亚波长金属光栅偏振器设计

针对仿生微纳导航传感器敏感波段380～520nm的要求,基于严格耦合波理论,设计了一种适用于蓝紫光波段的金属光栅偏振器,并应用等效介质理论直观地分析了金属光栅偏振器的工作原理．所设计的金属光栅偏振器与传统的金属光栅偏振器的不同之处在于：在基底和金属线栅之间增加了氟化镁薄膜,并且刻蚀一部分氟化镁薄膜．在垂直入射条件下,在整个可见光波段,金属光栅偏振器TN透射效率大于61．5％,消光比大于370;数值计算和理论分析表明,所设计的金属光栅偏振器是一种宽带宽、高TN透射效率和高消光比的偏振器件．     

反射型和透射型导模共振滤光片的设计

本文设计了中心波长为1315 nm的反射型和透射型导模共振滤光片,并利用严格耦合波法分析了其光谱特性。首先设计了中心波长1315 nm单层反射型导模共振滤光片,但由于覆盖层和基底层的折射率不匹配,使得远离中心波长处的反射率偏高,引入减反射层设计后,中心波长两侧的反射率明显降低。其次设计了中心波长1315 nm的透射型导模共振滤光片,分析了光栅层厚度对中心波长位置的影响。用严格耦合波法计算表明,设计的反射型和透射型导模共振滤光片具有优良的光谱性能。     

相移长周期光栅在EDFA增益平坦中的应用

对相移长周期光栅进行了理论分析,在此基础上,运用传输矩阵法对它的透射光谱进行数值计算,分析了相移量大小、平均折射率变化以及光栅长度等结构参数变化对相移长周期光栅透射谱的影响,并根据这些变化规律适当调节它的结构参数,使其透射光谱与平坦EDFA的目标光谱在一定程度上相符。平坦后的EDFA增益谱在34nm范围内最大波动不超过±0.7dB。根据此方法设计的增益平坦滤波器只包含一个器件,体积小,便于制造和封装,具有很好的市场应用前景。     

相移光纤光栅透射光谱特性研究

基于模耦合理论,利用传输矩阵法系统地分析了相移光纤光栅的透射谱特点.结果表明,相移光栅可在透射谱阻带中打开线宽极窄的一个或多个透射窗口,通过对相移光栅在不同相移量、不同位置、不同相移个数、不同kL值时的传输光谱特性进行分析研究,得到了影响其透射率以及其线宽和位置的主要因素.这些结果将对相移光纤光栅在滤波、波分复用、光纤激光器和光纤光栅传感系统的实际制作及应用有重要的指导意义.     

基于FDTD的光栅结构模型设计

目的研究自然界中结构色呈色的不同机理和光栅微结构的反射或透射光呈色的特点。方法运用时域有限差分法(FDTD)理论,以FDTD Solutions和Matlab为平台,建立2种周期性光栅结构仿真模型(对称仿生结构模型和非对称仿生结构模型),并利用颜色理论研究其结构色呈色原理。结果获得了2种光栅反射光谱特性曲线颜色及其差异。结论周期性光栅微结构可以创建光谱颜色,结构模型参数发生变化的峰值位置出现了明显偏离现象,颜色光从非对称仿生结构模型的蓝色光(光谱波峰值为455nm),变为对称仿生结构模型的绿色光(光谱波峰值为550 nm),为制造颜色特性可控的人造结构色和光栅结构色呈色规律提供更多理论依据。     

亚波长波导光栅导模共振研究

弱调制介质光栅可等效为平板波导,经其衍射的高级次子波与波导模式耦合时,形成导模 共振。由高级子波在介质光栅中的光程及菲涅耳相移,导出了垂直入射时弱调制介质光栅共振位置的解析表达式,其预测结果和严格耦合波理论所得值一致。导模共振对入射波参数和光栅参数极为敏感,具有窄带效应,可用来制作窄带滤波片。     

多层介质膜脉冲压缩光栅激光损伤特性研究进展

本文结合国内外研究情况,概括性介绍了用于啁啾脉冲放大系统中的多层介质膜脉冲压缩光栅的激光损伤特性研究进展,包括多层介质膜的损伤、表面浮雕结构的损伤,以及介质膜光栅损伤的影响因素。在关于介质膜光栅激光损伤的影响因素中又分别介绍了槽型结构、制备工艺、激光参数、脉冲数量、热应力和杂质缺陷对其抗激光损伤阈值的影响。最后,从结构设计、制备工艺以及后期处理等方面,介绍了提高多层介质膜光栅抗激光损伤阈值的常用方法。     

