纳米金刚石膜场发射性质的研究

研究了不同衬底上纳米金刚石膜场电子发射性质.纳米金刚石膜是用热灯丝化学气相沉积法合成的.反应气体是CH4、H2和N2的混合物.得到的纳米金刚石膜利用扫描电子显微镜和拉曼谱等进行检测和表征.场发射是在压强为106Pa的真空室进行测量的.实验结果表明,在纳米金刚石膜上涂有碳纳米管展显了更低的开启电场,它比碳纳米管,Mo上纳米金刚石及Si上纳米金刚均要低得多.但Mo和Si上纳米金刚石要比Si上多晶金刚石开启电场低.文中对实验结果进行了讨论.     

热灯丝CVD金刚石膜的微结构和形貌对其电子性质的影响

利用热灯丝CVD法在硅衬底上合成出了金刚石膜。金刚石膜的质量和电子性质由扫描电子显微镜、拉曼谱、阴极发光及霍尔系数测量来表征。实验结果表明,沉积条件对金刚石膜电子性质和质量有重要影响。载流子迁移率随甲烷浓度增加而减少,但场发射随其增加而增强。压阻效应随微缺陷增多而降低。异质外延金刚石膜压阻因子在室温下100微形变时为1200,但含有大量缺陷的多晶金刚石膜压阻因子低于200,这是由于薄膜中缺陷态密度增加,并依赖于膜结构的变化。     

CVD金刚石薄膜热,导率的研究

研究了直流等离子体喷射沉积金刚石膜的晶粒尺寸、晶粒取向、膜厚、杂质和缺陷对金刚石膜的热导率的影响。结果表明，随着晶粒尺寸的增大，金刚石膜的热导率先慢后快逐渐增大；随着膜的增厚，热导率先大幅度提高，达到一定值后，变化率变小；晶粒（111）取向对金刚石膜的热导率最有利，其次是（110）；非金刚石碳相和缺陷都降低膜的热导率，但晶间空隙对热导率的影响比非金刚石碳相大。     

金刚石膜内晶粒尺寸和取向对其热导率的影响

研究了金刚石膜内晶粒尺寸和取向程度对金刚石膜热导率的影响。通过对衬底表面进行不同研磨时间的处理和适当的工艺条件，采用灯丝热解化学气相沉积（ＨＦＣＶＤ）的方法在单晶硅衬底上形成了具有不同晶粒尺寸和不同程度（１００）晶面取向的金刚石膜，并研究了其热导率。结果表明，由大晶粒和较高程度（１００）晶面取向的晶粒构成的金刚石膜具有热导率特性。     

不同反应气源对制备纳米金刚石膜的影响

为确定两种典型的反应气源对制备纳米金刚石膜的影响,分别以CH4/Ar/H2及CH4/N2混合气体作为反应源,用微波等离子体化学气相沉积(MWPCVD)法制备纳米金刚石薄膜.XRD和Raman分析表明两种气源条件下得到的膜材均为金刚石多晶膜,但用CH4/N2气为反应源沉积的膜材中非金刚石相成分明显更多;AFM和SEM对照分析证实所有膜层的平均晶粒尺寸及表面粗糙度均在几十纳米量级,但CH4/N2气源沉积的膜中容易形成异常长大的晶粒,不利于表面质量的提高.研究结果表明,以CH4/Ar/H2混合气体作为反应气源可制备物相组成纯度更高、表面形态更为优越的纳米金刚石膜.     

金刚石膜—硬质合金基体横截面组织的金相研究

采用MeF3金相显微镜对CVD金刚石膜－硬质合金基体横截面的组织进行了观察，重点研究了甲烷浓度对CVD金刚石膜－基横截面各组织层次的影响。结果表明：硬质合金基体的表面组织发生了显著的变化，形成了不同的组织层次，在化学侵蚀脱钴和等离子体刻蚀脱碳预处理的基础上所沉积的金刚石膜－基横截面组织层次为：金刚石膜／薄的石墨或游离碳层／细小WC层／残留脱碳层（η相十W相）／残留疏松层／YG8基体，甲烷浓度对各层次的形成和厚度有显著的影响。     

硅尖上纳米金刚石膜场发射性质的研究

本文采用热灯丝CVD法在硅尖上制备了纳米金刚石膜，并研究了硅尖上纳米金刚石膜的场发射性质，实验结果表明，硅尖上纳米金刚石膜的场发射特性与硅平面上生长的多晶金刚石膜比较，有了极大的提高，硅尖上纳米金刚石膜场发射开启电场最小为2.7V/μm，而多晶金刚石膜为4.5V/μm。利用电子隧穿模型对实验结果进行了理论分析，研究表明实验结果与理论分析相符合。     

{100}织构化学气相沉积金刚石薄膜的取向生长过程

为了研究化学气相沉积（CVD）金刚石薄膜生长过程中{100}织构的形成机理,采用x射线衍射、电子背散射衍射和扫描电镜研究了CVD自支撑金刚石薄膜的宏观织构、微区晶界分布和表面形貌。结果表明：金刚石薄膜以{111}面或{100}面为生长前沿面都能够形成{100}织构,但形成的表面形貌不同;通过吸附CH3-和CH3-在{1...     

