Microstructural study of YBa2Cu3O7/SrTiO3/YBa2Cu3O7 heteroepitaxial trilayer films grown on (100) SrTiO3 substrates

Detailed transmission electron microscopic study has been carried out on heteroepitaxial YBa₂Cu₃O₇/SrTiO₃/YBa₂Cu₃O₇ trilayer thin films grown on (100)SrTiO₃ substrates prepared by DC and RF magnetron sputtering. The microstructural results showed the existence of somea-axis-oriented YBCO grains 20–90 nm wide in thec-axis-oriented YBCO matrix. Some of thea-axis grains in the lower YBCO thin film layer have protruded into the above SrTiO₃ layer, which may cause short circuit between the two YBCO superconducting layers. This is unsuitable for the application of trilayer thin films for microelectronic devices. The defects on the surface of the substrates would also influence the growth quality of the YBCO thin films.     

Influence of Interfacial LSMO Nanoparticles/Layer on the Vortex Pinning Properties of YBCO Thin Film

YBa₂Cu₃O_7?δ (YBCO) thin films have been deposited on bare and La_0.67Sr_0.33MnO₃ (LSMO) modified single crystal SrTiO₃ (STO) substrates. The effect of randomly distributed ferromagnetic LSMO nanoparticles and a complete LSMO layer, present at STO/YBCO interface, on the superconducting properties of YBCO thin films has been investigated by temperature dependent magnetization studies. The YBCO thin film on LSMO nanoparticles decorated STO substrate shows significant improvement in the critical current density and pinning force density as compared to the YBCO thin film deposited on bare STO substrate and this improvement is more significant at higher applied magnetic field. However, the LSMO/YBCO bilayer showed the improved flux pinning properties only up to a magnetic field of 1.5 T above which it deteriorates. In the case of LSMO/YBCO bilayer, the underlying LSMO layer gives rise to magnetic inhomogeneities due to domain structure, which leads to improved flux pinning properties limited to lower field. However, in the case of LSMO nanoparticles decorated substrate, the presence of LSMO nanoparticles at YBCO/STO interface seems to introduce magnetic inhomogeneities as well as structural defects, which might be acting as correlated pinning sites leading to improved flux pinning properties of the YBCO thin film over a wide range of applied magnetic field.     

Improved Critical Current Densities in YBa2Cu3O7?�� Multilayer Films Interspaced with Palladium Nano-dots

Power applications of superconducting coated conductors in high magnetic fields require thick films with high critical current density J _c and strong artificial pinning centers. Here, we report on the artificial pinning centers induced in YBCO quasi-multilayer films interspaced with palladium (Pd) nano-dots. Quasi-multilayered (QM) YBa₂Cu₃O_7??? (YBCO) films composed of YBCO layers interspaced with quasi-layers of palladium nano-dots were grown by pulsed laser deposition on SrTiO₃(100) substrates. DC magnetization and frequency-dependent measurements showed high J _c comparable with best YBCO films in thin quasi-multilayers and significant improvement of J _c in thick quasi-multilayers. TEM study shows regions of planar defects, stacking faults, and pore formations suitable for immobilizing vortices. These defects significantly contribute to the pinning of magnetic flux and increase critical current in the films.     

Effect of PrBa2Cu3O7?x buffer layer thickness on the properties of YBa2Cu3O7?x thin films grown on sapphire by laser ablation

Superconducting YBa₂Cu₃O_7–x (YBCO) thin films were deposited onr-plane A1₂O₃ substrates with PrBa₂Cu₃O_7–x (PBCO) buffer layer by XeCl excimer laser ablation. The thickness of PBCO buffer layer was systematically changed to investigate the superconducting properties of YBCO thin films on sapphire. The structure and surface morphology of the films were characterized by X-ray diffraction and scanning electron microscopy (SEM). Superconducting transition temperatures were varied depending on the buffer layer thickness. Interdiffusion between laser-ablated YBCO thin films and A1₂O₃ substrates had been studied by Auger electron spectroscopy (AES). The results of this study show that diffusion does not occur between the YBCO thin film and the substrate even with 20 Å thick PBCO buffer layer.     

