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1.
颗粒增强Sn-Ag基无铅复合钎料显微组织与性能 总被引:2,自引:0,他引:2
通过外加法向Sn-3.5Ag焊料中加入体积分数为10%的微米级Cu、Ni颗粒制备了无铅复合钎料,对钎料的显微组织、拉剪及润湿性能进行了研究。结果表明,颗粒周围以及基板界面处的显微组织中生成了金属间化合物,其形态及大小因加入颗粒而不同。颗粒的加入提高了钎料钎焊接头的剪切强度,其中Cu颗粒增强的接头的剪切强度提高了33%,Ni颗粒的提高了20%。两种复合钎料的铺展面积均下降了约15%,其中Cu颗粒增强复合钎料润湿角由11°增加到18°。 相似文献
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通过SEM(Scanning Electron Microscope)背散射照片和EDX(Energy Dispersive X-Ray Spectroscopy)成分分析研究了无铅钎料Sn3.5Ag0.75Cu与Au/Ni/Cu焊盘接头在老化过程中其界面金属间化合物(IMC)的生长演变过程;在175℃温度条件下老化72h后发现Cu可以穿过Ni层参与形成界面金属间化合物(Au,Ni,Cu)Sn4和(Au,Ni,Cu)6Sn5;基于金属间化合物生长动力学理论计自得该焊点结构中AuSn4生长的活化能为53.78KJ/mol。[第一段] 相似文献
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添加微量稀土元素的SnAgCu无铅钎料的研究 总被引:7,自引:0,他引:7
介绍目前国际上较为公认的SnAgCu系无铅钎料的特点,并汇总了国际上相关专利的情况.同时,结合本实验室的专利技术,介绍了添加微量稀土对SnAgCu系无铅钎料性能的影响,并着重研究了稀土对显微组织,特别是金属间化合物的影响规律.研究结果表明:从综合性能角度考虑,添加稀土的作用明显,特别是显著改善了钎料的抗蠕变性能,稀土添加量的最佳范围在w(0.05~0.25)%之间.适量的稀土添加,可有效抑制金属间化合物的生长,细化组织. 相似文献
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微电子组装中Sn-Zn系无铅钎料的研究与开发 总被引:3,自引:3,他引:3
无铅钎料的研究开发是我国电子材料行业目前面临的紧迫课题.其中Sn-Zn系无铅钎料具有低的熔点,优良的力学性能,能获得可靠的钎焊接头,且其原材料丰富、价格便宜,有望替代Sn-Pb钎料.但该系钎料易氧化,抗腐蚀性较差,目前还未得到广泛的采用.介绍了开发新型无铅钎料应满足的要求,及几种有潜力的Sn-Zn系无铅钎料. 相似文献
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Sn-Zn系无铅钎料最新进展 总被引:1,自引:0,他引:1
Sn-Zn系钎料熔点与传统Sn-37Pb钎料十分接近,成本低廉,被研究者所推崇。由于Zn的存在导致Sn-Zn钎料润湿性差及抗氧化性不足,阻碍了该钎料的发展。添加合金元素和纳米颗粒是改善Sn-Zn钎料组织和性能行之有效的方法之一,为国内外研究者所推崇。结合国内外Sn-Zn系无铅钎料最新研究成果,探讨添加微量的合金元素In、Ni、Cr、Ga、Bi、Cu、Al、Ag、稀土元素及纳米颗粒对钎料润湿性、抗氧化性、力学性能、显微组织和界面组织的影响,同时简述有关钎剂对Sn-Zn的影响,并对Sn-Zn系钎料的发展趋势进行分析与展望。 相似文献
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In this paper, methods for determining elastic moduli and coefficients of thermal expansion (CTE) of intermetallic compounds
(IMC) formed at the interfaces between lead-free solder and metal substrates are presented. For the determination of elastic
moduli, two kinds of lead-free solder—SnZn and Sn—were used; the metal substrates were copper and nickel. Nanoindentation
techniques were adopted to determine the elastic moduli of Cu33.5Zn66.6, Cu3Sn, Cu6Sn5, and Ni3Sn4. Results for Cu33.5Zn66.6 are new to the literature, and others values are in good agreement with those presented in the literature. On the other hand,
for CTE determination, two moiré techniques, namely reflection moiré and shadow moiré, were developed to measure the deformation
of IMC/metal composite structures subjected to thermal loading. Finite-element analyses using ANSYS were then performed as
a convolutional process, and the genetic search algorithm was used to optimally obtain the CTE of IMC. The CTE of Cu33.5Zn66.6 was found to be approximate to that of copper, and the CTE of Cu3Sn was 10% larger. This method is also applicable to on-wafer films and IMC on micrometer order, such as the case of solder/IMC/under
bump metallization. 相似文献
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根据实际工艺流程和服役工况制备了微电子封装中3种无铅焊点(Sn3.0Ag0.5Cu、Sn0.7Cu和Sn3.5Ag)内界面金属化合物(IMC)的试样;利用扫描电镜(SEM)和能量色散X射线荧光光谱仪(EDX)对所制IMC的形貌和化学成分进行了分析;另外,借助纳米压痕仪,采用连续刚度测量(CSM)技术在不同的加载速率下对所制IMC的弹性模量和硬度进行了测量。结果表明,3种无铅焊点内的IMC均为Cu6Sn5,其弹性模量分别为98.93±3.37,113.55±4.58和(102.16±3.11)GPa,硬度分别为5.18±0.14,5.78±0.11和(5.55±0.19)GPa。 相似文献
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M. L. Huang T. Loeher D. Manessis L. Boettcher A. Ostmann H. Reichl 《Journal of Electronic Materials》2006,35(1):181-188
A comparative study of solid/solid interfacial reactions of electroless Ni-P (15 at.% P) with lead-free solders, Sn-0.7Cu,
Sn-3.5Ag, Sn-3.8Ag-0.7Cu, and pure Sn, was carried out by performing thermal aging at 150°C up to 1000 h. For pure Sn and
