安百特M2受富士通·西门子青睐

欧洲的电脑巨头富士通·西门子公司将在其采用．Ｉｎｔｅｌ芯片的 ＰＲＩＭＥＲＧＹ服务器,采用 Ｓｏ－ｌａｒｉｓ／Ｓｐａｒｃ芯片的ＰＲＩＭＥＰＯＷＥＲ 平台及Ｒｅ－ｌｉａｎｔ的ＲＭ系列ＵＮＸ服务器上选用Ｍ２磁带机和磁带库。 Ｍ２ 磁带库可内置 ２至 １０台驱动器和 ７至２００盘磁带,可提供每小时１ＴＢ的传输速率和３０Ｔ的容量,除性能优势外还有 ＳｍａｒｔＣｌｅａｎ预防性维护技术、ＴａｐｅＳａｆｅ磁带处理系统和提高磁带机可靠性的ＡＭＥ数据磁带都提升了磁带机的性能。安百特M2受富士通·西门子青睐     

行业快讯

信息产业部电子第五研究所 隆重推出“可靠性维修性 工程软件ＣＡＲＭＥＳ－２０００” 信息产业部电子第五研究所数据中心现隆重推出“可靠性维修性工程软件ＣＡＲＭＥＳ－２０００（以下简称“ＣＡＲＭＥＳ－２０００”）。该软件包含可靠性、维修性与可用性应用程序模块（Ｃ－ＲＡＭＰ）、故障模式、影响及危害性分析模块（Ｃ－ＦＭＥＣＡ）、故障报告、分析及纠正措施系统（Ｃ－ＦＲＡＣＡＳ）三大功能模块。经半年多的反复测试、试运行及修正完善,现已交付１７个单位试用,其中信息产业部２９所、电科院总体部都取得了良好的使用效果…     

2英寸GaAs快速热退火技术研究

为配合２０００门ＧａＡｓ超高速门阵列及ＧａＡｓ超高速分频器等２英寸ＧａＡｓ工艺技术研究，开展了２英寸ＧａＡｓ快速热退火技术研究。做出了阈值电压为０～０．２Ｖ，跨导大于１００ｍＳ／ｍｍ的Ｅ型ＧａＡｓＭＥＳＦＥＴ和夹断电压为－０．４～－０．６Ｖ，跨导大于１００ｍＳ／ｍｍ的低阈值Ｄ型ＧａＡｓＭＥＳＦＥＴ。     

0．1μm NMOSFET沟道δ－掺杂与结构特性

沟道δ－形掺杂对于改善极小尺寸ＭＯＳＦＥＴ性能、提高可靠性极其重要。利用能量输运模型（ＥＴＭ），报道了沟道δ－形掺杂分布对０．１μｍ沟长ＮＭＯＳＦＥＴ结构特性的影响，根据漏源电流ＩＤＳ、截止态电流Ｉｏｆｆ、阈值电压ＶＴＨ和Ｓ因子的要求，提出了使性能和可靠性得到优化的δ－形掺杂分布。     

衬底正偏的MOSFET的近似模型

本文针对衬底正偏的ＭＯＳＦＥＴ的解析模型进行了讨论．在已有ＭＯＳＦＥＴ理论基础上，仅引入一个参数ξ，便得到了全偏压范围的ＭＯＳＦＥＴ的解析表达式的通式．当ξ＝１时，该表达式与已知的衬底负偏的ＭＯＳＦＥＴ的表达式相同；当ξ＝０．８时，可得到衬底正偏的ＭＯＳＦＥＴ的近似解析式．实验结果验证了该模型的正确性．     

2英寸GaAs快速热退火技术研究

为配合２０００门ＧａＡｓ超高速门列及ＧａＡｓ超高速分频器等２英寸ＧａＡｓ工艺技术研究，开展了２英寸ＧａＡｓ快速热退火技术研究，做出了阈值电压为０～０．２Ｖ，跨导大于１００ｍＳ／ｍｍ的Ｅ型ＧａＡｓＭＥＳＦＥＴ和夹断电压为－０．４～－０．６Ｖ，跨导大于１００ｍＳ／ｍｍ的低阈值Ｄ型ＧａＡｓＭＥＳＦＥＴ。     