Ag/SiO_2/Ag组成的三角形纳米柱的光学及传感特性

研究了一种Ag/SiO2/Ag组成的三角形纳米柱的LSPR消光光谱特性及其传感特性.时域有限差分（FDTD）法计算结果表明,三棱柱结构在中间夹层SiO2后,消光光谱峰值出现红移现象,并伴随着折射率灵敏度的增加.随着中间介质层厚度的增加,上下两层金属间表面等离子体耦合逐渐减弱,消光光谱峰值红移速度减慢.当介质层厚度为60nm时,金属层间的表面等离子体耦合消失,消光光谱与折射率灵敏度不再发生变化.对于实际制作时可能出现尖角钝化的三棱柱结构,中间介质层仍然表现出对其光学及传感特性的良好的调节作用.     

传感品质因数增强的塔姆-表面等离激元杂化模式

基于棱镜耦合的金膜表面塔姆等离激元(Tamm plasmon polarition, TPP)与表面等离极化激元(surface plasmon polariton, SPP)的杂化耦合受到广泛的关注和研究,但这种传统的激发装置由于拥有体积庞大的棱镜等光学元件以及对入射光角度精准控制有严格要求,限制了其集成化发展和实际应用。为了简化TPP和SPP杂化耦合激发方式,本文提出了一种光栅耦合型多层堆叠结构设计。该结构主要包括三部分：顶部纳米厚度的金膜、中间一维布拉格光子晶体以及底部金纳米光栅。在该结构中利用底部纳米光栅的一级透射光同时实现了顶部金膜上下表面SPP和TPP共振激发。两种模式之间的耦合杂化作用极大地减少了模式的共振带宽,从而使TPP-SPP模式的传感品质因数得到了显著的提高。此外,通过改变纳米光栅的周期和组成一维布拉格光子晶体的介质层厚度,SPP和TPP可以在较宽光谱范围内实现耦合杂化。相比于传统棱镜式的TPP和SPP双模式耦合结构,设计的光栅耦合型的多层堆叠结构无需借助棱镜和对入射角精确调控,在正入射光照射下就可实现两种模式的共振耦合,这不仅易于结构的进一步集成和小型化,同时对...     

阳光控制膜玻璃的光学特性及膜系设计

通过对阳光控制膜玻璃膜层结构的分析，指出三层膜各自所起的作用具有很明显的相对独立性，因而在进行膜层材料选择及工艺参数确定时，可分别独立地加以处理。对几种常用金属薄膜和金属氧化物薄膜的理化性能与工艺可行性进行了比较。用分光光度计测试了幕墙玻璃单层膜及三层膜在可见光区的反射和透射特性。通过具体的实验数据表明了各层膜对幕墙玻璃光学性能的影响。     

Enhanced middle-infrared light transmission through Au/SiO(x)N(y)/Au aperture arrays

The enhanced middle-infrared light transmission through Au/SiO(x)N(y)/Au aperture arrays by changing the refractive index and the thickness of a dielectric layer was studied experimentally. The results indicated that the transmission spectra was highly dependent on the refractive index and the thickness of SiO(x)N(y). We found that the transmission peaks redshifted regularly along with the refractive index from 1.6 to 1.8, owing to the role of surface plasmon polaritons (SPP) coupling in the Au/SiO(x)N(y)/Au cascaded metallic structure. Simultaneously, a higher transmission efficiency and narrower transmission peak was obtained in Au/SiO2.1N0.3/Au cascaded metallic structure with small refractive index (1.6) than in Au/SiO0.6N1/Au cascaded metallic structure with large refractive index (1.8). When the thickness of SiO(x)N(y) changes from 0.2 to 0.4 microm, the shape of transmission spectra exhibits a large change. It was found that a higher transmission efficiency and narrower transmission peak was obtained in Au/SiO(x)N(y)/Au cascaded metallic structure with a thin dielectric film (0.2 microm), with the increase of SiO(x)N(y) film's thickness, the transmission peak gradually widened and disappeared finally. This effect is useful in applications of biochemical sensing and tunable integrated plasmonic devices in the middle-infrared region.     

