Inducing dendrite formation using an atomic force microscope tip

Atomic force microscope (AFM) tip-induced nucleation, and dendrite growth of vapor deposited PETN films on Si (100) have been investigated at room temperature. The AFM tip induces a change from smooth and flat morphology to islands and dendrites, which is owing to the lowering and vanishing of 2-D nucleation barrier at the tip contact area; this action gives rise to the formation of large islands in the scanned area and dendrite growth along the scanning boundary.     

Nanometer-scale layer modification of polycarbonate surface by scratching with tip oscillation using an atomic force microscope

This paper presents a simple and reliable technique for nanometer-scale layer modification of a polycarbonate (PC) surface using an atomic force microscope (AFM). The AFM tip, coated with amorphous carbon was made to oscillate vertically at its resonance frequency. With tip oscillating in tapping mode, it scan-scratched the PC surface to make the desired modification. This action carved the PC surface without distorting it. The bottom of the depression made by scan-scratching with the oscillating tip was obviously flat in comparison with the area scan-scratched without tip oscillation in contact mode. The depth of the scan-scratched depression was controlled by adjusting the amplitude of oscillation and the scanning speed of scratching. This technique is very interesting for microtribology and surface modification.     

Lateral force microscope calibration using a modified atomic force microscope cantilever

A proof-of-concept study is presented for a prototype atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction measurement using a lateral force microscope (LFM). The calibration procedure is based on the method proposed by Feiler et al. [Rev. Sci. Instrum. 71, 2746 (2000)] but allows for calibration and friction measurements to be carried out in situ and with greater precision. The modified AFM cantilever is equipped with lateral lever arms that facilitate the application of normal and lateral forces, comparable to those acting in a typical LFM friction experiment. The technique allows the user to select acceptable precision via a potentially unlimited number of calibration measurements across the full working range of the LFM photodetector. A microfabricated version of the cantilever would be compatible with typical commercial AFM instrumentation and allow for common AFM techniques such as topography imaging and other surface force measurements to be performed.     

Guiding self-assembly with the tip of an atomic force microscope

We report the guided self-assembly of nanoparticles to geometrically well-defined charge patterns written on a dielectric surface with the conductive tip of an atomic force microscope (AFM). Charges are deposited in 30-90-nm thick fluorocarbon layers by applying voltage pulses to the conductive AFM tip. The samples are being developed by dipping them into an organic suspension of silica nanoparticles. Coulomb forces draw the nanoparticles to the charge patterns. With this simple process, we achieve a resolution of about 800 nm.     

Design of a sample approach mechanism for a metrological atomic force microscope

In order to obtain the high accuracy required for a metrological atomic force microscope, the sample approach mechanism meets strict specifications. The design presented in this paper offers a stiff construction, which limits the influences of floor vibrations on the measurement. Next to this, thermal considerations in the design decrease the uncertainties introduced by temperature variations of the environment. Uncertainties can also be caused by misalignment of the sample holder with respect to the measurement system of three interferometers. To limit these uncertainties, the approach mechanism provides sufficient alignment possibilities. The performance of the sample approach mechanism was evaluated by means of a finite element simulation of its dynamic stiffness. A series of experiments provide the unknown parameters to the simulation model. The dynamic stiffness lies around 395 Hz, which is sufficiently high to provide accurate measurements.     

Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscope

A combined scanning near field optical/atomic force microscope (AFM) is used to obtain surface force measurements between a near field sensing tip and a tapered optical fibre surface, whilst simultaneously detecting the intensity of the evanescent field emanating from the fibre. The tapered optical fibre acts as a compliant sample to demonstrate the possible use of the near field intensity measurement system in determining 'real' surface separations from normal AFM surface force measurements at sub-nanometer resolution between deformable surfaces.     

Fabrication of ionic liquid thin film by nano-inkjet printing method using atomic force microscope cantilever tip

We demonstrate the fabrication of thin films of ionic liquid (IL), 1-butyl-3-methyl-imidazolium tetrafluoborate, by nano-inkjet printing method using an atomic force microscope (AFM) cantilever. The IL filled in a pyramidal hollow of the AFM cantilever tip was extracted from an aperture at the bottom of the hollow and deposited onto a Pt substrate when the bias voltage was applied between the cantilever and the substrate. We succeeded in fabricating IL thin films with a thickness of 4 nm. The areas and thicknesses of IL thin films were controlled by the fabrication conditions in this method, which is also useful for the investigations of nanometer-scale properties of ionic liquid.     

Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces

In this paper, the influence of atomic force microscope tip on the multifractal analysis of rough surfaces is discussed. This analysis is based on two methods, i.e. on the correlation function method and the wavelet transform modulus maxima method. The principles of both methods are briefly described. Both methods are applied to simulated rough surfaces (simulation is performed by the spectral synthesis method). It is shown that the finite dimensions of the microscope tip misrepresent the values of the quantities expressing the multifractal analysis of rough surfaces within both the methods. Thus, it was concretely shown that the influence of the finite dimensions of the microscope tip changed mono-fractal properties of simulated rough surface to multifractal ones. Further, it is shown that a surface reconstruction method developed for removing the negative influence of the microscope tip does not improve the results obtained in a substantial way. The theoretical procedures concerning both the methods, i.e. the correlation function method and the wavelet transform modulus maxima method, are illustrated for the multifractal analysis of randomly rough gallium arsenide surfaces prepared by means of the thermal oxidation of smooth gallium arsenide surfaces and subsequent dissolution of the oxide films.     

