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Hyungjun Kim 《Thin solid films》2011,519(20):6639-6644
Atomic layer deposition (ALD) is expected to play an important role in future device fabrication due to various benefits, such as atomic level thickness control and excellent conformality. Plasma enhanced ALD (PE-ALD) allows deposition at significantly lower temperatures with better film properties compared to that of conventional thermal ALD. In addition, since ALD is a surface-sensitive deposition technique, surface modification through plasma exposure can be used to alter nucleation and adhesion. In this paper, characteristics of PE-ALD for various applications in semiconductor fabrication are presented through comparison to thermal ALD. The results indicate that the PE-ALD processes are versatile methods to enable nanoscale manufacturing in emerging applications. 相似文献
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以BCl3-NH3-H2-N2为前驱体系统, 在垂直放置的热壁反应器中利用化学气相沉积工艺制备氮化硼(BN)涂层, 分析了工艺参数对沉积速率的影响, 通过扫描电子显微镜(SEM)、X射线光电子能谱(XPS)和X射线衍射技术(XRD)分析了碳化硅纤维表面BN涂层的形貌和微观结构, 提出了BN沉积过程中主要的气相和表面反应, 以及关键气相组分。研究结果显示:在600~850℃的范围内, 随着沉积温度的升高, BN沉积速率逐渐加快, 同一温度下, 沉积区域内BN沉积速率沿气流方向逐渐减缓, 表明气相组分在气流方向逐渐消耗; 随着系统压力的提高, BN沉积速率先加快后减缓, 表明沉积过程由表面反应控制转变为质量传输控制; 随滞留时间延长, 距气体入口1~3 cm处, BN的沉积速率逐渐增大, 而距气体入口4~5 cm处, 沉积速率先增大后逐渐变小。SEM照片显示碳化硅纤维表面BN涂层光滑致密, XPS结果表明主要成分为BN及氧化产物B2O3, XRD图谱表明热处理前BN为无定形态, 1200℃热处理后BN的结晶度提高, 并向六方形态转变。BN的沉积是由BCl3和NH3反应所生成的中间气相组分Cl2BNH2、ClB(NH2)2和B(NH2)3来实现的。 相似文献
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多层喷射沉积技术的研究及进展 总被引:13,自引:0,他引:13
详细阐述了多层喷射沉积技术的产生及发展现状。多层喷射沉积技术与传统喷射沉积技术相比,在制备大型预成形坯件时冷却速度更大,工艺操作更简单,坯件表面精度更高。 相似文献
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High-rate deposition of amorphous silicon films using hot-wire CVD with a coil-shaped filament 总被引:1,自引:0,他引:1
To reduce the manufacturing cost of amorphous silicon (a-Si:H)-based photovoltaic devices, it is important to deposit high-quality a-Si:H and related materials at a high deposition rate. To this end, we designed and constructed a hot-wire deposition chamber with a coiled filament design and with multiple gas inlets. The process gas could be directed into the chamber through the filament coil and have maximum exposure to the high-temperature filament surface. Using such a chamber design, we deposited a-Si:H films at high deposition rates up to 800 Å s−1 and dense, low-void a-Si:H at rates up to 240 Å s−1. 相似文献
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一项技术应用的热度和广度,与其本身的技术优势、成熟度、适用性等密切相关。本文以文献数据可视化为手段对真空镀膜技术在世界范围内的研究及应用情况进行分析,以探究该技术的应用广度和热度特征,为真空镀膜技术装备的行业发展提供有益参考。研究发现离子束溅射、离子束辅助沉积、等离子体辅助物理气相沉积和原子层沉积技术是当前及以后一个时期内应重点关注的方向。 相似文献
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We have conducted characterization of a scanning plasma enhanced chemical vapor deposition (PECVD) system for producing controlled non-uniform deposition or etching profiles. Both self-bias and plasma potential showed that the plasma conditions were disturbed significantly when the source was very close to the chamber wall but electron temperature and ion density were not affected significantly. It was found that a very thin but long tail of parasitic deposition was present over the entire large substrate. To eliminate the parasitic deposition an aperture (plasma guarding house) was constructed and was found to eliminate the parasitic plasma deposition. Deposited silicon nitride and silicon oxide thin films using the plasma guarding house in the scanning PECVD system showed very good optical properties similar to those obtained in conventional deposition methods. No multilayer structure was observed in TEM analysis on these films. 相似文献