研究光解的瞬态ESR波谱技术

本文简要报导了作者研制的具有０．２μｓ时间分辨率的ＴＲＥＳＲ波谱仪，概述光解瞬态顺磁粒子电子自旋极化的ＴＭ与ＲＰＭ的两种机理。综述了在光物理；光化学和光生物学等领域中瞬态光解ＥＳＲ波谱技术某些应用的研究概况。     

精品展台

微芯片工业和汽车用微控制器 Ａｔｍｅｌ公司推出ＣＡＮａｒｙ系列ＣＡＮ基微控制器的新成员Ｔ８９Ｃ５１ＣＣ０２。它具有系统内编程（ＩＳＰ）能力,通过ＣＡＮ总线或ＵＡＲＴ,设计人员可开发其应用。它支持带２．０Ａ和２．０Ｂ结点的ＣＡＮ网络。用内部时钟倍频器,该器件可达到１Ｍｂｉｔ／ｓ的最高ＣＡＮ总线数据率。它包含１６Ｋ字节片上程序闪存和ＣＡＮ控制器、双数据指针、２Ｋ字节用户数据ＥＥＰＲＯＭ、８通道１０位Ａ／Ｄ转换器、５１２字节ＲＡＭ。它完全符合高速的ＩＳＯ规范１１９８９（２．０Ａ和２．０Ｂ）和低速的１１…     

低压低能耗应用的InGaAs／AlGaAsPHEMT单片微波SPDT开关

提出了微波频率下ＰＨＥＭＴ在作开关运用时一种简化的等效电路模型，其模型参数可从对实际ＰＨＥＭＴ芯片的在片微波测试方便地确定。对于电路中元件采用不同尺寸组合情形下所进行的开关性能（插入损耗，隔离度，输入及输出反射损耗）的模拟计算表明，与实验结果符合良好。在对串／并联ＰＨＥＭＴ型ＳＰＤＴ开关的ＣＡＤ优化设计基础上进行了ＩｎＧａＡｓ／ＡｌＧａＡｓＰＨＥＭＴ单片ＳＰＤＴ微波开关的实验研制。从研制的ＭＭＩＣ芯片上在片测试得到的结果为：对应新的个人通信频段的应用，在０～２ＧＨＺ范围内，插入损耗＜１．０ｄＢ，隔离度＞５０ｄＢ，输入及输出反射损耗均优于２４ｄＢ。研制的这种高性能单片开关还可在低至－２．０Ｖ的控制电压下工作。     

0.1μmNMOSFET沟道δ—掺杂与结构特性

沟道δ－形掺杂对于改善极小尺寸ＭＯＳＦＥＴ性能、提高可靠性其重要。利用能量输出模型，报道了沟道δ－形掺杂分布对０．１μｍ沟长ＮＭＯＳＦＥＴ结构特性的影响。     

考虑测试覆盖率和故障排除效率的软件可靠性增长模型

软件测试覆盖率直观地描述了软件测试的程度,现有的基于测试覆盖率的软件可靠性增长模型绝大多数都没有考虑故障的排除效率.论文把软件测试覆盖率和故障排除效率引入到软件可靠性评估过程中,建立了一个既考虑测试覆盖率,又考虑故障排除效率的非齐次泊松过程类软件可靠性增长模型,在一组失效数据上的实验分析表明:对这组失效数据,论文提出的模型比其他一些非齐次泊松过程类模型的拟合效果更好.     

