共查询到20条相似文献,搜索用时 31 毫秒
1.
C. M. L. Wu M. L. Huang J. K. L. Lai Y. C. Chan 《Journal of Electronic Materials》2000,29(8):1015-1020
A new lead free alloy, Sn-6Bi-2Ag-0.5Cu, has been developed by mechanical alloying and has great potential as a lead-free
solder system. Initial trials on the manufacture of solder joints with this alloy revealed that a high quality bond with copper
could be formed. Its melting range of 193.87°C to 209.88°C is slightly higher than that of eutectic tin-lead solder. Examination
of the microstructure of the as-soldered joints revealed that it mainly consists of small bismuth (1 μm to 2 μm) and Ag3Sn (1 μm) particles finely dispersed in a nearly pure tin matrix with a small amount of η-Cu6Sn5 particles. The Cu-Sn intermetallic compound (IMC) layer formed at solder-copper interface is the η-Cu6Sn5 phase with grain size of 2 μm. The shear strength of the solder joint is higher than that of Sn-37Pb or Sn-3.5Ag. Under shear
loading, fracture occurred at IMC layer-solder interface as well as in the bulk of solder. 相似文献
2.
It was reported in a previous study that the Sn-6Bi-2Ag-0.5Cu solder alloy had great potential to replace leaded alloys. This alloy was prepared by mechanical alloying, and had the advantage of providing a high percentage of supersaturate solution of bismuth in tin. In the present paper, the microstructural evolution of surface-mount joints during aging was examined. In the as-soldered joints, small bismuth and Ag3Sn particles of about 1 mum in size were found to be finely dispersed in a nearly pure tin matrix with a small amount of eta-Cu6Sn5 phase in the bulk of solder. During aging, microstructural evolution of solder joints occurred. These include Cu-Sn intermetallic compound (IMC) layer growth at the interface between solder and copper pad on the printed circuit board, as well as bismuth phase and Ag3Sn phase coarsening. The shear strength of the solder joints decreased parabolically with the increase in IMC layer thickness, such that taus=22.22-radic22.05(t-1.88), where taus is the shear strength in MPa and t (>1.88) is the total IMC layer thickness in micrometers. The microstructure of solder appeared to be stable under aging at elevated temperatures up to about 160degC. Above this temperature, brittle and porous IMC epsiv-Cu3Sn appeared at the copper/eta-Cu6Sn 5 interface. Fracture was found to occur at the Cu-Sn IMC layer-solder interface and in the bulk of solder 相似文献
3.
The formation of Ag3Sn plates in the Sn-Ag-Cu lead-free solder joints for two different Ag content solder balls was investigated in wafer level
chip scale packages (WLCSPs). After an appropriate surface mount technology reflow process on a printed circuit board, samples
were subjected to 150°C high-temperature storage (HTS), 1,000 h aging, or 1,000 cycles thermal cycling test (TCT). Sequentially,
the cross-sectional analysis was scrutinized using a scanning electron microscope/energy dispersive spectrometer (SEM/EDX)
to observe the metallurgical evolution of the amount of the Ag3Sn plates at the interface and the solder bulk itself. Pull and shear tests were also performed on samples. It was found that
the interfacial intermetallic compound (IMC) thickness, the overall IMC area, and the numbers of Ag3Sn plates increase with increasing HTS and TCT cycles. The amount of large Ag3Sn plates found in the Sn-4.0Ag-0.5 Cu solder balls is much greater than that found in the Sn-2.6Ag-0.5Cu solder balls; however,
no significant difference was found in the joint strength between two different Ag content solder joints. 相似文献
4.
