基于离差最大化的空战目标威胁评估

威胁评估是协同多目标攻击空战决策的关键技术之一。在分析了现有的目标威胁评估方法中距离威胁模型存在不足的基础上,考虑敌我双方飞机的雷达最大探测距离和导弹最大射程的不同情况,提出了改进的距离威胁模型。针对传统威胁评估方法在确定权重系数方面的缺陷和不足,提出了运用离差最大化方法来解决目标威胁评估问题,给出了离差最大化方法确定威胁因素权重的具体步骤。建立了目标威胁评估的数学模型,并进行了仿真研究,仿真结果表明该方法是合理和有效的。     

一种适用于四代机的多目标威胁评估算法

针对传统的空战多目标威胁评估不适于第四代战斗机超视距多目标空战威胁评估的问题, 提出了一种新的适合第四代战斗机超视距多目标空战的威胁评估方法。该方法在传统多目标威胁评估的基础上, 考虑空战高度和第四代战斗机隐身性能, 分别运用模糊优选法和区间层次分析(IAHP)法解算主客观权重, 进而得到综合权重区间, 并运用改进的TOPSIS法进行多目标威胁评估研究。仿真结果表明该算法的有效性和合理性, 适合于第四代战斗机超视距多目标空战的威胁评估。     

基于信息熵和TOPSIS法的目标威胁评估及排序

针对现有空战目标威胁评估方法中存在的不足,提出了一种基于信息熵和TOPSIS法的空战目标威胁评估方法。首先建立了空战目标威胁评估指标,确定了角度、速度、隐身等威胁因子;为综合考虑评估中的主客观因素,采用了组合权衡因子确定最终权重;最后采用TOPSIS法作为威胁评估的解算方法,进行仿真验证,结果证明了该方法的有效性及合理性。     

动态变权重的近距空战态势评估方法

针对空战态势评估中,常权求和带来的信息动态性不够灵活的问题,提出了动态变权重的近距空战态势评估方法。该方法在优势函数的基础上,加入空战能力指标,改进了评估指标体系;并且依据贝叶斯理论实时确定态势类型,综合空战态势变化特点,根据变权理论,动态调整评估指标权重。通过真实的空战数据仿真实验,验证了该方法在空战态势评估中的可行性和有效性。仿真结果表明,动态变权重的评估方法能够有效改善常权求和引起的信息动态性差的问题。     

基于多属性决策和态势估计结果的空战威胁评估方法

结合空战的特点,对影响目标威胁评估的属性进行了分析,并用层次分析法确定各属性的权值.根据多属性决策理论和方法,给出目标的威胁度,再根据空战的态势估计结果修正威胁度值,最终得到威胁排序结果,为传感器管理和火力分配提供依据.     

语言判断矩阵在确定多属性决策问题权重中的应用

在多属性决策问题中,由于易受人为因素的影响,所得权重值的客观性是确定权重的最基本的要求。但以往确定权重方法都在一定程度上受人为因素影响较大。在此介绍一种新的方法——语言判断矩阵方法,并运用该方法对防空作战中影响目标威胁度因素的权重进行了分析计算,其结果较为合理,且该方法与其他方法相比,在确定多属性决策的权重问题时受人的主观因素影响较小。     

基于TOPSIS方法的空战威胁评估研究

威胁评估是单机多目标攻击和空战协同战术决策的一项重要内容,首先提出了威胁评估指标的确定方法,然后阐述了TOPSIS(逼近于理想的排序法)方法的计算步骤,最后给出算例。该方法计算简单明确,可以有效地完成多机空战中威胁评估和威胁排序的计算,是解决威胁评估问题的一种有效途径。     

基于混合型多属性决策方法的目标威胁评估

针对目标属性信息存在不确定性的特点,通过对目标属性选取及其权重确定方法的全面分析,采用混合精确实数型指标和模糊区间型指标的决策模型,评价目标多属性并对目标威胁进行评估。最后给出仿真实例,仿真结果表明该方法简单、可靠,为目标威胁评估提供了又一有效途径。     

基于多专家权重的空对地多目标攻击决策

基于融合多专家权重的算法,提出了一种多机协同空对地多目标攻击决策方法.针对实际空对地攻击中的问题,利用评估地面的防空能力及目标的战役价值,分析对地攻击态势,并在此基础上建立威胁指数模型;通过多专家权重得到一个融合多专家权重的权值,以此得到综合威胁评估表,进而得到目标的分配方案.通过Matlab仿真验证了威胁指数模型和攻...     

直觉模糊信息下基于VIKOR和三支决策的多目标威胁评估方法

针对传统多目标威胁评估方法通常是二支决策,只能得到目标威胁排序,需要主观地划定威胁等级与选择作战目标数,不适应于复杂动态任务环境的问题,提出直觉模糊信息下基于VIKOR和三支决策的多目标威胁评估方法.首先,对动态直觉模糊威胁评估信息进行集结并求取属性权重;然后,通过VIKOR方法求取目标决策所需的条件概率;最后,通过评估信息构造各属性下目标的损失函数矩阵,集结得到目标的综合损失函数矩阵,计算综合阈值,得到决策规则.算例分析表明,所提方法能够有效地处理动态不确定目标态势信息,将传统方法的二支排序结果转变为三支分类结果;可以依据目标态势信息客观地选取作战目标.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.