共查询到20条相似文献,搜索用时 15 毫秒
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采用不同干法腐蚀条件下的CdTe薄膜制成器件, 通过I-V、C-V和光谱响应等测试 了电池性能参数。结果表明,溅 射时间太短和功率太小时不能完全去除氧化层,溅射时间过长和功率过高会对薄膜表面造成 损伤, 影响器件性能。 通 过选择器件性能较好的电池、 找出适合等离子束溅 射工艺的条件,所制成的电池转化效率 达 到10.99%;而湿法腐蚀所 制成器件的转化效率为 10.26%。由此可以认为,等离子束轰击溅射的 腐蚀方法较湿法腐蚀更适用于CdTe太阳电池的制备。 相似文献
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K. Yasuda M. Niraula K. Nakamura M. Yokota I. Shingu K. Noda Y. Agata K. Abe O. Eryu 《Journal of Electronic Materials》2007,36(8):837-840
Deep isolation trenches with high aspect ratio were formed on CdTe crystals using the excimer laser etching technique. Vertical
trenches 80-μm deep and 55-μm wide were formed in 5 min by irradiating a laser on the CdTe crystal through a contact-type metal mask in vacuum. Surface
chemistry of the laser-irradiated CdTe crystal was examined by Auger electron spectroscopy (AES), scanning electron microscopy
(SEM), and photoluminescence (PL) to determine the extent of laser-induced damage. It was found that the damaged layer remains
confined to the thin surface layer in the submicron range, which could be easily removed by a light Br-methanol etch. 相似文献
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以扫描电镜和X射线光电子能谱等多种测试手段研究分析了用反应脉冲激光淀积技术制备的PbS薄膜。分析结果表明,利用该淀积方法可以得到附着力好,符合化学计量比的硫化铅薄膜。 相似文献
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M.A. Miller M.H. Crawford A.A. Allerman K.C. Cross M.A. Banas R.J. Shul J. Stevens K.H.A. Bogart 《Journal of Electronic Materials》2009,38(4):533-537
Using a two-step method of plasma and wet chemical etching, we demonstrate smooth, vertical facets for use in Al
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Ga1−x
N-based deep-ultraviolet laser-diode heterostructures where x = 0 to 0.5. Optimization of plasma-etching conditions included increasing both temperature and radiofrequency (RF) power
to achieve a facet angle of 5 deg from vertical. Subsequent etching in AZ400K developer was investigated to reduce the facet
surface roughness and improve facet verticality. The resulting combined processes produced improved facet sidewalls with an
average angle of 0.7 deg from vertical and less than 2-nm root-mean-square (RMS) roughness, yielding an estimated reflectivity
greater than 95% of that of a perfectly smooth and vertical facet. 相似文献
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V. G. Ivanits’ka P. Moravec J. Franc Z. F. Tomashik P. I. Feychuk V. M. Tomashik L. P. Shcherbak K. Mašek P. Höschl 《Journal of Electronic Materials》2007,36(8):1021-1024
An iodine-based etching system, H2O2-HI-citric acid, has been developed and tested on CdTe samples with orientations (111)A, (111)B, (110), and (100). The etching
velocity of CdTe was shown to depend on sample orientation and other etching conditions. The surface roughness was comparable
with that of the surfaces after Br-methanol treatment. A comparative study of the chemical composition of the (211)B CdZnTe
surfaces etched under different conditions was performed. X-ray photoelectron spectroscopy (XPS) measurements showed that
all treated surfaces of CdZnTe samples are enriched with Te. The HI-based treatment seems to be more acceptable than the Br-methanol
treatment in terms of elimination of Te oxides from the surface, however. 相似文献
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为了研究激光诱导放电等离子体的膨胀特性,建立了一套基于脉冲CO2激光诱导锡靶放电等离子体极紫外光源装置,采用增强型电荷耦合器件对羽辉进行拍摄,并采用1维真空电弧模型对实验结果进行了理论说明。实验中改变放电电压和激光能量,得到了不同条件下时间分辨的羽辉图像。结果表明,在激光能量140mJ、放电电压10kV的条件下,获得了稳定的放电等离子体;等离子体的羽辉形态与电流存在对应关系,经历了形成、膨胀、收缩、再次膨胀和消散的不同阶段,放电电压和诱导激光能量对羽辉大小、稳定性和形成时间有影响。此研究有助于提高激光诱导放电等离子体光源的稳定性以及极紫外光的输出功率。 相似文献
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为了研究激光光源对极紫外(EUV)等离子体碎屑的影响,采用脉冲Nd:YAG激光与CO2激光激发Sn产生等离子体,基于直接成像法,研究了等离子体羽辉在低气压中的膨胀特性。通过确定等离子体边界,计算出各个角度的等离子体羽辉膨胀边界随时间的变化规律,以及运动动能随运动路径的变化规律。结果表明,气压为10Pa时,在相同激光能量密度(2.5106mJ/cm2)的条件下,CO2脉冲激光作用锡靶产生EUV的等离子体动能小于Nd:YAG脉冲激光作用锡靶产生的等离子体动能;在减缓离子碎屑的研究中,CO2脉冲激光作为EUV的产生光源要优于Nd:YAG脉冲激光。这一结果对研究激光等离子体的应用是有帮助的。 相似文献
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Experimental verification of a low temperature (<20 °C), reactive plasma etch process for copper films is presented. The plasma etch process, proposed previously from a thermochemical analysis of the Cu-Cl-H system, is executed in two steps. In the first step, copper films are exposed to a Cl2 plasma to preferentially form CuCl2, which is volatilized as Cu3Cl3 by exposure to a H2 plasma in the second step. Plasma etching of thin films (9 nm) and thicker films (400 nm) of copper has been performed; chemical composition of sample surfaces before and after etching has been determined by X-ray photoelectron and flame atomic absorption spectroscopies. 相似文献
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等离子划片是近年来兴起的一项新型圆片划片工艺.与传统的刀片划片、激光划片等工艺不同,该工艺技术可以同步完成一张圆片上所有芯片的划片,生产效率明显提升,是对现有划片工艺的一个颠覆.介绍了圆片划片工艺的工作原理、技术特点及其优势,并对其在解决圆片划片应用中的典型问题和不足之处进行了讨论. 相似文献
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采用激光烧蚀法和电化学腐蚀法制备硅纳米颗粒,两种方法制备的硅纳米颗粒粒径与形貌都不同,而且紫外-可见吸收谱也有很大差别.分析紫外-可见吸收谱发现,硅纳米颗粒与单晶硅相比发生了能带展宽、吸收边蓝移现象,并且有直接能隙的特点;两种方法制备的硅纳米颗粒的光致发光都与硅颗粒的粒径分布和表面层成分密切相关,并且光致发光谱还随激发波长的变化而规律地改变.用量子限制和表面层成分结合模型分析解释了这些现象. 相似文献
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气压对激光诱导等离子体辐射特征的影响 总被引:8,自引:0,他引:8
我们使用Nd:YAG激光器烧蚀金属Al靶获得等离子体,在100Pa~100kPa气压范围内,进行了环境气体压强对激光诱导等离子体辐射特征影响的研究.使用的气体是Ar气,激光能量145mJ.结果发现,最大特征辐射强度在10kPa、靶前0.1mm处、延时180ns获得;而信号-背景是在靶前1.0mm处、延时450ns达到最大值.基于Al等离子体不同气压下的时间-空间分辨谱,对结果进行了简单的讨论. 相似文献
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