Memory characteristics of Au/PZT/BIT/p-Si ferroelectric diode

A ferroelectric memory diode consisting of Au/PZT/BIT/p-Si multilayer configuration has been fabricated by pulsed laser deposition (PLD) technique. The ferroelectric properties and the memory characteristics are investigated. The P-E curve of the PZT/BIT/p-Si films system had an asymmetry saturated hysteresis loop with P, = 15 μC/cm2 and Ec = 48 kV/cm, and the decay in remanent polarization was only 10% after 109 switching cycles, meanwhile the increase in coercive field was 12% . The C-V hysteresis loop and the I-V curve showed a memory effect derived from the ferroelectric polarization of PZT/BIT films, and the current density was 6.7 × 10-8 A/cm2 at a voltage of + 4V. Our diode had nonvolatile and nondestructive memory readout operation. There was a read current disparity of 0.05 μA for logic "1" and logic "0" at a read voltage of + 2V, and the stored logical value ("1" or "0") could be read out in 30 min.     

Leakage behavior and distortion of the hysteresis loop in ferroelectric thin films

Leakage behavior and distortion of the polarization hysteresis loop in ferroelectric thin films are analyzed by applying a totally depleted asymmetric back-to-back Schottky model, with the Pt/Pb(Zr, Ti)O3/Pt ( Pt/ PZT/Pt) sandwich structural thin film capacitor as an example. Some interesting phenomena resulting from the asymmetric interfaces, such as the leakage current level, the flat-band voltage, the disclosure of the hysteresis loop, and the change in the remanent polarization and coercive field, as well as the vertical drift of the polarization hysteresis loop, are discussed in detail. The calculated results are also verified with experiments.     

MZr0.5Ti0.5O3（M=Pb,Nd）压电陶瓷的制备和表征

以硝酸铅（钕）、硝酸锆和钛酸丁酯为原料,采用固相反应法制备PbZr0.5Ti0.5O3和NdZr0.5Ti0.5O3陶瓷材料,利用XRD和高倍光学显微镜对产物进行了表征,并利用Radiant Precision Workstation铁电测试仪测试了两种材料的电滞回线,结果表明：在实验条件下,NdZr0.5Ti0.5O3的极化强度、剩余极化强度及矫顽电场分别为160μC·mm^-2、126μC·mm^-2、22.5kV·mm^-1。用Nd取代Pb的NdZr0.5Ti0.5O3可获得较高的极化强度、剩余极化强度及矫顽电场。     

溶胶-凝胶法制备（Nd,Bi）_4Ti_3O_（12）铁电薄膜

采用溶胶-凝胶法在Pt/Ti/SiO2/Si基片上制备了（Nd,Bi）4Ti3O12薄膜。将薄膜于空气中分别进行每1层、每2层、每3层500℃预退火10 min,最后于氮气氛中680℃退火30 min。结果表明：预退火工艺对薄膜的结构和铁电性能都有影响：每一层预退火处理的薄膜具有较大的剩余极化值和最小的矫顽场（2Pr=47.8μC/cm2,2Ec=254 kV/cm）。所有薄膜都呈现良好的抗疲劳特性。     

Crystallization and Electrical Properties of （Ba0.4Pb0.3）Sr0.3TiO3 Thin Film by Pulsed Laser Deposition

（Ba0.4Pb0.3）Sr0.3TiO3 thin films were fabricated via pulsed laser deposition （PLD） technique on Pt/TiO2/SiO2/Si substrate. The crystallization of the films was characterized by XRD and FSEM, and the experimental results suggested deposition parameters, especially the deposition temperature was the key factor in forming the perovskite structure. The dielectric properties of the film deposited with optimized parameters were studied by an Agilent 4294A impedance analyzer at 1 MHz. The dielectric constant was 772, and the loss tangent was 0.006. In addition, the well-shaped hysteresis loop also showed that the film had a well performance in ferroelectric. The saturated polarization P, remnant polarization Pr and coercive field E were about 4.6 μC/cm2, 2.5 μC/cm2 and 23 kV/cm （the coercive voltage is 0.7 V）, respectively. It is suggested the film should be a promising candidate for microwave applications and nonvolatile ferroelectric random access memories （NvFeRAMs）.     

