共查询到19条相似文献,搜索用时 187 毫秒
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作为一种新型的功能材料,FeGa合金磁致伸缩材料以其饱和磁致伸缩系数高、饱和场小、机械性能优良、成本低等优点,在诸多领域具有潜在的应用价值,已成为当前该领域科研工作者的热点研究问题之一。主要介绍了近年来在FeGa合金磁致伸缩材料方面的最新研究进展,重点从制备方法、合金成分及后期热处理等方面阐述了提高FeGa合金磁致伸缩材料性能的方法,最后对目前FeGa合金材料存在的问题和发展趋势进行了分析和展望。 相似文献
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超磁致伸缩致动器的磁-机械强耦合模型 总被引:9,自引:8,他引:9
稀土一铁超磁致伸缩材料作为一种新型功能材料,其应用越来越受到人们的关注。为了有效地设计、开发超磁致伸缩材料的器件,必须建立材料器件的输入输出模型。利用能量变分原理,针对研制的超磁致伸缩致动器,建立了系统的磁一机械强耦合模型,并应用有限元法计算了致动器的输入电流与输出位移的关系曲线。计算值与实验值比较吻合,表明所建立的模型能够反映致动器的输入输出关系,模型对于设计超磁致伸缩器件、优化设计方案具有重要意义。 相似文献
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稀土超磁致伸缩电机及其应用 总被引:1,自引:1,他引:1
稀土超磁致伸缩电机在大应变、强力和高功率密度及高精度、快速响应以及高可靠性等方面有着其它电机无法比拟的优点。介绍了这种电机的结构原理、性能特点及其典型应用事例。文中还就稀土超磁致伸缩材料及其驱动器件的市场应用前景进行了展望。 相似文献
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近些年发展起来的一种新型磁功能材料——稀土超磁致伸缩材料,显示出了广阔的发展前景。着重介绍了超磁致伸缩材料的基本特性和国内外发展近况以及在军事和海洋探索方面的应用。 相似文献
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用磁性物理的理论解释了磁致伸缩的产生机制,分析了磁致伸缩材料在磁化过程中的物理特性,指出了使用磁致伸缩换能器的物理条件。文末还介绍了磁致伸缩换能器材料的最新发展动态。 相似文献
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Abstract The electrical properties of thin film (<1000 Å) capacitor devices of lithium niobate grown on silicon and platinum and of thicker film metal-ferroelectric-semiconductor field effect transistors (MFSFET) with lithium niobate as the gate material were measured. Dielectric constants of the thin films on silicon were as high as 27, while those for films on platinum were as high as 49. The MFSFET structures showed good FET properties, and demonstrated a channel current modulation consistent with switching of the ferroelectric gate by pulsing. 相似文献
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随着Si材料半导体器件性能逐步达到瓶颈,宽禁带半导体器件(GaN、SiC)在诸多方面展现出了很好的性能,如低导通阻抗,小输入、输出电容等,这些特性使得GaN和SiC器件能够应用在更高的开关频率条件,从而提高系统的功率密度。针对基于GaN FETs构成的高频半桥谐振变换器进行设计,分析了高频条件下寄生电感参数对系统驱动电压及漏源极电压的影响,同时分析了高频条件下系统电压电流测量所需注意的事项及影响因素,为高频条件下GaN FETs的应用提供一定的帮助。 相似文献
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O. Auciello A. M. Dhote R. Ramesh B. T. Liu S. Aggarwal A. H. Mueller 《Integrated ferroelectrics》2013,141(1):295-306
We review our studies of film growth and interface processes performed using complementary in situ and ex situ characterization techniques that provide valuable information critical to the development of materials integration strategies for the fabrication of electroceramic film-based devices. Specifically, we review our work performed using in situ time-of-flight ion scattering and recoil spectroscopy (TOF-ISARS) / X-ray photoemission spectroscopy (XPS) / spectroscopic ellipsometry (SE), in conjunction with ex situ TEM and other techniques to study film growth and interface processes critical to the fabrication of non-volatile ferroelectric memories (NVFRAMs), dynamic random access memories (DRAMs), and high frequency devices based on high-K thin films. TOF-ISARS involves three distinct but closely related experimental methods, namely: ion scattering spectroscopy, direct recoil spectroscopy and mass spectroscopy of recoiled ions, which provide monolayer-specific information on film growth and surface segregation processes. Spectroscopic Ellipsometry enables investigation of buried interfaces. XPS provides valuable information on the chemistry of surface and interfaces. Specifically, we discuss: a) studies of oxidation of Ti-Al layers and synthesis and properties of La 0.5 Sr 0.5 CoO 9 /Ti-Al heterostructured layers for integration of PZT capacitors with Si substrates, and b) studies of BaSr x Ti 1 m x O 3 layer integration with Si substrates relevant to DRAMs, high frequency devices and high-K gate oxides for integrated circuits. This review shows the power of combined in situ / ex situ analytical techniques to provide valuable information for material integration strategies for electroceramic thin film-based devices. 相似文献
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Sudarshan T.S. Li C.R. 《Dielectrics and Electrical Insulation, IEEE Transactions on》1997,4(5):657-662
In order to determine the influence of intrinsic material properties of dielectric materials on high field surface flashover characteristics in vacuum, it is important that we minimize or eliminate the influence of the experimental test structure on the high field processes. In this paper we shall examine the flashover characteristics of polycrystalline alumina insulators, using a lateral test structure similar to the one used in semiconductor devices. A significant improvement in surface flashover strengths (~200%) was found using a metalized contact electrode system compared with a classical solid electrode system. The results indicate that, using a metalized film cathode, the scatter in the flashover data is significantly reduced compared with the solid electrode system, implying that the electron-dielectric interaction processes that lead to flashover occur in a more predictable fashion. The new metal contact electrode system reveals the dependence of flashover strength on the surface preparation and the grain size of the dielectric material. The average flashover strength increases and the scatter in the flashover data decrease with a decrease in the average grain size of the particles composing the alumina ceramic. Thus the surface flashover processes in vacuum are related to the dielectric surface microstructure, specifically the surface and sub-surface microdamage and grain-boundary defects 相似文献
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Chikako Yokota Kazushi Ishiyama Ken Ichi Arai 《IEEJ Transactions on Electrical and Electronic Engineering》2007,2(4):436-439
This paper describes a cantilevered actuator driven by magnetostriction in a low magnetic field. The dimensions of the two‐layer actuator were 1 mm × 5 mm, and amorphous FeSiB was used as the positive magnetostrictive material. The theoretical formulas for the amount of displacement and force of the actuator were obtained. In the experiment, a nonmagnetic polyimide film material and a negative magnetostrictive Ni film material were used as the substrates. The change in the characteristics of the actuator caused by changing the substrate was examined with theoretical formulas and experiments. It is shown that the actuator with Ni as the substrate was designed to obtain the largest displacement and the largest force. © 2007 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc. 相似文献