共查询到20条相似文献,搜索用时 62 毫秒
1.
2.
针对高光谱数据热红外温度和发射率反演为病态方程且易受大气下行辐射噪声干扰的问题,提出了基于相关性和小波滤波相结合的高光谱热红外温度发射率分离方法,即相关-小波法。在相关性方法的基础上,引入小波降噪的思想,生成一系列温度梯度,在不同温度梯度下,带入大气下行辐射计算得到的发射率曲线和不考虑大气下行辐射直接小波滤波得到的发射率曲线计算相关性,取相关性最大时的温度为反演温度。同时在反演发射率时利用相关性计算不同尺度的小波信号所占的比例合成发射率曲线。模拟数据结果显示:相关-小波法在温度梯度为0.01K时,温度反演平均误差为0.05K,并且相关-小波法在温度反演精度和发射率反演精度上都优于相关性方法和小波法。由此表明,该算法可一定程度上抑制大气校正不准确引入的误差,有效提高热红外温度和发射率的反演精度。 相似文献
3.
针对辐射光谱测温法测量误差问题,利用黑体炉搭建了标准辐射测温实验平台,选用200~1 100nm波段光谱仪对标准高温源进行辐射光谱测量。讨论了高温源辐射光谱特征,并基于辐射光谱测温法获得了温度测量值,该值与标准参考值的相对偏差小于4%,同时分析了测量重复性引起的标准不确定度分量,为辐射测温法应用提供参考。 相似文献
4.
5.
基于投影微分算法提出了一种应用于多光谱成像仪的自动对焦方法,该方法结合图像处理单元和多个波段的探测器调焦辅助机构来同时实现多个波段的独立自动对焦.首先,根据观测需要对自动对焦窗口进行手动选取,或结合投影微分与目标边缘的对应关系进行对焦窗口的自动选择;然后,将参与自动对焦计算的图像的对焦窗口内的数据做x与y方向投影,对这两个方向投影数组的微分1范数均值求均方根,并将其作为该帧图像的清晰度评价值;最后,结合经典的爬山搜索算法,完成系统的自动对焦过程.实验结果显示,同等条件下投影微分算法与经典的Brenner、能量梯度及Roberts梯度和算法具有同样好的评价效果,能够准确地实现系统的自动对焦,而其算法时间分别仅为这3种算法的0.67、0.33和0.33倍.这些结果表明,投影微分算法具有良好的单峰性与无偏性、较高的灵敏度及很好的实时性,能够满足系统的高精度自动对焦要求. 相似文献
6.
研究改进了一种高速高精度多谱线的光谱诊断系统.该诊断系统具有能同时接收多条谱线,采样频率高,空间分辨率高,数据采集量大,光谱分辨率高,频率响应好等特点,在多种复杂条件下的光谱诊断研究中得到了成功的应用. 相似文献
7.
大视场多光谱空间遥感相机获取的图像直接合成彩色图像后存在严重的色带,且不同片探测器获取的图像存在较大的颜色偏差.随着分辨率、视场角和光谱谱段数量的增加,在地面进行相对辐射校正时数据处理量大且耗时长.提出了一种大视场多光谱遥感相机的在轨自动相对辐射校正方法,通过最小二乘法拟合得到绝对辐射定标系数,计算得到能够消除片间颜色偏差的相对辐射校正系数.在成像控制FPGA中原始图像和从BLOCK RAM中读取的校正系数,依次经过13 b有符号加法器、17 b无符号乘法器和四舍五入模块,自动完成每个像元图像数据的实时相对辐射校正.实验室均匀辐射背景成像实验和仿真结果表明,自动相对辐射校正的结果和在地面进行相对辐射校正的结果一致,校正误差在0.5个DN(digital number)值以内,校正后的图像滞后原始图像6个系统时钟,可以满足实时性要求.在轨成像实验结果表明,经过自动相对辐射校正后直接合成的彩色图像去除了色带和片间色差,使得对感兴趣目标分辨和识别更加快速及时. 相似文献
8.
9.
10.
在400~720 nm波段范围,采用基于液晶可调谐滤波器(LCTF)和CMOS相机组合的多光谱成像系统对蜡染的布料进行每隔5 nm成像。讨论了多光谱成像的基本原理和多角度下彩色图像的实现过程,并且通过计算光谱反射率展示了光谱合成颜色的基本方法。对再现后的橘色、绿色、白色、蓝色、黄色、黑色六种颜色色块进行多角度下明度值、彩度值的分析。实验结果表明,六种颜色的明度值均呈现正态分布,并且通过计算六种颜色色块的色品坐标值a~*、b~*和彩度c_(ab)~*的均方差,得出在一定的范围内,六种颜色的色品坐标a~*、b~*近似不随角度变化,其中蓝色和黑色随角度的变化更小,近似于一条直线。 相似文献
11.