Metrological atomic force microscope using a large range scanning dual stage

We developed a metrological atomic force microscope (MAFM) using a large range scanning dual stage and evaluated the performance in the measurement of lateral dimension. AFMs are widely used in nanotechnology for very high spatial resolution, but the limitation in measurement range should be overcome to expand its application in nanometrology. Therefore, we constructed new MAFM having a large measurement of 200 mm × 200 mm by using a dual stage and an AFM head module. The dual stage is composed of a coarse and a fine stage to obtain large scanning range and high resolution simultaneously. Precision surfaces and PTFE sliding pads guide the motion of coarse stage, drove by a fine pitch screw and DC motors. Flexure hinges and PZT actuators are utilized for the fine stage. Multi-axis interferometers measure the five degrees of freedom motion of the dual stage for the position control and the compensation of parasitic angular motions. The vertical displacement of AFM tip is measured by a built-in capacitive sensor in the AFM head module within the range of 38 μm. The performance of the dual stage was evaluated and the expanded uncertainty (k = 2) in the measurements of 1-D displacement L was estimated as $ U(L) = \sqrt {(2.8nm)^2 + (3.0 \times 10^{ - 7} \times L)^2 } $ U(L) = \sqrt {(2.8nm)^2 + (3.0 \times 10^{ - 7} \times L)^2 } . The relative uncertainty in pitch measurement was less than 0.02 % and the improvement of accuracy was verified by comparing with other MAFM, which are mostly due to the expansion of scan range and the compensation of angular motion. To enhance the performance, we will reduce the vibration and examine the motion of stage in the vertical direction during a long range scan.     

Rotational positioning system adapted to atomic force microscope for measuring anisotropic surface properties

The diverse atomic configurations induce the anisotropic surface properties. For investigating anisotropic phenomena, we developed a rotational positioning system adapted to atomic force microscope (AFM). This rotational positioning system is applied to revolve the measured sample to defined angular direction, and it composed of an inertial rotational stepper and a visual angular measurement. The inertial rotational stepper with diameter 30 mm and height 7.6 mm can be easily attached to the AFM-system built in any general optical microscope. Based on a clearance less bearing and the inertial driving method, its bidirectional angular resolution reaches 0.005° per step. For realizing a close-loop controlled angular positioning function, the visual measurement method is utilized. Through the feedback control, the angular positioning error is less than 0.01°. For verifying the system performance, we used it to investigate the anisotropic surface properties of graphite. Through a modified cantilever tip, the atomic-scale stick-slip, and the anisotropic friction phenomena can be distinctly detected.     

Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array

A method for calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using an array of uniform microfabricated reference cantilevers. A series of force-displacement curves was obtained using a commercial AFM test cantilever on the reference cantilever array, and the data were analyzed using an implied Euler-Bernoulli model to extract the test cantilever spring constant from linear regression fitting. The method offers a factor of 5 improvement over the precision of the usual reference cantilever calibration method and, when combined with the Systeme International traceability potential of the cantilever array, can provide very accurate spring constant calibrations.     

Quantification of the lateral detachment force for bacterial cells using atomic force microscope and centrifugation

To determine the lateral detachment force for individual bacterial cells, a quantitative method using the contact mode of an atomic force microscope (AFM) was developed in this study. Three key factors for the proposed method, i.e. scan size, scan rate and cantilever choice, were evaluated and optimized. The scan size of 40×40 μm² was optimal for capturing sufficient number of adhered cells in a microscopic field and provide adequate information for cell identification and detachment force measurement. The scan rate affected the measurement results significantly, and was optimized at 40 μm/s considering both force measurement accuracy and experimental efficiency. The hardness of applied cantilevers also influenced force determination. The proposed protocol for cantilever selection is to use those with the lowest spring constant first and then step up to a harder cantilever until all cells are detached. The lateral detachment force of Escherichia coli cells on polished stainless steel and a glass-slide coated with poly-l-lysine were measured as 0.763±0.167 and 0.639±0.136 nN, respectively. The results showed that the established method had good repeatability and sensitivity to various bacteria/substrata combinations. The detachment force quantified by AFM (0.639±0.136 nN) was comparable to that measured by the centrifugation method (1.12 nN).     

Comparison of friction measurements using the atomic force microscope and the surface forces apparatus: the issue of scale

Results are presented of lateral force measurements using the atomic force microscope (AFM) and the surface forces apparatus (SFA). Two different probes are used in the AFM measurements; a sharp silicon nitride tip (radius R20 nm) and a glass ball (R15 m). The lateral force is measured between the (silicon nitride or glass) probe and a mica surface which has been coated by a thin lubricant film. In the SFA, a thin lubricant film separates two molecularly smooth mica surfaces (R1 cm) which are slid relative to each other. Perfluoropolyether (PFPE) and polydimethylsiloxane (PDMS) were used as the lubricant films. In the SFA where the contact diameter is largest, the PFPE film shows much lower friction than PDMS. As the size of the probe decreases, the difference in the measured friction decreases. For sharp AFM tips, no clear distinction between the tribological properties of the films can be made. Hence, the measured coefficient of friction varies according to the length scale probed, at least for small dimensions.     