Dhafer Abdulameer Shnawah Mohd Faizul Mohd Sabri Irfan Anjum Badruddin Suhana Binti Mohd Said Tadashi Ariga Fa Xing Che 《Journal of Electronic Materials》2013,42(3):470-484
This study compares the high-Ag-content Sn-3Ag-0.5Cu with the low- Ag-content Sn-1Ag-0.5Cu solder alloy and the three quaternary solder alloys Sn-1Ag-0.5Cu-0.1Fe, Sn-1Ag-0.5Cu-0.3Fe, and Sn-1Ag-0.5Cu-0.5Fe to understand the beneficial effects of Fe on the microstructural stability, mechanical properties, and thermal behavior of the low-Ag-content Sn-1Ag-0.5Cu solder alloy. The results indicate that the Sn-3Ag-0.5Cu solder alloy possesses small primary β-Sn dendrites and wide interdendritic regions consisting of a large number of fine Ag3Sn intermetallic compound (IMC) particles. However, the Sn-1Ag-0.5Cu solder alloy possesses large primary β-Sn dendrites and narrow interdendritic regions of sparsely distributed Ag3Sn IMC particles. The Fe-bearing SAC105 solder alloys possess large primary β-Sn dendrites and narrow interdendritic regions of sparsely distributed Ag3Sn IMC particles containing a small amount of Fe. Moreover, the addition of Fe leads to the formation of large circular FeSn2 IMC particles located in the interdendritic regions. On the one hand, tensile tests indicate that the elastic modulus, yield strength, and ultimate tensile strength (UTS) increase with increasing Ag content. On the other hand, increasing the Ag content reduces the total elongation. The addition of Fe decreases the elastic modulus, yield strength, and UTS, while the total elongation is still maintained at the Sn-1Ag-0.5Cu level. The effect of aging on the mechanical behavior was studied. After 720 h and 24 h of aging at 100°C and 180°C, respectively, the Sn-1Ag-0.5Cu solder alloy experienced a large degradation in its mechanical properties after both of the aging conditions, whereas the mechanical properties of the Sn-3Ag-0.5Cu solder alloy degraded more dramatically after 24 h of aging at 180°C. However, the Fe-bearing SAC105 solder alloys exhibited only slight changes in their mechanical properties after both aging procedures. The inclusion of Fe in the Ag3Sn IMC particles suppresses their IMC coarsening, which stabilizes the mechanical properties of the Fe-bearing SAC105 solder alloys after aging. The results from differential scanning calorimetry (DSC) tests indicate that the addition of Fe has a negligible effect on the melting behavior. However, the addition of Fe significantly reduces the solidification onset temperature and consequently increases the degree of undercooling. In addition, fracture surface analysis indicates that the addition of Fe to the Sn-1Ag-0.5Cu alloy does not affect the mode of fracture, and all tested alloys exhibited large ductile dimples on the fracture surface. 相似文献
5.
Hai-Tao Ma Jie Wang Lin Qu Ning Zhao A. Kunwar 《Journal of Electronic Materials》2013,42(8):2686-2695
A rapidly solidified Sn-3.5Ag eutectic alloy produced by the melt-spinning technique was used as a sample in this research to investigate the microstructure, thermal properties, solder wettability, and inhibitory effect of Ag3Sn on Cu6Sn5 intermetallic compound (IMC). In addition, an as-cast Sn-3.5Ag solder was prepared as a reference. Rapidly solidified and as-cast Sn-3.5Ag alloys of the same size were soldered at 250°C for 1 s to observe their instant melting characteristics and for 3 s with different cooling methods to study the inhibitory effect of Ag3Sn on Cu6Sn5 IMC. Experimental techniques such as scanning electron microscopy, differential scanning calorimetry, and energy-dispersive spectrometry were used to observe and analyze the results of the study. It was found that rapidly solidified Sn-3.5Ag solder has more uniform microstructure, better wettability, and higher melting rate as compared with the as-cast material; Ag3Sn nanoparticles that formed in the rapidly solidified Sn-3.5Ag solder inhibited the growth of Cu6Sn5 IMC during aging significantly much strongly than in the as-cast material because their number in the rapidly solidified Sn-3.5Ag solder was greater than in the as-cast material with the same soldering process before aging. Among the various alternative lead-free solders, this study focused on comparison between rapidly solidified and as-cast solder alloys, with the former being observed to have better properties. 相似文献
6.
