Development of a plate-to-plate MPCVD reactor configuration for diamond synthesis

The design and performance of a microwave plasma chemical vapor deposition (MPCVD) reactor based on compressed microwave waveguides and plate-to-plate substrate holders are described. This reactor can be operated at pressures from 10 to 40 kPa with microwave power of 0.4–1.2 kW, and a high plasma power density up to 500 W/cm³ can be obtained. The single-crystal diamond (lower substrate holder) and polycrystalline diamond (upper substrate holder) have been grown by the plate-to-plate MPCVD reactor using high pressure CH₄-H₂ mixture gases. Experimental results show that high quality single-crystal diamond and polycrystalline diamond were simultaneously synthesized at a growth rate of 25 μm/h and 12 μm/h, respectively. The results indicate that our MPCVD reactor is unique for the synthesis of diamond with high efficiency.     

Enlarged phase velocities of ultra-wideband surface acoustic wave devices with relaxor based ferroelectric single crystal/diamond layered structure

The surface acoustic wave (SAW) characteristics of Y-cut X propagating Pb(In_1/2Nb_1/2)O₃-Pb(Mg_1/3Nb_2/3)O₃-PbTiO₃ (YX-PIMNT) single crystals on a diamond substrate have been theoretically calculated. The simulated results show that the phase velocity of the shear horizontal (SH) SAW may be greatly enhanced from the 1350 m/s to 3350 m/s by reducing the thickness of the PIMNT from 0.5λ to 0.05λ, with a corresponding decrease in the electromechanical coupling factor (K²) from 73.6% to 19.6%. The dispersion curves of phase velocity and K² as a function of PIMNT thickness are given for the proposed layered structure. Besides the SH SAW, there are also higher order modes that would cause unwanted responses in the pass-band of wideband SAW filters. These were suppressed by properly controlling structural parameters including top electrode thickness, thickness and Euler angle (θ) of PIMNT substrate. The calculated results demonstrate the effectiveness of this approach to enlarge the phase velocity of the SH SAW without dramatically sacrificing its K², which makes relaxor based ferroelectric single crystals promising for realizing ultra-wideband SAW devices working in ~ GHz range.     

Experimentally defining the safe and efficient,high pressure microwave plasma assisted CVD operating regime for single crystal diamond synthesis

The detailed experimental behavior of a microwave plasma assisted chemical vapor deposition (MPACVD) reactor operating within the high, 180–300 torr, pressure regime is presented. An experimental methodology is described that first defines the reactor operating field map and then enables, while operating at these high pressures, the determination of the efficient, safe and discharge stable diamond synthesis process window. Within this operating window discharge absorbed power densities of 300–1000 W/cm³ are achieved and high quality, single crystal diamond (SCD) synthesis rates of 20–75 μm/h are demonstrated. The influence of several input experimental variables including pressure, N₂ concentration, CH₄ percentage and substrate temperature on SCD deposition is explored. At a constant pressure of 240 torr, a high quality, high growth rate SCD synthesis window versus substrate temperature is experimentally identified between 1030 and 1250 °C. When the input nitrogen impurity level is reduced below 10 ppm in the gas phase the quality of the synthesized diamond is of type IIa or better.     

Homoepitaxial single crystal diamond growth at different gas pressures and MPACVD reactor configurations

Homoepitaxial growth of single crystal diamond by microwave plasma chemical vapor deposition in a 2.45 GHz reactor was investigated at high microwave power density varied from 80 W/cm³ to 200 W/cm³. Two methods of achieving high microwave power densities were used (1) working at relatively high gas pressures without local increase of electric field and (2) using local increase of electric field by changing the reactor geometry (substrate holder configuration) at moderate gas pressures. The CVD diamond layers with thickness of 100–300µm were deposited in H₂–CH₄ gas mixture varying methane concentration, gas pressure and substrate temperature. The (100) HPHT single crystal diamond seeds 2.5 × 2.5 × 0.3 mm (type Ib) were used as substrates. The high microwave power density conditions allowed the achievement of the growth rate of high quality single crystal diamond up to 20 µm/h. Differences in single crystal diamond growth at the same microwave power density 200 W/cm³ for two process conditions—gas pressure 210 Torr (flat holder) and 145 Torr (trapezoid holder)—were studied. For understanding of growth process measurements of the gas temperature and the concentration of atomic hydrogen in plasma were made.     

