一种高精度超低功耗基准电压源

提出了一种超低功耗、无BJT的基于亚阈值CMOS特性的基准电压源。采用正负温度系数电流求和的方式来获得与温度无关的电流,再转换成基准电压;采用共源共栅电流镜来提高电源电压抑制比和电压调整率。基于SMIC 0.18 μm CMOS工艺进行仿真,结果表明,在-20℃~135 ℃温度范围内,温漂系数为2.97×10-5/℃;在0.9~3.3 V电源电压范围内,电压调整率为0.089%;在频率为100 Hz时,电源电压抑制比为-74 dB,电路功耗仅有230 nW。     

一种高性能的亚阈值基准电压源设计

本文给出了一种基于亚阈值MOS特性的基准电压源.通过使用线性区工作的MOS管代替传统电阻来消除掉迁移率和电流的温度影响,拓宽了温度范围,改善了性能.采用0.5μmCMOS工艺进行仿真.结果表明电路能在2.5～8V范围内工作,线性调整率为0.3mV/V.在3.3V工作电压下,输出基准在-55℃到150℃温度范围内温度系数为7.3ppm/℃,静态功耗为13.8μW,1kHz下电源抑制比为-53dB.该基准电压源的设计能满足宽温度范围、低温漂、低功耗和高电源抑制比的要求.     

一种亚阈值MOS管低功耗基准电压源

设计了一种基于亚阈值区MOS管的低功耗基准电压源。利用MOS管差分对的栅源电压差对MOS管的栅源电压进行温度补偿,从而得到基准输出电压。采用0.18 μm 混合信号CMOS工艺进行设计与仿真。结果表明,该基准电压源的最小工作电压为1.25 V,在0 ℃~80 ℃温度范围内的温度系数为6.096×10-5/℃。     

一种超低功耗基准电压源设计

设计了一种用于超低功耗线性稳压器电路的基准电压源,研究了NMOSFET阈值电压的温度特性。采用耗尽/增强型电压基准结构,显著降低了功耗。采用共源共栅型结构,提高了电源抑制比。设计了数模混合集成熔丝修调网络,优化了输出电压精度和温漂。电路基于0.35μm CMOS工艺实现。仿真结果表明,在2.2~5.5 V输入电压下,基准电压为814 mV,精度可达±1%。在-40℃~125℃范围内,温漂系数为2.52×10-5/℃。低频下,电源抑制比为-99.17 dB,静态电流低至27.4 nA。     

超低功耗亚阈值CMOS电压基准电路

采用SMIC 0.18μm CMOS工艺,设计了一种基于亚阈值MOS管的超低功耗、低温度系数的全CMOS电压基准电路。电路可在0.6~5V的工作电压范围内工作,当工作电压为1V时,功耗为1.12nW。在-20℃~80℃温度范围内,电路的最低温度系数为2.7×10-6/℃。在无片外滤波电容的情况下,电路的电源抑制比在100Hz和10MHz时分别为-56dB和-45dB。     

一种高性能的亚阈值CMOS电压基准

基于0.18 μm CMOS工艺设计了一种高性能的亚阈值CMOS电压基准。提出了一个电压减法电路,将两个具有不同阈值电压且工作在亚阈值区晶体管的栅源电压差作为电压基准输出。所提出的电压减法电路还可以很好地消除电源电压变化对输出基准的影响。后仿仿真结果表明,所设计的电压基准在0.55~1.8 V电源电压范围内,线性灵敏度为0.053%/V~0.121%/V;在-20 ℃~80 ℃范围内,温度系数为9.5×10-6/℃~3.49×10-5/℃;在tt工艺角、0.55 V电源电压下,电源抑制比为-65 dB@100 Hz,功耗为3.7 nW。芯片面积为0.008 2 mm²。该电路适用于能量采集、无线传感器等低功耗应用。     

