共查询到20条相似文献,搜索用时 31 毫秒
1.
《Electron Devices, IEEE Transactions on》1980,27(7):1256-1262
In order to determine the low-noise potential of microwave MESFET's fabricated from materials other than GaAs, a one-dimensional FET model is employed. From material parameters and device geometry the model enables the calculation of a small-signal equivalent circuit from which performance information is acquired. Material parameters, as predicted from Monte Carlo calculations, are used to simulate 1-µm devices fabricated from GaAs as well as InP, Ga0.47 In0.53 As, InP0.8 As0.2 , Ga0.27 In0.73 P0.4 As0.6 , and Ga0.5 In0.5 As0.96 Sb0.04 . Results obtained from simulations comparing a Ga0.5 In0.5 As0.96 - Sb0.04 device to an equivalent GaAs device indicate that a decrease in minimum noise figure of almost a factor of two is possible. Considerable improvement in noise performance over a GaAs device is also predicted for devices fabricated from Ga0.47 In0.53 As and Ga0.27 In0.73 P0.4 As0.6 . In addition, the quaternary and ternary devices as well as the InP device should exhibit superior gain and high-frequency performance compared to GaAs devices. 相似文献
2.
《Electron Device Letters, IEEE》1983,4(8):275-277
We report the use of an As2 (instead of As4 ) beam during molecular beam epitaxial (MBE) growth of Gax Aly In1-x-y As layers, lattice-matched to InP substrate. We also show that use of the As2 beam improves the room-temperature photoluminescence intensities of both In0.53 Ga0.47 As and Ga0.39 Al0.08 In0.53 As epilayers with more significant improvement for the latter. The substrate temperature employed was ∼ 580°C for both. 相似文献
3.
《Electron Device Letters, IEEE》1987,8(9):380-382
High-performance pseudomorphic Ga0.4 In0.6 As/ Al0.55 In0.45 As modulation-doped field-effect transistors (MODFET's) grown by MBE on InP have been fabricated and characterized. DC transconductances as high as 271, 227, and 197 mS/mm were obtained at 300K for 1.6-µm and 2.9-µm gate-length enhancement-mode and 2-µm depletion-mode devices, respectively. An average electron velocity as high as 2.36 × 107cm/s has been inferred for the 1.6-µm devices, which is higher than previously reported values for 1-µm gate-length Ga0.47 In0.53 As/Al0.48 In0.52 As MODFET's. The higher bandgap Al0.55 In0.45 As pseudomorphic barrier also offers the advantages of a larger conduction-band discontinuity and a higher Schottky barrier height. 相似文献
4.
《Electron Device Letters, IEEE》1985,6(1):20-21
A novel thin GaAs lattice-mismatched gate Ga0.47 In0.53 As field-effect transistor (LMG-FET) is reported. The device shows an extrinsic dc transconductance of 108 mS/mm for a 1.4-µm gate length and 240-µm gate width. Despite a 3.7-percent, lattice mismatch between GaAs and Ga0.47 In0.53 As, the LMG-FET shows stable operation even at 80°C (with a 13-percent increase in transconductances), exhibits negligible current drift, and suffers very little change in threshold voltages (<0.05 V) under illumination, This technology may find applications in high-speed lightwave transmission as well as high-speed digital circuits. 相似文献
5.
《Electron Device Letters, IEEE》1980,1(8):154-155
Ga0.47 In0.53 As MESFETs have been fabricated on InP substrates. The low barrier height of Ga0.47 In0.53 As (0.20 eV) which makes simple GaInAs MESFETs at this composition impractical, has been overcome by using thin Al0.48 In0.52 As layers between gate metal and GaInAs active layers. Al0.48 In0.52 As has also been exploited in the form of buffer layers. The double heterostructure FET wafers with single crystal Al gate metal were grown by molecular beam epitaxy (MBE). The 2.75 µm gate length MESFETs showed d.c. transconductance gm = 57 mS mm-1in spite of nonoptimized dimensions. 相似文献
6.
《Electron Device Letters, IEEE》1983,4(10):383-385
We report the first vertical n-p-n heterojunction bipolar transistors formed in the (Al,In)As/(Ga,In)As alloy system. The structures grown by molecular-beam epitaxy (MBE) use a wide band-gap (Eg = 1.44 eV) Al0.48 In0.52 As emitter on a lower band gap (Eg = 0.73 eV) Ga0.47 In0.53 As base 2500 Å in width. Transistors with both abrupt and graded heterojunction emitters were demonstrated with dc current gains of 140 and 280, respectively, at a collector current of 15 mA. The (Al,In)As/(Ga,In)As heterojunction transistors offer the attractive possibility of optical integration with long wavelength lasers and photodetectors. 相似文献
7.
