共查询到18条相似文献,搜索用时 62 毫秒
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在相同激光扫描速度(20mm/s)和不同激光功率(150W,200W,250W,300W)工艺条件下,利用CO2激光对铁磁Fe73.5Cu1Nb3Si13.5B9非晶带进行了辐照处理,诱导非晶带样品发生纳米晶化。应用穆斯堡尔(Mossbauer)谱(MS)、透射电镜(TEM)和X射线衍射(XRD)对实验样品的晶化工艺、纳米晶相的组织结构、晶化量和纳米晶化机理等进行了研究。结果表明,晶化析出相是α-Fe(Si)单相固溶体,具有4种超精细结构;其晶粒尺寸约为10~20nm;纳米晶均匀分布在非晶基体上,形成非晶相与纳米晶化相的双相组织结构。随着激光功率的增加,纳米晶化量随着增加,可通过控制激光处理工艺参量,来实现纳米晶化量的控制。 相似文献
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GaN在Si(001)上的ECR等离子体增强MOCVD直接生长研究 总被引:3,自引:0,他引:3
研究了用电子回旋共振(ECR)等离子体增强金属有机物化学气相沉积(PEMOCVD)技术在Si(001)衬底上,低温(620~720℃)下GaN薄膜的直接外延生长及晶相结构.高分辨透射电镜(HRTEM)和X射线衍射(XRD)结果表明:在Si(001)衬底上外延出了高度c轴取向纤锌矿结构的GaN膜,但在GaN/Si(001)界面处自然形成了一层非晶层,其两个表面平坦而陡峭,厚度均匀(≈2nm).分析认为,在初始成核阶段N与Si之间反应所产生的这层SixNy非晶层使GaN的β相没有形成.XRD和原子力显微镜(AFM)结果表明,衬底表面的原位氢等离子体清洗,GaN初始成核及后续生长条件对GaN膜的晶体质量非常重要. 相似文献
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研究了用电子回旋共振(ECR)等离子体增强金属有机物化学气相沉积(PEMOCVD)技术在Si(001)衬底上,低温(620~720℃)下GaN薄膜的直接外延生长及晶相结构.高分辨透射电镜(HRTEM)和X射线衍射(XRD)结果表明:在Si(001)衬底上外延出了高度c轴取向纤锌矿结构的GaN膜,但在GaN/Si(001)界面处自然形成了一层非晶层,其两个表面平坦而陡峭,厚度均匀(≈2nm).分析认为,在初始成核阶段N与Si之间反应所产生的这层SixNy非晶层使GaN的β相没有形成.XRD和原子力显微镜(AFM)结果表明,衬底表面的原位氢等离子体清洗,GaN初始成核及后续生长条件对GaN膜的晶体质量非常重要. 相似文献
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通过透射电镜原位观察,发现单斜η-Al11Cr2相在800℃保温2h后,其三个主带轴电子衍射图中的超点阵弱点逐渐减弱直至消失,且a轴和c轴所成的角度由91°变为90°,这些变化意味着单斜η-Al11Cr2相在加热后转变为一个新相,点阵参数为a=1.2428nm,b≈1.2658nm,c≈3.0456nm的体心正交相,命名为O-Al11Cr2.其[010]电子衍射图具有伪十次对称特点,因此也是一个十重对称准晶近似相. 相似文献
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在标准成分为Mn_(64)Co_8Si_(28)的急冷合金中观察到了一种新相,电子探针分析测定其成分为Mn66.9Co8.7Si24.4,与U相标准成分基本一致,故暂称之为U相。大角度倾转的电子衍射实验确定U相为六角晶系,其晶格常数为:a=0.68nm,c=1.29nm。图1绘出绕c~*轴倾转的一系列衍射谱中三张特征谱。因为出现了l=2k+1的斑矢,故可认为U相是简单六角结构。图1还展示了此样品因急冷条件下形成长周期结构,从而导致沿C轴方向存在一系到卫星斑点并形成明显的衍射条纹。 相似文献
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《电子元件与材料》2015,(9):46-49
采用单辊快淬法制备合金薄带Fe74CoxY6-xB20(粒子数分数x=2,3,4)合金系,取不同的温度对合金进行热处理,用X射线衍射(XRD),差热分析仪(DSC),振动样品磁强计(VSM)等测试手段对样品的晶化过程、热性能和磁性能进行研究。结果表明:制备的Fe74CoxY6–xB20均为非晶合金,Fe74CoxY6-xB20(x=2,3,4)非晶合金的晶化激活能分别为473.7,583.0和570.1kJ/mol,Fe74Co3Y3B20非晶合金热稳定性最好。非晶合金Fe74CoxY6-xB20(x=2,3,4)的饱和磁化强度MS分别为110,105和109A·m2·kg–1,矫顽力都较低,适量地添加Co提高了合金的非晶形成能力和磁性能。 相似文献
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Zero Thermal Expansion Achieved by an Electrolytic Hydriding Method in La(Fe,Si)13 Compounds 下载免费PDF全文
Shaopeng Li Rongjin Huang Yuqiang Zhao Wei Wang Yemao Han Laifeng Li 《Advanced functional materials》2017,27(5)
The La(Fe,Si)13‐based compounds have been recently developed as promising negative thermal expansion (NTE) materials by elemental substitution, which show large, isotropic and nonhysteretic NTE properties as well as relatively high electrical and thermal conductivities. In this paper, the La(Fe,Si)13 hydrides are prepared by a novel electrolytic hydriding method. Furthermore, the thermal expansion and magnetic properties of La(Fe,Si)13 hydrides are investigated by the variable‐temperature X‐ray diffraction and physical property measurement system. Fascinatingly, it is found that room‐temperature NTE properties and zero thermal expansion (ZTE) properties with broad operation‐temperature window (20–275 K) have been achieved after electrolytic hydriding. The further magnetic properties combined with theoretical analysis reveal that the improvements of NTE and ZTE properties in the La(Fe,Si)13 hydrides are ascribed to the variations of magnetic exchange couplings after hydrogenation. The present results highlight the potential applications of La(Fe,Si)13 hydrides with room‐temperature NTE and broad operation‐temperature window ZTE properties. 相似文献