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多层喷射沉积工艺的研究现状 总被引:2,自引:0,他引:2
多层喷射沉积技术是在传统喷射沉积的基础上发展而来的 ,克服了喷射沉积技术的局限性 ,具有独特的优越性。介绍了多层喷射沉积技术的原理 ,发展过程及在耐磨材料、耐热材料和复合材料等材料的制备上的应用情况。 相似文献
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Pei Zhao 《Materials Letters》2010,64(1):102-4320
YBa2Cu3O7-δ (YBCO) films were prepared by laser chemical vapor deposition using Y(DPM)3, Ba(DPM)2/Ba(TMOD)2 and Cu(DPM)2 as precursors with enhancement by a continuous wave Nd:YAG laser. A c-axis-oriented YBCO film almost entirely in a single phase was obtained. The YBCO film consisted of rectangular grains about 30 μm in size. The highest deposition rate was about 100 μm h− 1, which was 10-1000 times higher than that of conventional MOCVD. 相似文献
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C. Zuiker A. R. Krauss D. M. Gruen X. Pan J. C. Li R. Csencsits A. Erdemir C. Bindal G. Fenske 《Thin solid films》1995,270(1-2):154-159
Nanocrystalline diamond films have been deposited using a microwave plasma consisting of argon, 2–10% hydrogen and a carbon precursor such as C60 or CH4. It was found that it is possible to grow the diamond phase with both carbon precursors, although the hydrogen concentration in the plasma was 1–2 orders of magnitude lower than normally required in the absence of the argon. Auger electron spectroscopy, X-ray diffraction measurements and transmission electron microscopy indicate the films are predominantly composed of diamond. Surface roughness, as determined by atomic force microscopy and scanning electron microscopy indicate the nanocrystalline films grown in low hydrogen content plasmas are exceptionally smooth (30–50 nm rms) to thicknesses of 10 m. The smooth nanocrystalline films result in low friction coefficients (μ = 0.04–0.06) and low average wear rates as determined by ball-on-disk measurements. 相似文献
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Reactive sputter deposition of titanium dioxide 总被引:4,自引:0,他引:4
The microstructural, optical and electrical properties of reactively sputtered TiOx films have been examined at points along the reactive deposition hysteresis curve. The deposition process utilizes feedback control loops of the current and oxygen/argon flowrates for operation in the internal region of the hysteresis curve. The variations in the optical properties are well correlated to the process conditions and the microstructure. For thicknesses of 60–100 nm, the films are polycrystalline for low deposition/high oxygen flow rates, and become amorphous for high deposition/low oxygen flow rates. Electron diffraction ring patterns of the polycrystalline phase are best fit to the d-spacings of the rutile structure. The index of refraction at 550 nm for the rutile phase polycrystalline films (10 nm grain size) is 2.6, this falls to 2.4 as the films become amorphous, and rises to 2.5 as the films become oxygen substoichiometric. We find the variation of the optical band gap of TiOx to be less than 1%, and is less indicative of chemical and/or microstructural changes than the extinction coefficient at higher energies in the visible. The index of extinction at 350 nm shows a minimum at the same point as the index of refraction at 550 nm. We find the indirect fit of Tauc to the index of extinction gives the most linear fit. Variations in the complex index of refraction are consistent with the processing of r.f. sputtered films from titania targets. 相似文献