M. L. Huang T. Loeher D. Manessis L. Boettcher A. Ostmann H. Reichl 《Journal of Electronic Materials》2006,35(1):181-188
A comparative study of solid/solid interfacial reactions of electroless Ni-P (15 at.% P) with lead-free solders, Sn-0.7Cu,
Sn-3.5Ag, Sn-3.8Ag-0.7Cu, and pure Sn, was carried out by performing thermal aging at 150°C up to 1000 h. For pure Sn and
Sn-3.5Ag solder, three distinctive layers, Ni3Sn4, SnNiP, and Ni3P, were observed in between the solder and electroless Ni-P; while for Sn-0.7Cu and Sn-3.8Ag-0.7Cu solders, two distinctive
layers, (CuNi)6Sn5 and Ni3P, were observed. The differences in morphology and growth kinetics of the intermetallic compounds (IMCs) at the interfaces
between electroless Ni-P and lead-free solders were investigated, as well as the growth kinetics of the P-enriched layers
underneath the interfacial IMC layers. With increasing aging time, the coarsening of interfacial Ni3Sn4 IMC grains for pure Sn and Sn-3.5Ag solder was significantly greater than that of the interfacial (CuNi)6Sn5 IMC grains for Sn-0.7Cu and Sn-3.8Ag-0.7Cu solders. Furthermore, the Ni content in interfacial (CuNi)6Sn5 phase slightly increased during aging. A small addition of Cu (0.7 wt.%) resulted in differences in the type, morphology,
and growth kinetics of interfacial IMCs. By comparing the metallurgical aspects and growth kinetics of the interfacial IMCs
and the underneath P-enriched layers, the role of initial Cu and Ag in lead-free solders is better understood. 相似文献
7.
Comparative study of interfacial reactions of Sn-Ag-Cu and Sn-Ag solders on Cu pads during reflow soldering 总被引:1,自引:0,他引:1
The interfacial reaction in soldering is a crucial subject for the solder-joint integrity and reliability in electronic packaging
technology. However, electronic industries are moving toward lead-free alloys because of environmental concerns. This drive
has highlighted the fact that the industry has not yet arrived at a decision for lead-free solders. Among the lead-free alloys,
Sn-3.5Ag and Sn-3.5Ag-0.5Cu are the two potential candidates. Here, detailed microstructural studies were carried out to compare
the interfacial reaction of Sn-3.5Ag and Sn-3.5Ag-0.5Cu solder with a ball grid array (BGA) Cu substrate for different reflow
times. The Cu dissolution from the substrate was observed for different soldering temperatures ranging from 230°C to 250°C,
and the dissolution was found to increase with time and temperature. Dissolution of Cu in the Sn-3.5Ag solder is so fast that,
at 240°C, 12 μm of the Cu substrate is fully consumed within 5 min. Much less dissolution is observed for the Sn-3.5Ag-0.5Cu
solder. In respect to such high dissolution, there is no significant difference observed in the intermetallic compound (IMC)
thickness at the interface for both solder alloys. A simplistic theoretical approach is carried out to find out the amount
of Cu6Sn5 IMCs in the bulk of the solder by the measurement of the Cu consumption from the substrate and the thickness of the IMCs
that form on the interface. 相似文献
8.
In this work, the impact of microvoids on the microstructural evolution of η-Cu6Sn5 and ?-Cu3Sn in the Cu-Sn system is evaluated numerically. Through the use of the multiphase-field method, the systems of interest are allowed to evolve using a solid-state aging temperature of 453 K in conjunction with material parameters and reaction conditions adopted from previous research. The simulation results are then analyzed and compared with previous experiments in terms of the morphological evolution of the intermetallic compounds (IMCs), the IMC layer thicknesses, and the corresponding interfacial roughness. It is shown that the presence of microvoids at the ?/Cu interface interferes with the flow of mass throughout the phases, impeding phase transformations and grain coarsening. This ultimately affects the IMC coarsening rate and overall IMC layer thicknesses. Additionally, it was observed that the presence of microvoids at the ?/Cu interface affects the formation of both IMC layers and their corresponding interfaces, and the changes in roughness for the interfaces are quantitatively provided. Overall, the simulations are found to be within the range of accepted experimental values for the morphology of the IMC grains, the evolution of IMC layer thicknesses, and the evolution of interface roughness. 相似文献
9.