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope

A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p ≤10(-10) mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.     

Broadside coupling to long-range surface plasmons in metal stripes using prisms, particles, and an atomic force microscope probe

Techniques for broadside coupling to long-range surface plasmon waves propagating along metal stripes are investigated. The baseline technique consists of evanescently coupling an optical input beam originating from a polarization maintaining fiber to the plasmon wave via a right-angle prism positioned above the metal stripe, and providing an optical output some distance away through a mirror arrangement of identical elements. The technique is modeled theoretically using plane waves and implemented to measure the attenuation of the long-range plasmon wave propagating along a metal stripe supported by a thin freestanding dielectric membrane. An alternative technique for providing an output is proposed, whereby a tipless atomic force microscope probe physically contacts the metal stripe to generate out-of-plane scattering and a multimode fiber positioned nearby is used to capture a portion of the scattered light. This technique is easier to implement than the baseline technique, resulting in attenuation measurements of significantly better quality. The goodness of fit of the best fitting linear models to the measurements was significantly improved using this technique (0.93 and 0.99), and the measured attenuations were in very good agreement with the theoretical ones (6.01% and 0.27% error). This simple technique for optical probing and coupling could be applied to other surface plasmon waveguides and possibly to dielectric waveguides with modes having sufficient field strength in their evanescent tail. Output scattering using micron-sized particles located on the metal stripe was also investigated. The stability of the experimental setup was assessed and found to be about 0.01 dB peak to peak over a few minutes at constant temperature using a reference optical signal.     

High-speed atomic force microscope lithography using a piezo tube scanner driven by a sinusoidal waveform

Improving the throughput of atomic force microscope (AFM) lithography is an important success factor for employing it in nanolithography applications. The conventional motion of the AFM tube scanner is usually driven by triangular-shaped signals, but it is limited in speed due to mechanical instability of the scanner at the turning points. Here, we show that high-speed lithography is achievable using not only a piezo tube driven by a sinusoidal waveform signal but also highly sensitive noble organic resists including a photo acid generator. Cross-linked polymer nanostructures applying sinusoidal waveform driving have also shown improvements in the linearity and uniformity of line patterns.     

Real-time imaging of DNA-streptavidin complex formation in solution using a high-speed atomic force microscope

The direct observation of individual molecules in action is required for a better understanding of the mechanisms of biological reactions. We used a high-speed atomic force microscope (AFM) in solution to visualize short DNA fragments in motion. The technique represents a new approach in analyzing molecular interactions, and it allowed us to observe real-time images of biotinylated DNA binding to/dissociating from streptavidin protein. Our results show that high-speed AFMs have the potential to reveal the mechanisms of molecular interactions, which cannot be determined by analyzing the average value of mass reactions.     

Design of a scanning probe microscope with advanced sample treatment capabilities: An atomic force microscope combined with a miniaturized inductively coupled plasma source

We describe the design and performance of an atomic force microscope (AFM) combined with a miniaturized inductively coupled plasma source working at a radio frequency of 27.12 MHz. State-of-the-art scanning probe microscopes (SPMs) have limited in situ sample treatment capabilities. Aggressive treatments such as plasma etching or harsh treatments such as etching in aggressive liquids typically require the removal of the sample from the microscope. Consequently, time consuming procedures are required if the same sample spot has to be imaged after successive processing steps. We have developed a first prototype of a SPM which features a quasi in situ sample treatment using a modified commercial atomic force microscope. A sample holder is positioned in a special reactor chamber; the AFM tip can be retracted by several millimeters so that the chamber can be closed for a treatment procedure. Most importantly, after the treatment, the tip is moved back to the sample with a lateral drift per process step in the 20 nm regime. The performance of the prototype is characterized by consecutive plasma etching of a nanostructured polymer film.     

Surface imaging of thermally sensitive particulate and fibrous materials with the atomic force microscope: a novel sample preparation method

High-resolution surface imaging by atomic force microscopy (AFM) of particulate materials is often problematic, principally as a result of the large height (z) variations in sample topography that either prevent the probe scanning over the particle or cause probe self-imaging. This paper reports a novel method of embedding thermally sensitive particulate and fibrous materials which overcomes many of these problems and facilitates AFM imaging of these difficult materials. The process involves partial embedding of the sample in a cyanoacrylate film polymerized at room temperature. The sample heating required in currently used methods of particulate embedding is avoided and the method is therefore suitable for thermolabile materials. The cyanoacrylate film provides a flat hard surface which is ideal for AFM imaging, and the method has allowed successful imaging of relatively large particulate and fibrous samples such as starch granules and cellulose fibres. The cyanoacrylate has the added benefit that shrinkage holes in the film allow easy visual identification of areas where the film may have partially covered the sample.