Effect of Pb Substitution on the Microstructure and Ferroelectric Properties of Ba0.7Sr0.3TiO3 Ceramic

Ferroelectric Ba0.7Sr0.3TiO3(BST) and partially Pb2+ substituted for Ba2+ ceramics (Bao.7-xPbx)Sr0.3TiO3 (x=0.1-0.4,BPST) were prepared by using conventional solid-reaction method.XRD analysis shows that the samples microstructure changes from cubic phase to tetragonal one with the Pb2+ content increasing.ESEM analysis shows that the Pb2+ substituted samples have a denser and more uniform surface morphology than that of pure BST.Measured electrical properties suggest that the Pb2+ substitution for Ba2+ in the BST system enhances the ferroelectric performance obviously when x=0.2.In addition,the substitution increases the samples Curie temperature (Tc).(Ba0.5Pb0.2)Sr0.3TiO3 ceramic has good ferroelectric properties measured at a maximal electric field of 30 kV/cm under the condition of room temperature.The corresponding saturated polarization (Ps),remnant polarization (Pr) and coercive field (Ec) is respectively 15.687 μC/cm2,8.100μ C/cm2 and 6.611 kV/cm.The measured Tc of (Ba0.5Pb0.2)Sr0.3TiO3 is 117 ℃.     

组合法制备Pb（ZrxTi（1-x））O3组分梯度薄膜

在无蒸馏和无惰性气氛保护的条件下,快速制备了用于组合合成Pb(ZrxTi1-x)O3薄膜的前驱溶液PT和PZ。采用组合法在Pt/Ti/SiO2/Si衬底上制备了一系列Pb(ZrxTi1-x)O3组分梯度薄膜。经XRD分析表明,薄膜具有钙钛矿结构,择优取向为(111)。SEM结果显示薄膜厚度在500nm左右。电滞回线的测试表明,下梯度薄膜PZT-654表现出良好的铁电性能,明显优于其它薄膜。PZT-654梯度薄膜的剩余极化强度Pr为38.4μC/cm2,矫顽场Ec为75.0kV/cm,有较大的极化偏移,Poffset为12.9μC/cm2,表现出梯度铁电薄膜的特性。     

Ferroelectric properties of Bi_4Zr_(0.5)Ti_(2.5)O_(12) thin films prepared on LaNiO_3 bottom electrode by sol-gel method

The Bi4Zr0.5Ti2.5O12 (BZT) thin films were fabricated on the LaNiO3 bottom electrode using sol-gel method. The structure and morphology of the films were character-ized using X-ray diffraction, AFM and SEM. The results show that the films have a perovskite phase and dense microstructure. The 2Pr and 2Vc of the Pt/BZT/LaNiO3 capacitor are 28.2 μC/cm2 and 14.7 V respectively at an applied voltage of 25 V. After the switching of 1×1010 cycles, the Pr value decreases to 87% of its pre-fatigue val-ues. The dielectric constant (ε) and the dissipation factor (tanδ) of the BZT thin films are about 204 and 0.029 at 1 kHz, respectively. The films show good insulating behavior according to the test of leakage current. The clockwise C-V hysteresis curve observed shows that the Pt/BZT/LaNiO3 structure has a memory effect be-cause of the BZT film’s ferroelectric polarization.     

The domain structure and polarization retention properties of PT/PZT/PT ferroelectric thin film

The highly oriented perovskite-phase PT/PZT/PT ferroelectric thin film was pre- pared by sol-gel method. The domain structures and polarization retention proper- ties were investigated by scanning force microscopy. The amplitude and phase images of piezoresponse show complex various contrasts of dark, bright and gray. The complex variation of contrast in piezoresponse images results from the per- plexing orientation of grains and arrangement of domains in the ferroelectric films. The bright and dark areas in phase images correspond to top-to-bottom and bot- tom-to-top polarization oriented c-domain, respectively. The gray areas are c-domains with the polarization vector deviating from the direction normal to the film plane. The surface potential images of EFM are bright contrast, which is due to positive charges trapped on the film surface after being polarized by positive volt- age. And the brighter contrast is obtained from the higher electric field. The time-dependent surface potential images and line potential profiles show that the potential decays with time. And the decay in the region polarized by higher electric field is faster, especially at 15 min. This indicates that the polarization retention is related to the polarized electric field. Better retention properties may be obtained from a proper polarized electric field.     