氢等离子体处理对类金刚石膜场发射性能的影响

采用大功率、高重复频率、准分子激光溅射热解石墨靶制备了类金刚石膜,研究了直流辉光氢等离子体处理对类金刚石膜的场发射性能的影响。结果表明:氢等离子体处理后,类金刚石膜的场发射性能明显提高,其发射阈值电场由26V/μm下降到19V/μm。氢等离子体刻蚀除去了类金刚石膜生长表面的富含石墨的薄层,露出的新表面具有较低的功函数;膜表面的悬键被氢原子饱和,进一步降低了电子亲和势,改善了膜的场发射性能。     

热阴极直流辉光等离子体化学气相沉积法制备纳米晶金刚石膜的研究

采用热阴极直流辉光等离子体CVD方法,在氩气/甲烷/氢气混合气氛中制备出纳米晶金刚石膜,研究不同氩气/氢气流量比对纳米晶金刚石膜沉积的影响。对样品形貌的SEM测试表明,随着氩气与氢气流量比由40/160增加到190/10,膜中金刚石晶粒尺寸由约600nm减小到约30nm。金刚石膜Raman谱中金刚石特征峰逐渐减弱,石墨G峰逐渐增强,反式聚乙炔特征峰及其伴峰强度加大。等离子体光谱分析表明C2是生长纳米晶金刚石膜的主要活性基团。     

金刚石膜在多孔硅发光中的应用

采用微波等离子体化学气相沉积（MPCVD）法成功地在多孔硅上沉积出均匀、致密的金刚石膜。光致发光测量表明,金刚石膜可以有效稳定多孔硅的发光波长和发光强度,具有明显的钝化效应。金刚石膜的这个特点再加上高硬度特性使金刚石膜成为多孔硅的一种潜在的钝化膜。     

Field emission studies of CVD diamond thin films: effect of acid treatment

Field emission from CVD diamond thin films deposited on silicon substrate has been studied. The diamond films were synthesized using hot filament chemical vapor deposition technique. Field emission studies of as-deposited and acid-treated films were carried out using ‘diode’ configuration in an all metal UHV chamber. Upon acid treatment, the field emission current is found to decrease by two orders of magnitude with increase in the turn-on voltage by 30%. This has been attributed to the removal of sp² content present in the film due to acid etching. Raman spectra of both the as-deposited and acid-treated films exhibit identical spectral features, a well-defined peak at 1333 cm⁻¹ and a broad hump around 1550 cm⁻¹, signatures of diamond (sp³ phase) and graphite (sp² phase), respectively. However upon acid treatment, the ratio (I_d/I_g) is observed to decrease which supports the speculation of removal of sp² content from the film. The surface roughness was studied using atomic force microscopy (AFM). The AFM images indicate increase in the number of protrusions with slight enhancement in overall surface roughness after acid etching. The degradation of field emission current despite an increase in film surface roughness upon acid treatment implies that the sp² content plays significant role in field emission characteristics of CVD diamond films.     

CVD金刚石厚膜的稀土化合物浆料刻蚀

与现有的金刚石膜势光工艺相匹配的高效刻蚀技术,是目前研究的热点,自行研制的稀土化合物浆料对CVD金刚石厚膜进行了刻蚀研究,刻蚀过程在低于金刚石氧化点的温度下和大气环境中完成,其刻蚀结果,用扫描电子显微镜给出。实验表明,该工艺采用廉价的稀土化合物为原料,具有简单、完全、高效的特点。     

Enhanced field emission from ZnO nanoneedles on chemical vapour deposited diamond films

ZnO nanoneedles were coated on hot filament chemical vapour deposited diamond thin films to enhance the field emission properties of ZnO nanoneedles. The virgin diamond films and ZnO nanoneedles on diamond films were characterized using scanning electron microscopy, X-ray photoelectron spectroscopy and Raman spectroscopy. The field emission studies reveal that the ZnO nanoneedles coated on diamond film exhibit better emission characteristics, with minimum threshold field (required to draw a current density ~ 1 μA/cm²) as compared to ZnO needles on silicon and virgin diamond films. The better emission characteristic of ZnO nanoneedles on diamond film is attributed to the high field-enhancement factor resulting due to the combined effect of the ZnO nanoneedles and diamond film.     