《Measurement》2016
Ceramics coatings are materials widely used in gas turbines to provide thermal shielding of superalloy materials against excessive turbine temperatures. However, measurement of their surface temperatures using conventional radiation thermometers, more so in the presence of high ambient radiation and low emissivity is quite challenging. A multispectral method employing curve fitting technique to measure the temperature of such targets in the range of 800–1200 K and ambient temperature of 1273 K is implemented in this paper through simulation. Several simulated experiments were carried out to identify emissivity models best suited for multispectral radiation thermometry applicable to ceramic coatings. The best emissivity model applicable to yttria-stabilized zirconia of coating thickness of 330 μm in the wavelength range of 3.5–3.9 μm was found to predict temperature with an error of less than 1.5% in the presence and absence of background noise. 相似文献
12.
An analytical comparison of the accuracy of the most often used methods of emissivity measurements carried out during infrared thermographic studies on electronic microcircuits (thin-, thick-film and hybrid ones, high-density miniature PCBs, microsystems) is the main purpose of this paper. A typical measurement arrangement applied to these studies and main factors influencing the measurement results are presented. A special relationship describing the thermographic camera signal has been formulated. Conventional and unconventional methods of the emissivity measurements together with a detailed analysis of the accuracy of typical methods are presented in the paper. A criterion and a procedure of choosing the emissivity measurement method are also proposed. Similar problems concerning the temperature measurements will be presented and discussed in the next paper. 相似文献
13.
《Measurement》2016
In the framework of the HiTeMS project of the European Metrology Research Pogramme (EMRP) a new multi-wavelength device for measurement of high temperatures in industrial applications was developed at INRIM. The apparatus takes advantage of the ultra-violet operation with working wavelengths from 350 nm up, which reduces the possible errors connected with the multi-wavelength approach. The instrument has been characterised in terms of optical and electronic behaviour and some laboratory trials were carried out to verify the reliability of the multi-wavelength approach. The true temperature of a blackbody source at 1300 °C with optical windows of unknown spectral transmittance interposed has been defined. By applying an approach that allows a result to be accepted when a threshold limit is reached, it was found that, when an acceptable result can be obtained, errors are comprised within less than 1% of the temperature of the source. Three others single-band thermometers, at 508 nm, 650 nm and an IR broadband 0.8–1.1 μm, were also used to the purpose of a comparison. It has been found that, when the multi-wavelength approach is applicable, it provides generally better or in few cases, at worst similar results of corrected single-wavelength thermometers. 相似文献
14.
15.
The authors have developed a new radiation thermometer for the measurement of near room temperature with high signal-to-noise ratio (S/N). The thermometer, utilizing an HgCdTe semiconductor sensor, is compact and insensitive to temperature changes of the surroundings. Its major breakthrough owes much to the fact that the sensor is cooled and controlled by Peltier thermoelectric devices and that the sensor serves as reference radiator. A well designed optical system with a chopper and a concave mirror shuts off stray radiation, thus improving the S/N.
On-line experiments in a steel sheet manufacturing process using a prototype thermometer proved the validity of this new radiation thermometer. 相似文献
16.
17.
基于 Karhunen-leove 变换的多光谱数据压缩统计特性分析 总被引:1,自引:0,他引:1
提出了基于Karhunen-leove变换(KLT)的多光谱图像数据压缩方法,并对多光谱图像数据KLT统计特征进行了分析。在对KLT进行了理论推导后,如何将该方法应用于实际多光谱数据压缩系统进行了分析讨论。研究提出了一种最大限度地减少额外码流开销的方法。实验结果表明:该方法对16光谱段的三维数据可获得3.2~5.3的压缩比,且几乎没有失真,明显优于用DCT去除谱相关性的方法。 相似文献
18.
19.
《机械设计与制造》2016,(6)
在加工过程中,金属表面的发射率的准确设定,对于采用红外热像仪精确测量金属加工温度有重要影响。采用不同的切削用量,用铣削方法制备了5个具有不同反光程度的样件,并用白光干涉仪测量了各自的粗糙度。利用恒温加热炉加热样件到设定温度,调节FLIR红外热像仪Tools软件上的发射率,让测量温度等于设定温度,所设定的发射率就是对应的表面的发射率。利用这种方法,分别测量了不同反光表面的发射率。实验结果表明,金属反光件的发射率和表面粗糙度存在一定的对应关系。金属反光件的表面粗糙度越大,表面反光程度越小,金属的发射率就越大。对于金属反光表面的测温有实际应用重要的意义。 相似文献