Structural and electrical characteristics of chemical solution derived (Bi3.2La0.4Nd0.4)Ti3O12 thin films

(Bi_3.2La_0.4Nd_0.4)Ti₃O₁₂ (BLNT) thin films were prepared on Pt/Ti/SiO₂/Si substrates by using chemical solution deposition technique, and the effects of annealing temperatures in the range of 550-750 °C on structure and electrical properties of the thin films were investigated. X-ray diffraction analysis shows that the thin films have a bismuth-layered perovskite structure with preferred (117) orientation. The surface morphology observation by field-emission scanning electron microscopy confirms that films are dense and smooth with uniformly distributed grains. The grain size of the thin films increases with increasing annealing temperature; meanwhile, the structural distortion of the thin films also increases. It was demonstrated that the thin films show good electrical properties. The dielectric constant and dielectric loss are 191 and 0.028, respectively, at 10 kHz for the thin film annealed at 600 °C, and the 2Pr value of the thin film annealed at 700 °C is 20.5 μC/cm² at an electric field of 500 kV/cm.     

Thin film growth of epitaxial, polycrystalline and amorphous SrRuO3

The SrRuO₃ thin films were grown on amorphous fused silica and (100) single crystal LaAlO₃ substrates by pulsed laser deposition method. On fused silica substrates, polycrystalline SrRuO₃ thin film was obtained and below the crystallization temperature, SrRuO₃ thin films show an amorphous phase. For the case of epitaxial growth on (100) single crystal LaAlO₃ substrate, the crystallization temperature of SrRuO₃ thin film was increased by ∼ 100 °C indicating that additional energy is necessary in order to obtain the epitaxial thin film. By using the eclipse method and the control of substrate temperature, the variations of surface morphologies and grain size were observed by atomic force microscope. Below the crystallization temperature, amorphous SrRuO₃ thin film shows hopping transport property of an insulator.     

Comparison of Flux Pinning Mechanism in Laser Ablated YBCO and YBCO:BaZrO3 Nanocomposite Thin Films

Thin films of YBCO and YBCO:BaZrO₃ (BZO) nanocomposite have been deposited using the pulsed laser deposition technique. Substantial increase in critical current density (J _C ) and pinning force density (F _p ) of the nanocomposite thin films was observed. The possible pinning mechanism in YBCO:BZO nanocomposite thin films has been explored and compared with the pinning mechanism in pure YBCO thin film by studying the variation of J _C with magnetic field (B) and temperature. In the intermediate field regime (0.1–1 T), J _C follows B ^−α with nearly similar values of α for YBCO and YBCO:BZO nanocomposite thin films indicating similar pinning mechanism in both thin films. The variation of J _C with reduced temperature (t=T/T _C ) has been studied for both the films and it was observed that the mechanism of pinning in both YBCO and YBCO:BZO thin films is similar (δT _C pinning). The observed enhanced values of J _C and F _p of the nanocomposite thin film is attributed to the presence of BZO nanoparticles, which induces more defects due to lattice mismatch between YBCO and BZO leading to improved flux pinning properties of the nanocomposite thin film.     

Chemistry of post-annealing of epitaxial CoFe2O4 thin films

CoFe₂O₄ thin films of different thicknesses were grown on SrTiO₃ substrates. The X-ray diffraction analysis and atomic force microscopy indicated both epitaxy and a granular microstructure. We studied the magnetic properties of these films as a function of oxygen post-annealing and film thickness. All as-deposited films exhibited similar magnetic properties with saturated magnetization (M_s) of approximately 50% of the bulk M_s, (80 Am² kg^− 1). After the post-annealing the M_s changes as a consequence of crystallographic restructuring of the film. Cation ordering in 100 nm thick films reduces M_s, whereas re-oxidation increases M_s for thinner films. 13 nm films, annealed for 1 h, reach the bulk M_s. For even thinner films the quantum-size effect reduces M_s. For a synthesis of ≥ 30 nm films an annealing cycle after deposition of every 15 nm layer is recommended.     