《Electron Devices, IEEE Transactions on》1986,33(2):188-191
We demonstrate for the first time a long-wavelength Ga0.47 In0.53 As vertical photoconductive detector with very high gain, low noise, low-bias voltages, high sensitivity, and high-coupling efficiency. The detector consists of an n+ InP, a Fe-doped Ga0.47 In0.53 As, and an n+ Ga0.47 In0.53 As layer grown successively on a semi-insulating InP substrate. The highly resistive active layer sandwiched between two n+ layers creates a uniform electric field perpendicular to the surface, producing a dc gain of 86 at bias voltages as low as 0.5 V. The noise power at 100 MHz is about 11 dB lower than that of a coplanar interdigitated photoconductive detector prepared with undoped GaInAs grown by vapor-phase epitaxy. Preliminary measurements reveal a receiver sensitivity of -28.2 dBm at a bit-error rate of 10-9at 420 Mbit/s and a wavelength of 1.55 µm. 相似文献
8.
Pearsall T. Piskorski M. Brochet A. Chevrier J. 《Quantum Electronics, IEEE Journal of》1981,17(2):255-259
We have used a Ga0.47 In0.53 As/InP heterostructure to produce a photodiode (area =3 times 10^{-4} cm2) which shows a saturated dark current of 100 pA at 23°C and 1.7 nA at 50°C. At this dark current, these photodiodes have near-unity quantum efficiency at 1.6 μm and show good photoresponse over the1.0-1.65 mu m region of the optical spectrum. 相似文献
9.
《Electron Device Letters, IEEE》1982,3(6):152-155
We report the first demonstration of a depletion mode modulation doped Ga0.47 In0.53 As field effect transistor. This transistor combines the advantage of modulation doping and the superior material characteristics of Ga0.47 In0.53 As. DC transconductances of 31 mmho/ mm at 300 K and 69 mmho/mm at 77 K have been measured for a device with 5.2µm gate length and 340 µm gate width. An enhanced drift mobility is responsible for 88 percent of the improvement in the transconductance at 77 K and the remaining 12 percent is attributed to an improved ohmic contact. A high performance modulation doped Ga0.47 In0.53 As FET is expected to play an important role in very high speed digital and analog applications. 相似文献
10.
《Electron Device Letters, IEEE》1981,2(3):73-74
It is demonstrated that inversion-mode n-channel insulated gate field-effect transistors can be made of p-type heteroepitaxially-grown Ga0.47 In0.53 As layers on semi-insulating InP. 相似文献
11.
《Electron Devices, IEEE Transactions on》1987,34(4):782-792
A novel variation on the doped quantum well avalanche photodiode is presented that provides comparable signal-to-noise performance at more realizable material doping requirements. The device consists of repeated unit cells formed from a p-n Al0.48 In0.52 As junction immediately followed by near-intrinsic Ga0.47 In0.53 As and Al0.48 In0.52 As layers. As in the doped quantum well device, the asymmetric unit cell selectively heats the electron distribution much more than the hole distribution prior to injection into the narrow-gap Ga0.47 In0.53 As layer in which impact ionization readily occurs. The effects of various device parameters, such as the junction doping, Ga0.47 In0.53 As and intrinsic Al0.48 In0.52 As layer widths as well as the overall bias on the electron and hole ionization rates, is analyzed using an ensemble Monte Carlo method. From the determination of the ionization rates and the ionization probabilities per stage, P and Q, an optimal device design can be obtained that provides high gain at low multiplication noise. In addition, a structure that operates at less than 5 V bias is presented that can provide moderate gain at very low noise. It is expected that the device designs presented herein can serve either as high-gain low-noise detectors for lightwave communications systems or as moderate-gain low-noise detectors for on-chip application. 相似文献
12.
Ga0.47 In0.53 As has been used to make fast (rt < 1 ns), photodiodes with low dark current (i_{D} < 10^{-8} A) and good quantum efficiency (ηQ ext > 50 percent over the entire1.0-1.7 mu m region of the optical spectrum). The physical properties related to the crystal growth and carrier transport are discussed in this paper in terms of both the design and the operating characteristics of detectors fabricated from this ternary alloy. The results of our work show that Ga0.47 In0.53 As is a material well-suited to several important semiconductor device applications. A comparison to other semiconductor photodiodes shows that Ga0.47 In0.53 As is one of the most sensitive detectors available in the1.0-1.7 mu m wavelength region. One can expect repeater-free transmission in excess of 150 km at 100 Mbits . s-1using these detectors in a digital optical fiber link at the 1.55 μm low-loss (alpha < 0.3 dB . km-1) low-dispersion transmission window. 相似文献
13.
《Electron Device Letters, IEEE》1982,3(8):205-208
We report a selectively doped Ga0.47 In0.53 As/Al0.48 In0.52 As field effect transistor with a 1.2 µm gate length and present a model of two-region operation to analyze its I-V characteristics. This depletion mode transistor shows complete pinch-off and saturation characteristics with a low frequency transconductance of 70 mmho/ mm at 300 K and 125 mmho/mm at 77 K. The theoretical model, which includes the background carriers in the undoped Ga0.47 In0.52 As layer, agrees with the experimental results. 相似文献
14.
