Precise optical activity measurement of quartz plate by using a true phase-sensitive technique

A method of considering the circular and linear birefringent properties of a material on the basis of circular and linear polarization eigenstates is presented theoretically and experimentally. A polarized common-path optical heterodyne interferometer with respect to both right-hand and left-hand circularly polarized light was set up. It was used in conjunction with a phase lock-in technique to measure the optical activity of quartz crystal in real time. The signal-to-noise ratio of the measured phase change caused by the lateral displacement of quartz cornus was 75, which corresponded to a measuring accuracy of 10(-7). This novel method, in which a true-phase-sensitive optical heterodyne interferometer is used, has higher detection sensitivity and higher immunity to environmental disturbances.     

Precise measurement of refractive index spectral dependence of optical materials for laser,fiber, and integrated optics

An interferometric technique for measuring the spectral dependence of the refractive index of solid-state materials to an accuracy of 10^?5 over the entire transparency region is described. The possibilities of the technique are demonstrated by the example of new phosphate glasses formulated for laser and fiber optics. It is shown that, in the presence of absorption bands in the transmission spectrum, the technique allows their associated jumps in the refractive index values to be recorded on the order of 10^?4?10^?5 and below. The shift in the spectral dependence of the refractive index in the region of the absorption band with intensity at 1.7 cm^?1 is measured for the first time.     

Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide

We introduce a very sensitive new configuration, to the best of our knowledge, in an optical microscope system that utilizes two detectors: one is to measure the power of a low reflected signal from a sample, and the other is only to monitor the confocal geometry of the system. With this new configuration, we could effectively remove measurement noise associated with small perturbation in measurement conditions such as surface curvature, tilt, and vibration in a microscope system. We have obtained a high-resolution relative index precision of 9x10(-5) by employing this novel technique with two detectors.     

Ionization effect on arc plasma's optical diagnosis by the measurement of the refractive index

The effect of arc plasma ionization on its temperature diagnosis by the measurement of the refractive index is discussed. The refractive index of arc plasma in two conditions is compared: 1) only the first ionization is considered and 2) both the first and second ionizations are considered. In order to facilitate plasma temperature reconstruction, two corresponding refractive index models are deduced. For the sake of making this study universal, both the monatomic and dual-atomic molecule arc plasmas are chosen as typical examples for theoretical deduction and analysis. A condition, which can be adopted to estimate whether the second ionization should be considered in temperature reconstruction, is proposed. Finally, an argon arc plasma is chosen as an example for experiment, and the experimental results match well with the theoretical analysis. This study is crucial to arc plasma's optical diagnosis, which is based on the measurement of the refractive index.     

一种液体折射率的薄膜干涉测量方法

理论分析表明在镀有金属分光膜的玻璃介质和金属介质构成的几何楔形成的斐索干涉条纹中,相长干涉并不位于相邻的两相消干涉的中央,而是存在一明显偏移,这一偏移与引入几何楔中待测液体的折射率相关.基于该原理,提出了一种新的折射率测量的方法,并对该方进行了实验验证.该方法不需要利用标准液对光学几何量进行标定,测量范围广.     

Optical activity measurement by use of a balanced detector optical heterodyne interferometer

What we believe to be a novel amplitude sensitive optical heterodyne polarimeter in which a Zeeman laser is associated with balanced detector detection was set up. The aim was to measure the optical activity of a quartz crystal with a Cornu depolarizer at high accuracy. The features of this novel polarimeter, which include the use of a two-frequency laser that ensures the accuracy of the measurement, are discussed. Furthermore, the detection sensitivity of the optical activity of a quartz crystal was measured as 8.5x10(-10). To our knowledge, this is the highest sensitivity obtained for optical activity measurement of a quartz crystal when the error of the measurement is also analyzed.     