Improvement of Pinning Force and Critical Current Density in Thick YBa 2 Cu 3 O 7−δ Films Grown on SrTiO 3 Substrates Decorated with LaNiO 3 Nanodots

We have investigated by DC magnetization measurements and frequency-dependent AC susceptibility the critical current density (J _c), pinning force (F _p) and pinning potential in thick (1.3–1.6 μm) YBa₂Cu₃O_7−δ (YBCO) films grown by Pulsed Laser Deposition on SrTiO₃ substrates decorated with LaNiO₃ nanodots deposited by a few (5–15) laser pulses, in comparison with those of a 1 μm thick YBCO reference sample. Experiments show that the highest improvement of superconducting properties was achieved for films grown on substrates decorated with 10 laser pulses on the LaNiO₃ target, which have, at 77.3 K, a J _c of 40–125% higher than in pure YBCO in fields between 1 and 2 T, and F _p increased by 40%. These results could be important for further improvement of current-carrying capability of coated conductors for in-field power applications.     

Influence of oxygen partial pressure on the structural and dielectric properties of Ba(Zr0.3Ti0.7)O3 thin films grown on (LaAlO3)0.3(Sr2AlTaO6)0.35 (001) using pulsed laser deposition

Epitaxial Ba(Zr_0.3Ti_0.7)O₃ thin films were grown on (LaAlO₃)_0.3(Sr₂AlTaO₆)_0.35 (001) single-crystal substrates by pulsed laser deposition at 700 °C in different oxygen partial pressures ranging from 6.7 Pa to 40.0 Pa. A strong correlation is observed between the structure and dielectric properties for the Ba(Zr_0.3Ti_0.7)O₃ thin films. The tetragonal distortion (ratio of in-plane and out-of-plane lattice parameter, a/c) of the films depends on the oxygen partial pressures. a/c varies from 0.989 at 6.7 Pa to 1.010 at 40.0 Pa, indicating the in-plain strain changes from compressive to tensile. The in-plain strain (either compressive or tensile) shifts the Curie temperature of the Ba(Zr_0.3Ti_0.7)O₃ thin films dramatically. Surface morphology and dielectric properties of Ba(Zr_0.3Ti_0.7)O₃ thin films have a strong dependence of the oxygen partial pressure. The film grown 26.7 Pa, which corresponds to a moderate in-plain tensile strain and a Curie temperature of ~ 30 °C, shows the largest relative permittivity, tunability and the best figure of merit in a broad frequency range (1 kHz-500 MHz), which may be a promising candidate for room-temperature microwave device applications.     

The growth of BaTiO3 films on (001) MgAl2O4 substrates by pulsed laser deposition technique

The microstructural evolution of the BaTiO₃ films grown on (001) MgAl₂O₄ spinel substrates at different temperatures by means of pulsed laser deposition technique is studied via transmission electron microscopy (TEM). The BaTiO₃ film grown at 850 °C consists of columnar grains of random orientations. Once the substrate temperature is over 900 °C, the BaTiO₃ films grow on (001) MgAl₂O₄ substrates epitaxially. The cross-sectional TEM study reveals that the boundaries and interfaces act as the sources to emit stacking faults and twins which are detrimental to the film quality. The quality of epitaxial films increases with the growth temperature, and is optimized at the growth temperature of 1050 °C. The evolution of film microstructures with the growth temperature is discussed in view of the growth temperature, the surface structure of MgAl₂O₄ substrates, and the phase transition of BaTiO₃.     

Effects of substrate temperature on Bi0.8La0.2FeO3 thin films prepared by pulsed laser deposition

Bi_0.8La_0.2FeO₃ thin films on Pt/TiO₂/SiO₂/Si substrates at various substrate temperatures from 500 °C to 750 °C are prepared by pulsed laser deposition, and their microstructures and ferroelectric/magnetic properties are carefully investigated using various techniques. It is observed that the crystallographic orientation and Fe-ion valence state depend significantly on the substrate temperature, which consequently influences considerably on the ferroelectric and magnetic properties of the thin films. A considerable improvement of the ferroelectric and magnetic properties of the thin films can be achieved by optimizing the substrate temperature for deposition.     

