Film thickness dependence of critical current density for YBa2Cu3O7 films post-annealed at a low oxygen partial pressure

The variation of critical current density at 77 K as a function of film thickness was studied for YBa₂Cu₃O₇ films on (100) LaAlO₃ substrates. Film thicknesses were in the range 0.2–1.6m. The films were deposited by co-evaporation and post-annealed under conditions which have previously resulted in high-quality films (750°C and an oxygen partial pressure of 29 Pa). The critical current density at 77 K exceeds 1 MA cm^–2 for the thinner films, and decreases with increasing film thickness in excess of about 0.4m. The decrease is in rough agreement with a switch fromc-axis toa-axis growth at about this critical thickness. A good anticorrelation was found between room temperature resistivity and critical current density at 77 K. The results are compared to those obtained before by post-annealing at 850°C in 1 atm of oxygen.     

Superconducting behavior of high-Tc YBa2Cu3O7 thin films with BaO impurity produced by pulsed laser deposition

We have investigated the superconducting behavior of high-T _c YBa₂Cu₃O₇ (YBCO) thin films containing BaO impure phase produced by pulsed laser deposition. The thin films were characterized by the standard four-probe method, X-ray diffraction (XRD), and scanning electron microscopy (SEM). XRD showed that all these thin films contained BaO impurity, with thec-axis normal to the surface of the substrates. The presence of impurity existed from substrate temperatureT _s of 727 to 796°C. When these thin films with BaO impurity were measured under the magnetic fields, it was found that the critical current densityJ _c increased slightly with increase in magnetic fieldB within the range ofB500 G, in the case ofB perpendicular to thec-axis of the film.     

Critical current density and microstructure of YBa2Cu3O7 thin films post-annealed at a low oxygen partial pressure

Post-annealing of thin films of YBa₂Cu₃O₇ (YBCO) has been performed at 29 Pa and 750°C. For films 0.6 μm thick, a critical current density >1 MA cm^?2 is obtained at 77 K, with a sharp eddy current response at 25 MHz. Microstructural investigation of these films by crosssectional and planar transmission electron microscopy reveals that the YBCO film has thec-axis normal to the plane of the substrate in a continuous sheet of varying thickness, frequently covering the entire thickness of the film. Mutually perpendicular rods with thec-axis in the plane of the LaAlO₃ substrate are also seen. The microstructure and critical current density of these films are compared with those of previously reported films post-annealed in atmosphericpressure oxygen.     

Reproducibility of transition temperature and critical current density of thin films of YBa2Cu3O7 on (100) LaAlO3

Submicrometer epitaxial films of YBa₂Cu₃O₇(YBCO) on (100) LaAlO₃ were made by coevaporation and furnace annealing. Samples from more than a dozen runs are used in this study. The zero resistance transition temperature (T _c) is high (89 or 90 K) if the film composition is phase pure (Ba/Y=2, Cu/Y=3) or if it is enriched in Ba and Cu. For these compositions the critical current density (J _c) at 77 K has an average value of 2×10⁵ A cm^–2, with a tendency for decreasingJ _c with increasing film thickness (0.2 to 0.8m). Variations inJ _c are not correlated with deviations from ideal stoichiometry. Steeper slopes of the resistance-temperature curves above 100 K and lower values of the room-temperature resistivity are associated with high values ofJ _c. If the film composition is enriched in Y relative to Ba and Cu,T _c decreases by several degrees.     

Microstructural study of YBa2Cu3O7/SrTiO3/YBa2Cu3O7 heteroepitaxial trilayer films grown on (100) SrTiO3 substrates

Detailed transmission electron microscopic study has been carried out on heteroepitaxial YBa₂Cu₃O₇/SrTiO₃/YBa₂Cu₃O₇ trilayer thin films grown on (100)SrTiO₃ substrates prepared by DC and RF magnetron sputtering. The microstructural results showed the existence of somea-axis-oriented YBCO grains 20–90 nm wide in thec-axis-oriented YBCO matrix. Some of thea-axis grains in the lower YBCO thin film layer have protruded into the above SrTiO₃ layer, which may cause short circuit between the two YBCO superconducting layers. This is unsuitable for the application of trilayer thin films for microelectronic devices. The defects on the surface of the substrates would also influence the growth quality of the YBCO thin films.     