Improved microwave plasma cavity reactor for diamond synthesis at high-pressure and high power density

Microwave plasma assisted synthesis of diamond is experimentally investigated using high purity, 2–5% CH₄/H₂ input gas chemistries and operating at high pressures of 180–240 Torr. A microwave cavity plasma reactor (MCPR) was specifically modified to be experimentally adjustable and to enable operation with high input microwave plasma absorbed power densities within the high-pressure regime. The modified reactor produced intense microwave discharges with variable absorbed power densities of 150–475 W/cm³ and allowed the control of the discharge position, size, and shape thereby enabling process optimization. Uniform polycrystalline diamond films were synthesized on 2.54 cm diameter silicon substrates at substrate temperatures of 950–1150 °C. Thick, freestanding diamond films were synthesized and optical measurements indicated that high, optical-quality diamond films were produced. The deposition rates varied between 3 and 21 μm/h and increased as the operating pressure and the methane concentrations increased and were two to three times higher than deposition rates achieved with the MCPR operating with equivalent input methane concentrations and at lower pressures (≤ 140 Torr) and power densities.     

Grain size dependent physical and chemical properties of thick CVD diamond films for high energy density physics experiments

We report on the grain size dependent morphological, physical and chemical properties of thick microwave-plasma assisted chemical vapor deposited (MPCVD) diamond films that are used as target materials for high energy density physics experiments at the Lawrence Livermore National Laboratory. Control over the grain size, ranging from several μm to a few nm, was achieved by adjusting the CH₄ content of the CH₄/H₂ feed gas. The effect of grain size on surface roughness, morphology, texture, density, hydrogen and graphitic carbon content was systematically studied by a variety of techniques. For depositions performed at 35 to 45 mbar and 3000 W microwave power (power density ~ 10 W cm^− 3), an abrupt transition from micro-crystalline diamond to nanocrystalline diamond was observed at 3% CH₄. This transition is accompanied by a dramatic decrease in surface roughness, a six percent drop in density and an increasing content in hydrogen and graphitic carbon impurities. Guided by these results, layered nano-microhybrid diamond samples were prepared by periodically changing the growth conditions from nano- to microcrystalline.     

From micro to nanocrystalline transition in the diamond formation on porous pure titanium

A novel composite material of nanocrystalline (NCD) and/or microcrystalline (MCD) diamond films grown on porous titanium (Ti) substrate was obtained by hot filament chemical vapor deposition technique. Diamond films were grown using 1.5 vol.% CH₄ in a balanced mixture of Ar/H₂. The grain size control was obtained by varying the argon concentration from 0 up to 90 vol.% at substrate temperature of 870 K. Porous Ti substrates were obtained by powder metallurgy and presented an inter-connected open porosity. Scanning electron microscopy images of diamond/Ti exposed the substrate covered by a continuous textured coating which changed from MCD to NCD morphology; depending on the amount of Ar concentration in the feed gas. Micro-Raman spectra showed the characteristic t-polyacethylene peaks around 1150 cm^− 1 and 1470 cm^− 1, associated to NCD formation for samples grown with Ar concentration higher than 40 vol.%. X-ray diffraction patterns identified the diamond and TiC peaks, where the crystallinity of (111) TiC phase decreased as the Ar amount increased. This behavior was associated to diamond (220) peak increase for films grown with Ar concentration higher than 70 vol.%. Diamond crystallite size was also evaluated from Sherrer's formula in the range of 11 up to 20 nm.     

Sp3/sp2 character of the carbon and hydrogen configuration in micro- and nanocrystalline diamond

Hot filament and microwave plasma CVD micro- nanocrystalline diamond films are analysed by visible and ultra-violet excitation source Raman spectroscopy. The sample grain size varies from 20 nm to 2 μm. The hydrogen concentration in samples is measured by SIMS and compared to the grain size, and to the ratio of sp² carbon bonds determined by Raman spectroscopy from the 1332 cm^− 1 diamond peak and the sp² 1550 cm^− 1 G band. Hydrogen concentration appears to be proportional to the sp² bonds ratio. The 3000 cm^− 1 CH_x stretching mode band intensity observed on the Raman spectra is decreasing with the G band intensity. Thermal annealing modifies the sp² phase structure and concentration, as hydrogen outdiffuses.     