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A first-principles pseudo-potential study of Frenkel pair generation close to the Si(1 0 0) surface in the presence of germanium and oxygen atoms is reported. The energies and structures of the defect structures (i.e. vacancy and relaxed tetrahedral Si interstitial) are calculated using supercell with up to 88 atoms. We present results obtained using the generalized gradient approximation (GGA) for the exchange-correlation energy. We examine the effect of the presence of germanium and oxygen atoms on the stability of Frenkel pairs generated near the Si(1 0 0) surface by comparing a number of individual cases, starting from vacancy interstitial pairs situated at various positions. The general tendency of the created interstitials is to climb towards the surface, but they generally remain in subsurface layers, ready to migrate into the layer. This tendency is enhanced by the presence of the Ge and/or O atoms. We show that the formation energy is lower and Si interstitials can be created with energies as low as 1.5 eV. 相似文献
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PECVD法制备的ZnO薄膜结晶性能的影响 总被引:2,自引:0,他引:2
报道了在等离子体作用下,以CO2/H2为氧源,Zn(C2H5)2为锌源,N2为载气,在Si(111)衬底上采用自行设计等离子体化学气相沉积(PECVD)装置来生长的ZnO薄膜。采用X射线衍射仪(XRD)、原子力显微镜(AFM)和场发射扫描电镜分别对不同衬底温度生长的薄膜样品进行了组成、表面和横截面的形貌表征,并且测试了薄膜的PL谱。研究结果表明,衬底温度直接影响薄膜的结晶质量。随衬底温度的升高,ZnO薄膜的结晶取向性开始增强,晶粒尺寸增大。在衬底温度约为450℃时,生长的ZnO薄膜有很强的择优取向性。 相似文献
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单晶硅衬底材料中的消光衍射 总被引:1,自引:0,他引:1
在经典衍射理论中,Si(2 0 0 ) ,Si(2 2 2 )等4 n+2面的反射是消光的,但在单晶硅或硅基材料中,常发现Si(2 0 0 ) ,Si(2 2 2 )的衍射.考虑非谐效应和电子云反对称分布的贡献,分别计算了Si(2 0 0 ) ,Si(2 2 2 )消光衍射的相对强度,并用XRD测试手段进行了验证.结果表明,理论与实验值基本符合.在室温下,Si(2 0 0 ) ,Si(2 2 2 )衍射主要是因为反对称的电子云分布所致.同时,强调了Si(2 0 0 ) ,Si(2 2 2 )衍射在XRD分析中的应用 相似文献
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Fabrication of Co2Fe(Al,Si) and Co2Fe(Al,Si)/MgO on Ge(111) Substrate and Its Magnetic Properties 下载免费PDF全文
We investigated the interfacial effects on magnetic properties in Co2Fe(Al,Si)/Ge (CFAS/Ge) and CFAS/MgO/Ge systems to demonstrate the effects of the interface structure on magnetic properties. CFAS and CFAS/MgO were deposited on the i-Ge(111) substrate. In-situ reflection high energy electron diffraction (RHEED) patterns showed epitaxially grown CFAS and MgO on Ge(111). According to the X-ray diffraction (XRD) ϕ-scan of CFAS(220), we determined that the crystallographic orientation relationships were CFAS(111)<–110>// Ge(111)<–110> and CFAS(111)<–110>//MgO(111)<–110>Ge(111)<–110>. The magnetic properties were measured by the vibrating sample magnetometer (VSM) and the saturation magnetization Ms value of CFAS with 2-nm thick MgO reached the value of L21 ordered one. A uniaxial magnetic anisotropy behavior was observed both in CFAS/Ge and CFAS/MgO/Ge structures after annealing. We confirmed the behavior did not only originate from the CFAS/Ge interface but also CFAS/MgO and the ordering structure. 相似文献
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Weijun Luo Xiaoliang Wang Hongling Xiao Cuimei Wang Junxue Ran Lunchun Guo Jianping Li Hongxin Liu Yanling Chen Fuhua Yang Jinmin Li 《Microelectronics Journal》2008,39(9):1108-1111
AlGaN/GaN high electron mobility transistor (HEMT) hetero-structures were grown on the 2-in Si (1 1 1) substrate using metal-organic chemical vapor deposition (MOCVD). Low-temperature (LT) AlN layers were inserted to relieve the tension stress during the growth of GaN epilayers. The grown AlGaN/GaN HEMT samples exhibited a maximum crack-free area of 8 mm×5 mm, XRD GaN (0 0 0 2) full-width at half-maximum (FWHM) of 661 arcsec and surface roughness of 0.377 nm. The device with a gate length of 1.4 μm and a gate width of 60 μm demonstrated maximum drain current density of 304 mA/mm, transconductance of 124 mS/mm and reverse gate leakage current of 0.76 μA/mm at the gate voltage of −10 V. 相似文献