In situ grown superconducting YBCO films on buffered silicon substrates for device applications

Thin films of YBa₂Cu₃O_7– (YBCO) have been grownin situ on silicon single-crystal (100) substrate by using SrTiO₃ as a buffer layer. The deposition has been carried out by on-axis rf magnetron sputtering method. The deposition condition have been optimized by studying the plasma characteristics and correlating them with the superconducting performance of the film. Films deposited at substrate temperature in the range of 680–700°C from stoichiometric YBCO targets in an argon + oxygen mixture (31) are superconducting and showc-axis epitaxy. Compositional confirmation has been carried out using Rutherford backscattering. Scanning tunneling microscopy of the films reveal formation of well-defined layered structure with some defects in the initial stages ofin situ growth of the films. Films grown on SrTiO₃ substrates have excellent crystalline quality (XRD), transition temperatureT _c0=81 K and the critical current densityJ _c >2×10⁵ A/cm² for unpatterned films at 77 K. On silicon substrates using buffer layers thein situ deposited YBCO films shows a higher transition width andT _c0 is also slightly less (71 K).     

Direct Peritectic Growth of c-Axis Textured YBa2Cu3Ox on a Flexible Metallic Substrate

Previous work in the development of YBa₂Cu₃O _x (YBCO) superconducting wires and tapes has been focused on the deposition of YBCO on buffered metallic substrates. Although such an approach has proved successful in terms of achieving grain texturing and high transport current density, critical issues involving continuous processing of long-length conductors and stabilization of the superconductor have not yet been entirely settled. We have developed a novel process, the so-called direct peritectic growth (DPG), in which textured YBCO thick films have been successfully deposited directly onto a silver alloy substrate. No buffer layer is employed in the film deposition process. The textured YBCO grains have been obtained through peritectic solidification over a wide range of temperatures and times. The substrate materials have not demonstrated any observable reaction with the YBCO melt at the maximum processing temperature near 1010°C. The transport J _c has reached a respectable value of 10⁴ A/cm² at 77 K and zero magnetic field. Based on the experimental results in this work, we show that the DPG method offers an effective alternative for the fabrication of long-length YBCO conductors. Also reported is a physical explanation of the texturing mechanism on the metal substrate.     

High-Quality YBa2Cu3O7?x Films with CeO2/YSZ Buffer Layers on 2-Inch Si Wafers Deposited by Pulsed Laser

The pulsed laser deposition (PLD) process is shown for in situ reproducibly fabricating YBa₂Cu₃O_7–x (YBCO) superconducting films with yttrium-stabilized zirconia (YSZ) and CeO₂ buffer layers, nonsuperconducting crystalline YBa₂Cu₃O_7–x (YBCO*) passivation layer, and silver contact film on 2-inch silicon wafers. Variations of less than ±7% in film thickness have been obtained for this multilayer growth over the whole wafer. The YBCO films on 2-inch silicon wafers have homogeneous superconducting properties with zero resistance temperature T _c0 from 88.4 K to 88.9 K. and critical current density J _c at 77 K and zero field from 2.5 × 10⁶ to 7× 10⁶ A/cm². The YSZ, CeO₂ and YBCO layers grow epitaxially on silicon wafers. Full widths at half maximum (FWHMs) of (113) reflections of 40 nm thick YBCO layer from -scan patterns are only 1.71° and 1.85° corresponding to the center and edge of the wafer, respectively. These results are very promising for developing high-quality high-T _c superconducting devices on large-area silicon wafers.     

High Critical Current Density YBa2Cu3Ox Tapes Using the RABiTs Approach

Progress in the fabrication of epitaxial, high-J _c, biaxially aligned YBCO thick films on Rolling-assisted biaxially textured substrates (RABiTs) is reported. RABiT substrates comprise a biaxially textured metal substrate with epitaxial oxide buffer layers suitable for growth of superconductors. Oxide buffer layers have been deposited using three techniques: laser ablation, electron-beam evaporation, and sputtering. Epitaxial YBCO films grown using laser ablation on such substrates have critical current densities approaching 3 × 10⁶ A/cm² at 77 K in zero field and have field dependences similar to epitaxial films on single crystal ceramic substrates. Critical current densities in excess of 0.2 MA/cm² have been obtained on stronger, nonmagnetic substrates. In addition, samples with J _e of 12.5 kA/cm² at 77 K have been fabricated. The highest strain tolerence obtained so far is 0.7% in compression and 0.25% in tension. Deposited conductors made using this technique offer a potential route for the fabrication of long lengths of high-J _c wire capable of carrying high currents in high magnetic fields and at elevated temperatures.     

