Environmental chamber for an atomic force microscope

A commercial atomic force microscope (AFM), originally designed for operation in ambient conditions, was placed inside a compact aluminum chamber, which can be pumped down to high vacuum levels or filled with a desired gaseous atmosphere, including humidity, up to normal pressure. The design of this environmental AFM is such that minimal intrusion is made to the original setup, which can be restored easily. The performance inside the environmental chamber is similar to the original version.     

大范围扫描原子力显微镜自动调平控制技术

为了进一步扩大原子力显微镜(AFM)的应用范围,研制出一套大范围高速AFM系统.该系统采用上、下两个扫描器,上扫描器负责Z方向闭环控制的动态响应,下扫描器负责X、Y方向平面扫描及Z方向补偿控制.针对样品放置倾斜对大范围扫描成像的影响,提出基于多线扫描的样品自动调平控制技术.首先通过多线扫描确定样品倾斜位置,然后将所有扫描点的倾斜位移差用函数式表达,最后将位移差换算为控制电压作为扫描器Z向的前馈控制输入.实验结果表明,能消除样品倾斜对AFM大范围扫描的影响.     

Note: vibration reduction control of an atomic force microscope using an additional cantilever

Since an atomic force microscope is used to measure sub-nanometer level precision, it is sensitive to external vibration. If the vibration can be measured by using an additional sensor, we can obtain the vibration-free signal by subtracting the vibration signal from the signal containing the vibration. To achieve a highly effective vibration rejection ratio, it is important to decide where to locate the additional sensor. This is because the vibration measured at the sensing position should have the same phase as that of the vibration in the signal. Vibration reduction control using this electrical sensing method is verified through time domain analysis and topology images of a standard grid sample.     

Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments

It is well known that the low-Q regime in dynamic atomic force microscopy is afflicted by instrumental artifacts (known as "the forest of peaks") caused by piezoacoustic excitation of the cantilever. In this article, we unveil additional issues associated with piezoacoustic excitation that become apparent and problematic at low Q values. We present the design of a photothermal excitation system that resolves these issues, and demonstrate its performance on force spectroscopy at the interface of gold and an ionic liquid with an overdamped cantilever (Q < 0.5). Finally, challenges in the interpretation of low-Q dynamic AFM measurements are discussed.     

Ferrule-top atomic force microscope

Ferrule-top cantilevers are a new generation of all-optical miniaturized devices for utilization in liquids, harsh environments, and small volumes [G. Gruca et al., Meas. Sci. Technol. 21, 094033 (2010)]. They are obtained by carving the end of a ferruled fiber in the form of a mechanical beam. Light coupled from the opposite side of the fiber allows detection of cantilever deflections. In this paper, we demonstrate that ferrule-top cantilevers can be used to develop ultra compact AFMs for contact mode imaging in air and in liquids with sensitivity comparable to that of commercial AFMs. The probes do not require any alignment procedure and are easy to handle, favoring applications also outside research laboratories.     

Feedforward control of a closed-loop piezoelectric translation stage for atomic force microscope

Simple feedforward ideas are shown to lead to a nearly tenfold increase in the effective bandwidth of a closed-loop piezoelectric positioning stage used in scanning probe microscopy. If the desired control signal is known in advance, the feedforward filter can be acausal: the information about the future can be used to make the output of the stage have almost no phase lag with respect to the input. This keeps in register the images assembled from right and left scans. We discuss the design constraints imposed by the need for the feedforward filter to work robustly under a variety of circumstances. Because the feedforward needs only to modify the input signal, it can be added to any piezoelectric stage, whether closed or open loop.     

Investigation of penetration force of living cell using an atomic force microscope

Recently, the manipulation of a single cell has been receiving much attention in transgenesis, in-vitro fertilization, individual cell based diagnosis, and pharmaceutical applications. As these techniques require precise injection and manipulation of cells, issues related to penetration force arise. In this work the penetration force of living cell was studied using an atomic force microscope (AFM). L929, HeLa, 4T1, and TA3 HA II cells were used for the experiments. The results showed that the penetration force was in the range of 2∼22 nN. It was also found that location of cell penetration and stiffness of the AFM cantilever affected the penetration force significantly. Furthermore, double penetration events could be detected, due to the multi-membrane layers of the cell. The findings of this work are expected to aid in the development of precision micro-medical instruments for cell manipulation and treatment. This paper was presented at the 9^th Asian International Conference on Fluid Machinery (AICFM9), Jeju, Korea, October 16–19, 2007.recommended for publication in revised form by Associate Editor Keum-Sik Hong Eun-Young Kwon received her B.S. and M.S degrees in Mechanical Engineering from Yonsei University, Korea, in 2005 and 2007, respectively. Ms. Kwon is currently an Engineer at Digital Printing Division of Samsung Electronics. Her research interests include biotribology, tribology, and electrophotography. Young-Tae Kim received his B.S. in Automotive Engineering from Seoul National University of Technology, Korea, in 2003. He then received his M.S. degree from Yonsei University in Seoul, Korea in 2005. Mr. Kim is currently a Ph. D. candidate at the Graduate School of Mechanical Engineering at Yonsei University in Seoul, Korea. His research interests include biotribology, tribology, and biomechanics. Dae-Eun Kim received his B.S. in Mechanical Engineering from Tufts University, USA, in 1984. He then received his M.S. and Ph.D. degrees from M.I.T. in 1986 and 1991, respectively. Dr. Kim is currently a Professor at the School of Mechanical Engi-neering at Yonsei University in Seoul, Korea. His research interests include tribology, functional surfaces, and micromachining.     

