The role of Poisson's binomial distribution in the analysis of TEM images

Frank's observation that a TEM bright-field image acquired under non-stationary conditions can be modeled by the time integral of the standard TEM image model [J. Frank, Nachweis von objektbewegungen im lichtoptis- chen diffraktogramm von elektronenmikroskopischen auf- nahmen, Optik 30 (2) (1969) 171–180.] is re-derived here using counting statistics based on Poisson's binomial distribution. The approach yields a statistical image model that is suitable for image analysis and simulation.     

Nanoparticle embedded chitosan film for agglomeration free TEM images

Transmission electron microscopy (TEM) is a very useful and commonly used microscopy technique, used especially for the characterization of nanoparticles. However, the identification of the magnetic nanoparticle could be thought problematic in TEM analysis, due to the fact that the magnetic nanoparticles are usually form aggregates on the TEM grid to form bigger particles generating higher stability. This prevents to see exact shape and size of each nanoparticle. In order to overcome this problem, a simple process for the formation of well‐dispersed nanoparticles was conducted, by covering chitosan film on the unmodified copper grid, it was said to result in aggregation‐free TEM images. It is also important to fix the magnetic nanoparticles on the TEM grids, due to possible contamination of TEM filament which is operated under high vacuum conditions. The chitosan film matrix also helps to protect the TEM filament from contact with magnetic nanoparticles during the imaging process. The proposed procedure offers a quick method to fix the nanoparticles in a conventional copper TEM grid and chitosan matrix prevents agglomeration of nanoparticles, and thus getting TEM images showing well‐dispersed individual nanoparticles.     

Advances and problems with TEM characterization of Cr/CrN multilayer coatings

Multilayer Cr/CrN/Cr/Cr(N,C) and Cr/CrN with 8 and 32 layer coatings were deposited on austenite substrates using pulsed laser deposition (PLD) technique. The microstructure observations were performed using Philips CM20?, TECNAI G² F20 – TWIN? and JEOL EX4000? transmission microscopes. The performed experiments indicated that lowering the argon flow from 60 to 30 cm³/s during chromium ablation changes buffer layers microstructure from nearly amorphous to nano‐crystalline. The nitride or carbo‐nitride layers turned out to be less sensitive to changes in nitrogen flow during deposition. The columnar microstructure of Cr layers is coarser than those in CrN ones under the same deposition condition. This observation proved also that relying on PLD technique as thin as 30 nm layers might be formed within multilayer Cr/CrN coatings.     

A simple algorithm for measuring particle size distributions on an uneven background from TEM images

Nanoparticles have a wide range of applications in science and technology. Their sizes are often measured using transmission electron microscopy (TEM) or X-ray diffraction. Here, we describe a simple computer algorithm for measuring particle size distributions from TEM images in the presence of an uneven background. The approach is based on adaptive thresholding, making use of local threshold values that change with spatial coordinate. The algorithm allows particles to be detected and characterized with greater accuracy than using more conventional methods, in which a global threshold is used. Its application to images of heterogeneous catalysts is presented.     

The variogram method for characterization of scanning electron microscopy images

Some aspects of the variogram method used for characterizing the surface texture through scanning electron microscopy images are discussed. The sample case, which presents periodicity in some scale, is extensively discussed. The variogram application is studied for characterizing also the region in which the information attainment about the fractal dimension is obstructed by the presence of the minimum in the variogram due to the above-mentioned periodicity. The use of an invariant parameter at rotations is proposed to characterize the surface texture in such a region.     

Cryo-sectioning and chemical-fixing ultramicrotomy techniques for imaging rubber latex particle morphology

Two methods adapted from biological microscopy are described for a new application in imaging the morphology of rubbery latex particles. In the first method, a drop of latex is frozen in liquid nitrogen, sectioned with a diamond knife and vapour-stained with osmium tetroxide, then viewed by transmission electron microscopy. When applied to latexes made by emulsion polymerization of methyl methacrylate in a natural rubber latex seed, inclusions are clearly visible. A chemical fixation method is then described for imaging the morphology of such rubbery latex particles. Glutaraldehyde is added to the latex, followed by osmium tetroxide. The sample is then dehydrated in ethanol, epoxy resin added, and the sample cured, ultramicrotomed, and imaged with transmission electron microscopy. An inclusion morphology is again clearly seen.     

