共查询到20条相似文献,搜索用时 78 毫秒
1.
利用传输矩阵法理论,研究介质光学厚度对一维光子晶体(AB)5(BA)5透射谱特性的影响,结果表明:只要A、B介质光学厚度满足DA=DB,随着介质光学厚度的增大,光子晶体透射峰的透射率、频率位置和带宽均保持不变;当A、B介质的光学厚度不相等即DA≠DB时,随着DA或DB,或DA、DB的增大,禁带中透射峰的透射率不变但带宽变宽,且当DADB时透射峰向高频方向移动,反之则向低频方向移动。介质光学厚度对光子晶体透射谱的调制规律,可为光子晶体模型的构建、窄带光学滤波器和光学开关的设计等提供有益参考。 相似文献
2.
为了分析结构参量对正负折射率材料1维光子晶体缺陷模的影响,利用传输矩阵法计算了基于正负折射率材料含正折射率缺陷1维光子晶体B(AB)m(ACB)n(AB)mB的透射谱,分析了各参量对该结构1维光子晶体缺陷模的影响,并用波动理论定性分析了多通道滤波器形成的原因。结果表明,在各介质层的光学厚度绝对值都为0/4的情况下,每个禁带中都有n个超窄的透射峰,相邻两个透射峰间距比相同结构下正折射率情况的宽;当n=1时,随着C层介质光学厚度以0/4的k倍增加,透射谱中同一禁带内出现了k条透射峰;当n2时,透射谱中同一禁带内出现了nk条透射峰。该研究结果对可调多通道滤波器的设计和研究有一定的参考价值。 相似文献
3.
为设计高品质的光学滤波器和光学开关,用传输矩阵法研究双负介质对一维光子晶体量子阱(AB)m(CBAABC)n(BA)m透射谱的影响,结果表明:当C层为双正介质时,光量子阱透射谱中出现2n+1条窄透射峰,当C层为双负介质时,呈现简并现象,光量子阱透射峰中仅出现2n-1条窄透射峰;当C层双负介质折射率负值增大时,光量子阱透射谱向禁带中心两侧移动,同时透射峰的品质因子快速提高;当C层双负介质光学厚度负值减小时,光量子阱透射谱向禁带中心靠拢,同时透射峰的品质因子迅速提高;光量子阱透射品质因子对双负介质光学厚度的响应灵敏度高于对折射率负值的响应。双负介质对光量子阱透射谱特性的影响规律,可为光子晶体理论研究及新型量子光学器件设计提供参考。 相似文献
4.
通过传输矩阵法理论,研究两端对称缺陷C对一维光子晶体ACmB(AB)n(BA)nBCmA透射谱的影响,发现:当无缺陷C时,透射谱符合镜像对称结构光子晶体的透射谱特征。当引入缺陷C后,随着缺陷折射率nC的增大,禁带中的透射峰逐渐变宽的同时向高频方向移动。缺陷周期数m及其光学厚度DC对透射谱的影响,在数值上具有明显的奇偶特性,m为奇数或DC为奇数倍时,禁带中心均出现一个较宽的通带,且通带宽度随着m或DC的增大逐渐变窄,而且通带上方的振荡加快,但通带中心所处频率位置不变;m为偶数或DC为偶数倍时,禁带中心均出现一条细窄缺陷模,且缺陷模的宽度随着m或DC的增大缓慢变窄,但其位置不变;两端对称缺陷对对称结构光子晶体透射谱的调制规律,为光子晶体设计窄带、宽带光学滤波器或光开关等提供指导。 相似文献
5.