Angstrom-range optical path-length measurement with a high-speed scanning heterodyne optical interferometer

A highly accurate method of optical path-length measurement is introduced by use of a scanning heterodyne optical interferometer with no moving parts. The instrument has demonstrated the potential to measure optical path length at angstrom resolution over continuous thickness in the micrometer range. This optical path length can be used to calculate the thickness of any material if the refractive index is known or to measure the refractive index of the material if the thickness is known. The instrument uses a single acousto-optic device in an in-line ultra-stable reflective geometry to implement rapid scanning in the microsecond domain for thickness measurements of the test medium.     

Effect of refractive index on the measurement of optical properties in turbid media

Continuous-wave measurement-based methods offer a rapid cost-effective way to determine optical properties in turbid media. This method requires a measure of the refractive index of the medium, which is often unknown a priori. Whereas previous studies have reported that the refractive index has little impact on the measurement of optical properties, here we show a significant effect of refractive indices on measurements, using both simulations and experiments. In addition we propose a noniterative method to determine the refractive index of the medium. This method can also provide an optimal initial guess of the optical properties for the standard iterative method for determining optical properties in turbid media. Our method is confirmed by simulations and experiments with latex spheres and Intralipid suspensions.     

Extrinsic fiber-optic Fabry-Perot interferometer sensor for refractive index measurement of optical glass

A simple fiber-optic sensor based on Fabry-Perot interference for refractive index measurement of optical glass is investigated both theoretically and experimentally. A broadband light source is coupled into an extrinsic fiber Fabry-Perot cavity formed by the surfaces of a sensing fiber end and the measured sample. The interference signals from the cavity are reflected back into the same fiber. The refractive index of the sample can be obtained by measuring the contrast of the interference fringes. The experimental data meet with the theoretical values very well. The proposed technique is a new method for glass refractive index measurement with a simple, solid, and compact structure.     

Circularly polarized optical heterodyne interferometer for optical activity measurement of a quartz crystal

Phase retardation between two orthogonal circularly polarized light waves that propagate in an optical active medium is proportional to its optical activity. The measurement of optical activity of a quartz depolarizer in terms of the phase difference of two orthogonal circularly polarized waves is proposed. A circularly polarized optical heterodyne interferometer with a Zeeman laser to measure the optical activity of a quartz crystal is demonstrated experimentally. The accuracy of the measurement is discussed. In addition, the effect of elliptical polarization and nonorthogonality of linearly polarized light waves of a Zeeman laser on the optical activity measurement is analyzed.     

High-resolution refractive index anisotropy measurement in optical fibers through phase retardation modulation

We present an improved, high-resolution method for the measurement of phase retardation induced by the material birefringence of optical fibers. Such a method can be used to retrieve information about the spatial distribution of refractive index anisotropy in the fiber by comparing the accumulated phase of a polarization component oriented along the fiber transmission axis and another located in the transverse plane. The method is based on the nonlinear regression of a phase modulated signal of known modulation amplitude altered by the sample. Experimental results obtained with our method for a standard telecommunications fiber (the Corning SMF-28) as well as photosensitive fibers (Fibercore PS1250 and PS1500) are presented with a noise-limited phase resolution below 10(-4) radians and a spatial resolution below 1 microm. An analysis of the limitation of such measurement methods is also presented including diffraction by the fibers.     

Automated measurement of the refractive index of fluids

A method for automating refractive-index measurements of fluids has been developed. An encoded rotation stage and position-sensitive detector enable automated reading of angles typically acquired by visual means. Two tunable lasers are used to obtain index measurements at ten discrete wavelengths across the visible spectrum. This method has been implemented on a Hilger-Chance refractometer from which the bulk refractive-index values for various transparent fluids have been measured. An index measurement accuracy of better than one part in the fourth decimal place for distilled water and a few parts in the fourth decimal place for higher index fluids is obtained.     