Hybrid diamond/graphite films: Morphological evolution,microstructure and tribological properties

Diamond films were deposited on silicon substrate by microwave plasma enhanced chemical vapor deposition (MPCVD) using H₂ and CH₄ gas mixture. The morphological evolution process was characterized systematically by means of field-emission scanning electron microscopy (SEM), X-ray diffraction (XRD) and Raman spectroscopy. Special attention has been paid to the influence of the methane concentrations on the microstructures of diamond films, which shows a gradual transition from nanocrystalline to microcrystalline films, and finally displays a hybrid diamond-graphite nanostructure with the length of a few micrometers. Finally, the friction behaviour of the hybrid films was studied. The value of the friction coefficient of the hybrid films is 0.10 and the corresponding wear resistance is below 1.9 × 10^− 7 mm³/N·m in diamond composites/Al₂O₃ sliding system in ambient atmosphere under dry sliding conditions. It is a convenient path to synthesize hybrid diamond/graphite nanostructures by MPCVD depending on higher methane concentrations in the absence of nitrogen or argon. The structure is appropriate for the potential applications as high efficient mechanical tools.     

High-rate homoepitaxial growth of CVD single crystal diamond by dc arc plasma jet at blow-down (open cycle) mode

Growth and applications of large size high quality single crystal diamond is one of the most significant progresses in the field of CVD diamond film research ever made in the past 15 years. However, up to now most of the works were done by microwave plasma CVD operating at high pressures. In the present investigation it is demonstrated that relatively high quality single crystal diamond layer with the FWHM of the diamond Raman peak of less than 2 cm^− 1 and the FWHM of the diamond (400) reflection X-ray Rocking Curve of 0.028° can be obtained by the 20 kW dc arc plasma jet operating at blow down (open cycle) mode at a growth rate as high as 36 μm/h. The reason why dc arc plasma jet is also suitable for high quality epitaxial growth of single crystal diamond is that very high concentration of atomic hydrogen can be easily provided by the extremely high gas temperature due to the arc discharging. Detailed results on the effects of the ratio of H₂/Ar, the distance between the substrate to the anode nozzle of the arc plasma torch, the concentration of methane, and the substrate temperature on the growth of single crystal diamond are presented, and discussed comprehensively, and compared to that with the MWCVD, and with our previous work on the 30 kW dc arc plasma jet operating at arc root rotation and gas recycling mode.     

Growth of diamond films with high surface smoothness

Diamond films with highly smooth backside surface have been deposited by positively biasing the substrate during diamond growth in a hot-filament chemical vapor deposition (HFCVD) system. By bonding the diamond film on the glass and wet etching to remove silicon, the highly smooth diamond surface can be exposed and used directly for the fabrication of diamond devices.Silicon substrate was first treated by diamond powder of 625 nm in an ultrasonic bath. By positively biasing the substrate, electron bombardment during diamond growth increases the nucleation density from 10⁸ ∼ 10⁹ cm^− 2 to 4 × 10¹¹ cm^− 2. The surface smoothness on the backside of diamond film has thus been improved significantly, inducing root-mean-square roughness of 5 nm. Owing to the extremely high surface smoothness and the high crystalline quality on the backside of diamond film and the high diamond growth rate, the backside surface of the diamond film grown under electron bombardment is particularly suitable for device fabrication.     

Thermal analysis of submicron nanocrystalline diamond films

The thermal properties of sub-μm nanocrystalline diamond films in the range of 0.37–1.1 μm grown by hot filament CVD, initiated by bias enhanced nucleation on a nm-thin Si-nucleation layer on various substrates, have been characterized by scanning thermal microscopy. After coalescence, the films have been outgrown with a columnar grain structure. The results indicate that even in the sub-μm range, the average thermal conductivity of these NCD films approaches 400 W m^− 1 K^− 1. By patterning the films into membranes and step-like mesas, the lateral component and the vertical component of the thermal conductivity, k_lateral and k_vertical, have been isolated showing an anisotropy between vertical conduction along the columns, with k_vertical ≈ 1000 W m^− 1 K^− 1, and a weaker lateral conduction across the columns, with k_lateral ≈ 300 W m^− 1 K^− 1.     