Anisotropy in the resistive superconducting transition under magnetic fields in single crystal Pb2Sr2Ho0.5Ca0.5Cu3O8

Anisotropie properties of the single crystal Pb₂Sr₂Ho_0.5Ca_0.5Cu₃O₈ have been investigated by measuring the electrical resistivity in theab-plane _ab (H, ,T), which depends on the angle between theab-plane and the magnetic-field direction, in various constant fieldsH perpendicular to the current direction. All the angle-dependent values of _ab (H, ,T) at a constant temperature are scaled to be on one curve as a function of reduced field. The anisotropic parameter (m _c ^* /m _ab ^* )^1/2 is estimated as 12–13, which is larger than that of YBa₂Cu₃O₇ and much smaller than that of Bi₂Sr₂CaCu₂O₈. It has been concluded that the anisotropy does not always depend on the thickness of the blocking layer but seems to depend on the overlap of the electronic wave functions along thec-axis. Anisotropy in the pinning potential has also been discussed from the resistive tail in the temperature dependence of _ab (H,,T).     

Tl2Ba2CaCu2O8 thin films on 2 in. LaAlO3(0 0 1) substrates

High quality Tl₂Ba₂CaCu₂O₈ (Tl-2212) superconducting thin films are prepared on both sides of 2 in. LaAlO₃(0 0 1) substrates by off-axis magnetron sputtering and post-annealing process. XRD measurements show that these films possess pure Tl-2212 phase with C-axis perpendicular to the substrate surface. The thickness unhomogeneity of the whole film on the 2 in. wafer is less than 5%. The superconducting transition temperatures T_cs of the films are around 105 K. At zero applied magnetic field, the critical current densities J_cs of the films on both sides of the wafer were measured to be above 2 × 10⁶ A/cm² at 77 K. The microwave surface resistance R_s of film was as low as 350 μΩ at 10 GHz and 77 K. In order to test the suitability of Tl-2212 thin films for passive microwave devices, 3-pole bandpass filters have been fabricated from double-sided Tl-2212 films on LaAlO₃ substrates.     

Crystal Structure and Superconductivity of MgB2 Thin Films Grown on Various Oxide Substrates

The crystal structure and superconductivity of MgB₂ thin films grown on various oxide substrates were investigated by X-ray diffraction and resistance measurement. The films were prepared by a two-step method, in which precursors B films were annealed in Mg vapor at 900C. The X-ray diffraction shows that the MgB₂ films grown on C–AL₂O₃, R–AL₂O₃, and MgO (001) are c-axis oriented while the films grown on SrTiO₃ (001), LaAlO₃ (001), and ZrO₂ (001) are aligned with the (101) direction normal to the substrate planes. All the grown films show superconductivity and their transition temperature varies with the substrates in the range of 34–39 K. We think that the transition temperature variation is probably due to the lattice matching between the film and the substrate, as well as the interdiffusion at the film/substrate interface. The experimental results suggest that if there is no severe interdiffusion at the film/substrate interface in the high temperature annealing process, more substrates could be used for the growth of MgB₂ films using the two-step method.     

Transport properties of textured Bi2Sr2CaCu2O8+y, thin films

Superconducting films of the high-T _c compound Bi₂Sr₂CaCu₂O_8+y , have been grown on (111)-oriented gadolinium gallium garnet substrates by a liquid-phase technique. The films show a very high degree of preferential orientation with thec-axis perpendicular to the substrates. The onset of the resistive transition was 85 K while zero resistance was obtained at 78 K. Results concerning the critical current properties of the films are described. Measurements of the paraconductivity effects on the electrical resistivity above the superconducting transition due to thermodynamic fluctuations are also reported.Supported by Ansaldo S.p.A Divisione Ansaldo Ricerche, Via Corso Perrone 25, I-16100 Genova, Italy.     

Anisotropy of optical constants of YBCO

Otto configuration attenuated total reflection (ATR) measurements of the excitation of surface plasmons in the infrared have been carried out on YBCO films deposited on MgO (100) substrates. The dielectric constants for YBCO at 3.392m are determined to be –10+15i forc-axis material. The anisotropic nature of the cuprate is seen from films with other orientations: nearlya-axis material has constants of 4.0+7.0i. It is thus not metallic in its optical response along thec-axis which lies parallel to the substrate plane. Ellipsometric measurements in the visible onc-axis material point to a maximum surface plasmon energy of 1 eV.     