为研究和设计高品质、高性能的光学滤波、光学放大、光学衰减和全反射镜等器件,通过计算模拟的方式,研究两端对称复缺陷对光子晶体C(AB)n(BAB)(BA)nC光传输特性的激活效应,研究表明:在对称结构光子晶体的两端置入缺陷C,当缺陷C为实介质时,光子晶体透射谱中出现多条透射率为100%的分立透射峰.当C中掺入具有增益放大效应的杂质形成含负虚部的复折射率缺陷时,透射谱中各分立透射峰的透射率均出现增益放大现象,而且缺陷层复折射率的虚部或实部对透射峰的增益放大倍数均具有调制作用,随着缺陷层复折射率的负虚部或实部增大,透射增益放大倍数先增大,达到极大值后再减小,增益放大倍数最高达可达104数量级.当C中掺入具有衰减效应的杂质形成含正虚部的复折射率缺陷时,透射谱中各分立透射峰均出现透射率衰减现象,而且缺陷层复折射率的虚部或实部对透射峰的衰减倍数也具有调制作用,随着缺陷层复折射率的正虚部增大,各分立透射峰的透射率不断衰减,直至透射率趋于零,出现全反射或全吸收现象.两端对称复缺陷对光子晶体光传输特性的调制规律,可为新型光学器件的研究与设计提供理论参考. 相似文献
6.
7.
为设计高品质光学滤波器、光开关等量子光学器件,用传输矩阵法理论研究晶格常数对一维光量子阱(AB)5(CD)2(BA)5透射谱的影响,结果发现:当A、B介质层的晶格常数偶数倍增加时,禁带中心频率处的窄透射峰变成宽透射带,透射带两侧对称分布着2条透射率为100%的窄透射峰;当A介质层的晶格常数奇数倍增加时,禁带中心频率处出现透射率为100%单条窄透射峰;当B介质层的晶格常数奇数倍增加,或D介质层的晶格常数按整数倍增加时,禁带中心频率处恒定出现3条透射率为100%的窄透射峰,且三者之间距离随着B、D介质层晶格常数的增大而逐步向禁带中心靠拢;当D介质层晶格常数按整数增加时,不仅禁带中心频率处恒定出现3条透射率为100%的窄带透射峰,同时两侧对称出现与晶格常数倍数密切相关的双透射峰结构,且双透射峰的透射率随晶格常数倍数增大而增高。这些特性可实现可调通道光滤波和光开关功能,并为实验制备工作提供理论指导。 相似文献
8.
9.
10.
设计了包含缺陷层和多层异质结构的混合结构的一维光子晶体,然后在光子晶体中加入泵浦源.用传输矩阵法研究了加入泵浦源前后光子晶体的透射谱,结果发现该混合结构的光子晶体具有非常宽周且平坦的禁带,且在此禁带内只有一条极窄的透射带,加入激励源后的透射带透射率远远大于1,并且透射带的透射率和位置都可以通过调节光子晶体的参数来改变.利用这些特性,设计了一种具有放大功能的宽禁带超窄单通滤波器,当激活系数取0.033 4时,在1000~2000 nm的禁带范围内只有在红外波段1550 nm处出现一条透射率为1.1×106,3 Db带宽为0.005 nm的透射窄带. 相似文献
11.
Michael Reilly 《半导体技术》2004,29(12)
DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system. 相似文献
12.
Thomas M.Trexler 《半导体技术》2004,29(5)
From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test. 相似文献
13.
The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation. 相似文献
14.
The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high. 相似文献
15.
Today, micro-system technology and the development of new MEMS (Micro-Electro-Mechanical Systems) are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible. 相似文献
16.
GU Min-fen LIANG Zhong-cheng WANG Ren-zhou DONG Xiang-mei ZHANG Pei-ming CHEN Jia-bi 《光电子快报》2008,4(2):150-152
Waveguide multilayer optical card (WMOC) is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling & processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic (VB) language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor. 相似文献
17.
Qi-jiang Ran Pei-de Han Yu-jun Quan Li-peng Gao Fan-ping Zeng Chun-hua Zhao 《光电子快报》2008,4(4):239-242
This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel's. 相似文献
18.
The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well. 相似文献
19.
Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems. 相似文献
20.
An insert layer structure organic electroluminescent device(OLED) based on a new luminescent material (Zn(salen)) is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn(salen)/Liq/LiF/A1/CuPc/NPD/Zn(salen)/Liq/LiF/A1. Effective insert electrode layers comprising LiF(1nm)/Al(5 nm) are used as a single semitransparent mirror, and bilayer cathode LiF(1 nm)/A1(100 nm) is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect. 相似文献