聚光系统对显微物镜杂光测量影响的分析与实验

显微物镜通常采用部分相干照明,测量它的杂光时,有必要研究照明系统的影响。实验表明,对于中、低倍物镜来说,当照明系统的数值孔径变化时,物面相干性变化对显微物镜杂光测量的影响可以忽略,从而可以采用积分球面扩展光源去测量它们的杂光系数。文中对相关的问题进行了分析讨论。     

显微物镜杂散光测试技术研究

本文介绍了一种测量显微物镜杂散光的原理和装置。并讨论了影响杂散光测试的因素。文中列出一些国内外显微物镜杂散光系数实测结果,并作了初步分析。     

杂光系数测量装置的改进与测试条件标准化的探讨

照相物镜一类光学系统杂光系数的测量与评价,现在更加引起了人们的重视,它与光学传递函数、分光透过率、畸变一起,成为评价光学系统性能的主要项目。     

大数值孔径物镜的波像差测量及其特殊问题

设计了基于振幅型棋盘光栅的二维剪切干涉仪,用于测量大数值孔径(NA)物镜的波像差。研究了棋盘光栅剪切干涉仪的基本原理,分析了大数值孔径物镜波像差测量时涉及的几个特殊问题。首先,根据棋盘光栅的远场衍射函数分析了棋盘光栅的衍射效率和衍射级分布,给出了剪切干涉图数据的处理方法。接着,根据球面光瞳坐标与平面探测器坐标的投影关系,分析了光瞳坐标畸变的影响;采用几何光线追迹方法,分析了光栅方程非线性对系统误差的影响。最后,推导了物镜光瞳边缘的相对照度与数值孔径的关系。试验结果表明:采用相同光瞳坐标,NA为0.6的显微物镜的波像差测量重复性(3σ)可达到3.7 mλ。对大数值孔径物镜测量过程中涉及的特殊问题进行了探讨,结果提示:测量大数值孔径物镜的波像差时,需要考虑光瞳坐标畸变、光栅方程引入的系统误差、光瞳边缘照度衰减的影响等。     

基于电视—计算机分析艾利图评定显微镜物镜的质量

对根据衍射点像定量评定显微镜物质量的装置和方法作了阐述。用测定包括大相对孔径物镜在内的显微物镜在宽光谱区整个视场上的点扩展函数、调制传递函数、几何特性、光度学特性实例显示该系统的能力。此外，还表明该系统能够同时评定光散射。     

Design of optical system for catadioptric fundus camera

为控制传统眼底相机的杂光和鬼像,设计了一款40°视场、48 mm工作距离的折反式眼底相机光学系统.设计了离轴反射式网膜物镜,引入了自由曲面以校正其离轴像差,成像物镜中采用两个自由曲面对网膜物镜的剩余像差进行校正.建立了一种离焦眼模型,用于优化成像光路,消除人眼像差对成像的影响,同时得到不同视度缺陷眼的成像光路.照明光路中使用3个相邻的环形光阑,减少了眼球光学系统反射的杂光.成像光学系统可在-10～+10 m-1调焦,物方各视场分辨率为33 lp/mm,系统畸变小于8.5％;照明光学系统在不产生鬼像的前提下,可均匀照明眼底,照度非均匀性在15％以内.实验表明,引入自由曲面的折反式眼底相机,有效地消除了杂光和鬼像,满足大视场和大工作距离的要求.     

线阵 CCD 光敏面不平度测量装置设计与电路实现

介绍了以测微导轨、微调平台、显微物镜、电感测微仪和微机为主要组成部分的线阵CCD光敏面不平度测量装置的工作原理,详细论述了微机接口电路的设计及实现方法。     

拍照手机镜头杂散光测量系统

在分析拍照手机镜头杂散光对成像品质影响的基础上,介绍了手机镜头杂散光测量的基本原理和方法。提出了区别传统测量装置的杂散光测量系统,该系统基于方型光箱和面型感光器件。CMOS图像传感器接收选定像场指定位置的目标黑体和白体成像后的光强度信号,经处理后由USB送入电脑,专用电脑软件自动计算各位置的杂散光系数并判断是否符合设定的标准。实测结果证明系统能快速测量拍照手机镜头的杂散光系数,方便评定镜头的影像品质,对镜头生产厂有较大的实用价值。     

光学系统的杂光计算分析

探讨了光学系统杂光分析方法,[提出了鬼像判别依据,在修改小镜面散射理论中几何遮挡因子(Geometrical Masking-shadowing Factor)基础上,抽象出光学系统中表面粗糙度σ_m/λ≥1.0,的表面双向反射分布函数(BRDF)模型,同时应用矢量微扰理论给出表面粗糙度σ_m/λ<<1.0的 BRDF 模型,并编制杂光分析程序     

像差在临界角方法探焦技术中的影响

分析了在临界角方法探焦技术中像差对测量灵敏度的影响。并给出了对两个显微物镜测量的结果。焦点探测试验精度为±1×10^-2μm.     

