFVD.     

Two electron transitions of the exciton bound at the Si Donor confined in GaAs/AlxGa1-xAs quantum wells

The exciton bound to the shallow Si-donor confined in a 100A wide GaAs quantum well has been studied in selective photoluminescence (SPL) and photoluminescence excitation (PLE) spectroscopy. The transition from the ground state, ls(Γ₆), to the first excited state, 2s(Γ₆), of the confined Si donor has been observed via two-electron transitions (TETs) of the donor bound exciton observed in SPL for the first time to the best of our knowledge. The interpretation of the TET peaks is confirmed by PLE measurements. Further, from Zeeman measurements, the magnetic field dependence of the donor ls(Γ₆)-2s(Γ₆) transition energy has been determined.     

量子阱红外探测器

评述了半导体量子阱内子带间光跃迁的主要特性以及量子阱红外探测器的物理问题和器件结构特点,介绍了国外在此领域研究的最新进展,讨论了有关子带间跃迁和量子阱红外探测器研究的若干发展趋势.     

GaAs／AlGaAs窄量子阱中激子二维特性的退化

用光荧光（ＰＬ）和时间分辨光谱（ＴＲＰＬ）技术研究了ＧａＡＳ／ＡＩＧａＡＳ量子阱结构中荧光上升时间τｆ和激子谱线半宽（ＦＷＨＭ）随阱宽的变化关系，发现在窄阱中，τｆ，随阱宽的变化关系与宽阱时的情况恰恰相反，在窄阱中τｆ随着阱宽的减小而增加，归结为激子二维特性的退化导致声学声子对激子的散射作用减弱造成的．同时观测到窄阱中谱线半宽随着阱宽减小而增加，这也是因为激子特性由维二维向三维转化造成的．     

Critical thickness of GaAs/InGaAs and AlGaAs/GaAsP strained quantum wells grown by organometallic chemical vapor deposition

In this paper we describe a study of strained quantum wells (QWs) as a means to experimentally observe the critical thickness (h _c) for the formation of interfacial misfit dislocations. Two material systems were investigated: GaAs/In_0.11Ga_0.89As, in which the QW layers are under biaxialcompression, and Al_0.35Ga_0.65As/GaAs_0.82P_0.18, in which the QW layers are under biaxialtension. Samples were grown by atmospheric pressure organometallic chemical vapor deposition, and characterized by low-temperature photoluminescence (PL), x-ray diffraction, optical microscopy, and Hall measurements. For both material systems, the observed onset of dislocation formation agrees well with the force-balance model assuming a double-kink mechanism. However, overall results indicate that the relaxation is inhomogeneous. Annealing at 800–850° C had no significant effect on the PL spectra, signifying that even layers that have exceededh _c and have undergone partial relaxation are thermodynamically stable against further dislocation propagation.     

Type I and Type II Alignment of the Light Hole Band in In0.15Ga0.85As/GaAs and in ln0.15Ga0.85As/Al0.15Ga0.85As Strained Quantum Wells

We present results of photoluminescence and cathodoluminescence measurements of strained undoped In_0.15Ga_0.85As/GaAs and In_0.15Ga_0.85As/Al_0.15Ga_0.85As quantum well structures, designed to throw light on the current controversy over light-hole band alignment at low In content. We compare these data with theoretical calculations of the confined state energies within the eight band effective mass approximation. Our analysis shows that for In_0.15Ga_0.85As/GaAs, the observed two transitions are consistent with either type I or type II alignment of the light hole band for band offset ratios within the accepted range. In the case of In_0.15Ga_0.85As/Al_0.15Ga_0.85As, however, our results clearly indicate type II alignment for the light hole band. We derive the band offset ratio Q, defined here as Q = δE_c/δE_g where δE_c is the conduction band offset and δE_g is the bandgap difference between the quantum well and the barrier in the presence of strain, for the In_0.15Ga_0.85As/Al_0.15Ga_0.85As system to be Q = 0.83 and discuss it in the context of the common anion rule.     

合金无序和界面不平整对InGaAs/GaAs应变量子阱光谱展宽的影响

用光荧光和光吸收的实验方法研究了InGaAs/GaAs应变量子阱低温下的光谱展宽机理。实验观察到激子谱线半宽随着InGaAs层厚度和In的组分增加而增大。采用有效晶体近似的方法分析了实验数据,发现样品中合金组合无序引起的激子谱线展宽是主要的光谱展宽机理。实验中还发现与轻空穴有关的吸收光谱结构在升温过程中由吸收峰变为台阶状的谱结构。该现象可用与轻空穴有关的吸收为空间间接跃过来解释。