一种低功耗亚阈值全MOS管基准电压源的设计

分析了工作在亚阈值区、线性区和饱和区的MOS晶体管不同电流特性,设计了一种低功耗全MOS基准电压源电路。使用工作在线性区的MOS晶体管代替普通常规电阻,使整个电路实现全MOS基准源的特性,同时有效减小电路芯片面积,并且输出基准电压为线性区MOS管提供偏压以进一步降低功耗。基于SMIC 0.18μm CMOS工艺设计电路。仿真结果表明此电路在1.8 V电源电压下,–50~+150℃的温度系数为22.6×10–6/℃,基准电压源输出电压约为992 m V,25℃时静态电流为327.3 n A,电路总静态功耗为0.59μW,10 k Hz时的电源抑制比为–25.36 d B。     

一种新型的CMOS亚阈值低功耗基准电压源

利用工作于亚阈值的NMOS器件,产生两个负温度系数的电压源,然后将两个电压源作差,产生稳定的基准电压输出.整体电路采用HJTCl80 nrn标准CM（）S工艺实现.仿真结果表明,基准源输出电压为220 mV,在一25℃到100℃的温度范围内的温度系数为68×10^-6/ C.电路的最小供电电压可低至O.7 V,在供电电压O.7～4V范围内的线性调整率为1.5 mV/V.无滤波电容时,1 kHz的电源抑制比为-56 dB室温下,1.O V电压供电时,电路总体功耗为3.7μW.版图设计后的芯片核心面积为O.02 mm².本文设计的电压源适用于低电压低功耗的条件.     

一种具有高电源抑制比的低功耗CMOS带隙基准电压源

文章设计了一种适用于CMOS工艺的带隙基准电压源电路，该电路采用工作在亚阈值区的电路结构，并采用高增益反馈回路，使其具有低功耗、低电压、高电源电压抑制比和较低温度系数等特点。     

高电源抑制比低温度系数超低功耗基准电压源

在0.18 μm标准CMOS工艺模型下,利用亚阈值及深线性区MOS管的特性,设计了一种新颖的偏置电流产生电路,并采用此电路设计出一种具有高电源抑制比、低温度系数的全MOS型基准电压源。该电压源采用全MOS结构,不使用电阻,功耗超低。电源电压在0.9~3 V变化时,该电压源均可正常工作,输出电压约为558 mV。1.2 V电源电压下,在－55 ℃~100 ℃温度范围内,该电压源的温度系数为2.3×10-5/℃,低频电源抑制比为－81 dB,总功耗约为127 nW。     

High speed interconnect through device optimization for subthreshold FPGA

Field programmable gate array (FPGA) consumes a significant amount of static and dynamic power due to the presence of additional logic for providing more flexibility as compared to application specific integrated circuits (ASICs). The fabrication cost of ASICs is rising exponentially in deep submicron and hence it is important to investigate different techniques for reducing FPGA power consumption so that they can also be employed in place of ASICs in portable energy constrained applications. It is also important to investigate the possibility of extending the use of FPGA even to subthreshold region for ultra low power (ULP) applications. Interconnect resources of an FPGA consumes most of the chip power, area and also determines the overall circuit delay. Subthreshold circuits show orders of magnitude power saving over superthreshold circuits. Improving the performance of subthreshold circuits is a main design challenge at the circuit and device levels to spread their application area. This paper proposes to improve the performance of subthreshold FPGA in terms of delay and switching energy by optimizing and operating interconnect drivers in the near threshold operating region. The possibility of inserting repeaters and the suitability of CNT as an interconnect in the subthreshold region are also explored. The simulation of FPGA interconnect resources using the proposed technique shows 67%, 73.33% and 61.8% increase in speed and 35.72%, 39% and 35.44% reduction in switching energy for Double, Hex and Long interconnect segments, respectively, over the conventional one.     

一种CMOS带隙基准电压源设计

为了满足IC设计中对基准电源低功耗、低温度系数、高电源抑制比的要求,设计一种带隙基准电压源电路.在对传统带隙基准结构分析的基础上,该电路重点改善基准源中运算放大器的性能,采用台积电0.35μm CMOS工艺库设计并绘制版图.仿真结果表明,温度在0～100℃之间变化时,该电路输出电压的温度系数小于10 ppm/℃,并且具有低功耗、高电源抑制比的特性.     