This study investigates the microstructural evolution and kinetics of intermetallic (IMC) formation in Sn-3.5Ag-0.7Cu lead-free solder joints with different percentages of Sb element, namely, Sn-3.5Ag-0.7Cu-xSb (x=0, 0.2, 0.5, 0.8, 1.0, 1.5, and 2.0). To investigate the elemental interdiffusion and growth kinetics of IMC formation, isothermal aging test is performed at temperatures of 100/spl deg/C, 150/spl deg/C, and 190/spl deg/C, respectively. Scanning electron microscope (SEM) is used to measure the thickness of intermetallic layer and observe the microstructural evolution of solder joint. The IMC phases are identified by EDX and XRD. Results show that some of the antimony powders are dissolved in the /spl beta/-Sn matrix (Sn-rich phase), some of them participate in the formation of Ag/sub 3/(Sn,Sb) and the rest dissolves in the Cu/sub 6/Sn/sub 5/ IMC layer. There is a significant drop in IMC thickness when Sb is added to 0.8 wt%. Over this amount the thickness of the IMC increases slightly again. The activation energy and growth rate of the IMC formation are determined. Results reveal that adding antimony in Sn-3.5Ag-0.7Cu solder system can increase the activation energy, and thus reduce the atomic diffusion rate, so as to inhibit the excessive growth of the IMC. The solder joint containing 0.8 wt% antimony has the highest activation energy. SEM images reveal that the number of small particles precipitating in the solder matrix increases with the increase in Sb composition. Based on the observation of the microstructural evolution of the solder joints, a grain boundary pinning mechanism for inhibition of the IMC growth due to Sb addition is proposed. 相似文献
10.
11.
研究了Cu/Sn-58Bi/Cu焊点接头在室温和55℃下通电过程中阴极和阳极界面处微观组织的演变,电流密度均采用104A/cm2。结果表明,室温条件下通电达到25 d,Bi原子由阴极向阳极发生了扩散迁移,在阳极界面处形成了厚度约22.4μm的均匀Bi层,而阴极出现了Sn的聚集。加载55℃通电2 d后,焊点发生了熔融,阴极界面处形成了厚度为34.3μm的扇贝状IMC,而阳极界面IMC的厚度仅为9.7μm。在IMC层和钎料基体之间形成了厚度约7.5μm的Bi层,它的形成阻碍了Sn原子向阳极界面的扩散迁移,进而阻碍了阳极界面IMC的生长,导致了异常极化效应的出现。 相似文献
12.
This work investigates the effect of reflow and the thermal aging process on the microstructural evolution and microhardness
of five types of Sn-Ag based lead-free solder alloys: Sn-3.7Ag, Sn-3.7Ag-1Bi, Sn-3.7Ag-2Bi, Sn-3.7Ag-3Bi, and Sn-3.7Ag-4Bi.
The microhardness and microstructure of the solders for different cooling rates after reflow at 250°C and different thermal
aging durations at 150°C for air-cooled samples have been studied. The effect of Bi is discussed based on the experimental
results. It was found that the microhardness increases with increasing Bi addition to Sn-3.7Ag solder regardless of reflow
or thermal aging process. Scanning electron microscopy images show the formation of Ag3Sn particles, Sn-rich phases, and precipitation of Bi-rich phases in different solders. The increase of microhardness with
Bi addition is due to the solution strengthening and precipitation strengthening provided by Bi in the solder. The trend of
decrease in microhardness with increasing duration of thermal aging was observed. 相似文献
13.
波峰焊及再流焊无铅焊点组织演变规律的研究 总被引:6,自引:1,他引:5
以电子封装线上的波峰焊无铅焊点Sn-0.7Cu/Cu、回流焊无铅焊点Sn-3Ag-0.5Cu/Cu为对象,研究了150 ℃时效过程中无铅焊点处金属间化合物(IMC)、焊料合金组织的演化规律及界面处金属间化合物生长的动力学.试验结果表明:两种无铅焊点处IMC层的厚度随着时效时间的延长而增加,IMC层的生长基本上符合抛物线规律,因此IMC层的长大受元素扩散控制;且两种无铅焊点处IMC层的生长速率常数相近,但Sn-0.7Cu焊料中Sn的晶粒尺寸较Sn-3Ag-0.5Cu中的大;长期时效后,在试样的IMC层内发现有孔洞产生. 相似文献
14.
The low-temperature Sn-9Zn-1.5Bi-0.5In-0.01P lead-free solder alloy is used to investigate the intermetallic compounds (IMCs)
formed between solder and Cu substrates during thermal cycling. Metallographic observation, scanning electron microscopy,
transmission electron microscopy, and electron diffraction analysis are used to study the IMCs. The γ-Cu5Zn8 IMC is found at the Sn-9Zn-1.5Bi-0.5In-0.01P/Cu interface. The IMC grows slowly during thermal cycling. The fatigue life
of the Sn-9Zn-1.5Bi-0.5In-0.01P solder joint is longer than that of Pb-Sn eutectic solder joint because the IMC thickness
of the latter is much greater than that of the former. Thermodynamic and diffusivity calculations can explain the formation
of γ-Cu5Zn8 instead of Cu-Sn IMCs. The growth of IMC layer is caused by the diffusion of Cu and Zn elements. The diffusion coefficient
of Zn in the Cu5Zn8 layer is determined to be 1.10×10−12 cm2/sec. A Zn-rich layer is found at the interface, which can prevent the formation of the more brittle Cu-Sn IMCs, slow down
the growth of the IMC layer, and consequently enhance the fatigue life of the solder joint. 相似文献
15.