利用前后处理技术改进钛／硅基板上的类金刚石场发射特性

采用微波等离子体化学气相沉积系统存钛/硅基板上沉积类金刚石薄膜,并利用拉曼光谱仪、扫瞄式电子显微镜及原子力显微镜研究了氢等离子体前处理及快速退火后处理对类金刚石薄膜场发射特性之影响.在沉积类金刚石薄膜之前,钛/硅基板使用了两种前处理技术:第一种为研磨金刚石粉末,第二种为研磨金刚石粉末后外加氢等离子体刻蚀处理.成长类金刚石薄膜后进行快速退火处理.发现不论是氢等离子体前处理还是快速退火后处理皆能改善场发射特性,其中经退火后处理的场发射特性比氢等离子体前处理的场发射特性改善更明显.其因之一在于快速退火后处理可在类金刚石薄膜表而形成sp2丛聚,提供了很多的场发射子,也同时增加了表面粗糙度;另一个原因可能是在快速退火后处理期间会使类金刚石薄膜进一步石墨化,因而提供了许多电子在通过类金刚石薄膜时的传输路径.研究结果表明:利用适当的前后处理技术可改进类金刚石薄膜的场发射特性,进而做为冷阴极材料之应用.     

系统压强对微波等离子体化学气相沉积金刚石成核的影响

为了在氧化铝上制备（100）定向织构的金刚石薄膜,必须先提高金刚石的成核密度,在微波等离子体化学气相沉积（MPCVD）系统中,采用低压成核的方法,在氧化铝陶瓷上沉积出高成核密度的金刚石薄膜,扫描电镜显示其成核密度可达10^8cm^-2。在此基础上,沉积出（100）织构的金刚石薄膜。     

Growth behavior of CVD diamond films with enhanced electron field emission properties over a wide range of experimental parameters

In this study, diamond films were synthesized on silicon substrates by microwave plasma enhanced chemical vapor deposition (CVD) over a wide range of experimental parameters. The effects of the microwave power, CH₄/H₂ ratio and gas pressure on the morphology, growth rate, composition, and quality of diamond films were investigated by means of scanning electron microscope (SEM), X-ray diffraction (XRD), Raman spectroscopy and X-ray photoelectron spectroscopy (XPS). A rise of microwave power can lead to an increasing pyrolysis of hydrogen and methane, so that the microcrystalline diamond film could be synthesized at low CH₄/H₂ levels. Gas pressure has similar effect in changing the morphology of diamond films, and high gas pressure also results in dramatically increased grain size. However, diamond film is deteriorated at high CH₄/H₂ ratio due to the abundant graphite content including in the films. Under an extreme condition of high microwave power of 10 kW and high CH₄ concentration, a hybrid film composed of diamond/graphite was successfully formed in the absence of N₂ or Ar, which is different from other reports. This composite structure has an excellent measured sheet resistance of 10–100 Ω/Sqr. which allows it to be utilized as field electron emitter. The diamond/graphite hybrid nanostructure displays excellent electron field emission (EFE) properties with a low turn-on field of 2.17 V/μm and β = 3160, therefore it could be a promising alternative in field emission applications.     

Field emission from diamond and diamond-like carbon films

Field emission from diamond and diamond-like carbon thin films deposited on silicon substrates has been studied. The diamond films were synthesized using hot filament chemical vapor deposition technique. The diamond-like carbon films were deposited using the radio frequency chemical vapor deposition method. Field emission studies were carried out using a sphere-to-plane electrode configuration. The results of field emission were analyzed using the Fowler-Nordheim model. It was found that the diamond nucleation density affected the field emission properties. The films were characterized using standard scanning electron microscopy, Raman spectroscopy, and electron spin resonance techniques. Raman spectra of both diamond and diamond-like films exhibit spectral features characteristic of these structures. Raman spectrum for diamond films exhibit a well-defined peak at 1333cm^?1. Asymmetric broad peak formed in diamond-like carbon films consists of D-band and G-band around 1550 cm^?1 showing the existence of both diamond (sp³ phase) and graphite (sp² phase) in diamond-like carbon films.     

器件级同质外延CVD金刚石膜上的具有高击穿电压的铝肖特基二极管

用微波等离子体化学气相沉积方法合成高品质同质外延金刚石膜,并且用扫描电镜和阴极荧光分析法评价。为了得到高薄膜生长速率,把甲烷浓度设定在4%。薄膜上的生长丘的数量和大小依赖于生长条件。在本工作的样品中,未发现任何非外延晶粒。室温下的阴极荧光分光结果表明这种金刚石薄膜具有与自由励起子相关的谱峰。氢终端的膜表面制作的铝电极显示了P型整流特性。击穿电压高于380V。实验结果表明,阴极荧光分析法观测到的缺陷和电性能密切相关,并且可以在有室温边发射的金刚石表面上制作具有高击穿电压的整流电极。