Print your atomic force microscope

Progress in scanning probe microscopy profited from a flourishing multitude of new instrument designs, which lead to novel imaging modes and as a consequence to innovative microscopes. Often these designs were hampered by the restrictions, which conventional milling techniques impose. Modern rapid prototyping techniques, where layer by layer is added to the growing piece either by light driven polymerization or by three-dimensional printing techniques, overcome this constraint, allowing highly concave or even embedded and entangled structures. We have employed such a technique to manufacture an atomic force microscopy (AFM) head, and we compared its performance with a copy milled from aluminum. We tested both AFM heads for single molecule force spectroscopy applications and found little to no difference in the signal-to-noise ratio as well as in the thermal drift. The lower E modulus seems to be compensated by higher damping making this material well suited for low noise and low drift applications. Printing an AFM thus offers unparalleled freedom in the design and the rapid production of application-tailored custom instruments.     

Inducing dendrite formation using an atomic force microscope tip

Atomic force microscope (AFM) tip-induced nucleation, and dendrite growth of vapor deposited PETN films on Si (100) have been investigated at room temperature. The AFM tip induces a change from smooth and flat morphology to islands and dendrites, which is owing to the lowering and vanishing of 2-D nucleation barrier at the tip contact area; this action gives rise to the formation of large islands in the scanned area and dendrite growth along the scanning boundary.     

Design of mechanical components for vibration reduction in an atomic force microscope

Vibration is a key factor to be considered when designing the mechanical components of a high precision and high speed atomic force microscope (AFM). It is required to design the mechanical components so that they have resonant frequencies higher than the external and internal vibration frequencies. In this work, the mechanical vibration in a conventional AFM system is analyzed by considering its mechanical components, and a vibration reduction is then achieved by reconfiguring the mechanical components. To analyze the mechanical vibration, a schematic of the lumped model of the AFM system is derived and the vibrational influences of the AFM components are experimentally examined. Based on this vibration analysis, a reconfigured AFM system is proposed and its effects are compared to a conventional system through a series of simulations and experiments.     

On the importance of precise calibration techniques for an atomic force microscope

Proper calibration of any instrument is vital to an investigator's ability to compare laboratory experiments, as well as to draw quantitative relations between experimental results and the real world. For the atomic force microscope, knowledge of quantities such as the probe spring constant, the piezoactuator voltage/height response, and the probe radius of curvature is necessary when transforming raw data into height, separation and force. These parameters are also prerequisites when applying mathematical models to the collected data. In this communication, we adapt existing techniques of quantifying these parameters to our equipment and show differences between the adjusted parameters and those provided by the manufacturer. The total statistical uncertainty attributable to these parameters was calculated as > 1500% using the manufacturers' values. After adjustment, this contribution drops to approximately 20%. The combined effect of quantifying these parameters, which had previously not been explored in concert, demonstrates the necessity of properly understanding one's equipment in order to generate reproducible and credible experimental results.     

Lateral force microscope calibration using a modified atomic force microscope cantilever

A proof-of-concept study is presented for a prototype atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction measurement using a lateral force microscope (LFM). The calibration procedure is based on the method proposed by Feiler et al. [Rev. Sci. Instrum. 71, 2746 (2000)] but allows for calibration and friction measurements to be carried out in situ and with greater precision. The modified AFM cantilever is equipped with lateral lever arms that facilitate the application of normal and lateral forces, comparable to those acting in a typical LFM friction experiment. The technique allows the user to select acceptable precision via a potentially unlimited number of calibration measurements across the full working range of the LFM photodetector. A microfabricated version of the cantilever would be compatible with typical commercial AFM instrumentation and allow for common AFM techniques such as topography imaging and other surface force measurements to be performed.     

Guiding self-assembly with the tip of an atomic force microscope

We report the guided self-assembly of nanoparticles to geometrically well-defined charge patterns written on a dielectric surface with the conductive tip of an atomic force microscope (AFM). Charges are deposited in 30-90-nm thick fluorocarbon layers by applying voltage pulses to the conductive AFM tip. The samples are being developed by dipping them into an organic suspension of silica nanoparticles. Coulomb forces draw the nanoparticles to the charge patterns. With this simple process, we achieve a resolution of about 800 nm.     