Microstructure characterization of SnAgCu solder bearing Ce for electronic packaging 总被引:1,自引:0,他引:1
Liang Zhang Song-bai Xue Li-li GaoWei Dai Feng JiYan Chen Sheng-lin Yu 《Microelectronic Engineering》2011,88(9):2848-2851
The creep-rupture lives of Sn3.8Ag0.7Cu and Sn3.8Ag0.7Cu0.03Ce lead-free solder joints for electronic packaging were investigated, respectively. And the relationship between creep behavior and intermetallic compound (IMC: Ag3Sn, Cu6Sn5, CeSn3) particles in SnAgCu/SnAgCuCe solder joints has been obtained. Meanwhile, rare earth Ce concentration gradient and retardation effect of Ce on the IMC layer have been observed at the solder/Cu interface. Moreover, aging reaction of Sn and Cu, and the effect mechanism of rare earth Ce on two IMCs (Cu6Sn5 and Cu3Sn) are reported. 相似文献
16.
Flip-chip devices with Sn-3.8Ag-0.7Cu solder on electroless Ni (EN) without immersion Au were studied after aging at different
temperatures. The (Cu,Ni)6Sn5 intermetallics (IMCs) growth was volume diffusion controlled and Kirkendall voids were found in the Ni3P layer even at the initial stage of high-temperature aging due to the faster diffusion of Ni in the Ni3P layer via its column structure boundaries. The Ag3Sn IMCs were distributed in the bulk solder, existing as plate- or lamella-like phases or as small particles around the β-Sn
dendrites, and the (Cu,Ni)6Sn5 IMCs existed as facet-like phases. The plate- and lamella-like Ag3Sn phases break up into small parts and these broken parts, together with small Ag3Sn particles, coarsen into pebble-like phases during high-temperature aging. Shear tests showed that all the solder bumps
fractured in the bulk solder. The shear strength of solder bumps decreases at the initial stage of aging at 150°C and 175°C,
and the strength degradation during aging may be caused by the coarsening of small Ag3Sn particles. 相似文献
17.
Effects of microstructural evolution and intermetallic layer growth on shear strength of ball-grid-array Sn-Cu solder joints 总被引:1,自引:0,他引:1
The shear strength of ball-grid-array (BGA) solder joints on Cu bond pads was studied for Sn-Cu solder containing 0, 1.5,
and 2.5 wt.% Cu, focusing on the effect of the microstructural changes of the bulk solder and the growth of intermetallic
(IMC) layers during soldering at 270°C and aging at 150°C. The Cu additions in Sn solder enhanced both the IMC layer growth
and the solder/IMC interface roughness during soldering but had insignificant effects during aging. Rapid Cu dissolution from
the pad during reflow soldering resulted in a fine dispersion of Cu6Sn5 particles throughout the bulk solder in as-soldered joints even for the case of pure Sn solder, giving rise to a precipitation
hardening of the bulk solder. The increased strength of the bulk solder caused the fracture mode of as-soldered joints to
shift from the bulk solder to the solder/IMC layer as the IMC layer grew over a critical thickness about 1.2 m for all solders.
The bulk solder strength decreased rapidly as the fine Cu6Sn5 precipitates coarsened during aging. As a consequence, regardless of the IMC layer thickness and the Cu content of the solders,
the shear strength of BGA solder joints degraded significantly after 1 day of aging at 150°C and the shear fracture of aged
joints occurred in the bulk solder. This suggests that small additions of Cu in Sn-based solders have an insignificant effect
on the shear strength of BGA solderjoints, especially during system use at high temperatures. 相似文献
18.