《Electron Device Letters, IEEE》1980,1(9):174-176
MESFETs with GA0.47 In0.53 As active channel grown by MBE on InP substrates were successfully fabricated. Thin layers of MBE grown Al0.48 In0.52 As seperated both the single crystal aluminum gate from the active channel and the active channel from the InP substrate so raising the Schottky barrier height of the gate and confining the electrons to the channel. The MESFETs with 0.6µm long gates and gate-to-source separations of 0.8 um exhibited an average gm of 135 mS mm-1of gate width for Vds = 2V and Vg = 0. This is higher than that reported for GaAs MESFETs with a similar geometry in spite of the intermediate layer between the gate metal and the active layer. 相似文献
15.
《Electron Device Letters, IEEE》1982,3(10):318-319
The first reported growth of the quaternary AlGaInAs on an InP substrate by molecular beam epitaxy had an equal aluminum-to-gallium mole fraction ratio, and exhibited a 5 K bandgap energy of 1.237 eV. This is intermediate between the 5 K band gap energy of Ga0.47 In0.53 As (0.810 eV) and that of Al0.48 In0.52 As (1.56 eV). A Schottky diode and a MESFET were fabricated on this material. 相似文献
16.
《Electron Device Letters, IEEE》1986,7(5):320-323
The successful application of short-term halogen lamp annealing to form ohmic contacts to AlGaAs/GaAs and In0.52 Al0.48 As/ In0.53 Ga0.47 As modulation-doped structures is demonstrated. Use of Ti in the electron-beam evaporated metallization scheme and a two-step annealing cycle give contacts with reproducibly good electrical and morphological characteristics. Minimum values of specific contact resistancerho_{c} = 4.0 times 10^{-7} and6.0 times 10^{-7} Ω.cm2for AlGaAs/GaAs and In0.52 Al0.48 As/In0.53 Ga0.47 As, respectively, are measured. Corresponding values of the transfer resistance Rc are 0.12 ± 0.02 and 0.18 ± 0.05 Ω.mm. These values are the lowest achieved with lamp annealing and are comparable to the best obtained with transient furnace annealing. 相似文献
17.
《Electron Device Letters, IEEE》1981,2(1):7-9
The first operation of an integrated differential notch-type photoconductor and dual gate (DG) double heterostructure (DH) MESFET in Ga0.47 In0.53 As is reported. The starting material was grown by molecular beam epitaxy on a semi-insulating InP substrate. A 2 mW HeNe laser with a spot diameter Of 0.5 mm could modulate the drain current by 300 µA with the upper gate suitably biased. 相似文献
18.
《Electron Device Letters, IEEE》1987,8(1):33-35
We have successfully fabricated FET's with In0.53 Ga0.47 As channels, lattice-matched In0.52 Al0.48 As gate barriers, and n+ In0.53 - Ga0.47 As gates. For a barrier thickness of 600 Å and a gate length of 1.7 µm, the maximum transconductance is 250 mS/mm at T = 300 K. From gate capacitance measurements, the cutoff frequency is inferred to be ft = 15 GHz for this gate length. Self-aligned source and drain implants have been used to permit nonalloyed ohmic contacts with a characteristic resistance of 0.1 Ω.mm. The transconductance remains above 210 mS/mm for forward gate bias up to +1.0 V, confirming the usefulness of this gate structure for enhancement-mode devices. 相似文献
19.
《Electron Devices, IEEE Transactions on》1987,34(4):793-803
A new Ga0.47 In0.53 As/Al0.48 In0.52 As multiquantum well avalanche photodiode, the APD, is presented that provides comparable signal-to-noise performance compared to either the doped quantum well APD or the p-n junction quantum well APD, but without carrier trapping effects even at very low overall applied electric fields. The device is made of repeated unit cells consisting of a p-n junction formed between two dissimilar materials followed by a nearly intrinsic wide-bandgap layer. As in the doped quantum well device, the asymmetric unit cell selectively heats the electron distribution much more than the hole distribution within the narrow-gap Ga0.47 In0.53 As layer leading to a greatly enhanced electron-to-hole ionization rates ratio. The most significant improvement over the doped and p-n junction quantum well devices is the lack of carrier trapping at the heterojunction without further engineering of the interface (compositional grading). Carrier trapping is avoided, thereby providing very high-speed performance even for low-voltage devices, by doping the narrow-gap layer. The resulting built-in field within the GaInAs layer is sufficiently large of itself that both electrons and holes are heated to energies large enough to overcome the potential barrier at the end of the quantum well. In this way, devices operating at 5 V bias can be built that will provide a gain of about 4 at large bandwidths, ~18 GHz. 相似文献
20.
The electron and hole impact ionization rates, α andβ, in an InP/Ga0.47 In0.53 As superlattice have been experimentally determined from photomultiplication data made on an InP/GaInAs superlattice photodiode. A Monte Carlo simulation of α and β in the superlattice has been developed, and the enhancement of impact ionization due to the effect of the band edge discontinuity has been investigated. The experimental ionization rates have been analyzed by the simulation. The larger β than α in the superlattice has been shown to be explained by the valence band discontinuity about two times larger than the conduction band edge discontinuity in this superlattice structure. 相似文献