高电源抑制比带隙基准电压源的设计

提出一种采用0.25 μm CMOS工艺的低功耗、高电源抑制比、低温度系数的带隙基准电压源(BGR)设计.设计中,采用了共源共栅电流镜结构,运放的输出作为驱动的同时也作为自身电流源的驱动,并且实现了与绝对温度成正比(PTAT)温度补偿.使用Hspice对其进行仿真,在中芯国际标准0.25 μm CMOS工艺下,当温度变化范围在-25～125℃和电源电压变化范围为4.5～5.5 V时,输出基准电压具有9.3×10-6 V/℃的温度特性,Vref摆动小于0.12 mV,在低频时具有85 dB以上的电源电压抑制比(PSRR),整个电路消耗电源电流仅为20μA.     

Design of Bandgap Reference in Switching Power Supply

A bandgap voltage reference is designed to meet the requirements of low power loss,low temperature coefficient and high power source rejection ratio(PSRR) in the intergrated circuit.Based on the analysis of conventional bandgap reference circuit,and combined with the integral performance of IC,the specific design index of the bandgap reference is put forward.In the meantime,the circuit and the layout are designed with Chartered 0.35 μm dual gate CMOS process.The simulation result shows that the coefficient is less than 30ppm/℃ with the temperature from -50℃ to 150℃. The bandgap reference has the characteristics of low power and high PSRR.     

一种10-ppm/~oC低压CMOS带隙电压基准源设计

在对传统CMOS带隙电压基准源电路分析和总结的基础上,综合一级温度补偿、电流反馈和电阻二次分压技术,提出了一种10-ppm/oC低压CMOS带隙电压基准源。采用差分放大器作为基准源的负反馈运放,简化了电路的设计,放大器的输出用于产生自身的电流源偏置,提高了电源抑制比(PSRR)。整个电路采用TSMC 0.35mm CMOS工艺实现,采用Hspice进行仿真,仿真结果证明了基准源具有低温度系数和高电源抑制比。     

Low-voltage nanopower clock generator for RFID applications

The design of an on-chip RC-based oscillator, implemented in a standard BiCMOS process, without any external component, is presented. The proposed oscillator provides a clock signal at a frequency of 50 kHz with a temperature coefficient smaller than 0.3%/^°C over a temperature range from 0 to , without any external trimming. The proposed oscillator operates with a supply voltage of 0.8 V and has a power consumption of at room temperature. The chip area is .     

一种带输出缓冲的低温度系数带隙基准电路

基于TSMC 0.18μm标准CMOS标准工艺,提出了一种低温度系数,宽温度范围的带隙基准电压电路,该电路具有高电源抑制比,启动快及宽电源电压工作区域的优点,由于具备输出缓冲,可提供较低的输出阻抗及较高的电流负载能力.电路在-40℃到 110℃的温度变化范围内,基准电压为2.302 0 V±0.001 5 V,温度系数仅为7.25×10-6/℃(-40℃到 110℃时),PSRR为64 dB(11 kHz处),电源电压变化范围为1.6～4.3 V,输出噪声为5.018μV/平方根Hz(1 kHz处).     

A 90nm Passive RFID Tag's Custom Baseband Processor for Subthreshold Operation Below 0.3V

In the design of passive Radio frequency (RF) tags' baseband processor, subthreshold timing and wide-range-Process, voltage and temperature (PVT) varia-tion problems are the bottlenecks to extend the tag's work-ing range. A sophisticated processor is presented based on the EPC and ISO protocol. Power-aware ideas are applied to the entire processor, including data link portions. In-novatively, a novel custom ratioed logic style is adopted in critical logic paths to fundamentally speed up the cir-cuit operations at ultra-low-voltage. The proposed base-band processor was fabricated in 90nm CMOS, another baseband processor design by regular standard-cell-based design flow was also fabricated for comparison. In mea-surement the proposed design indicates good robustness in wide-range supply and frequency variation and much more competent for subthreshold operation. It can oper-ate at minimum 0.28V supply with power consumption of 129nW.