Large area deposition of boron doped nano-crystalline diamond films at low temperatures using microwave plasma enhanced chemical vapour deposition with linear antenna delivery

We report on the preparation and characterisation of boron (B) doped nano-crystalline diamond (B-NCD) layers grown over large areas (up to 50 cm × 30 cm) and at low substrate temperatures (< 650 °C) using microwave plasma enhanced linear antenna chemical vapour deposition apparatus (MW-LA-PECVD). B-NCD layers were grown in H₂/CH₄/CO₂ and H₂/CH₄ gas mixtures with added trimethylboron (TMB). Layers with thicknesses of 150 nm to 1 μm have been prepared with B/C ratios up to 15000 ppm over a range of CO₂/CH₄ ratios to study the effect of oxygen (O) on the incorporation rate of B into the solid phase and the effect on the quality of the B-NCD with respect to sp³/sp² ratio. Experimental results show the reduction of boron acceptor concentration with increasing CO₂ concentration. Higher sp³/sp² ratios were measured by Raman spectroscopy with increasing TMB concentration in the gas phase without CO₂. Incorporation of high concentrations of B (up to 1.75 × 10²¹ cm³) in the solid is demonstrated as measured by neutron depth profiling, Hall effect and spectroscopic ellipsometry.     

Graphitized filament plasma enhanced CVD deposition of nanocrystalline diamond

A novel approach to the deposition of polycrystalline diamond is presented. The technique is based on the hot filament chemical vapour deposition technique (HFCVD). While it is similar to a high plasma power “bias enhanced growth” HFCVD, it relies on a graphite filament rather than on a metal one. It was found that with an appropriate choice of the growth parameters, 4–9% CH₄ in H₂, filament temperature > 2200 °C, 25 mBar gas pressure, plasma power > 500 W, a long filament lifetime can be achieved, when a simultaneous deposition of graphitic carbon on the hot graphite filament and of nanocrystalline diamond on a substrate facing the filament assembly is realized. In this paper the growth of nanocrystalline diamond films and their characterization (SEM, XRD, AFM) are presented. While the technique is promising for low cost, large area deposition of nanocrystalline diamond films, also the growth of microcrystalline diamond has been observed.     

Effect of H2/Ar plasma on growth behavior of ultra-nanocrystalline diamond films: The TEM study

Incorporation of H₂ species into Ar plasma was observed to markedly alter the microstructure of diamond films. TEM examinations indicate that, while the Ar/CH₄ plasma produced the ultrananocrystalline diamond films with equi-axed grains (~ 5 nm), the addition of 20% H₂ in Ar resulted in grains with dendrite geometry and the incorporation of 80% H₂ in Ar led to micro-crystalline diamond with faceted grains (~ 800 nm). Optical emission spectroscopy suggests that small percentage of H₂-species (< 20%) in the plasma leads to partially etching of hydrocarbons adhered onto the diamond clusters, such that the C₂-species attach to diamond surface anisotropically, forming diamond flakes, which evolve into dendrite geometry. In contrast, high percentage of H₂-species in the plasma (80%) can efficiently etch away the hydrocarbons adhered onto the diamond clusters, such that the C₂-species can attach to diamond surface isotropically, resulting in large diamond grains with faceted geometry. The field needed to turn on the electron field emission for diamond films increases from E₀ = 22.1 V/μm (J_e = 0.48 mA/cm² at 50 V/μm applied field) for 0% H₂ samples to E₀ = 78.2 V/μm (J_e < 0.01 mA/cm² at 210 V/μm applied field) for 80% H₂ samples, as the grains grow, decreasing the proportion of grain boundaries.     

Nitrogen-doped diamond films selected-area deposition by the plasma-enhanced chemical vapor deposition process

The nitrogen-doped diamond films have been successfully synthesized by using urea as the nitrogen source. Selected-area deposition of diamond nuclei was formed by using a SiO₂ layer as the masking material. Diamond pads, around 9 μm in diameter, were obtained when the N-doped diamond films were deposited on these patterned diamond nuclei using the chemical vapor deposition process. An emission current density as high as 200 μA/cm², with a turn-on field of around 8 V/μm, was obtained. However, the diamond emitters broke down easily, which is ascribed to the localized melting of the substrate materials surrounding the diamond pads.     

Investigation of the nucleation and growth mechanisms of nanocrystalline diamond/amorphous carbon nanocomposite films

Nucleation and growth, but especially the development of the morphology of nanocrystalline diamond/amorphous carbon (NCD/a-C) nanocomposite films have been investigated by systematic variation of three important parameters, namely the deposition time, the growth rate, and the substrate pre-treatment used to enhance the nucleation density. The films have been characterized, among others, by scanning electron microscopy, atomic force microscopy, and Fourier transform infrared spectroscopy. It is shown that, by successive addition of ultradispersive diamond powder to the suspension of nanocrystalline diamond powder in n-pentane used for the ultrasonic pre-treatment, the nucleation density can be enhanced by two orders of magnitude from 1 · 10⁸ cm^− 2 to > 1 · 10¹⁰ cm^− 2. This reduces the thickness required to achieve closed films from 1 µm to 100 nm. However, once coalescence of the individual nodules emerging from the nucleation sites has taken place the films loose “memory” of the nucleation step and start to develop the typical NCD morphology consisting of larger features with diameters of some hundreds of nm which are in turn composed of much smaller features. Irrespective of the feature size and of the parameters used, the films of this investigation possess AFM rms roughnesses of 9–13 nm, indicating that rms values are not sufficient to characterize NCD surfaces.     

