RLVIP制备Ge1－xCx薄膜的X射线光电子能谱研究

应用低压反应离子镀（Reactive Low Voltage Ion Plating：RLVIP）在Ge基底上沉积了Ge1-xCx薄膜。制备过程中,低压等离子源作为辅助等离子源,Ge作为蒸发材料,CH4作为反应气体,在相同的条件下以不同沉积速率制备了C含量( x )从0.23到0.78的Ge1-xCx薄膜。X射线衍射测试表明制备的Ge1-xCx薄膜为无定形结构。通过X射线光电子能谱研究了不同C含量下Ge1-xCx薄膜的化学键合变化。测试结果表明当 x > 0.78时,成键为C-H键;当x在0.53至0.62时,成键为C-C键;当x < 0.47时,成键为Ge-C键。     

低压反应离子镀制备Ge1-xCx薄膜的硬度研究

应用低压反应离子镀的薄膜制备方法在G e基底上沉积了G e1-xCx薄膜,随着沉积速度在0.1nm/s~0.9nm/s之间变化,G e1-xCx薄膜的硬度在2.12 GPa~11.066 GPa之间可变,当沉积速率为0.9nm/s时,G e1-xCx薄膜最大硬度为11.066 GPa。XRD测试结果表明,沉积的G e1-xCx薄膜均为无定形结构。对薄膜稳定性和牢固度的测试表明,制备的G e1-xCx薄膜在具有较高的硬度的同时,也有良好的性能。     

薄膜X射线测厚仪

介绍了以西门子PLC(可编程控制器)用于薄膜测厚的全自动往复式X射线测厚仪的研制,介绍了该测厚仪的硬件构成和测厚的工作原理。该装置已成功应用在双向拉伸聚丙烯薄膜生产线上。     

往复式薄膜X射线测厚仪的研制

介绍了用于薄膜测厚的全自动往复式X射线测厚仪的研制,详述了该测厚仪的硬件组成和测厚的工作原理.该装置已成功运行在双向拉伸聚丙烯(BOPP)薄膜生产线上.     

激光等离子体X射线能谱诊断

为了诊断激光装置聚爆靶辐射等离子体内部的分布及运动过程,搭建了基于球面弯曲晶体的能谱成像系统。该系统的核心元件为弯曲半径为200mm的石英球面弯曲晶体(1011),利用晶体的晶格结构进行反射,利用弯曲表面实现聚焦。在中国工程物理研究院神光Ⅲ原型激光装置上利用该能谱成像系统首次进行X射线能谱成像实验。IP成像板得到了清晰的高Z元素Au等离子体X射线能谱。能谱信息分析显示,石英球面弯曲晶体得到的能谱分辨率约为1 380,与能谱分辨模型理论值的误差为3.9%。该结果表明石英球面弯曲晶体具有很好能谱分辨能力。     

非极化中子超镜用NiC薄膜制作技术研究

NiC/Ti中子超镜是一种高性能的中子多层膜光学元件,NiC纳米薄膜的制作是实现NiC/Ti多层膜的关键技术。基于Ni和C的直流磁控溅射方法,提出了一种NiC联合溅射靶材的实现方法,并制作了NiC单层膜样品。X射线光电子能谱的测量结果表明:用联合溅射靶材制作的NiC薄膜中Ni和C的原子数比与理论预期相吻合;基于X射线光电子能谱测试得到的Ni、C原子数比,通过构建Ni_(86)C_(14)的模型,可以很好地对掠入射X射线反射测试结果进行理论拟合。该研究可为进一步开展NiC/Ti中子超镜的制作提供参考。     

利用X射线光电子谱振激峰识别铜的氯化物

对未知粉末样品进行了Ｘ射线光电子谱分析。利用振激峰可以反映元素化学状态的特点,判断铜的氯化物的价态。实验结果证明,样品中的铜为一价铜,所以铜的氯化物为ＣｕＣｌ。     

X-射线光电子能谱表征与能量相关的器件

谱仪设计的新发展使得X-射线光电子能谱（XPS）具有独特的功能,成为科学家和工程师在可再生领域进行能源生产与贮存工作中最新的设备。由于器件的设计和制造都依赖于纳米材料工程,因此能够在纳米尺寸上实现化学表征的技术是很重要的。本文将讨论两种与能量相关的器件的表征。     

X射线诱导俄歇电子能谱(XAES)的应用

简要介绍X射线诱导俄歇电子能谱(XAES)用于化学分析的一般性理论。XAES可与X射线光电子能谱(XPS)一起用于元素化学态分析。但是XAES分析有其优势,(1)俄歇参数与荷电位移无关,结果无需荷电校准就可用于价态分析;(2)在一些涉及过渡元素和重元素物质的价态分析时,XAES峰化学位移大于XPS峰;(3)对于分析一些轻元素(如K、Mg、Al等),XAES峰比某些XPS峰有更高的灵敏度。因而,XAES可弥补XPS分析的某些不足,可方便、有效地表征元素价态。通过实例,介绍XAES在这3个方面的实际应用。     

X射线光电子能谱仪样品前处理装置的设计及应用

针对商品X射线光电子能谱仪(XPS)不能在通常的化学反应条件下进行原位分析的缺点,设计了与能谱仪配套连接的样品前处理装置.该装置可以将经预处理(如高温氧化、还原和预吸附等)或反应后的样品厌氧转入能谱仪,使X射线光电子能谱仪对表面的探测结果能真实地代表样品在反应或预处理后的组成与结构特征.对还原态NiO的XPS表征结果表明,采用样品前处理装置进行处理后,还原态NiO从反应器转至能谱仪过程中没有发生再氧化现象.     