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Threshold ionization mass spectroscopy is used to measure the radicals that cause deposition of hydrogenated amorphous silicon by “hotwire” (HW), or “catalytic,” chemical vapor deposition. We provide the probability of silane (SiH4) decomposition on the HW, and of Si and H release from the HW. The depositing radicals, and H atoms, are measured versus conditions to obtain their radical-silane reaction rates and contributions to film growth. A 0.01-3 Pa range of silane pressures and 1400-2400 K range of HW temperatures were studied, encompassing optimum device production conditions. Si2H2 is the primary depositing radical under optimum conditions, accompanied by a few percent of Si atoms and a lot of H-atom reactions. Negligible SiHn radical production is observed and only a small flux of disilane is produced, but at the higher pressures some Si3Hn is observed. A Si-SiH4 reaction rate coefficient of 1.65 ? 10− 11 cm3/s and a H + SiH4 reaction rate coefficient of 5 ? 10− 14 cm3/s are measured. 相似文献
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CVD法与PCVD法TiN薄膜研究 总被引:6,自引:0,他引:6
用等离子增强化学气相沉积(PCVD)法和化学气相沉积(CVD)法分别制备TiV系薄膜。采用扫描电镜、X射线衍射仪和连续加载压入仪研究分析薄膜的微观结构、相结构和薄膜的力学性能,并采用电极电位法测定了薄膜的耐腐蚀性能,研究表明,PCVD法TiN系薄膜的微观组织形态明显优于同类的CVD法薄膜,PCVD法薄膜晶粒尺寸细小,均匀,形态圆整,组织致密;CVD法薄膜晶粒形态为多边形,尺寸较粗大、不均匀,组织致密性差,PCVD法TiN系薄膜的声望生和结合力等力学性能可达或优于同类CVD法薄膜,虽然PCVD法薄膜的氯含量(约为2%)远主CVD法薄膜(约为0.5%),但PCVD法薄膜的耐蚀性能却明显优于CVD法薄膜,还研究分析了PCVD法和CVD法成膜模式对薄膜微观结构和性能的影响机理。 相似文献
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Epitaxial CoSi2 layers, which are phase pure but contain {111} twins, are grown on Si(001) at 700 °C by reactive deposition epitaxy. Transmission electron microscopy analyses show that the initial formation of CoSi2(001) follows the Volmer-Weber mode characterized by the independent nucleation and growth of three-dimensional islands whose evolution we follow as a function of deposited Co thickness tCo in order to understand the origin of the observed twin density. We find that there are two families of island shapes: inverse pyramids and platelets. The rectangular-based pyramidal islands extend along orthogonal 〈110〉 directions, bounded by four {111} CoSi2/Si interfaces, and grow with a cube-on-cube orientation with respect to the substrate: (001)CoSi2||(001)Si and [100]CoSi2||[100]Si. Platelet-shaped CoSi2 islands are bounded across their long 〈110〉 directions by {111} twin planes (i.e. {111}(001)CoSi2||{111}Si) and their narrow 〈110〉 directions by {511}CoSi2||{111}Si interfaces. The top and bottom surfaces are {22¯1}, with {22¯1}CoSi2||(001)Si, and {1¯1¯1}, with {1¯1¯1}CoSi2||{11¯1}Si, respectively. The early stages of film growth (tCo ≤ 13 Å) are dominated by the twinned platelets due to a combination of higher nucleation rates resulting from a larger number of favorable adsorption sites in the Si(001)2 × 1 surface unit cell and rapid elongation of the platelets along preferred 〈110〉 directions. However, at tCo ≥ 13 Å island coalescence becomes significant as orthogonal platelets intersect and block elongation along fast growth directions. In this regime, where both twinned and untwinned island number densities have saturated, further island growth becomes dominated by the untwinned islands. A continuous epitaxial CoSi2(001) layer, with a twin density of 2.8 × 1010 cm− 2, is obtained at tCo = 50 Å. 相似文献