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1.
图形反转工艺用于金属层剥离的研究   总被引:1,自引:0,他引:1  
研究了AZ-5214胶的正、负转型和形成适用于剥离技术的倒台面图形的工艺技术.用扫描电镜和台阶仪测试制作出的光刻胶断面呈倒台面,倾角约为60°,胶厚1.4μm.得到了优化的制作倒台面结构的光刻胶图形的工艺参数:匀胶转速4 000 r/min,前烘温度100 ℃,时间60 s,曝光时间0.3 s,反转烘温度110℃,时间90 s,泛曝光时间2 s,显影时间50 s.用金相显微镜测试了在优化工艺参数条件下制作的光刻胶图形的分辨率,同时对图形反转机理进行了讨论.  相似文献   

2.
BG-101J分步光刻机检测记录(二)倍率误差检测一、工艺过程及条件前烘温度:90℃光刻胶:KTI820曝光当量:1200显影温度:20.5℃机器温度:20℃±0.2℃气压前烘时间:20分钟胶厚:1.2μm显影时间:45s日期:94.12.9湿度:4...  相似文献   

3.
BG-101J分步光刻机检测记录(一)实用分辨率检测一、工艺过程及条件前烘温度:90℃光刻胶:KTI820曝光当量:1200显影温度:21℃测试人:李威前烘时间:20分钟胶厚:1.2μm显影时间:45s日期:1994.12.9.二、分辨率检测版名称G...  相似文献   

4.
AZ4620是一种广泛应用于微系统制作的正性光刻胶。高温改性后的AZ4620在紫外曝光时光照部分不再发生光化学反应,基于这样的材料特性,以220℃高温硬烘30 min获得改性的无光敏性的光刻胶,通过Plasma氧刻蚀制作出底层结构,再在底层结构表面涂胶采用多次曝光和显影制作出具有三层微结构的光刻胶模具,利用模塑法制作聚合物PDMS芯片。对光刻胶高温硬固工艺进行分析,对产生回流、残余应力、气泡等问题进行理论分析和实验研究,优化了模具加工工艺。采用多次喷涂,Plasma氧处理改善浸润性,高温硬烘0.5℃/min的升温速率得到了质量较好的多层光刻胶模具,为利用正性厚胶制作多层微结构提供了新的方法。  相似文献   

5.
研究了一种利用光刻胶的回流特性去除表面的磨痕,使其表面平整化的方法,结合牺牲层结构可以非常简便地制备出微机电器件中各种悬臂梁结构。着重研究了光刻胶的前烘胶温度、回流温度、回流时间对回流效果的影响。通过大量的实验得到了较好的回流工艺,即光刻胶90℃下60min前烘后,并在90℃下回流60min,不但能通过机械抛光准确控制减薄厚度,而且还可以完全除去其表面的磨痕,获得平滑的表面结构。  相似文献   

6.
0611622 微流控芯片金属模具制备工艺研究[刊,中]/李建华//微细加工技术.-2005,(4).-56-58,75(D) 为了解决SU-8光刻胶电铸金属模具中遇到的光刻胶脱落和电铸后去胶难等同题,提出了采用硅橡胶 (PDMS)微复制与电铸毛细管电泳芯片金属模具相结合的新工艺。该方法首先用SU-8光刻胶制备通道阳  相似文献   

7.
烘焙工艺条件对厚胶光刻面形的影响   总被引:6,自引:1,他引:5  
采用厚层正性光刻胶AZ P4620进行光刻实验,考察了在前烘和坚膜阶段不同的工艺参数条件下的光刻胶浮雕面形的变化.实验表明,完全显影后光刻胶的浮雕面形受前烘工艺参数的影响很小,但其显影速率有一定差别;当坚膜烘焙后,不同前烘条件下的浮雕面形差别较大;当前烘条件相同时,坚膜参数的变化对光刻胶的浮雕面形影响较大.由此得出,在前烘阶段应采取较高温度、较短时间的烘焙,而在坚膜阶段应采取较低温度、较长时间的烘焙,这样可提高厚胶光刻面形的质量.  相似文献   

8.
本文介绍利用普通接触式曝光系统和等离子刻蚀机来制作亚微米线条。基本工艺是用深紫外线作为光源,对曝光后的光刻胶在HMDS或TMDS气氛下加热处理,然后采用氧反应离子刻蚀,结果可得到0.7微米的光刻胶线条,其端面完整、侧壁陡直,非常适合于大规模集成电路制造中的剥离工艺。  相似文献   

9.
采用大规模集成电路的多次掩模光刻和刻蚀技术制作二元光学元件阵列是较为传统和实用的制作方法,其工艺过程主要包括:利用光刻技术将设计的掩模版图形转印到有光刻胶的衬底表面;利用刻蚀技术将光刻胶的图形转移到衬底表面,形成所需的表面浮雕结构.在工艺中,光刻胶的行为和特性对衬底的最终图形有着极为重要的作用.光刻和刻蚀两道工序都要求实际图形与掩模版的图形达到很高的一致性,这样才能实现元件被高保真地制作到衬底上.在整个工艺过程中,由于不同光刻胶在甩胶、前烘、曝光、显影、坚膜、刻蚀或腐蚀等工艺中表现不同的行为特性:附着性、均匀性、边缘效应、分辨率、感光度、高温形变、耐刻蚀性等等,使得所制作的器件性能有较大的区别.本文详细研究了不同光刻胶在不同工艺过程中的行为.在二元光学元件的制作中,通过选用不同的光刻胶:在第一次光刻刻蚀台阶较深时,选择粘度系数较大,高感光度,耐刻蚀的厚胶;在套刻中,刻蚀台阶较浅时,选用高分辨率、高陡直度、耐高温的薄胶,最终制作出了性能良好的二元光学元件.(OD2)  相似文献   

10.
简要介绍了利用深反应离子刻蚀制作折叠波导慢波结构的现状及制作的工艺流程。对深反应离子刻蚀掩膜制作即光刻工艺,以及折叠波导慢波结构的深刻加工进行了深入的研究。详细分析了各光刻工艺对光刻胶图形的影响,尤其是前烘对光刻胶图像侧壁垂直度的影响;在深反应离子刻蚀中,还详细分析了刻蚀时间、下电极功率以及刻蚀气体气压对刻蚀结果的影响。经参数优化后获得最佳工艺参数,并制作出带有电子注通道的W波段折叠波导慢波结构,慢波结构深为946μm,侧壁垂直度为91°,电子注通道深为225μm,侧壁垂直度为90°。  相似文献   

11.
DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.  相似文献   

12.
From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.  相似文献   

13.
The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.  相似文献   

14.
The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.  相似文献   

15.
Today, micro-system technology and the development of new MEMS (Micro-Electro-Mechanical Systems) are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.  相似文献   

16.
Waveguide multilayer optical card (WMOC) is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling & processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic (VB) language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor.  相似文献   

17.
This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel's.  相似文献   

18.
The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well.  相似文献   

19.
Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems.  相似文献   

20.
An insert layer structure organic electroluminescent device(OLED) based on a new luminescent material (Zn(salen)) is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn(salen)/Liq/LiF/A1/CuPc/NPD/Zn(salen)/Liq/LiF/A1. Effective insert electrode layers comprising LiF(1nm)/Al(5 nm) are used as a single semitransparent mirror, and bilayer cathode LiF(1 nm)/A1(100 nm) is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect.  相似文献   

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