Sn-3.5Ag solder, three distinctive layers, Ni3Sn4, SnNiP, and Ni3P, were observed in between the solder and electroless Ni-P; while for Sn-0.7Cu and Sn-3.8Ag-0.7Cu solders, two distinctive
layers, (CuNi)6Sn5 and Ni3P, were observed. The differences in morphology and growth kinetics of the intermetallic compounds (IMCs) at the interfaces
between electroless Ni-P and lead-free solders were investigated, as well as the growth kinetics of the P-enriched layers
underneath the interfacial IMC layers. With increasing aging time, the coarsening of interfacial Ni3Sn4 IMC grains for pure Sn and Sn-3.5Ag solder was significantly greater than that of the interfacial (CuNi)6Sn5 IMC grains for Sn-0.7Cu and Sn-3.8Ag-0.7Cu solders. Furthermore, the Ni content in interfacial (CuNi)6Sn5 phase slightly increased during aging. A small addition of Cu (0.7 wt.%) resulted in differences in the type, morphology,
and growth kinetics of interfacial IMCs. By comparing the metallurgical aspects and growth kinetics of the interfacial IMCs
and the underneath P-enriched layers, the role of initial Cu and Ag in lead-free solders is better understood. 相似文献
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Morphology of intermetallic compounds formed between lead-free Sn-Zn based solders and Cu substrates
The morphologies of intermetallic compounds formed between Sn-Zn based solders and Cu substrates were investigated in this
study. The investigated solders were Sn-9Zn, Sn-8.55Zn-0.45Al, and Sn-8.55Zn-0.45Al-0.5Ag. The experimental results indicated
that the Sn-9Zn solder formed Cu5Zn8 and CuZn5 compounds on the Cu substrate, while the Al-containing solders formed the Al4.2Cu3.2Zn0.7 compound. The addition of Ag to the Sn-8.55Zn-0.45Al solder resulted in the formation of the AgZn3 compound at the interface between the Al4.2Cu3.2Zn0.7 compound and the solder. Furthermore, it was found that the cooling rate of the specimen after soldering had an effect on
the quantity of AgZn3 compound formed at the interface. The AgZn3 compound formed with an air-cooling condition exhibited a rougher surface and larger size than with a water-quenched condition.
It was believed that the formation of the AgZn3 compound at the interface occurs through heterogenous nucleation during solidification. 相似文献
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研究了Cu/Sn-58Bi/Cu焊点接头在室温和55℃下通电过程中阴极和阳极界面处微观组织的演变,电流密度均采用104A/cm2。结果表明,室温条件下通电达到25 d,Bi原子由阴极向阳极发生了扩散迁移,在阳极界面处形成了厚度约22.4μm的均匀Bi层,而阴极出现了Sn的聚集。加载55℃通电2 d后,焊点发生了熔融,阴极界面处形成了厚度为34.3μm的扇贝状IMC,而阳极界面IMC的厚度仅为9.7μm。在IMC层和钎料基体之间形成了厚度约7.5μm的Bi层,它的形成阻碍了Sn原子向阳极界面的扩散迁移,进而阻碍了阳极界面IMC的生长,导致了异常极化效应的出现。 相似文献
18.
H. Rhee F. Guo J. G. Lee K. C. Chen K. N. Subramanian 《Journal of Electronic Materials》2003,32(11):1257-1264
Mechanical incorporation of metallic particles in the Sn-Ag-based solder resulted in various intermetallic compound (IMC)
morphologies around these particles during reflow. Unlike with the Ni particles, the IMCs formed around Cu and Ag particles
are relatively insensitive to reflow profiles employed. The IMC formed around the Ni particles ranges from “sunflower” morphology
to “blocky” morphology with increasing time and temperature above liquidus during the heating part of the reflow profile.
Mechanical properties, such as simple shear strength and creep behavior, of these composite solders were affected by the IMC
morphologies in the composite solders investigated. Sunflower-shaped IMC formed around an Ni particles resulted in higher
simple shear strength and better creep properties. 相似文献