一种基于神经网络的模拟电路故障诊断方法

提出了一种基于模拟电路故障诊断的神经网络方法。这种方法利用小波分解、数据标准化、主成分分析对输入数据进行预处理,采用k个神经元输出的前馈神经网络结构进行有效训练。该方法检测和识别故障准确率高,系统的鲁棒性和稳定性强。     

一种基于神经网络的模拟电路故障诊断方法

模拟电路故障诊断一直是一项富有挑战性的研究课题。文章在简要介绍BP神经网络基本原理的基础上,以差分放大电路为例,设计并实现了基于BP算法的模拟电路故障诊断方法,建立了模拟电路故障诊断BP神经网络模型。实验表明,该模型的辨识精度高,能实现对模拟电路故障的正确诊断。     

模拟电路故障诊断的双重扰动支持向量机集成方法

为进一步提高模拟电路故障诊断准确率,提出一种特征和模型参数双重扰动的集成支持向量机新算法.首先在集合覆盖思想下设计基于混沌蚁群算法的属性约简算法将特征样本空间划分成若干子空间,然后针对每个子空间,在"低偏差区域"内进行模型参数扰动,经过两次多数投票法得到最终集成结果.故障诊断实例表明,该方法比多分类支持向量机、Attribute Bagging(AB)算法、Bagging方法等具有更好的故障诊断率.     

基于蚁群支持向量机的模拟电路故障诊断

针对人为选择支持向量机参数的随机性和盲目性,将蚁群算法的全局收敛和并行计算的特点引入到支持向量机参数的优化中,建立了基于蚁群算法优化支持向量机参数的模型,使两种算法的优点有机结合,通过对支持向量机的惩罚因子和核函数参数进行优化,使支持向量机分类效果达到最好,并与遗传支持向量机模型比较,结果表明:蚁群算法优化支持向量机参...     

Soft Fault Feature Extraction in Nonlinear Analog Circuit Fault Diagnosis

Aiming at the problem to diagnose soft faults in nonlinear analog circuits, a novel approach to extract fault features is proposed. The approach is based on the Wigner–Ville distribution (WVD) of the subband Volterra model. First, the subband Volterra kernels of the circuit under test are cleared. Then, the subband Volterra kernels are used to obtain the WVD functions. The fault features are extracted from the WVD functions and taken as input data into the hidden Markov model (HMM). Finally, with classification of features using HMMs, the soft fault diagnosis of the nonlinear analog circuit is achieved. The simulations and experiments show that the method proposed in this paper can extract the fault features effectively and improve the fault diagnosis.     

紧致型小波网络在模拟电路故障诊断中的应用

提出了一种新的基于紧致型小波神经网络的模拟电路故障诊断方法。该法首先利用小波包变换对故障信号进行预处理,减少了紧致型小波神经网络的输入数目,简化了紧致型小波神经网络结构,然后对紧致型小波神经网络进行训练和测试。仿真试验表明,该方法比普通BP神经网络方法训练速度更快,诊断准确率更高,容错能力强,非常适用于模拟电路故障诊断。     

一种基于小波-神经网络的模拟电路故障诊断方法

小波分析具有数据压缩和特征提取的特性,神经网络具有非线性映射和学习推理的优点。结合两者的特点,提出了一种基于小波与神经网络的模拟电路故障诊断方法,该方法用小波变换对电路响应信号进行特征提取,从而简化神经网络的结构,降低计算的复杂度,加快了训练速度。对实例仿真表明,该法能有效地对模拟电路进行故障诊断。     

模拟电路故障诊断的结点电压灵敏度比值法

在证明线性电路中结点电压变化量比值等于结点电压灵敏度比值的基础上,提出了结点电压灵敏度比值法,通过结点电压变化量比值和结点电压灵敏度比值的比对确定电路的故障元件。理论分析和实验结果表明,该方法算法简单、诊断速度快,在可测点受限条件下具有较高的诊断精度,特别适合大规模线性模拟电路的故障诊断和测试。     