美国军用手册338B中的软件可靠性预计模型及其应用

介绍美国军用手册338B中软件可靠性以及软件可靠性预计,具体讨论四种软件可靠性预计模型——Musa执行时间模型、Putnam模型、以及罗马实验室的RL-TR-92-52模型与RL- TR-92-15模型,并给出其适用条件和应用例子。     

Software Reliability Analysis and Measurement Using Finite and Infinite Server Queueing Models

Software reliability is often defined as the probability of failure-free software operation for a specified period of time in a specified environment. During the past 30 years, many software reliability growth models (SRGM) have been proposed for estimating the reliability growth of software. In practice, effective debugging is not easy because the fault may not be immediately obvious. Software engineers need time to read, and analyze the collected failure data. The time delayed by the fault detection & correction processes should not be negligible. Experience shows that the software debugging process can be described, and modeled using queueing system. In this paper, we will use both finite, and infinite server queueing models to predict software reliability. We will also investigate the problem of imperfect debugging, where fixing one bug creates another. Numerical examples based on two sets of real failure data are presented, and discussed in detail. Experimental results show that the proposed framework incorporating both fault detection, and correction processes for SRGM has a fairly accurate prediction capability.     

基于卫星通信监测系统的软件可靠性研究

软件可靠性直接影响到软件成本和质量,软件可靠性低会影响到系统的正常运行.结合卫星监控系统客户端软件的研究从多线程,内存管理等角度讨论如何提高软件的可靠性问题.     

Software reliability estimation: A realization of competing risk

A software reliability model presented here assumes a time-dependent failure rate and that debugging can remove as well as add faults with a nonzero probability. Based on these assumptions, the expected number of faults and mean standard error of the estimated faults remaining in the system are derived. The model treats the capability of correcting errors as a random process under which most of the existing software reliability models become special cases of this proposed one. It, therefore, serves to realize a competing risk problem and to unify much of the current software reliability theory. The model deals with the nonindependence of error correction and should be extremely valuable for a large-scale software project.     

关于软件可靠性Halstead模型的改进

1970年以来，近百个软件可靠性模型被建立起来，大部分模型是基于测试数据来建立的，用一定测试时间或数据范围内错误发生的概率来度量软件可靠性，希望用一种概率统计表达式来揭示错误发生的规律。很少有模型将可靠性度量与可靠性因素一开发者，开发工具，软件复杂度联系起来，Halstead模型是唯一将软件复杂性与软件错误数联系起来的模型，但是没有考虑其它两个可靠性因素，文章将这些因素考虑进来以后对Halstead模型进行了一定改进，得出一个面向用户的软件可靠性模型。     

软件可靠性评测技术及其应用

本文论述了软件可靠性评测技术及其工程应用中的常见问题和解决方案，介绍了软件可靠性评测的主要活动。软件可靠性是重要的软件质量特性之一，软件可靠性评测是软件质量与可可靠性保证的重要环节。     

Adjusting software failure rates that are estimated from test data

Software test environments are often different from field environments. Using test data exclusively to estimate a field failure rate will not usually give a very accurate estimate. In this paper, we extend an empirical calibration methodology for adjusting the failure rate estimate obtained from analysing test data. In addition to scaling the estimated failure rate of a fault, we propose scaling the estimated number of residual faults as well. We also derive likelihood ratio tests to formally determine (from previous releases of the software) if test, and field environments are significantly different. We illustrate our new results with two telecommunications case studies. The combination of the likelihood ratio test, and the calibration methodology offers a practical way to extend the application of software reliability growth models to less formal test environments.     

An Assessment of Testing-Effort Dependent Software Reliability Growth Models

Over the last several decades, many Software Reliability Growth Models (SRGM) have been developed to greatly facilitate engineers and managers in tracking and measuring the growth of reliability as software is being improved. However, some research work indicates that the delayed S-shaped model may not fit the software failure data well when the testing-effort spent on fault detection is not a constant. Thus, in this paper, we first review the logistic testing-effort function that can be used to describe the amount of testing-effort spent on software testing. We describe how to incorporate the logistic testing-effort function into both exponential-type, and S-shaped software reliability models. The proposed models are also discussed under both ideal, and imperfect debugging conditions. Results from applying the proposed models to two real data sets are discussed, and compared with other traditional SRGM to show that the proposed models can give better predictions, and that the logistic testing-effort function is suitable for incorporating directly into both exponential-type, and S-shaped software reliability models