Nucleation and growth surface conductivity of H-terminated diamond films prepared by DC arc jet CVD

High-quality polycrystalline diamond film has been extremely attractive to many researchers, since the maximum transition frequency (f_T) and the maximum frequency of oscillation (f_max) of polycrystalline diamond electronic devices are comparable to those of single crystalline diamond devices. Besides large deposition area, DC arc jet CVD diamond films with high deposition rate and high quality are one choice for electronic device industrialization. Four inch free-standing diamond films were obtained by DC arc jet CVD using gas recycling mode with deposition rate of 14 μm/h. After treatment in hydrogen plasma under the same conditions for both the nucleation and growth sides, the conductivity difference between them was analyzed and clarified by characterizing the grain size, surface profile, crystalline quality and impurity content. The roughness of growth surface with the grain size about 400 nm increased from 0.869 nm to 8.406 nm after hydrogen plasma etching. As for the nucleation surface, the grain size was about 100 nm and the roughness increased from 0.31 nm to 3.739 nm. The XPS results showed that H-termination had been formed and energy band bent upwards. The nucleation and growth surfaces displayed the same magnitude of square resistance (R_s). The mobility and the sheet carrier concentration of the nucleation surface were 0.898 cm/V s and 10¹³/cm² order of magnitude, respectively; while for growth surface, they were 20.2 cm/V s and 9.97 × 10¹¹/cm², respectively. The small grain size and much non-diamond carbon at grain boundary resulted in lower carrier mobility on the nucleation surface. The high concentration of impurity nitrogen may explain the low sheet carrier concentration on the growth surface. The maximum drain current density and the maximum transconductance (g_m) for MESFET with gate length L_G of 2 μm on H-terminated diamond growth surface was 22.5 mA/mm and 4 mS/mm, respectively. The device performance can be further improved by using diamond films with larger grains and optimizing device fabrication techniques.     

High-quality diamond film deposition on a titanium substrate using the hot-filament chemical vapor deposition method

Diamond film on titanium substrate has become extremely attractive because of the combined properties of these two unique materials. Diamond film can effectively improve the properties of Ti for applications as aerospace and biomedical materials, as well as electrodes. This study focuses on the effects of process parameters, including gas composition, substrate temperature, gas flow rate and reactor pressure on diamond growth on Ti substrates using the hot-filament chemical vapor deposition (HFCVD) method. The nucleation density, nuclei size as well as the diamond purity and growth tendency indices were used to quantify these effects. The crystal morphology of the material was examined with scanning electron microscopy (SEM). Micro-Raman spectroscopy provided information on the quality of the diamond films. The growth tendency of TiC and diamond film was determined by X-ray diffraction analysis. The optimal conditions were found to be: CH₄:H₂ = 1%, gas flow rate = 300 sccm, substrate temperature T_sub = 750 °C, reaction pressure = 40 mbar. Under these conditions, high-quality diamond film was deposited on Ti with a growth rate of 0.4 μm/h and sp² carbon impurity content of 1.6%.     

Early stage of diamond growth at low temperature

We investigate the first stages of nanocrystalline diamond (NCD) thin film growth at low substrate temperature. NCD films were grown on silicon substrates by microwave plasma enhanced chemical vapor deposition (CVD) for 0–300 min at a temperature of 410 °C. Si substrates were ultrasonically seeded in suspension of detonation nanocrystalline diamond powder. The seeding density approached values up to 1 ⁎ 10¹² cm^− 2, which allows growth of ultra-thin fully closed layers. Stagnation of the AFM roughness indicates that the low temperature NCD growth is a) delayed due to the surface contamination of the used nanodiamond powder and b) possibly dominated by the growth in the lateral direction. XPS measurements showed that the measured surface exhibits changes from a multi-phase composite (seeding layer) to single-phase one (NCD layer).