The interfacial interaction between Cu substrates and Sn-3.5Ag-0.7Cu-xSb (x = 0, 0.2, 0.5, 0.8, 1.0, 1.5, and 2.0) solder alloys has been investigated under different isothermal aging temperatures
of 100°C, 150°C, and 190°C. Scanning electron microscopy (SEM) was used to measure the thickness of the intermetallic compound
(IMC) layer and observe the microstructural evolution of the solder joints. The IMC phases were identified by energy-dispersive
x-ray spectroscopy (EDX) and x-ray diffractometry (XRD). The growth of both the Cu6Sn5 and Cu3Sn IMC layers at the interface between the Cu substrate and the solder fits a power-law relationship with the exponent ranging
from 0.42 to 0.83, which suggests that the IMC growth is primarily controlled by diffusion but may also be influenced by interface
reactions. The activation energies and interdiffusion coefficients of the IMC formation of seven solder alloys were determined.
The addition of Sb has a strong influence on the growth of the Cu6Sn5 layer, but very little influence on the formation of the Cu3Sn IMC phase. The thickness of the Cu3Sn layer rapidly increases with aging time and temperature, whereas the thickness of the Cu6Sn5 layer increases slowly. This is probably due to the formation of Cu3Sn at the interface between two IMC phases, which occurs with consumption of Cu6Sn5. Adding antimony to Sn-3.5Ag-0.7Cu solder can evidently increase the activation energy of Cu6Sn5 IMC formation, reduce the atomic diffusion rate, and thus inhibit excessive growth of Cu6Sn5 IMCs. This study suggests that grain boundary pinning is one of the most important mechanisms for inhibiting the growth of
Cu6Sn5 IMCs in such solder joints when Sb is added. 相似文献
19.
Growth of an intermetallic compound layer with Sn-3.5Ag-5Bi on Cu and Ni-P/Cu during aging treatment
Growth kinetics of intermetallic compound (IMC) layers formed between the Sn-3.5Ag-5Bi solder and the Cu and electroless Ni-P
substrates were investigated at temperatures ranging from 70°C to 200°C for 0–60 days. With the solder joints between the
Sn-Ag-Bi solder and Cu substrates, the IMC layer consisted of two phases: the Cu6Sn5 (η phase) adjacent to the solder and the Cu3Sn (ε phase) adjacent to the Cu substrate. In the case of the electroless Ni-P substrate, the IMC formed at the interface
was mainly Ni3Sn4, and a P-rich Ni (Ni3P) layer was also observed as a by-product of the Ni-Sn reaction, which was between the Ni3Sn4 IMC and the electroless Ni-P deposit layer. With all the intermetallic layers, time exponent (n) was approximately 0.5, suggesting
a diffusion-controlled mechanism over the temperature range studied. The interface between electroless Ni-P and Ni3P was planar, and the time exponent for the Ni3P layer growth was also 0.5. The Ni3P layer thickness reached about 2.5 μm after 60 days of aging at 170°C. The activation energies for the growth of the total
Cu-Sn compound layer (Cu6Sn5 + Cu3Sn) and the Ni3Sn4 IMC were 88.6 kJ/mol and 52.85 kJ/mol, respectively. 相似文献
20.
Yee-Wen Yen Weng-Ting Chou Yu Tseng Chiapyng Lee Chun-Lei Hsu 《Journal of Electronic Materials》2008,37(1):73-83
This study investigates the dissolution behavior of the metallic substrates Cu and Ag and the intermetallic compound (IMC)-Ag3Sn in molten Sn, Sn-3.0Ag-0.5Cu, Sn-58Bi and Sn-9Zn (in wt.%) at 300, 270 and 240°C. The dissolution rates of both Cu and
Ag in molten solder follow the order Sn > Sn-3.0Ag-0.5Cu >Sn-58Bi > Sn-9Zn. Planar Cu3Sn and scalloped Cu6Sn5 phases in Cu/solders and the scalloped Ag3Sn phase in Ag/solders are observed at the metallic substrate/solder interface. The dissolution mechanism is controlled by
grain boundary diffusion. The planar Cu5Zn8 layer formed in the Sn-9Zn/Cu systems. AgZn3, Ag5Zn8 and AgZn phases are found in the Sn-9Zn/Ag system and the dissolution mechanism is controlled by lattice diffusion. Massive
Ag3Sn phases dissolved into the solders and formed during solidification processes in the Ag3Sn/Sn or Sn-3.0Ag-0.5Cu systems. AgZn3 and Ag5Zn8 phases are formed at the Sn-9Zn/Ag3Sn interface. Zn atoms diffuse through Ag-Zn IMCs to form (Ag, Zn)Sn4 and Sn-rich regions between Ag5Zn8 and Ag3Sn. 相似文献