Improved dielectric properties of chemical solution derived Pb0.5Sr0.5TiO3 thin films by a layer-by-layer annealing method

Pb_0.5Sr_0.5TiO₃ thin films were prepared on Pt/TiO₂/SiO₂/Si and LaNiO₃ (LNO)/Si substrates by using chemical solution deposition technique, and a layer-by-layer annealing method was used in an attempt to improve the dielectric properties of the thin films. The structure, dielectric, and ferroelectric properties of the thin films were investigated. Improved dielectric properties of the thin films were clearly confirmed: the dielectric constant and dielectric loss for the films on Pt/TiO₂/SiO₂/Si substrates annealed at 650 °C were 1064 and 0.027, respectively, at 1 kHz, with a dielectric tunability of more than 50%; similarly, the films prepared on LNO/Si substrates, showed a high dielectric constant of 1280 and a low dielectric loss of 0.023, at 1 kHz. P-E hysteresis loop measurements indicated that the remanent polarization and coercive field for the films on Pt/TiO₂/SiO₂/Si substrates annealed at 650 °C were 15.7 μC/cm² and 51 kV/cm, respectively.     

Enhancement of critical current density of YBa2Cu3O7 − δ thin films by self-assembly of Y2O3 nanoparticulates

YBa₂Cu₃O_7 − δ (YBCO) thin films, possessing high critical current density (J_c), have been synthesized by embedding a homogeneous array of Y₂O₃ non-superconducting nanoclusters/nanoparticles using a pulsed laser deposition technique. The size, interparticle spacing, and density of Y₂O₃ nanoparticles in YBCO thin films were tailored by varying the number of laser pulses in order to determine the optimum size for effective immobilization of vortices. Scanning transmission electron microscopy with atomic number contrast and X-ray diffraction techniques were used to determine the size and structure of the nanoparticles. Both techniques indicate that the Y₂O₃ particles are epitaxial with respect to the surrounding YBCO matrix. The information about pinning of vortices by the nanoparticles was obtained by investigating the behavior of critical current density as a function of temperature and applied field, which in turn determines the vortex density in the sample. The superconducting transition temperature (T_c) of YBCO films with the inclusion of nanoparticles was observed to remain almost the same or decrease marginally (1-2 K) with respect to T_c of pure YBCO films deposited under identical conditions. However, J_cs of YBCO films embedded with self-assembled nanoparticles were found to be significantly higher than that of pure YBCO films. The J_c enhancement was up to five times in high magnetic field, which is a key requirement for practical application of high-T_c materials.     

The influence of annealing temperatures on the properties of Bi2VO5.5/LaNiO3/Si thin films

Bi₂VO_5.5 ferroelectric thin films were fabricated on LaNiO₃/Si(100) substrate via chemical solution deposition. Ferroelectric and dielectric properties of the thin films annealed at 500-700 °C were studied. The thin film annealed at 700 °C exhibited more favorable ferroelectric and dielectric properties than those annealed at lower temperatures. The values of remnant polarization 2P_r and coercive field E_c for the film annealed at 700 °C are 10.62 µC/cm² and 106.3 kV/cm, respectively. The leakage current of the film is about 1.92 × 10^− 8 A/cm² at 6 V. The possible mechanism of the dependence of electrical properties of the films on the annealing temperature was discussed.     