An Analog Circuit Fault Characterization Methodology

A methodology for diagnosing and characterizing multiple faults in analog circuits, and results from applying this methodology to a real circuit is presented. Our method is a novel combination of a Simulation Before Test (SBT) and Interpolation After Test (IAT) methodology. Our method uses the classical SBT concept of a fault dictionary database constructed before test. It also uses a method of IAT that consists in using the measurements to guide an interpolation algorithm to effectively increase the local resolution of the fault dictionary database and thereby yield the most likely test parameter value. Our methods underlying principle is to characterize the fault-free and faulty circuit cases by their impulse responses obtained by simulation and subsequently stored in a fault dictionary database. The method uses the technique of Lagrange interpolation to resolve the faults between the fault dictionary database entries and the actual measurements. Our experimental results reveal that the method is effective for characterizing faults when the simulations match the measurements sufficiently. Consequently, the methods effectiveness depends highly on the quality of the models used to build the dictionary as well as on the accuracy of the measurements.Yvan Maidon was born in Bordeaux, France. He received the M.Sc degree in (electronics) applied physics from the University of Bordeaux, in 1980. He is currently Head of the Department for Applied Sciences in Electrical and Electronic Engineering at the University of Bordeaux 1. His special research interests include failure analysis and relaibility of analog circuits. He has also developed original BICS for mixed circuits and SoC testing.Thomas Zimmer is currently Professor at the University of Bordeaux 1. He received the M.Sc. degree in physics from the University of Würzburg, Germany, in 1989 and the Ph.D. degree in electronics from the University of Bordeaux 1, France, in 1992. His research interests include characterization and modeling of high frequency bipolar devices. He has authored and co-authored about 70 scientific and technical publications including several book chapters. He is also co-founder of the start-up company XMOD.André Ivanov is Professor in the Department of Electrical and Computer Engineering, at the University of British Columbia. Prior to joining UBC in 1989, he received his B.Eng. (Hon.), M. Eng., and Ph.D. degrees in Electrical Engineering from McGill University. In 1995–96, he spent a sabbatical leave at PMC-Sierra, Vancouver, BC. He has held invited Professor positions at the University of Montpellier II, the University of Bordeaux I, and Edith Cowan University, in Perth, Australia. His primary research interests lie in the area of integrated circuit testing, design for testability and built-in self-test, for digital, analog and mixed-signal circuits, and systems on a chip (SoCs). He has published widely in these areas and holds several patents in IC design and test. Besides testing, Ivanov has interests in the design and design methodologies of large and complex integrated circuits and SoCs. Ivanov has served and continues to serve on numerous national and international steering, program, and/or organization committees in various capacities. Recently, he was the Program Chair of the 2002 VLSI Test Symposium (VTS 02) and the General Chair for VTS 03 and VTS 04. In 2001, Ivanov co-founded Vector 12, a semiconductor IP company. He has published over 100 papers in conference and journals and holds 4 US patents. Ivanov serves on the Editorial Board of the IEEE Design and Test Magazine, and Kluwers Journal of Electronic Testing: Theory and Applications. Ivanov is currently the Chair of the IEEE Computer Societys Test Technology Technical Council (TTTC). He is a Golden Core Member of the IEEE Computer Society, a Senior Member of the IEEE, a Fellow of the British Columbia Advanced Systems Institute and a Professional Engineer of British Columbia.     

现代模拟电路故障诊断新方法

介绍了模拟电路故障诊断技术的发展历史及现状，探讨了基于专家系统、神经网络、模糊理论、小波变换等理论的模拟电路故障诊断新理论和新方法。同时，重点介绍上述各种方法的基本原理和优缺点，分析存在的问题，最后指出了模拟电路故障诊断技术的发展趋势。     

基于GA-LMBP算法的模拟电路故障诊断方法

主要分析遗传算法和BP神经网络的特点和存在的一些缺陷,研究遗传算法和改进型的BP算法相结合的相关技术,设计并实现一个基于遗传算法和LMBP算法相结合的GA—LMBP算法。通过诊断实例．比较三种算法的模拟电路故障诊断,结果证明在相同精确度的要求下,基于GA—LMBP的算法可以大大提高模拟电路故障诊断准确率。     