薄膜厚度对铁电薄膜铁电性能的影响

为研究薄膜厚度对外延铁电薄膜铁电性能的影响,应用与时间有关的Ginzburg-Landau方程,在同时考虑应力和表面效应的条件下,获得了不同应力情况下,不同厚度铁电薄膜的电滞回线及蝶形应变迟滞回线.计算结果显示,处于不同应力值下的铁电薄膜,剩余极化强度和场致应变随着薄膜厚度的增加而增加.而矫顽场随着薄膜厚度的增加而减小.证明了不同应力情况下,薄膜厚度对剩余极化强度和矫顽场的影响是不能忽略的.这种变化趋势与实验结果的情况是一致的.     

Effect of Bi content in precursor solutions on microstructure and ferroelectric properties of bismuth cerium titanate thin films

Sol-gel derived bismuth cerium titanate (BCT) thin films with different Bi contents in precursor solutions were deposited on the Pt/Ti/SiO₂/Si substrates. The effect of Bi content in the precursor solutions on the microstructure and ferroelectric properties of the films was investigated. It is found that with Bi content increasing from 90% to 110% of the nominal value in the precursor solutions, the dissipation factor and leakage current density of the BCT films obtained decrease, while the grain sizes, dielectric constant and remanent polarizations (2Pr) increase, and concurrently, a Bi-deficient phase of Bi₂Ti₂O₇ gradually disappears. The film prepared from solution with 110% of the nominal Bi content exhibits pure Bi-layered Aurivillius polycrystalline phase, and the 2Pr value and coercive field value are 67.1 μC/cm² and 299.7 kV/cm, respectively. Their dielectric constant and the dissipation factor are about 172 and 0.033 at 1 kHz, respectively. Moreover, this film shows no polarization fatigue after 4.46×10⁹ switching cycles. Supported by the Hubei Province Natural Science Foundation (Grant No. 2007ABA309)     

BiFeO_3薄膜的图案化制备及性能研究

采用短波紫外光照射仪（λ=184.9nm）作为光刻设备,在光掩膜的覆盖下,将沉积在（111）Si基板上的十八烷基三氯硅烷（OTS）自组装单分子层（SAMs）进行刻蚀形成图案,并结合溶胶-凝胶法在功能化的OTS-SAMs表面制备图案化BiFeO3薄膜,并对BiFeO3薄膜性能进行研究.结果表明,所得图案化BiFeO3薄膜为六方扭曲的钙钛矿结构,图案边缘轮廓清晰,宽度在200μm左右;在最大测试电场为385kV/cm下,所得电滞回线有较好的对称性和饱和性,剩余极化强度为0.17μC/cm2,饱和极化强度为3.8μC/cm2,矫顽场强为19kV/cm.在1kHz～1MHz的频率范围内,介电常数随频率增加逐渐减小,介电损耗较小.     

A betavoltaic microbattery based on PIN diodes

A betavoltaic Microbattery was studied.The diode was composed of a PIN structure with an active area of 10 mm×10 mm to collect the charge from a 10mCi Ni-63 source.An open circuit voltage of 0.16 V and a short circuit current density of 67.6 nA/cm2 were measured.An efficiency (η) of 1.44% was obtained.The performance of device was limited by high series resistance,edge recombination and attenuation of electron in PIN diodes.It is expected to be improved by optimizing the design and using more suitable radioisotope.     

Ni/4H-SiC肖特基二极管高温特性研究

采用自行研制的工作在800℃的半导体器件高温测试装置，对Ni／4H-SiC肖特基二极管的伏安特性在常温297K至677K的温度范围内进行了测量，表明温度升高对正向特性的影响非常显著，而对较低偏置(30V以下)条件下的反向特性影响则比较小．对实验结果进行了比较分析，I-V特性测量说明镰4H-SiC肖特基二极管有较好的整流特性，在正向偏压条件下，热电子发射是其主要的输运机理，理想因子在297-677K的温度范围内从1．165增加到1．872，肖特基势垒高度的变化范围为0．916～2．117eV，正向导通电压为0．5V．     