Fabrication and Analysis of Tri-layer YBa<Subscript>2</Subscript>Cu<Subscript>3</Subscript><Emphasis Type="Italic">O</Emphasis><Subscript>7−<Emphasis Type="Italic">δ</Emphasis></Subscript> Thick Films by Low-Fluorine MOD Method

Improving the thickness of superconducting layer in coated conductors is an effective way to enhance its critical current. In this work, tri-layer YBCO/YBCO/YDyBCO films were successfully deposited on buffered Hastelloy substrate using the multi-coating lowfluorine metal-organic decomposition (LF-MOD) method and the thickness of the films can be up to 2.4 μ m. The effects of high-temperature annealing time on microstructures and superconducting properties of the films were systematically studied. Energy dispersive X-ray spectroscopy (EDS) results reveal that there remains a large amount of F element in the upper layer of the film when the annealing time is too short. With increasing the annealing time, the fluoride-containing precursor converts to YBCO grains completely. But the coarsening of grains appeared, and the critical current density (J _c) of the film dropped slightly when the annealing time is too long. The cross-sectional scanning electron microscope (SEM) image and EDS plane analysis were applied to investigate the microstructure and element distribution of the final triple-layer YBCO films, respectively. The critical current of the final YBCO superconducting film could reach 316 A (77 k, self-field) for 1.2-cm-wide tapes with the optimal annealing conditions.     

Anisotropy in ac losses near the irreversibility field of Bi2Sr2CaCu2O8

The ac susceptibility under a biased dc field near the irreversibility field (H _irr) of a Bi₂Sr₂CaCu₂O₈ single crystal has been measured. The frequency dependence, the ac-power dependence, and the nearly lossless character of the vs.H _dc curve forHa-axis have been roughly explained from a reversible (elastic) fluxoid motion, while those forH c-axis have been explained from a thermally assisted flux-flow (TAFF) model. The obtained parameters are discussed in relation to anisotropic flux-pinning mechanisms in the layered structure of this compound.     

Observation of X-band SQUID signals in a High-Tc superconducting film device

A microwave superconducting magnetometer is described in which a microstrip resonator is coupled to a two-hole high-T _c thin-film SQUID device. Both the microstrip circuit and the thin-film SQUID were fabricated by photolithography techniques. The YBCO thin film was deposited on single-crystal substrate of yttria-stabilized zirconia [YSZ(100)] by an ion beam sputtering technique producing a superconducting transition measured at a critical temperature ofT _c =92 K to within T 3 K. Non linear oscillatory behavior was observed in the microstrip resonator when inductively coupled to the SQUID. This nonlinear behavior yielded a microwave device in which the reflected microwave power varied with applied DC magnetic flux.     

Intrinsic intergranular transport current density in high-Tc superconductors

The intrinsic, intergranular, critical current densityJ _c(H=0,TT _c) in sintered untextured YBCO specimens of different grain size is self-consistently determined using a recently proposed critical state model [1] on ZFC magnetizationM(H, T) and on pulse transportJ _ct(T) measurements. Flux-creep effects, which are significant in these materials, are treated and theJ _c(T) results are corrected to their intrinsic values.     

The Influence of Bi Doping on the In Situ Growth of TlBa2Ca2Cu3O9 High-Tc Films

The in situ process—laser ablation in combination with thermal evaporation of Tl₂O—has turned out to be a preparation method for single-phase and epitaxial TlBa₂Ca₂Cu₃O₉ (1223) thin films with T _c values up to 109 K. It was found by several groups that a partial substitution of Tl by Bi simplifies the phase development of the 1223 compound in the usual two-step process. We have investigated the influence of the Bi doping on the in situ growth. X-ray measurements show that the films consisted mainly of the 1223 compound. In 300-nm thin films there was no evidence of a Bi amount in the crystal structure, but thinner films (80 nm) show a small amount of Bi. We concluded that Bi doping supports the phase development of the 1223 compound only in an early stage of the film growth. The Bi-doped films have higher T _c values up to 114 K, higher j _c values up to 6 × 10⁵ A/cm² (77 K, 0 T), and lower surface resistances of 56 m (77 K, 87 GHz) than the undoped films.