多模态动态原子力显微镜系统

动态原子力显微镜(atomic force microscope,AFM)是通过检测悬臂谐振状态的变化来对物体表面形貌进行测量的。通过对谐振状态的三种因素即振幅、相位、频率的检测,动态AFM可以分为三种工作模式,即振幅反馈、相位反馈与频率反馈模式,这三种反馈模式有着不同的扫描特点。基于硅悬臂具有高阶谐振的特性,动态原子力显微镜可以在悬臂工作于高阶谐振状态时对物体进行扫描。综合上述工作模式研制了一套多模态动态AFM,可以在三种反馈模式、不同阶谐振状态下对物体进行扫描测量。利用该系统在不同反馈模式、不同阶谐振状态下进行了扫描测试,结果显示,系统在各模式下具有亚纳米分辨力,其中在相位反馈模式,悬臂二阶谐振时可达到最优灵敏度与分辨力,分别为17.5V/μm和0.29nm,在最优灵敏度与分辨力状态下对光栅试样进行了三维扫描,得到光栅的三维形貌图。     

Optimizing AC-mode atomic force microscope imaging

We have operated an atomic force microscope in ambient air with several oscillating cantilever modes to establish the optimal scanning parameters to maximize image resolution and to minimize probe and sample damage. This was done by scanning a surface in air and correlating scan parameters such as oscillation amplitude and damping with image resolution. We also examined the geometry of the probe with a scanning electron microscope, before and after scanning, in order to determine whether the scanning technique had an effect on the geometry of the probe tip. If the probe is oscillated such that it contacts the surface on each oscillation, substantial damage or “wear” to the probe occurs and significant degradation of image quality was observed. In ambient air, the optimal conditions are achieved when the probe penetrates the contamination layer and reverses direction before touching the surface. Under these “near-contact” conditions no probe damage is observed and high-image resolution can be maintained indefinitely.     

Nanotribological characterization of digital micromirror devices using an atomic force microscope

Texas Instruments’ digital micromirror device (DMD) comprises an array of fast digital micromirrors, monolithically integrated onto and controlled by an underlying silicon memory chip. The DMD is one of the few success stories in the emerging field of MEMS. In this study, an atomic force microscope (AFM) has been used to characterize the nanotribological properties of the elements of the DMD. An AFM methodology was developed to identify and remove micromirrors of interest. The surface roughness, adhesion, friction, and stiffness properties of the DMD elements were studied. The influence of relative humidity and temperature on the behavior of the DMD element surfaces was also investigated. Potential mechanisms for wear and stiction are discussed in light of the findings.     

Mechanical property measurements of nanoscale structures using an atomic force microscope

This paper describes nanometer-scale bending tests of fixed single-crystal silicon (Si) and silicon dioxide (SiO2) nanobeams using an atomic force microscope (AFM). The technique is used to evaluate elastic modulus of the beam materials and bending strength of the beams. Nanometer-scale Si beams with widths ranging from 200 to 800 nm were fabricated on a Si diaphragm using field-enhanced anodization using an AFM followed by anisotropic wet etching. Subsequent thermal oxidation of Si beams was carried out to create SiO2 beams. Results from the bending tests indicate that elastic modulus values are comparable to bulk values. However, the bending strength appears to be higher for these nanoscale structures than for large-scale specimens. Observations of the fracture surface and calculations of the crack length from Griffith's theory appear to indicate that the maximum peak-to-valley distance on the beam top surfaces influence the values of the observed bending strengths.     

无线控制式原子力显微镜系统

提出了一种基于嵌入式系统和WiFi无线控制的接触模式原子力显微镜(AFM)系统。该AFM系统直接由迷你型移动电源给扫描与反馈电路及嵌入式系统等供电;嵌入式系统由微型电脑树莓派和微小型ADDA模块构成,通过WiFi与笔记本电脑实现无线数据通信。利用这一方法,成功研发了无线控制式AFM系统,并开展了微纳米样品的扫描成像实验。实验结果表明,该AFM系统的横向分辨率达到纳米量级,纵向分辨率达到0.1nm,最大扫描范围为3.6μm×3.6μm。该系统的显著特点是无需交流市电供电,无需直流高压电源,也无需与计算机之间的线缆连接,可在约100m远处通过无线控制的方式实现AFM的扫描成像。这一新型AFM系统,不仅能够在微纳米技术的常规领域得到应用,而且在野外考察、隔离环境、真空条件、气体氛围环境及星际探测等特殊领域具有广阔的应用前景。     

Dynamic friction measurements with an atomic force microscope on polymer surfaces

The combination of scanning friction force microscopy (SFFM) and lock‐in techniques leads to dynamic SFFM (DSFFM) and provides great advantages in friction force studies with sub‐micrometre resolution. In this paper are presented measurements on thin adsorbed organic films on polymers (polymer blend of 75% poly(allylaminehydrochloride) (PAA) and 25% poly(diallyl‐dimethylammonium chloride) (PDDAC)) and on mica (as a reference). The amplitude and phase response as a function of the excitation amplitude can be explained on hard surfaces by a simple static and dynamic friction model. This model allows us further to distinguish static friction forces and kinetic friction forces in a quantitative way. Furthermore, we demonstrate the use of these spectra to determine the correct modulation amplitude of the excitation to achieve the optimal friction contrasts directly. Polymer data suggest that the viscoelastic shear flow under the atomic force microscope (AFM) tip is responsible for the shape of the phase and amplitude spectrum. Lastly, we demonstrate that DSFFM is a useful technique for surface characterisation in situations where SFFM may not be adequate.