现代模拟电路智能故障诊断方法研究与发展

对系统可靠性和经济性要求的提高使得模拟电路故障诊断的重要性日益凸显。首先在介绍了模拟电路故障原因及分类的基础上,详细分析了模拟电路故障诊断的特点。针对传统诊断方法的不足之处,介绍了基于人工智能和现代信息信号处理的现代故障诊断方法,包括专家系统诊断方法、神经网络诊断方法、模糊诊断方法和基于核的诊断方法,同时系统地分析了每种方法的基本原理、优缺点、研究进展和典型应用。最后探讨了目前模拟电路故障诊断研究存在的问题和未来的发展方向。     

基于网格搜索的改进SVM模拟电路故障诊断方法

针对模拟电路故障识别与诊断问题,提出了一种基于K最近邻的一对一SVM分类器(KNN-OSVM)的故障诊断方法。将K最近邻算法与用网格搜索法优化后的一对一SVM模型相结合,建立KNN-OSVM模型,有效解决了SVM因存在不可分域造成的误分问题,提高了故障诊断率。采用小波分析法提取输出端电压信号作为故障特征值,采用网格搜索对核函数、惩罚参数寻优。采用两个模拟电路进行仿真实验,并将改进的SVM与传统SVM进行对比。结果证明了该故障诊断方法的可行性。     

基于KPCA和类峰值特征的模拟电路诊断方法

针对传统的核主成分分析方法(KPCA)无法解决在故障样本交叠严重时多分类性能较差的问题,提出一种基于改进KPCA的特征提取和类峰值特征辅助识别分类相结合的模拟电路故障诊断方法.在预处理阶段,提出了一种图像混合欧氏距离用于建立核函数,进行核主成分分析特征提取,克服了传统KPCA的局限性;并且设计了一种用类峰值特征识别的方...     

模拟电路故障实时诊断的滤波器方法

本文讨论了一种模拟电路故障实时诊断的滤波器方法,该方法首先用状态空间模型来描述模拟电路,然后利用强跟踪滤波器对模型进行状态与参数联合估计,再利用修正的Bayes分类算法对故障进行检测与分离,从而实现故障的实时诊断.实验结果证明了本方法是有效的.     

基于DSP的模拟电路诊断系统的实现

以现代测试技术、信号处理、信息融合等理论为基础,以神经网络在模拟电路故障诊断中的应用为主线,深入研究了模拟电路的故障特征提取和故障诊断方法。用TMS320F2812对选定的待测电路在元件存在容差的条件下,实现了模拟电路软故障诊断。验证了使用DSP实现模拟电路故障诊断系统的可行性。     

基于PCA和PNN的模拟电路故障诊断

为了解决模拟电路故障识别困难的问题,提出一种基于主成分分析和概率神经网络的模拟电路故障诊断方法。该方法对采集到的模拟电路故障信息进行特征提取,将提取的故障特征归一化处理后输入概率神经网络,进行训练和故障模式的分类识别。实验结果表明,该方法是有效的,具有较高的故障诊断率。     

模拟电路故障诊断的神经网络优化方法综述

对故障诊断和模拟电路的特点做了简要介绍,分析了故障诊断的现状和相关研究方法。针对目前用于模拟电路故障诊断的神经网络,阐述了优化神经网络的方法--小波变换、遗传算法、模糊理论、粒子群算法和聚类算法等,并对未来的发展方向进行了展望。     

模拟电路的多频灵敏度故障诊断方法

文章在灵敏度故障诊断方法的基础上提出多频灵敏度参数识别故障诊断方法，并给出选择测试频率的一般原则。该方法能够适用于可及测试节点较少的电路。针对模拟电路中一般只存在部分元件故障的情况，进一步提出只识别部分故障元件参数的多频灵敏度故障诊断方法，使该方法能适用于更大规模的电路。电路仿真结果验证了所提方法的有效性。