共查询到20条相似文献,搜索用时 31 毫秒
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FED(FieldEmisionDisplay,场致发射显示器)是世界上发达国家正在研制的一种具有巨大潜在市场的平板型显示器件,支撑技术是FED研究中的关键技术之一,也是微细加工技术领域的一个有意义的研究课题。叙述了FED对支撑技术的研究要求,介绍了美国、日本的几家公司和研究机构近几年的支撑技术研究方案和结果。 相似文献
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场致发射平面显示器的发展及应用前景 总被引:1,自引:1,他引:0
介绍了场致发射平面显示器(FED)的工作原理及研究现状,分析了LCD,PDP,FED等平板显示器的特点,并对FED显示器的应用前景作了展望. 相似文献
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Analysis for charged spacers in FED 总被引:3,自引:0,他引:3
Choi Y.S. Cha S.N. Jung S.Y. Kim J.W. Jung J.E. Kim J.M. 《Electron Devices, IEEE Transactions on》2000,47(8):1673-1677
Charged spacers in the field emission display (FED) are analyzed with the Monte Carlo method. The spacer is made of an insulator, which has generally a high secondary electron emission property. Under electron bombardment, the secondary electron emission induces charge on the spacer. We show that the surface of the spacer is charged positively in FED operation, which would cause an image distortion. We analyze the effect of charging on the spacer in terms of the electron density profile and luminescence profile of a dot near the spacer. Simulation results show that the image of a dot near the spacer is darker and smaller than that of a dot away from the spacer, though electrons are crowded near spacers. The results are confirmed by experiments. Finally, we suggest a way to reduce the effect of spacer charging by introducing a metal strip 相似文献
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平板显示器中FED与OLED技术特性比较 总被引:2,自引:2,他引:0
从发光原理、物理结构、驱动电路和制作3-艺上对场致发射显示器(field emission display,FED)和有机发光二极管(organic light Emitting diode,OLED)进行了详细的技术特性比较,并分析了各自的优缺点,为平板显示领域的研究提供了一定的理论基础。 相似文献
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The Field Emission Display (FED) is one of the most promising flat panel displays for the future. Currently this has been demonstrated using Very Large Scale Integrated circuit (VLSI) thin film technology to manufacture the key component of the FED, which is the Spindt type molybdenum micro-cone-shape field emitters. These are normally produced on glass or silicon substrates. In this paper, a new approach has been successfully developed to fabricate micro-field emitters on ceramic substrates. The significance of this development is that it provides the possibility to integrate small size FEDs into large dimensions. 相似文献
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介绍了场致显示器的灰度调制的原理及其灰度调制驱动电路的设计。采用FPGA控制技术实现前端视频信号接口、脉宽灰度调制的功能。通过串并转换模块与寻址芯片的连接,将PWM信号放大驱动FED显示屏实现视频图像的显示。该电路能驱动63.5cm彩色FED样机实现256级灰度显示。 相似文献
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论述印刷型场致发射显示器驱动系统的工作原理,介绍了采用DVI、VGA视频接口技术、专用集成图像灰度调制和集成扫描电路接口技术以及FPGA控制等技术研制出了能驱动显示VGA分辨率的印刷型FED视频显示系统。该系统能显示各种彩色视频图像,图像亮度已达400cd/m2、对比度达1 000:1,电路灰度等级达256级,有效显示对角线尺寸为635 mm(25 in)。 相似文献
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Yang Yang Akram A. Salman Dimitris E. Ioannou Stephen G. Beebe 《Solid-state electronics》2008,52(10):1482-1485
A thorough investigation is carried out by numerical simulations of the field effect diode (FED) with the aim to explore its potential for ESD protection applications in silicon on insulator (SOI) technologies. It is shown that the carrier lifetime value has an important impact on the device operation. By careful sizing and doping, FED devices with reasonable breakdown voltage values can be achieved but at rather high gate voltage values. Better results are achieved by modifying the doping profile to resemble a PNPN structure with two gates. 相似文献
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Chenggang Xie Yi Wei 《Electron Devices, IEEE Transactions on》2003,50(12):2348-2352
Spacer visibility is a critical issue in field emission displays (FEDs). Many reasons can lead to visible spacers, such as charging due to secondary electron emission under electron bombardment. In this paper, we will present results on spacer visibility due to chemical contamination on the spacer surface. We have identified Na contamination as the cause for the white spacer problem observed in the early developing stage of FED. The diffusion of Na from spacers to its adjacent cathode area during field emission operation caused higher field emission current from those field emitters. We believe the higher emission is due to the temporary gettering effect from the Na species, which cleaned the local field emitters. We have also found the existence of Pb on the spacer surface could create the dark spacer problem. To avoid any spacer visibility problem, the spacer surface must be kept clean. Any post clean procedure used to clean the surface should not leave any trace of elements such as Na, or Pb. 相似文献
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A Gummel-Poon model is developed for ZnSe-Ge-GaAs heterojunction bipolar transistors (HBTs). In this structure, undoped Ge spacers are placed at the emitter-base and collector-base junctions. Injected current components as well as bulk, spacer, and space charge recombination current components are modeled. Early voltage and bandgap narrowing effects are included in the model. The device performance was simulated and compared with the experimental results. The paper shows a good agreement between our model and the experimental results. The paper shows also that using spacers would improve the device performance. The advantages of this model is that it is analytical, compact, and can be easily implemented in CAD tool programs to simulate single or double HBTs with similar or dissimilar materials structure for the emitter and collector. 相似文献
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《Microelectronics Reliability》2014,54(12):2704-2716
The reduction of breakdown voltage (BV) influenced by high voltage interconnection (HVI) is a key problem in power integrated circuit, which essentially is that the modulation of electric field distribution at the device surface caused by HVI. In this paper, we review the developments of the methods to shield HVI including thick insulating film technology, field reduction layer technology, field plate technology and self-shielding technology. The four kinds of HVI technologies prevent BV degradation from the introduced adverse charge induced by interconnections in different ways. Thick insulting film technology increases the distance between the HVI and surface of silicon. Field reduction layer technology uses additional doping layers with optimized impurity concentration to enhance the depletion of the drift region under HVI. Field plate technology shields the influence of HVI with various field plate structures. Self-shielding technology makes HVI avoid crossing over high voltage junction terminal (HVJT), thus no additional shielding structure is needed. The divided reduced surface field (RESURF) technology solves the leakage current in the self-shielding structure. 相似文献