Novel techniques of preparing TEM samples for characterization of irradiation damage

Focus ion beam preparation of transmission electron microscopy (TEM) samples has become increasingly popular due to the relative ease of extraction of TEM foils from specific locations within a larger sample. However the sputtering damage induced by Ga ion bombardment in focus ion beam means that traditional electropolishing may be a preferable method. First, we describe a special electropolishing method for the preparation of irregular TEM samples from ex‐service nuclear reactor components, spring‐shaped spacers. This method has also been used to prepare samples from a nonirradiated component for a TEM in situ heavy ion irradiation study. Because the specimen size is small (0.7 × 0.7 × 3 mm), a sandwich installation is adopted to obtain high quality polishing. Second, we describe some modifications to a conventional TEM cross‐section sample preparation method that employs Ni electroplating. There are limitations to this method when preparing cross‐section samples from either (1) metals which are difficult to activate for electroplating, or (2) a heavy ion irradiated foil with a very shallow damage layer close to the surface, which may be affected by the electroplating process. As a consequence, a novel technique for preparing cross‐section samples was developed and is described.     

Complementary TEM characterization of a squeeze-cast metal-matrix composite by dissolution of the sample in butanol

Transmission electron microscopy observations of ion-beam thinned samples and samples extracted using a butanol dissolution technique gave information regarding the interface microstructure which could not be obtained from the ion-beam thinned samples, and that therefore both these sample preparation routes should be considered when observing aluminium metal-matrix composites in the transmission electron microscope.     

X‐ray microdiffraction,TEM characterization and texture analysis of human dentin and enamel

Human tooth is a complex bioceramic composite, which consists of enamel, dentin and the interface, the dentin–enamel junction (DEJ). The crystal properties and ultrastructure of the inorganic phase through the thickness of healthy human molar teeth were investigated using X‐ray microdiffraction (μXRD), electron diffraction and transmission electron microscopy (TEM) techniques. The XRD data were analysed using the Le Bail profile fitting approach. The size and the texture of the crystallites forming enamel and dentin in the crown part of teeth were measured using both techniques and then compared. Results showed that the thickness of dentin crystallites was found to decrease towards the DEJ, whereas the thickness of the enamel crystallites increased from the DEJ towards the outer layers. It was demonstrated that enamel exhibited an increase of texture in 002 lattice planes from the DEJ towards the outer layers. Texture was also detected in 102 lattice planes. The texture effect in 002 planes at the scale of less than 1 μm was also demonstrated in dentin. The variation of lattice parameters as a function of the position within the thickness of dentin and enamel was also observed. The values of the nonuniform microstrain in the dentin and enamel crystallites were from 1.40 × 10^?6% to 4.44 × 10^?5%. The good correlation between XRD and TEM indicated that μXRD is a useful technique to study crystallography and microstructure of heterogeneous enamel and dentin. The observed gradient characteristics of texture and crystallite size in enamel and dentin maybe an evolutionary outcome to resist wear and fracture, thereby contributing to the excellent mechanical properties of teeth.     

Preparation of cross-sectional TEM samples with observable thin sections at desired regions of non-uniform surfaced semiconducting devices

Transmission electron microscopy of cross-sectional samples offers an attractive means to study process evaluation and failure analysis of many semiconducting devices. In the present work, a technique to prepare cross-sectional TEM samples, containing thin sections of specifically desired regions within nonuniform surfaced semiconducting devices, is described.     

On the use of TEM cells for the calibration of power frequency electric field meters

This paper focuses on the performances of TEM cells when used in the calibration of power frequency environmental electric field meters. The spatial non-uniformity of the electric field inside a TEM cell is analyzed through experimental investigations and three-dimensional Boundary Element modeling to evaluate the field experienced by the sensing elements of actual 3D meter probes. The perturbation caused by the probe support is also taken into account. The uncertainty component associated with the spatial non-uniformity in the volume taken up by typical power and low frequency field probes is estimated. The field non-uniformity is also evaluated in relation to the use of TEM cells of reduced size. Finally, the field non-uniformity is exploited to predict the performance of an actual field meter operating in significant field gradients.     