Method for determination of the dielectric function of a thin absorbing film on variable substrates from transmission spectra

Transmission spectra of bilayers of a strongly absorbing dye molecule on thin semitransparent metallic films show a pronounced variation of the shape as a function of the thickness of the metal film. The shape changes with increasing thickness of the metal film from the form of an absorption spectrum as determined by the imaginary part of the dielectric function to an antisymmetric shape characteristic of the dispersion of the real part of the dielectric function in the vicinity of a resonance. These different spectra shapes were exploited to derive the complex dielectric function of a dye layer from transmission spectra of the layer on metal films of a different thickness. This method proved to be a simple alternative to determination of the dielectric function of a thin film of a dye by spectroscopic ellipsometry.     

High transmission efficiency for surface plasmon resonance by use of a dielectric grating

The efficiency of the transmission of surface plasmon waves by use of a dielectric diffraction grating is discussed. The Kretschmann device allows us to obtain a surface plasmon resonance that consists of an absorption peak in the reflection spectrum. When surface plasmon resonance occurs, the TM-polarization mode of the incident electromagnetic wave is neither transmitted nor reflected. The procedure to transform an 4bsorption peak into a transmission peak is described. Transmittivity of 68% is obtained for a simple structure that consists of a thin-film layer of Ag coated on a volume diffraction grating and embedded between two dielectric media. The results presented herein were obtained by numerical simulations that were carried out by use of an algorithm based on the rigorous coupled-wave theory.     

Realization of integrated polarizer and color filters based on subwavelength metallic gratings using a hybrid numerical scheme

This study realizes integrated polarizer and RGB (red, green, and blue) color filters using single- and multiple-layered subwavelength metallic grating structures. A hybrid numerical scheme based on the rigorous coupled-wave analysis method and a genetic algorithm is used to determine the optimal values of the grating period, filling factor, and grating thickness of three different grating structures, namely, a single-layer grating, a double-layer grating, and a double-layer grating with a lateral shift. The optical performance of the various structures is evaluated and compared in terms of the transmission efficiency at the center wavelengths 700.0?nm, 546.1?nm, and 435.8?nm of red, green, and blue light, respectively, and the extinction ratio over the visible wavelength spectrum (380-780?nm). It is shown that the double-layer grating achieves a transmission efficiency of about 50% and an extinction ratio of around 60?dB. Thus, this grating structure provides a convenient and effective means of achieving the polarizing and filtering functions in LCD panels using a single device.     

具有多层结构的聚合物复合薄膜的介电和磁性能

采用旋涂法制备了 Fe3 O4/聚偏氟乙烯(PVDF)复合薄膜(A)、多壁碳纳米管(MWCNT)/PVDF复合薄膜(B)以及纯PVDF薄膜(P)。利用热压法制备具有3层结构的AAA、ABA及APA 复合薄膜。为了探究层状结构对复合薄膜介电和磁性能的影响,制备了单层膜A作为对比(厚度与AAA复合薄膜相同)。分别研究了薄膜的介电和磁性能。结果表明：由于界面效应,同等厚度的AAA复合薄膜较A膜而言具有较高的介电常数;以B和P薄膜替代AAA结构中间层薄膜后,其中ABA复合薄膜的介电常数高于AAA及APA复合薄膜,同时保持较低的介电损耗。对于磁性能,层状结构对复合薄膜的饱和磁化强度及矫顽力均无明显的影响,而ABA复合薄膜的饱和磁化强度高于AAA及APA复合薄膜,且ABA和APA复合薄膜的矫顽力增加。层状结构设计不仅能够调节复合材料的介电性能和磁性能,而且有利于不同纳米填料的分散,为制备多功能聚合物复合材料提供了一定的借鉴作用。     

Polarization-independent wideband mixed metal dielectric reflective gratings

A polarization-independent wideband mixed metal dielectric grating with high efficiency of the -1st order is analyzed and designed in Littrow mounting. The mixed metal dielectric grating consists of a rectangular-groove transmission dielectric grating on the top layer and a highly reflective mirror composed of a connecting layer and a metal film. Simplified modal analysis is carried out, and it shows that when the phase difference accumulated by the two propagating modes is odd multiples of π/2, the diffraction efficiency of the -1st order will be high. Selecting grating depth and duty cycle for satisfying the phase difference condition for both TE (electric field parallel to grooves) and TM (magnetic field parallel to grooves) polarizations, a polarization-independent high-efficiency grating can be designed. Using rigorous coupled-wave analysis and a simulated annealing algorithm, geometric parameters of the reflective grating are exactly obtained. The optimized grating for operation around a wavelength of 800 nm exhibits diffraction efficiencies higher than 90% for both TE and TM polarizations over a 120 nm wavelength bandwidth. The simplified modal analysis can be applied in other types of reflective gratings if the top layer is a dielectric transmission grating.     