Dispersion-insensitive measurement of thickness and group refractive index by low-coherence interferometry

We describe a low-coherence interferometric technique for simultaneous measurement of geometric thickness and group refractive index of highly dispersive samples. The technique is immune to the dispersion-induced asymmetry of the interferograms, thus overcoming limitations associated with some other low-coherence approaches to this simultaneous measurement. We use the experimental configuration of a tandem interferometer, with the samples to be characterized placed in an air gap in one arm of the measurement interferometer. Unambiguous, dispersion-insensitive measurements of critical group-delay imbalances in the measurement interferometer are determined from the optical frequency dependence of interferogram phases, by means of dispersive Fourier transform spectrometry. Sample thickness and group refractive index are calculated from these group delays. A thickness measurement precision of 0.2 mum and group index measurement accuracy of 5 parts in 10(5) across a wavelength range of 150 nm have been achieved for BK7 and fused-silica glass samples in the thickness range 2000 to 6000 mum.     

气体折射率的测试光路--用激光干涉条纹计数原理

本文阐述两种气体折射率的测试光路。它们是用白光干涉“O”级条纹定位，激光干涉条纹计数原理作光程差补偿测试。便于自动测量。     

Dispersion of the nonlinear refractive index of optical crystals

The nonlinear refractive indices of several important optical materials have been measured at the second and third harmonic wavelengths of the Nd laser using nearly degenerate four-wave mixing. Measurements made relative to the nonlinear index of fused silica have the highest accuracy. Absolute measurements were also made using the Raman cross-section of benzene as a nonlinear reference standard. The relative measurements are compared with a despersion model base on parameters fitted to the linear refractive indicies and also to a recently proposed model based on Kramers-Kronig transformation of the calculated, two-band, two-photon loss spectrum.     

Alternative method for measuring the full-field refractive index of a gradient-index lens with normal incidence heterodyne interferometry

A linearly/circularly polarized heterodyne light beam coming from a heterodyne light source with an electro-optic modulator in turn enters a modified Twyman-Green interferometer to measure the surface plane of a GRIN lens. Two groups of periodic sinusoidal segments recorded by a fast complementary metal-oxide semiconductor camera are modified, and their associated phases are derived with the unique technique. The data are substituted into the special equations derived from the Fresnel equations, and the refractive index can be obtained. When the processes are applied to other pixels, the full-field refractive-index distribution can be obtained similarly. Its validity is demonstrated.     

光学高分子材料折射率的计算及应用

折射率是光学高分子材料的一项基本性能。本文用 5种方法计算高分子材料的折射率 ,计算结果与测量值一致。几种方法相互结合可以推导出某种方法中未知基团或化学键的折射度值 ,从而计算出该化合物的折射率。利用以上方法对氟化丙烯酸酯聚合物折射率、密度进行了计算 ,计算结果非常准确 ,为光学材料研究提供了新的理论数据     

Far-infrared laser measurement of the refractive index of polypropylene

The refractive index of polypropylene in the far infrared (FIR) is measured by means of a suitably modified laser of a FIR spectrometer. When thin polypropylene films of 12.7-microm nominal thickness are introduced in the optical cavity of a laser at the Brewster angle, the radiation ceases because of the change in the optical path of the laser beam. This change is measured from the displacement of one of the laser mirrors, which is necessary to restore the laser resonance. The refractive index of polypropylene is deduced from this measurement and from the film thickness, as obtained from an independent measurement based in pycnometry. The value obtained for the refractive index is 1.492(15) for the wavelengths between 118.834 and 251.140 microm, for a polypropylene film of 12.71(2)-microm thickness and 0.9049(7) g/cm3 density.     

Precise focal-length measurement technique with a reflective Fresnel-zone hologram

A new technique for precise focal-length measurement with a hologram is presented. This technique is widely applicable and is particularly useful for measuring large, slow lenses. In diffraction, the Fresnel-zone plate hologram emulates the reflective properties of a convex spherical mirror for use during transmission null tests of an optic by use of a phase-shifting interferometer. The hologram is written lithographically and therefore offers a higher degree of precision at a lower cost than its spherical mirror counterpart. A hologram offers the additional benefit of easy characterization by use of the same interferometer employed in examining the test optic. Better than +/-0.01% precision is achieved during measurement of a 9-m focal-length lens by use of a 150-mm aperture interferometer.