金属橡胶减振器在同轴两反空间相机中的应用

为了减少振动对同轴两反空间相机的影响,研究了金属橡胶减振结构及同轴两反空间相机的随机振动响应.分析金属橡胶结构的力学模型,研制出串联金属橡胶减振结构,建立空间相机的有限元模型并进行模态分析和随机振动响应分析;最后,通过正弦扫频试验和随机振动试验验证有限元分析的准确性.试验结果表明,装配有金属橡胶减振器的同轴两反空间相机...     

一种合成孔径声呐图像目标分割方法

合成孔径声呐图像的信噪比低于普通光学图像,使图像分割成为合成孔径声呐图像处理中的重要环节。本文研究了表示合成孔径声呐图像数据分布的瑞利混合模型,结合马尔科夫随机场模型,将其应用于声呐图像水下目标(亮区)分割;通过最大期望算法分别估计目标和背景的瑞利混合模型参数,并利用该参数使用Graph cut方法进行马尔科夫随机场图像分割,通过重复迭代,最后形成稳定的目标分割结果;对实际的声呐图像进行了数据分析及目标分割,结果表明瑞利混合模型在描述合成孔径声呐声图上有良好的性能,可以改善目标分割的效果。     

TEM纳米尺度石墨标样的制备

透射电镜的长度标尺或公称放大倍数是判断试样中组织细节尺寸的依据,需要应用纳米级长度标样进行校准。本文介绍了一种用石墨制备透射电镜专用纳米尺度标样的方法,对石墨的X射线衍射分析以及对石墨标样的TEM高分辨像和电子衍射分析表明,标样中石墨的高分辨像为（002）晶面的点阵像,其晶面间距为0．342nm,可作为纳米尺度的参照材料。本文对使用纳米尺度标样校正ETEM标尺的基本方法进行了简要讨论。     

Segmentation of scanning electron microscopy images from natural rubber samples with gold nanoparticles using starlet wavelets

Electronic microscopy has been used for morphology evaluation of different materials structures. However, microscopy results may be affected by several factors. Image processing methods can be used to correct and improve the quality of these results. In this article, we propose an algorithm based on starlets to perform the segmentation of scanning electron microscopy images. An application is presented in order to locate gold nanoparticles in natural rubber membranes. In this application, our method showed accuracy greater than 85% for all test images. Results given by this method will be used in future studies, to computationally estimate the density distribution of gold nanoparticles in natural rubber samples and to predict reduction kinetics of gold nanoparticles at different time periods. Microsc. Res. Tech. 77:71–78, 2014. © 2013 Wiley Periodicals, Inc.     

新方法制备透射电镜粉末样品

尝试一种新的方法制备了SiC粉末的透射电镜样品,并利用H－800型透射电子显微镜对SiC粉末样品进行了观察。     

Structural characterization of TiN/NbN multilayers: X-ray diffraction, energy-filtered TEM and Fresnel contrast techniques compared

Two TiN/NbN multilayers with wavelength 13.6 and 6.15 nm have been characterized by X-ray diffraction (XRD), Fresnel contrast analysis (FCA) and energy-filtered transmission electron microscopy (EFTEM). Good agreement between the composition profile obtained by FCA and EFTEM is obtained if the lower resolution of the EFTEM images is taken into account. The relative advantages and disadvantages of the techniques are discussed. Used together the two TEM techniques provide a quantitative characterization that is consistent with, and for some parameters provides more precise values than, that from XRD. The analysis shows that the multilayers have narrow interfaces (< 1 nm) and a composition amplitude close to 95% for the longer wavelength.     

The substructure of quasicrystalline Al-Mn alloy observed by TEM

The morphology of the icosahedral phase in Al₈₆Mn₁₄ alloy has been observed as flower-like and of granular shape by TEM. These two kinds of morphologies may be regarded as the different sections of a three-dimensional flower-like grain. Inside these grains, a fine substructure of a few nm in size has been found. A dendritic morphology with a diffraction pattern showing five-fold symmetry have also been observed in the Al₈₆Mn₁₄ alloy. On the basis of these observations, a model based on nucleation, growth and aggregation has been proposed to explain the formation process of the quasicrystalline state.