Effect of Annealing on Ferroelectric Properties of Bi3.25La0.75Ti3O12 Thin Films Prepared by the Sol-gel Method

Bi_3.25La_0.75Ti₃O₁₂(BLT) thin films were prepared on Pt/Ti/SiO₂/Si substrate by the sol-gel method. The effect of annealing on their structures and ferroelectric properties was investigated. The XRD patterns indicate that the BLT films annealed at different temperatures are randomly orientated and the single perovskite phase is obtained at 550°C. The remnant polarization increases and the coercive field decreases with the annealing temperature increasing. The leakage current density of the BLT films annealed at 700°C is about 5.8×10⁻⁸ Al cm² at the electric field of 250 kV/cm. Funded by the National Natural Science Foundation of China (No. 90407023)     

Struchre and Electrical Properties of (Na0.5Bi0.5)0.94Ba0.06TiO3 Ceramic with 0.5 wt% of MnO

The structure and electrical properties of(Na0.5Bi0.5)0.94Ba0.06TiO3 ceramic doped with 0.5 wt% of MnO were investigated in comparison with those of(Na0.5Bi0.5)0.94Ba0.06TiO3 ceramic.It was ascertained that the MnO addition did not cause remarkable change in crystal structure and microstructure.The MnO addition mainly displayed a hard effect on the electrical properties,an increase of coercive field(Ec)and mechanical quality factor(Qm)together with a decrease of dielectric constant(?r)and piezoelectric constant(d33).An enhancement of electromechanical coupling factor(kp)with the MnO addition was obtained too.An essential relation between the piezoelectric properties and ferroelectric nature of the ceramics was detected.It was found that the piezoelectric properties of the ceramics highly depended on the corporative contribution of remanent polarization(Pr)and coercive field.     

Effect of copper ions implantation on the corrosion behavior of ZIRLO alloy in 1 mol/L H2SO4

1. IntroductionZIRLO alloy is widely used in the nuclear industrybecause of its low thermal neutron capture cross sec-tion, favorable mechanical properties, and good corro-sion resistance. For example, ZIRLO alloy can serve asfuel cladding, spreaders for …     

Effect of La Doping on Microstructure and Ferroelectric Properties of Bi4Ti3O12 Thin Films Prepared by Sol-gel Method

The Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin films were prepared on the Pt/Ti/SiO2/Si substrate using the sol-gel method. The effect of La doping on the microstructure and ferroelectric properties of Bi4Ti3O12 films were investigated. Both the Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin films exhibited typical bismuth layered perovskite structure. The 2Pr (remanent polarization) value of Bi3.25La0.75Ti3O12 thin films is 18.6 Μc/cm2, which is much larger than that of Bi4Ti3O12 thin films. And the Bi3.25La0.75Ti3O12 films show fatigue-free behavior, while the Bi4Ti3O12 thin films exhibit the fatigue problem. The mechanism of improvement of La doping was discussed.     

铌铁酸锶-钛酸铅铁电固溶体的合成与性能研究

通过铌铁矿预合成法制备了(1-x)Sr(Fe1/2Nb1/2)O3-xPbTiO3(SFN-PT)铁电陶瓷。XRD测量表明,合成的SFN-PT陶瓷为纯钙钛矿结构。随着PbTiO3(PT)摩尔分数的增加,SFN-PT陶瓷的晶体结构从三方相向四方相转变,其介电响应也从弥散的宽峰变得比较尖锐,并伴随着介电常数峰值温度(Tm)的升高。少量的MnO2或Li2CO3掺杂能有效地降低SFN-PT陶瓷的介电损耗。SFN-PT陶瓷呈现典型的P-E电滞回线,但是剩余极化强度较小,少量的MnO2或Li2CO3掺杂能明显地降低矫顽场、增大剩余极化强度。SFN-PT陶瓷的压电应变常量d33较小,随着组分的不同,d值在10～22pC/N之间变化。     

铁电存储器1T单元ID-VG特性的计算机模拟

为了得到简单、准确且移植性强的铁电存储器1T单元ID-VG（电流转移特性）模型,通过引入漏极电压影响因子、阈值电压和极化饱和程度等因素,从理论上得到了和MOSFET电流模型结构一致的铁电存储器1T单元的ID-VG特性模型。与测试数据进行对比,验证了该模型的正确性。