Sialolith characterization by scanning electron microscopy and X-ray photoelectron spectroscopy

The objective of this study has been to characterize sialolith, a calcium phosphate deposit that develops in the human oral cavity, by high-resolution field emission scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS). The morphological and chemical data obtained helped in the determination of their formation mechanism in salivary glands. Sialoliths in the submandibular salivary glands may arise secondary to sialodenitis, but not via a luminal organic nidus. We believe this is the first study that characterizes a sialolith by XPS.     

Determination of oxygen in acid-treated high-purity niobium by X-ray photoelectron spectroscopy

High-purity niobium was immersed in nitric acid and hydrofluoric acid for two minutes and the resulting product was characterized. Scanning electron microscopy was employed to characterize the morphology of the acid treated product. Inert gas fusion was used for determination of oxygen in the high-purity niobium. X-ray photoelectron spectroscopy was employed to characterize the surface ratio of oxygen to niobium. The oxygen concentration was 30 ppm in the acid-treated material and 70 ppm in the untreated material. X-ray photoelectron spectroscopy was employed to characterize the reduction of oxygen at the surface. The ratio of oxygen to niobium decreased from 9.75 to 2.60 without treatment compared to acid treatment for two minutes. The concentrations of adsorbed water and niobium oxide decreased following etching. The acid-treated high-purity niobium was characterized by argon ion bombardment; adsorbed water molecules and niobium oxides were not present but non-lattice oxygen was observed.     

Ag-Cu亚稳态合金薄膜的共溅射法制备及其特性研究

采用共溅射法,于不同温度下在玻璃基底上沉积Ag-Cu薄膜。X衍射(XRD)分析表明,当基片温度为100℃和200 ℃时,形成的是Ag-Cu亚稳态合金;而当温度升高到300℃以上时,形成的则是Ag和Cu的分离相。通过X光电子能谱(XPS)法测量不同温度下沉积薄膜的Ag和Cu原子含量比,发现基片加热温度对沉积元素的相对比有一定影响。原子力显微镜(AFM)检测表明,随着加热温度的升高,薄膜表面的粗糙度增加,颗粒尺寸增大。分析认为,在温度较低时,原子热激活能相对较低,不足以发生迁移,形成Ag-Cu亚稳态合金;而当温度较高时,原子热激活能增大,容易发生迁移,此时Ag和Ag、 Cu和Cu各自结合的能量最低,形成Ag和Cu的分离相。     

Anisotropic oxidation of MoS2 crystallites studied by angle-resolved X-ray photoelectron spectroscopy

The oxidation behavior of the solid lubricant MoS₂ was studied using X-ray photoelectron spectroscopy. MoS₂-containing slip ring brushes were used to take advantage of anisotropic orientation of the plate-shaped MoS₂ crystallites occurring during fabrication of the brushes. Because oxidation occurs preferentially at the edges of the crystallites, greater oxidation fractions are measured when the edges are oriented toward the photoelectron energy analyzer. These results indicate a novel method for separately probing the chemistry on the edge and (lubricious) basal surfaces of MoS₂.     

Surface characterization of polytetrafluoroethylene (PTFE) transfer films during rolling-sliding tribology tests using X-ray photoelectron spectroscopy

A disk-on-disk Amsler wear tester simulating the rolling-sliding motion and high pressure during wheel/rail contact, was used to study the wear performance of PTFE including its film transfer and material flow properties. The chemical composition of the transfer film formed on the wheel-disk surface at various test stages were analyzed by X-ray photoelectron spectroscopy (XPS). The friction curve of the PTFE films obtained on the Amsler can be divided into three regions, according to the friction level and disk surface morphology. Initially, there is a rapid increase of friction coefficient which is presumably accompanied by a fast material transfer from pre-coated rail-disk to the wheel-disk surfaces. In the second region, the friction remains stable throughout and the XPS results show the presence of PTFE on the wheel-disk surface which confirms a transfer of material between the two contact surfaces. In addition, the splitting of F 1s and C 1s photoelectron peaks of PTFE, as a result of a discrepancy in surface charging, suggests that the transfer film exists in two forms: thick patch and thin film. With an increase in rolling cycles, the thick patches become thinner, as well as its coverage reduces. By contrast, the thin film gains both in thickness and coverage. Using a simple model, the thin film is calculated to be only a few nanometers thick. At the beginning of the third region, only a thin film is left on the surface. Additional rolling leads to a rapid rise in friction and the transfer film thickness continues to decrease. The evidence supports the removal of PTFE out of the contact zone, and a high friction coefficient (μ = 0.6) is reached at the end of the test indicating an un-lubricated metal-metal contact. No major tribochemical reaction of PTFE is observed during this study.     

The tribo-chemistry of graphite fluoride studied using X-ray photoelectron spectroscopy

A preliminary investigation involving the application of X-ray photo-electron spectroscopy (XPS) for the study of the degradation, under sliding conditions, of thin graphite fluoride films on steel has been carried out. The results described here show that the technique can provide invaluable information in establishing the mode of failure of the lubricating film.     

Measurement of thin liquid films by a fluorescence technique

A method is described for measuring the thickness of surface films of substances which are fluorescent, either naturally or by doping. Preliminary results are presented for oil film behaviour on a spinning cylinder. These observations have important implications for oil starvation in roller bearings.The range of thickness which can be measured depends on the optical absorption characteristics and degree of fluorescence of the film. For a light lubricating oil it is typically 0.1 μm to 1 mm. The technique needs optical access with small aperture from one side only and has a fast response with good spatial resolution. Contact with the surface film is not required.     

现代X光电子能谱(XPS)分析技术

现代电子能谱仪有3个主要功能:单色XPS(Mono XPS)、小面积XPS(SAXPS)和成像XPS(iXPS),被认为是光电子能谱仪发展方向。本文介绍这3个功能突出的特点及在材料微分析方面的实际应用。