Investigations of the structural, optical, and electrical properties of Pb0.8Sn0.2Te layers grown on Si(100) using BaF2/CaF2 buffer

Pb_0.8Sn_0.2Te thin films were grown on Si(100) substrates using intermediate BaF₂/CaF₂ buffer layers in a molecular beam epitaxy system. Atomic force microscopy showed that the PbSnTe films become more flat as deposition rate increases, and substrate temperature decreases. The optimal substrate temperature was found to be about 350 °C. Fourier-transform infrared spectroscopy and variable angle spectroscopic ellipsometry were used for the optical characterization of the PbSnTe films in the infrared and visible to ultraviolet range of the light, respectively. It was found that the PbSnTe film grown at about 350 °C with higher deposition rate has the most pronounced optical characteristics as well as smoothest surface. The charge carrier concentrations and mobilities of the Pb_0.8Sn_0.2Te films were determined by means of infrared spectroscopy and also using conventional Hall-effect measurements, these results were then compared and analyzed. The different values obtained using these two techniques are explained by the grain structure of the surface and by occurrence of the microcracks in the PbSnTe films. The thicker PbSnTe films have the higher values of carrier mobility.     

Optical properties of ZnO thin film on γ-LiAlO2 substrate grown by pulsed laser deposition

Optical properties were investigated of ZnO thin films grown on (100) γ-LiAlO₂ (LAO) substrates by pulsed laser deposition method. C-axis oriented ZnO film was grown on (100) LAO substrate at the substrate temperature of 550 °C. The transmittances of the films were over 85%. Peaks attributed to excitons were seen in the absorption spectra, indicating that the thin films have high crystallinity. Photoluminescence spectra were observed at room temperature; the peak at 550 nm is ascribed to oxygen vacancies in the ZnO films caused by the diffusion of Li from the substrate into the film during deposition.     

VO2 thin films deposited on silicon substrates from V2O5 target: Limits in optical switching properties and modeling

Thermochromic VO₂ thin films presenting a phase change at T_c = 68 °C and having variable thickness were deposited on silicon substrates (Si-001) by radio-frequency sputtering. These thin films were obtained from optimized reduction of low cost V₂O₅ targets. Depending on deposition conditions, a non-thermochromic metastable VO₂ phase might also be obtained. The thermochromic thin films were characterized by X-ray diffraction, atomic force microscopy, ellipsometry techniques, Fourier transform infrared spectrometry and optical emissivity analyses. In the wavelength range 0.3 to 25 μm, the optical transmittance of the thermochromic films exhibited a large variation between 25 and 100 °C due to the phase transition at T_c: the contrast in transmittance (difference between the transmittance values to 25 °C and 100 °C) first increased with film thickness, then reached a maximum value. A model taking into account the optical properties of both types of VO₂ film fully justified such a maximum value. The n and k optical indexes were calculated from transmittance and reflectance spectra. A significant contrast in emissivity due to the phase transition was also observed between 25 and 100 °C.     

Growth and characterization of Fe3O4 films

Iron oxide films were grown on sapphire substrates by pulsed laser deposition at substrate temperatures between 100 and 700 °C. X-ray diffraction, Raman spectroscopy, and vibrational sample magnetometer analysis revealed that structural and magnetic properties of the iron oxide films strongly depend on the substrate temperature during growth. Single phase Fe₃O₄ film was successfully grown on sapphire substrate at a substrate temperature of 500 °C. The saturation magnetic moment of the single phase Fe₃O₄ film is 499 emu/cm³, which is in good agreement with the value reported for bulk magnetite, suggesting the Fe₃O₄ film is of high crystal quality without antiphase boundaries.     

Synthesis and characterization of Ca3Co4O9 thin films prepared by sol-gel spin-coating technique on Al2O3(001)

Ca₃Co₄O₉ thin films are deposited on Al₂O₃(001) substrates using a sol-gel spin-coating process. X-ray diffraction shows that the film exhibits a single phase of Ca₃Co₄O₉ with the (00l) planes parallel to the film surface. The temperature dependence of magnetic susceptibility showed as expected the existence of two magnetic transitions similar to those observed in bulk samples: a ferrimagnetic and a spin-state transition around 19 and 375 K, respectively. At 5 K the magnetization curves along the c-axis of the Al₂O₃(001) show that the remanent magnetization and coercive field are close to those obtained for films grown by pulsed laser deposition, which evidences the interest to use such an easy technique to grow complex thin films oxides.