提高杂光系数测量用积分球装置中照明均匀性的理论分析与实验

本文从积分球的基本理论出发,作一些简化和近似,分析了改进杂光系数与像面照度分布测量用积分球装置照明均匀性的途径,并结合研制ZG—2型杂光测定仪的具体实践,进行了实验和讨论。结果表明,使照明光源朗伯化是最重要的解决办法。由此,在直径1.6m的积分球内,半球上面的亮度均匀性偏差可小于±3%,远优于国际标准草案的要求。     

An Investigation of the Steady-State Performance of a Pivoted Shoe Journal Bearing with ISO VG 32 and VG 68 Oils

This article presents a report on an investigation into the performance characteristics of a steadily loaded pivoted shoe journal (PSJ) bearing that is lubricated with ISO VG 32 and VG 68 oils. The article describes a testing machine on which the experimental investigation was performed. Measurements of shaft torque, pad temperature distributions, oil inlet and outlet temperatures, oil flow rate, and eccentricity have all been recorded as functions of load and speed. The experimental results from both test oils are presented in graphical form and are compared with theoretical predictions obtained from the author's computer model of the PSJ bearing. These results showed that the thicker ISO VG 68 oil provided thicker oil films. However, it also had higher bearing temperatures and power losses. A good correlation between the theoretical and experimental results has been found. Theoretical analysis of the bearing friction losses indicate that shear losses predominate and churning losses account for approximately 20% of the total losses.     

显微物镜光学传递函数测定

本文介绍了显微物镜光学传递函数测定仪的研制工作,包括仪器的基本工作原理,仪器电路设计、计算机接口设计、软件系统设计。并介绍了仪器的技术性能测试结果,仪器的使用效果。     

激光气体遥测仪整机测试系统自动化测试软件设计

激光气体遥测仪是基于红外气体吸收光谱原理,采用先进的可调谐半导体激光吸收光谱(TDLAS)技术分析测量被测区域(如传输管道、天花板、墙体等)内的甲烷气体平均浓度的新型仪表。性能优良的激光气体遥测仪表已在许多危险领域得到了广泛的应用,但是,目前整机测试系统流程复杂、费时、低效。结合相关生产实践开发一种较为实用的整机测试自动化软件,以提高整机测试的效率。目前已有效地帮助生产相关人员快速、准确地完成整机测试流程。     

基于CNAS检测实验室产教融合实训基地建设调查报告

建设标准化、专业化、智能化、高公信力的CNAS检测实验室是实现智能制造发展、提升职业教育技能人才培养质量的必由之路.通过本次调研了解了企业对我院CNAS检测实验室实训基地建设的需求和建议,为课题研究提供最根本的依据.对特定的企业岗位与工作任务的调查与分析,得出典型工作过程及人才所需的知识能力结构,确立专业建设和发展方向...     

Application of the dual-beam FIB/SEM to metals research

The dual‐beam microscope is a combination of a focused ion beam with an electron beam. The instrument used in this work is also equipped with an energy‐dispersive X‐ray system for local elemental analysis. This powerful tool gives access to specific features inside a material. Two different applications are presented in this paper: (1) cross‐sections and transmission electron microscope specimens cut in order to investigate the interface between an aluminium substrate and its epoxy coating; and (2) a grain boundary in a Cu₃Au alloy. In both cases, the dual beam succeeded where other methods failed.     

Inclined selective plane illumination microscopy adaptor for conventional microscopes

Driven by the biological sciences, there is an increased need for imaging modalities capable of live cell imaging with high spatial and temporal resolution. To achieve this goal in a comprehensive manner, three‐dimensional acquisitions are necessary. Ideal features of a modern microscope system should include high imaging speed, high contrast ratio, low photo‐bleaching and photo‐toxicity, good resolution in a 3D context, and mosaic acquisition for large samples. Given the importance of collecting data in live sample further increases the technical challenges required to solve these issues. This work presents a practical version of a microscopy method, Selective Plane Illumination Microscopy re‐introduced by Huisken et al. (Science 2004 ,305,1007–1009). This method is gaining importance in the biomedical field, but its use is limited by difficulties associated with unconventional microscope design which employs two objectives and a particular kind of sample preparation needed to insert the sample between the objectives. Based on the selective plane illumination principle but with a design similar to the Total Internal Reflection Fluorescence microscope, Dunsby (Dunsby, Opt Express 2008 ,16,20306–20316) demonstrated the oblique plane microscope (OPM) using a single objective which uses conventional sample preparation protocols. However, the Dunsby instrument was not intended to be part of a commercial microscope. In this work, we describe a system with the advantages of OPM and that can be used as an adaptor to commonly used microscopes, such as IX‐71 Olympus, simplifying the construction of the OPM and increasing performance of a conventional microscope. We named our design inclined selective plane illumination microscope (iSPIM). Microsc. Res. Tech. 2012. © 2012 Wiley Periodicals, Inc.