Diffraction-based tracking of surface plasmon resonance enhanced transmission through a gold-coated grating

Surface plasmon resonance enhanced transmission through metal-coated nanostructures represents a highly sensitive yet simple method for quantitative measurement of surface processes and is particularly useful in the development of thin film and adsorption sensors. Diffraction-induced surface plasmon excitation can produce enhanced transmission at select regions of the visible spectrum, and wavelength shifts associated with these transmission peaks can be used to track adsorption processes and film formation. In this report, we describe a simple optical microscope-based method for monitoring the first-order diffracted peaks associated with enhanced transmission through a gold-coated diffraction grating. A Bertrand lens is used to focus the grating's diffraction image onto a CCD camera, and the spatial position of the diffracted peaks can be readily transformed into a spectral signature of the transmitted light without the use of a spectrometer. The surface plasmon peaks appear as a region of enhanced transmission when the sample is illuminated with p-polarized light, and the peak position reflects the local dielectric properties of the metal interface, including the presence of thin films. The ability to track the position of the plasmon peak and, thus, measure film thickness is demonstrated using the diffracted peaks for samples possessing thin films of silicon oxide. The experimental results are then compared with calculations of optical diffraction through a model, film-coated grating using the rigorously coupled wave analysis simulation method.     

Investigation on Spectral Properties of Metal�CInsulator�CMetal Film Stack with Rectangular Hole Arrays

Spectral properties of metal?Cinsulator?Cmetal hole arrays consisting of a dielectric core layer sandwiched between two metallic layers drilled in rectangular hole arrays are investigated using the finite-difference time-domain method in the visible and near-infrared regions. The influences of the thickness and refractive index of the dielectric core layer as well as the thickness of the metallic layer on the spectral absorptance and transmittance are numerically studied. It is found that strong spectral absorption can be excited by the internal- and external-surface plasmon polaritons (SPPs). For some specific structure parameters, the metal?Cinsulator?Cmetal hole arrays show strong absorptance of the incident wave of about 95% if the internal- and external-SPPs are simultaneously excited.     

Grating-coupler assisted infrared reflection absorption spectroscopy for the characterization of organic thin films

We demonstrate how grating-coupler assisted infrared reflection absorption spectroscopy can be used to simultaneously determine the chemical identity and relative thickness of organic thin films. With a grating substrate, a threshold anomaly associated with passing off of the -1 diffracted order occurs at grazing angles of incidence, resulting in a sharp absorbance in the infrared. The position of this peak is sensitive to the grating geometry as well as the dielectric environment near its surface. Thus, shifts in the peak position can be used to determine the relative thickness of adsorbed films or quantify molecular adsorption events. To illustrate the characteristics and sensitivity of this phenomenon, several samples were prepared and tested, including self-assembled alkanethiolate monolayers with 11-mercaptoundecanoic acid, 11-mercapto-1-undecanol, decanethiol, and a covalently linked layer of bovine serum albumin on a commercial, gold-coated grating. For these samples, the position of the threshold absorbance peak shifted to lower wavenumbers as film thickness increased, which is consistent with calculated shifts based upon an increasing refractive index at the interface. The sensitivity of this shift was measured to be 3.7 cm(-1) nm(-1). These results illustrate how a grating substrate can be exploited in a standard infrared reflectance measurement to provide additional information about the relative thickness of adsorbed surface films.     

衍射频谱法测光栅膜层厚度

根据傅立叶光学理论从光栅的衍射频谱中可以反推光栅本身的多种信息,包括其形貌特征。 利用矩形相位光栅的傅立叶变换,推导出零级和一级衍射光强和矩形相位光栅膜层厚度之间的函数关系,据此可在测得零级和一级次光强后,推算出光栅膜层厚度。以台阶仪作为标准,该方法的测量误差在4%以内。